JP4726212B2 - センシング装置 - Google Patents

センシング装置 Download PDF

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Publication number
JP4726212B2
JP4726212B2 JP2005270050A JP2005270050A JP4726212B2 JP 4726212 B2 JP4726212 B2 JP 4726212B2 JP 2005270050 A JP2005270050 A JP 2005270050A JP 2005270050 A JP2005270050 A JP 2005270050A JP 4726212 B2 JP4726212 B2 JP 4726212B2
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JP
Japan
Prior art keywords
conductor portion
specimen
electromagnetic wave
conductor
sensing device
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JP2005270050A
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English (en)
Japanese (ja)
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JP2007078621A5 (enExample
JP2007078621A (ja
Inventor
敏彦 尾内
亮太 関口
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Canon Inc
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Canon Inc
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Priority to JP2005270050A priority Critical patent/JP4726212B2/ja
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JP2005270050A 2005-09-16 2005-09-16 センシング装置 Expired - Fee Related JP4726212B2 (ja)

Priority Applications (1)

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JP2005270050A JP4726212B2 (ja) 2005-09-16 2005-09-16 センシング装置

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JP2005270050A JP4726212B2 (ja) 2005-09-16 2005-09-16 センシング装置

Publications (3)

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JP2007078621A JP2007078621A (ja) 2007-03-29
JP2007078621A5 JP2007078621A5 (enExample) 2008-09-04
JP4726212B2 true JP4726212B2 (ja) 2011-07-20

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JP2005270050A Expired - Fee Related JP4726212B2 (ja) 2005-09-16 2005-09-16 センシング装置

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JP (1) JP4726212B2 (enExample)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008014732A (ja) * 2006-07-04 2008-01-24 Tohoku Univ 表面プラズモン共鳴測定装置
RU2352969C1 (ru) * 2007-07-12 2009-04-20 Государственное образовательное учреждение высшего профессионального образования "Российский университет дружбы народов" (РУДН) Способ разделения совмещенных поверхностной и объемной электромагнитных волн терагерцового диапазона
JP4183735B1 (ja) 2007-10-15 2008-11-19 国立大学法人 岡山大学 物質分布計測装置
JP5083781B2 (ja) * 2008-03-25 2012-11-28 学校法人早稲田大学 光学的センサー
KR100993894B1 (ko) * 2008-10-21 2010-11-11 한국과학기술원 랩탑(ｌａｐ－ｔｏｐ) 크기의 근접장 증폭을 이용한 고차 조화파 생성장치
WO2011096563A1 (ja) * 2010-02-08 2011-08-11 国立大学法人 岡山大学 パルス電磁波を用いた計測装置及び計測方法
EP2537021A1 (en) 2010-02-15 2012-12-26 Koninklijke Philips Electronics N.V. Device for analyzing a sample using radiation in the terahertz frequency range
JP4534027B1 (ja) * 2010-03-01 2010-09-01 国立大学法人 岡山大学 電磁波波面整形素子及びそれを備えた電磁波イメージング装置、並びに電磁波イメージング方法
JPWO2011142155A1 (ja) * 2010-05-12 2013-07-22 株式会社村田製作所 被測定物の特性を測定する方法、それに用いられる空隙配置構造体および測定装置
JP6117506B2 (ja) 2012-10-09 2017-04-19 国立大学法人 東京大学 テラヘルツ波測定装置及び方法
JP6099190B2 (ja) 2012-11-21 2017-03-22 ローム株式会社 溶液検査装置
RU2547164C1 (ru) * 2013-11-29 2015-04-10 Федеральное государственное автономное образовательное учреждение высшего образования "Новосибирский национальный исследовательский государственный университет" (Новосибирский государственный университет, НГУ) Геодезическая призма для отклонения пучка монохроматических поверхностных плазмон-поляритонов терагерцового диапазона
JP6269008B2 (ja) * 2013-12-12 2018-01-31 株式会社豊田中央研究所 電磁波−表面ポラリトン変換素子。
JP6928931B2 (ja) * 2017-05-08 2021-09-01 国立大学法人電気通信大学 計測用デバイス及び計測センサ

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB8509492D0 (en) * 1985-04-12 1985-05-15 Plessey Co Plc Optical assay
JP2002357543A (ja) * 2001-06-01 2002-12-13 Mitsubishi Chemicals Corp 分析素子、並びにそれを用いた試料の分析方法
JP2005016963A (ja) * 2003-06-23 2005-01-20 Canon Inc 化学センサ、化学センサ装置
JP3950820B2 (ja) * 2003-06-25 2007-08-01 キヤノン株式会社 高周波電気信号制御装置及びセンシングシステム
US6985664B2 (en) * 2003-08-01 2006-01-10 Corning Incorporated Substrate index modification for increasing the sensitivity of grating-coupled waveguides
JP4402026B2 (ja) * 2005-08-30 2010-01-20 キヤノン株式会社 センシング装置

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Publication number Publication date
JP2007078621A (ja) 2007-03-29

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