JP4699524B2 - 測光およびリアルタイムのレポート能力を有する画像センサ素子またはアレイのためのシステムおよび方法 - Google Patents

測光およびリアルタイムのレポート能力を有する画像センサ素子またはアレイのためのシステムおよび方法 Download PDF

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Publication number
JP4699524B2
JP4699524B2 JP2008532376A JP2008532376A JP4699524B2 JP 4699524 B2 JP4699524 B2 JP 4699524B2 JP 2008532376 A JP2008532376 A JP 2008532376A JP 2008532376 A JP2008532376 A JP 2008532376A JP 4699524 B2 JP4699524 B2 JP 4699524B2
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Japan
Prior art keywords
pixel
report
pixels
reports
exposure
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Expired - Fee Related
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JP2008532376A
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Japanese (ja)
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JP2009509474A5 (enExample
JP2009509474A (ja
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ダビドビチ，ソーリン
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RJS Tech Inc
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RJS Tech Inc
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/64—Analogue/digital converters with intermediate conversion to phase of sinusoidal or similar periodical signals
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/70—Circuitry for compensating brightness variation in the scene
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/70—Circuitry for compensating brightness variation in the scene
    • H04N23/71—Circuitry for evaluating the brightness variation
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/70—Circuitry for compensating brightness variation in the scene
    • H04N23/76—Circuitry for compensating brightness variation in the scene by influencing the image signals
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/50—Control of the SSIS exposure
    • H04N25/51—Control of the gain
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/50—Control of the SSIS exposure
    • H04N25/53—Control of the integration time
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/50—Control of the SSIS exposure
    • H04N25/57—Control of the dynamic range
    • H04N25/571—Control of the dynamic range involving a non-linear response
    • H04N25/575—Control of the dynamic range involving a non-linear response with a response composed of multiple slopes
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
    • H04N25/772—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising A/D, V/T, V/F, I/T or I/F converters
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/78—Readout circuits for addressed sensors, e.g. output amplifiers or A/D converters

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  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Studio Devices (AREA)
  • Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
  • Analogue/Digital Conversion (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Light Receiving Elements (AREA)
JP2008532376A 2005-09-21 2006-09-21 測光およびリアルタイムのレポート能力を有する画像センサ素子またはアレイのためのシステムおよび方法 Expired - Fee Related JP4699524B2 (ja)

Applications Claiming Priority (9)

Application Number Priority Date Filing Date Title
US71930605P 2005-09-21 2005-09-21
US71930405P 2005-09-21 2005-09-21
US71930505P 2005-09-21 2005-09-21
US60/719,305 2005-09-21
US60/719,306 2005-09-21
US60/719,304 2005-09-21
US72789705P 2005-10-18 2005-10-18
US60/727,897 2005-10-18
PCT/US2006/036793 WO2007035860A2 (en) 2005-09-21 2006-09-21 System and method for image sensor element or array with photometric and realtime reporting capabilities

Publications (3)

Publication Number Publication Date
JP2009509474A JP2009509474A (ja) 2009-03-05
JP2009509474A5 JP2009509474A5 (enExample) 2010-10-28
JP4699524B2 true JP4699524B2 (ja) 2011-06-15

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Family Applications (4)

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JP2008532376A Expired - Fee Related JP4699524B2 (ja) 2005-09-21 2006-09-21 測光およびリアルタイムのレポート能力を有する画像センサ素子またはアレイのためのシステムおよび方法
JP2008532372A Active JP5242399B2 (ja) 2005-09-21 2006-09-21 ゲインを制御した高ダイナミックレンジ感度センサ素子またはアレイのためのシステムおよび方法
JP2008532377A Expired - Fee Related JP5059767B2 (ja) 2005-09-21 2006-09-21 高ダイナミックレンジ感度センサ素子またはアレイのためのシステムおよび方法
JP2008532373A Expired - Fee Related JP4537483B2 (ja) 2005-09-21 2006-09-21 高分解能および広ダイナミックレンジ積分器

Family Applications After (3)

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JP2008532372A Active JP5242399B2 (ja) 2005-09-21 2006-09-21 ゲインを制御した高ダイナミックレンジ感度センサ素子またはアレイのためのシステムおよび方法
JP2008532377A Expired - Fee Related JP5059767B2 (ja) 2005-09-21 2006-09-21 高ダイナミックレンジ感度センサ素子またはアレイのためのシステムおよび方法
JP2008532373A Expired - Fee Related JP4537483B2 (ja) 2005-09-21 2006-09-21 高分解能および広ダイナミックレンジ積分器

Country Status (5)

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US (5) US7532145B2 (enExample)
EP (4) EP1938584A4 (enExample)
JP (4) JP4699524B2 (enExample)
KR (4) KR100972551B1 (enExample)
WO (4) WO2007035858A2 (enExample)

Families Citing this family (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1938584A4 (en) * 2005-09-21 2009-09-30 Technology Inc Rjs INTEGRATED WIDE DYNAMIC RANGE AND HIGH RESOLUTION
DE102007036973A1 (de) 2007-02-24 2008-09-04 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Pixelzelle, Verfahren zum Betreiben einer Pixelzelle, Verfahren zum Bestimmen einer Position eines Maximums einer Hüllkurve eines analogen amplituden-modulierten Signals, Vorrichtung zum Bestimmen einer Ladungsmenge, Vorrichtung und Verfahren zum Bestimmen einer Ladungsmenge auf einem kapazitiven Element, Vorrichtung und Verfahren und Setzen eines Schaltungsknotens auf eine vorbestimmte Spannung, Vorrichtung und Verfahren zum ladungsbasierten analog-/digital-Wandeln und Vorrichtung und Verfahren zur ladungsbasierten Signalverarbeitung
WO2010016449A1 (en) * 2008-08-08 2010-02-11 Semiconductor Energy Laboratory Co., Ltd. Photoelectric conversion device and electronic device having the same
KR101733755B1 (ko) 2010-01-15 2017-05-08 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 전자 기기
EP2664130B1 (en) 2011-01-09 2021-12-29 Emza Visual Sense Ltd. Pixel design with temporal analysis capabilities for scene interpretation
US10197501B2 (en) 2011-12-12 2019-02-05 Kla-Tencor Corporation Electron-bombarded charge-coupled device and inspection systems using EBCCD detectors
US9041838B2 (en) 2012-02-14 2015-05-26 Gentex Corporation High dynamic range imager system
JP6041500B2 (ja) * 2012-03-01 2016-12-07 キヤノン株式会社 撮像装置、撮像システム、撮像装置の駆動方法、撮像システムの駆動方法
US9210304B2 (en) 2012-03-16 2015-12-08 Empire Technology Development Llc Low light adaptive imaging device
KR101895415B1 (ko) 2012-03-27 2018-09-06 삼성전자주식회사 아날로그-디지털 변환 회로와 이를 포함하는 적산 회로
US9496425B2 (en) 2012-04-10 2016-11-15 Kla-Tencor Corporation Back-illuminated sensor with boron layer
US9601299B2 (en) 2012-08-03 2017-03-21 Kla-Tencor Corporation Photocathode including silicon substrate with boron layer
US9426400B2 (en) 2012-12-10 2016-08-23 Kla-Tencor Corporation Method and apparatus for high speed acquisition of moving images using pulsed illumination
US9478402B2 (en) 2013-04-01 2016-10-25 Kla-Tencor Corporation Photomultiplier tube, image sensor, and an inspection system using a PMT or image sensor
US9347890B2 (en) * 2013-12-19 2016-05-24 Kla-Tencor Corporation Low-noise sensor and an inspection system using a low-noise sensor
US9748294B2 (en) 2014-01-10 2017-08-29 Hamamatsu Photonics K.K. Anti-reflection layer for back-illuminated sensor
US9410901B2 (en) 2014-03-17 2016-08-09 Kla-Tencor Corporation Image sensor, an inspection system and a method of inspecting an article
US9767986B2 (en) 2014-08-29 2017-09-19 Kla-Tencor Corporation Scanning electron microscope and methods of inspecting and reviewing samples
US9860466B2 (en) 2015-05-14 2018-01-02 Kla-Tencor Corporation Sensor with electrically controllable aperture for inspection and metrology systems
US10748730B2 (en) 2015-05-21 2020-08-18 Kla-Tencor Corporation Photocathode including field emitter array on a silicon substrate with boron layer
US10462391B2 (en) 2015-08-14 2019-10-29 Kla-Tencor Corporation Dark-field inspection using a low-noise sensor
US10778925B2 (en) 2016-04-06 2020-09-15 Kla-Tencor Corporation Multiple column per channel CCD sensor architecture for inspection and metrology
US10313622B2 (en) 2016-04-06 2019-06-04 Kla-Tencor Corporation Dual-column-parallel CCD sensor and inspection systems using a sensor
TWI611282B (zh) * 2017-01-03 2018-01-11 友達光電股份有限公司 電源供應電路及電源供應方法
US11114489B2 (en) 2018-06-18 2021-09-07 Kla-Tencor Corporation Back-illuminated sensor and a method of manufacturing a sensor
US10943760B2 (en) 2018-10-12 2021-03-09 Kla Corporation Electron gun and electron microscope
US11114491B2 (en) 2018-12-12 2021-09-07 Kla Corporation Back-illuminated sensor and a method of manufacturing a sensor
US11848350B2 (en) 2020-04-08 2023-12-19 Kla Corporation Back-illuminated sensor and a method of manufacturing a sensor using a silicon on insulator wafer
TWI840098B (zh) * 2022-04-11 2024-04-21 義明科技股份有限公司 高感度的光感測器及其感測方法
CN117490838B (zh) * 2024-01-03 2024-03-19 成都善思微科技有限公司 一种高可靠性的平板探测器数据采集方法、系统及计算机
CN120445398B (zh) * 2025-07-02 2025-09-26 南京大学 基于复合介质栅双晶体管光敏探测器的感算一体方法

Family Cites Families (67)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US682145A (en) * 1901-04-23 1901-09-03 William J Jones Apparatus for carbonating liquids.
US4352210A (en) * 1980-09-12 1982-09-28 General Electric Company Linear mixer with reduced spurious responses
JPS5795771A (en) * 1980-12-05 1982-06-14 Fuji Photo Film Co Ltd Solid-state image pickup device
US4419692A (en) 1981-12-31 1983-12-06 Texas Medical Instruments, Inc. High speed infrared imaging system
US4629879A (en) 1984-06-11 1986-12-16 Eastman Kodak Company Light beam intensity controlling apparatus
JPS6313520A (ja) * 1986-07-04 1988-01-20 Sony Corp Ａｄ変換回路
US4825144A (en) * 1987-11-10 1989-04-25 Motorola, Inc. Dual channel current mode switching regulator
JP2720478B2 (ja) * 1988-10-18 1998-03-04 株式会社ニコン 縦型オーバーフロードレインを備える固体撮像素子を用いた測光装置
US5416616A (en) * 1990-04-06 1995-05-16 University Of Southern California Incoherent/coherent readout of double angularly multiplexed volume holographic optical elements
KR100396203B1 (ko) * 1993-06-17 2003-12-31 소니 가부시끼 가이샤 노광장치및방법,그노광장치를가지는비디오카메라
US5461426A (en) 1993-08-20 1995-10-24 Samsung Electronics Co., Ltd. Apparatus for processing modified NTSC television signals, with digital signals buried therewithin
KR0168451B1 (ko) 1994-03-31 1999-01-15 다까노 야스아끼 컬러 고체 촬상 소자
DE4423214C2 (de) * 1994-07-01 1998-02-12 Harris Corp Multinorm-Dekoder für Videosignale und Verfahren zum Dekodieren von Videosignalen
JPH1022489A (ja) * 1996-07-02 1998-01-23 Fuji Xerox Co Ltd 固体撮像素子
ES2176703T3 (es) * 1996-09-27 2002-12-01 Markus Bohm Sensor optico autoadaptativo localmente.
US5794922A (en) * 1996-12-13 1998-08-18 Meglino; Don A. Fence slats with locking portions
US5796392A (en) * 1997-02-24 1998-08-18 Paradise Electronics, Inc. Method and apparatus for clock recovery in a digital display unit
JP3697678B2 (ja) * 1997-05-09 2005-09-21 ローム株式会社 Ｖ／ｆ変換回路
WO1999004344A1 (en) * 1997-07-18 1999-01-28 Net Exchange, Inc. Apparatus and method for effecting correspondent-centric electronic mail
US6229133B1 (en) * 1997-10-27 2001-05-08 Texas Instruments Incorporated Image sensing device with delayed phase frequency modulation
US6452633B1 (en) * 1998-02-26 2002-09-17 Foveon, Inc. Exposure control in electronic cameras by detecting overflow from active pixels
US6529241B1 (en) * 1998-02-27 2003-03-04 Intel Corporation Photodetecting device supporting saturation detection and electronic shutter
US20020176009A1 (en) 1998-05-08 2002-11-28 Johnson Sandra Marie Image processor circuits, systems, and methods
US6188056B1 (en) 1998-06-24 2001-02-13 Stmicroelectronics, Inc. Solid state optical imaging pixel with resistive load
US6396561B1 (en) * 1998-11-10 2002-05-28 Maniabarco N.V. Method and device for exposing both sides of a sheet
US6249807B1 (en) * 1998-11-17 2001-06-19 Kana Communications, Inc. Method and apparatus for performing enterprise email management
US6757018B1 (en) 1998-12-18 2004-06-29 Agilent Technologies, Inc. CMOS image sensor with pixel level gain control
US6654787B1 (en) * 1998-12-31 2003-11-25 Brightmail, Incorporated Method and apparatus for filtering e-mail
US6777663B2 (en) * 1999-05-07 2004-08-17 Intel Corporation Enhanced Photocell with sample and hold amplifier
US7123301B1 (en) * 1999-06-11 2006-10-17 Analog Devices, Inc. Pixel gain amplifier
US6400810B1 (en) * 1999-07-20 2002-06-04 Ameritech Corporation Method and system for selective notification of E-mail messages
JP3903361B2 (ja) * 1999-08-13 2007-04-11 日本放送協会 固体撮像装置
US7133074B1 (en) * 1999-09-28 2006-11-07 Zoran Corporation Image sensor circuits including sampling circuits used therein for performing correlated double sampling
JP4550957B2 (ja) * 1999-11-15 2010-09-22 浜松ホトニクス株式会社 光検出装置
EP1113254A1 (en) 1999-12-30 2001-07-04 STMicroelectronics S.r.l. A circuit and a method for extending the output voltage range of an integrator circuit
US6438215B1 (en) * 2000-02-29 2002-08-20 Ameritech Corporation Method and system for filter based message processing in a unified messaging system
JP4011818B2 (ja) 2000-02-29 2007-11-21 キヤノン株式会社 半導体固体撮像装置
US6882367B1 (en) * 2000-02-29 2005-04-19 Foveon, Inc. High-sensitivity storage pixel sensor having auto-exposure detection
JP3753925B2 (ja) * 2000-05-12 2006-03-08 株式会社ルネサステクノロジ 半導体集積回路
US7032023B1 (en) * 2000-05-16 2006-04-18 America Online, Inc. Throttling electronic communications from one or more senders
US6654594B1 (en) * 2000-05-30 2003-11-25 Motorola, Inc. Digitized automatic gain control system and methods for a controlled gain receiver
US6590426B2 (en) * 2000-07-10 2003-07-08 Silicon Laboratories, Inc. Digital phase detector circuit and method therefor
EP1731087A3 (en) * 2000-07-14 2008-08-06 Novadaq Technologies Inc. Compact fluorescent endoscopy video system
JP3840050B2 (ja) * 2000-11-01 2006-11-01 キヤノン株式会社 電磁波変換装置
US6580496B2 (en) * 2000-11-09 2003-06-17 Canesta, Inc. Systems for CMOS-compatible three-dimensional image sensing using quantum efficiency modulation
US20020113887A1 (en) * 2001-02-16 2002-08-22 Iimura Russell M. CMOS image sensor with extended dynamic range
JP3852324B2 (ja) * 2001-02-20 2006-11-29 ティアック株式会社 信号処理回路及び信号処理方法
US7176962B2 (en) * 2001-03-01 2007-02-13 Nikon Corporation Digital camera and digital processing system for correcting motion blur using spatial frequency
US6678039B2 (en) 2001-05-23 2004-01-13 Canesta, Inc. Method and system to enhance dynamic range conversion useable with CMOS three-dimensional imaging
US6867693B1 (en) * 2001-07-25 2005-03-15 Lon B. Radin Spatial position determination system
US7176976B2 (en) * 2001-08-30 2007-02-13 Lightsurf Technologies, Inc. Autoexposure methodology in a digital camera
US6849841B2 (en) 2001-09-28 2005-02-01 Raytheon Company System and method for effecting high-power beam control with outgoing wavefront correction utilizing holographic sampling at primary mirror, phase conjugation, and adaptive optics in low power beam path
US6809358B2 (en) * 2002-02-05 2004-10-26 E-Phocus, Inc. Photoconductor on active pixel image sensor
JP4086514B2 (ja) 2002-02-13 2008-05-14 キヤノン株式会社 光電変換装置及び撮像装置
US20030184673A1 (en) 2002-04-02 2003-10-02 Michael Skow Automatic exposure control for digital imaging
US7031409B2 (en) * 2002-08-23 2006-04-18 Samsung Electronics Co., Ltd. Fully digital AGC circuit with wide dynamic range and method of operation
US7277129B1 (en) * 2002-10-31 2007-10-02 Sensata Technologies, Inc. Pixel design including in-pixel correlated double sampling circuit
US7423678B2 (en) * 2002-11-07 2008-09-09 Rohm Co., Ltd. Area image sensor
KR100920353B1 (ko) 2003-03-14 2009-10-07 삼성전자주식회사 표시 장치용 광원의 구동 장치
US20050057670A1 (en) * 2003-04-14 2005-03-17 Tull Damon L. Method and device for extracting and utilizing additional scene and image formation data for digital image and video processing
CN1823336A (zh) * 2003-05-07 2006-08-23 Dvip多媒体股份有限公司 消除传感器电平图像失真的方法和装置
JP2005244311A (ja) 2004-02-24 2005-09-08 Canon Inc 撮像装置、撮像装置の制御方法、及び制御プログラム
US6972995B1 (en) * 2004-04-09 2005-12-06 Eastman Kodak Company Imaging cell with a non-volatile memory that provides a long integration period and method of operating the imaging cell
JP4664017B2 (ja) * 2004-07-12 2011-04-06 浜松ホトニクス株式会社 光半導体集積回路装置
US7489351B2 (en) * 2005-01-21 2009-02-10 Bae Systems Information And Electronic Systems Integration Inc. Dynamic range extension for focal plane arrays
US7560679B1 (en) * 2005-05-10 2009-07-14 Siimpel, Inc. 3D camera
EP1938584A4 (en) * 2005-09-21 2009-09-30 Technology Inc Rjs INTEGRATED WIDE DYNAMIC RANGE AND HIGH RESOLUTION

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Publication number Publication date
US7532145B2 (en) 2009-05-12
EP1938060A4 (en) 2009-09-30
KR20080063475A (ko) 2008-07-04
US20070075881A1 (en) 2007-04-05
KR100972551B1 (ko) 2010-07-28
EP1938584A4 (en) 2009-09-30
US7800669B2 (en) 2010-09-21
US20070064128A1 (en) 2007-03-22
US20070085529A1 (en) 2007-04-19
JP2009509474A (ja) 2009-03-05
US7786422B2 (en) 2010-08-31
JP2009515377A (ja) 2009-04-09
US8735793B2 (en) 2014-05-27
KR101003054B1 (ko) 2010-12-21
EP1938059A4 (en) 2009-09-30
JP2009509473A (ja) 2009-03-05
KR20080050515A (ko) 2008-06-05
EP1938059A2 (en) 2008-07-02
EP1935018A2 (en) 2008-06-25
WO2007035860A2 (en) 2007-03-29
WO2007035858A2 (en) 2007-03-29
EP1938060A2 (en) 2008-07-02
JP5242399B2 (ja) 2013-07-24
WO2007035861A3 (en) 2007-07-19
US20070064146A1 (en) 2007-03-22
EP1935018B1 (en) 2014-05-21
KR101152859B1 (ko) 2012-07-03
JP2009509475A (ja) 2009-03-05
WO2007035858A3 (en) 2007-06-28
WO2007035861A2 (en) 2007-03-29
WO2007044191A3 (en) 2009-04-23
WO2007035860A3 (en) 2007-05-24
US20100295965A1 (en) 2010-11-25
EP1935018A4 (en) 2009-09-23
US7782369B2 (en) 2010-08-24
KR20080050623A (ko) 2008-06-09
KR20080050516A (ko) 2008-06-05
EP1938584A2 (en) 2008-07-02
WO2007044191A2 (en) 2007-04-19
JP4537483B2 (ja) 2010-09-01
KR100970599B1 (ko) 2010-07-16
JP5059767B2 (ja) 2012-10-31

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