JP4749089B2 - 半導体装置 - Google Patents

半導体装置 Download PDF

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Publication number
JP4749089B2
JP4749089B2 JP2005246408A JP2005246408A JP4749089B2 JP 4749089 B2 JP4749089 B2 JP 4749089B2 JP 2005246408 A JP2005246408 A JP 2005246408A JP 2005246408 A JP2005246408 A JP 2005246408A JP 4749089 B2 JP4749089 B2 JP 4749089B2
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JP
Japan
Prior art keywords
output
circuit
memory cell
buffer circuit
input
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2005246408A
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English (en)
Japanese (ja)
Other versions
JP2007059026A5 (enExample
JP2007059026A (ja
Inventor
篤史 宮西
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Renesas Electronics Corp
Original Assignee
Renesas Electronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Renesas Electronics Corp filed Critical Renesas Electronics Corp
Priority to JP2005246408A priority Critical patent/JP4749089B2/ja
Priority to TW095127700A priority patent/TWI421873B/zh
Priority to KR1020060075050A priority patent/KR101221787B1/ko
Priority to US11/508,288 priority patent/US20070047283A1/en
Priority to CN2006101256650A priority patent/CN1921000B/zh
Publication of JP2007059026A publication Critical patent/JP2007059026A/ja
Publication of JP2007059026A5 publication Critical patent/JP2007059026A5/ja
Priority to US12/410,868 priority patent/US7898896B2/en
Priority to US13/008,423 priority patent/US20110110166A1/en
Application granted granted Critical
Publication of JP4749089B2 publication Critical patent/JP4749089B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C7/00Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/10Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C8/00Arrangements for selecting an address in a digital store
    • G11C8/16Multiple access memory array, e.g. addressing one storage element via at least two independent addressing line groups
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/41Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
    • G11C11/412Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger using field-effect transistors only
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C7/00Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/10Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
    • G11C7/1006Data managing, e.g. manipulating data before writing or reading out, data bus switches or control circuits therefor
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C7/00Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/18Bit line organisation; Bit line lay-out
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C8/00Arrangements for selecting an address in a digital store
    • G11C8/14Word line organisation; Word line lay-out
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C2207/00Indexing scheme relating to arrangements for writing information into, or reading information out from, a digital store
    • G11C2207/10Aspects relating to interfaces of memory device to external buses
    • G11C2207/108Wide data ports

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Dram (AREA)
  • Static Random-Access Memory (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Memories (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
JP2005246408A 2005-08-26 2005-08-26 半導体装置 Expired - Fee Related JP4749089B2 (ja)

Priority Applications (7)

Application Number Priority Date Filing Date Title
JP2005246408A JP4749089B2 (ja) 2005-08-26 2005-08-26 半導体装置
TW095127700A TWI421873B (zh) 2005-08-26 2006-07-28 半導體裝置
KR1020060075050A KR101221787B1 (ko) 2005-08-26 2006-08-09 반도체 장치
US11/508,288 US20070047283A1 (en) 2005-08-26 2006-08-23 Semiconductor device
CN2006101256650A CN1921000B (zh) 2005-08-26 2006-08-25 半导体装置
US12/410,868 US7898896B2 (en) 2005-08-26 2009-03-25 Semiconductor device
US13/008,423 US20110110166A1 (en) 2005-08-26 2011-01-18 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005246408A JP4749089B2 (ja) 2005-08-26 2005-08-26 半導体装置

Publications (3)

Publication Number Publication Date
JP2007059026A JP2007059026A (ja) 2007-03-08
JP2007059026A5 JP2007059026A5 (enExample) 2008-08-07
JP4749089B2 true JP4749089B2 (ja) 2011-08-17

Family

ID=37778692

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2005246408A Expired - Fee Related JP4749089B2 (ja) 2005-08-26 2005-08-26 半導体装置

Country Status (5)

Country Link
US (3) US20070047283A1 (enExample)
JP (1) JP4749089B2 (enExample)
KR (1) KR101221787B1 (enExample)
CN (1) CN1921000B (enExample)
TW (1) TWI421873B (enExample)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009238332A (ja) 2008-03-27 2009-10-15 Renesas Technology Corp 半導体記憶装置
US9472268B2 (en) * 2010-07-16 2016-10-18 Texas Instruments Incorporated SRAM with buffered-read bit cells and its testing
US8837250B2 (en) * 2010-07-20 2014-09-16 Taiwan Semiconductor Manufacturing Co., Ltd. Method and apparatus for word line decoder layout
US10249361B2 (en) * 2014-01-14 2019-04-02 Nvidia Corporation SRAM write driver with improved drive strength
US9589611B2 (en) 2015-04-01 2017-03-07 Semiconductor Energy Laboratory Co., Ltd. Memory device, semiconductor device, and electronic device
US10854284B1 (en) 2016-12-06 2020-12-01 Gsi Technology, Inc. Computational memory cell and processing array device with ratioless write port
US10847212B1 (en) 2016-12-06 2020-11-24 Gsi Technology, Inc. Read and write data processing circuits and methods associated with computational memory cells using two read multiplexers
US10847213B1 (en) 2016-12-06 2020-11-24 Gsi Technology, Inc. Write data processing circuits and methods associated with computational memory cells
US10770133B1 (en) 2016-12-06 2020-09-08 Gsi Technology, Inc. Read and write data processing circuits and methods associated with computational memory cells that provides write inhibits and read bit line pre-charge inhibits
US10891076B1 (en) 2016-12-06 2021-01-12 Gsi Technology, Inc. Results processing circuits and methods associated with computational memory cells
US10998040B2 (en) 2016-12-06 2021-05-04 Gsi Technology, Inc. Computational memory cell and processing array device using the memory cells for XOR and XNOR computations
US10777262B1 (en) 2016-12-06 2020-09-15 Gsi Technology, Inc. Read data processing circuits and methods associated memory cells
US10943648B1 (en) 2016-12-06 2021-03-09 Gsi Technology, Inc. Ultra low VDD memory cell with ratioless write port
US11227653B1 (en) 2016-12-06 2022-01-18 Gsi Technology, Inc. Storage array circuits and methods for computational memory cells
US10521229B2 (en) 2016-12-06 2019-12-31 Gsi Technology, Inc. Computational memory cell and processing array device using memory cells
US10860320B1 (en) 2016-12-06 2020-12-08 Gsi Technology, Inc. Orthogonal data transposition system and method during data transfers to/from a processing array
US11631465B2 (en) 2018-07-03 2023-04-18 Samsung Electronics Co., Ltd. Non-volatile memory device
CN110675907B (zh) * 2018-07-03 2024-08-23 三星电子株式会社 非易失性存储器装置和在其内部传输数据的方法
CN109885154B (zh) * 2019-02-28 2023-06-23 江西天漪半导体有限公司 一种带旁路通道的低功耗寄存器
US10958272B2 (en) 2019-06-18 2021-03-23 Gsi Technology, Inc. Computational memory cell and processing array device using complementary exclusive or memory cells
US10877731B1 (en) 2019-06-18 2020-12-29 Gsi Technology, Inc. Processing array device that performs one cycle full adder operation and bit line read/write logic features
US10930341B1 (en) 2019-06-18 2021-02-23 Gsi Technology, Inc. Processing array device that performs one cycle full adder operation and bit line read/write logic features

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0329185A (ja) * 1989-06-26 1991-02-07 Nec Corp デュアルポートメモリー装置
JPH04356793A (ja) * 1990-08-18 1992-12-10 Mitsubishi Electric Corp 半導体記憶装置
JPH04205787A (ja) * 1990-11-29 1992-07-27 Seiko Epson Corp マルチポートメモリ
JPH0574198A (ja) 1991-09-13 1993-03-26 Sony Corp テスト回路を備えたメモリ装置
JP3689435B2 (ja) * 1992-12-24 2005-08-31 株式会社リコー シリアル記憶装置
JP3664777B2 (ja) * 1995-08-18 2005-06-29 株式会社ルネサステクノロジ 半導体記憶装置
JP3691170B2 (ja) * 1996-08-30 2005-08-31 株式会社ルネサステクノロジ テスト回路
JP3226886B2 (ja) * 1999-01-29 2001-11-05 エヌイーシーマイクロシステム株式会社 半導体記憶装置とその制御方法
JP2001023400A (ja) 1999-07-07 2001-01-26 Hitachi Ltd 半導体装置およびその不良解析方法
JP3835220B2 (ja) * 2001-08-31 2006-10-18 セイコーエプソン株式会社 半導体記憶装置
JP2004253499A (ja) * 2003-02-19 2004-09-09 Hitachi Ltd 半導体装置

Also Published As

Publication number Publication date
US20090185431A1 (en) 2009-07-23
US7898896B2 (en) 2011-03-01
CN1921000A (zh) 2007-02-28
US20070047283A1 (en) 2007-03-01
KR20070024358A (ko) 2007-03-02
TW200710864A (en) 2007-03-16
JP2007059026A (ja) 2007-03-08
CN1921000B (zh) 2012-07-18
KR101221787B1 (ko) 2013-01-11
TWI421873B (zh) 2014-01-01
US20110110166A1 (en) 2011-05-12

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