JP4754587B2 - Ｍｔｆ測定方法及びｍｔｆ測定装置 - Google Patents

Ｍｔｆ測定方法及びｍｔｆ測定装置 Download PDF

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JP4754587B2
JP4754587B2 JP2008028369A JP2008028369A JP4754587B2 JP 4754587 B2 JP4754587 B2 JP 4754587B2 JP 2008028369 A JP2008028369 A JP 2008028369A JP 2008028369 A JP2008028369 A JP 2008028369A JP 4754587 B2 JP4754587 B2 JP 4754587B2
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pixel
scanning direction
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main scanning
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JP2009186388A (ja
JP2009186388A5 (enExample
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暁紅 劉
孝 増田
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Acutelogic Corp
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JP2008028369A 2008-02-08 2008-02-08 Ｍｔｆ測定方法及びｍｔｆ測定装置 Expired - Fee Related JP4754587B2 (ja)

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JP2009186388A5 JP2009186388A5 (enExample) 2010-09-30
JP4754587B2 true JP4754587B2 (ja) 2011-08-24

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CN104296968B (zh) * 2014-10-10 2016-12-07 中国科学院长春光学精密机械与物理研究所 多通道ccd的调制传递函数测试方法
KR102530697B1 (ko) * 2016-02-26 2023-05-10 엘지이노텍 주식회사 표시 제어 장치 및 방법
CN112666178B (zh) * 2020-12-14 2024-06-18 杭州当虹科技股份有限公司 一种户外led大屏坏点在线监控方法
JP2023108387A (ja) * 2022-01-25 2023-08-04 富士通フロンテック株式会社 Ｍｔｆ測定用チャート

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JP3635392B2 (ja) * 1998-03-17 2005-04-06 コニカミノルタホールディングス株式会社 画像処理装置
JP4154661B2 (ja) * 2003-01-14 2008-09-24 ソニー株式会社 画像処理装置および方法、記録媒体、並びにプログラム
JP4514731B2 (ja) * 2006-05-18 2010-07-28 アキュートロジック株式会社 Ｍｔｆ測定装置、ｍｔｆ測定方法およびｍｔｆ測定プログラム

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