JP4684829B2 - テスト中回路技術分野へのテストパターンの連続的な適用およびデコンプレッション - Google Patents
テスト中回路技術分野へのテストパターンの連続的な適用およびデコンプレッション Download PDFInfo
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- JP4684829B2 JP4684829B2 JP2005284623A JP2005284623A JP4684829B2 JP 4684829 B2 JP4684829 B2 JP 4684829B2 JP 2005284623 A JP2005284623 A JP 2005284623A JP 2005284623 A JP2005284623 A JP 2005284623A JP 4684829 B2 JP4684829 B2 JP 4684829B2
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
- G01R31/318335—Test pattern compression or decompression
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/31813—Test pattern generators
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318544—Scanning methods, algorithms and patterns
- G01R31/318547—Data generators or compressors
Description
CiはI番目の出力チャネルであり、Skは、LFSRのk番目のステージを示す。LFSRは、クロック・サイクル毎に、その2個の入力チャネル37a、37bおよび入力インジェクター48a、48b(XORゲート)を介して、レジスタの第2および第6のステージへ与えられると仮定する。チャネル37a上で受信した入力変数「a」(圧縮したテストパターン・ビット)は、偶数の添字(a0、a2、a4、..)によってラベル付けされ、また、チャネル37a上で受信した変数「a」は、奇数の偶数の添字(a1、a2、a5、..)によってラベル付けされる。ブールとしてこれらの外部変数を扱うと、走査セルはすべて概念的に、テスター21によってLFSR52に注入された入力変数の線形関数である記号表現で満たすことができる。フィードバック多項式(移相器50)を与えられると、LFSRだけがテスト・データによって供給される4つのクロック・サイクルの追加の初期期間と同様にインジェクター48a、bの位置にて、図6中の走査チェーン26内の各走査セルの内容は論理上決定することができる。図7は、図6中で識別される走査チェーンC7、Cl(C6)に対応する図6の中で0〜7と番号付けられた走査チェーンで、図6中の64個の走査セルのための式を与えている。図7の中の各走査チェーンの式は、情報がチェーンへシフトされる順にリストされる。つまり、一番上の式は、データが1番目にシフトしたことを示す。
xxxxxxxx 走査チェーン1
xxxx11xx 走査チェーン2
xx0xxx1x 走査チェーン3
xxxx0xxl 走査チェーン4
xx0x0xxx 走査チェーン5
xx1x1xxx 走査チェーン6
xxxxxxxx 走査チェーン7
テーブル2
変数xは、「どちらでもかまわない」条件を示す。対応する圧縮したテストパターンは、ガウス‐ジョルダン消去法技術のような多くの周知の技術のいずれかを使用する図7から次の10個の方程式の系の解により決定することができる。選択された方程式は、決定論的に特定されたビットに相当する。
残りの変数が0の値を仮定している一方、シード変数a0、a1、a2、a3とal3は1の値と等しいことを立証することができる。このシードは、続いて次の形式で十分に特定されたテストパターンを生成する(初期の特定された位置に下線が引かれる)。
図10は、XORゲートではなく多くのXNORゲートで構築された移相器50の他の実施例を例示する。移相器はXNORとXORのゲートから組合せで同様に構成することができる。
(外1)
クロック・サイクルは、LFSMを初期化するために使用しても良い。LFSMの初期化及びクロックCO及びClが同じ率で実行していると仮定した後、新しいビットは、移相器50によるすべてのクロック・サイクル毎に、並列に各走査チェーン26にロードされる。この時に、テスト中回路34は走査モードで操作され、解凍されたテストパターンがOsと1s内で走査チェーンに26を満たす(そしてそこに格納されたどんな前のテスト応答もシフトする)。残りの位置がLFSMによって生成されたランダムなビットで満たされている一方、走査チェーン中の少数のビット位置はしたがって、決定論的に特定された値を得る。テストパターンがシフトされるクロック・サイクル数は、最長の走査チェーン中のセルの数と少なくとも同じくらいの数で、回路内の最長の走査チェーンの長さによって決定される。最長の走査チェーンが全テストパターンを得るまで、走査変更信号はしたがってすべての走査チェーンに対して高位に保持される。シフトされる最初の数ビットが情報消失なしで上書きされるように、回路中のより短い走査チェーンは左に寄せられる。
Claims (17)
- システムであって、
レジスタと線形のフィードバック・シフトレジスタ(LFSR)を有するデコンプレッサーとを有する集積回路、
該集積回路の外部に位置する自動テスト装置、を有し、
前記レジスタは、圧縮テストパターンデータを前記自動テスト装置の出力からロードし、該圧縮テストパターンデータを前記LFSRの入力ロジックゲートへ出力し、
前記LFSRの入力ロジックゲートは、前記圧縮テストパターンデータを受信し、該圧縮テストパターンデータを前記LFSR内に格納されたデータと論理的に結合する、システム。 - 前記レジスタは、前記圧縮テストパターンデータの複数のビットが前記LFSRの入力ロジックゲートへ出力される前に、前記自動テスト装置の複数の出力から該圧縮テストパターンデータの複数のビットを並列に受信する、請求項1記載のシステム。
- 前記デコンプレッサーは、前記LFSRの出力と結合された入力を有する位相シフターを更に有し、該位相シフターは、該位相シフターから出力された前記テストパターンのビットの位相を互いにずらす、請求項1記載のシステム。
- 前記集積回路は、走査チェーンを更に有し、
前記デコンプレッサーは、前記LFSRと前記走査チェーンとの間に結合された位相シフターを更に有し、
該位相シフターは、該位相シフターから出力された前記テストパターンのビットの位相を互いにずらす、請求項1のシステム。 - 前記レジスタは、前記自動テスト装置の複数の出力から前記圧縮テストパターンデータを並列に受信し、該圧縮テストパターンを前記LFSR内へシフトする、請求項1記載のシステム。
- 集積回路であって、
レジスタ、
位相シフターと、前記レジスタの出力と該位相シフターの入力との間に結合された線形のフィードバック・シフトレジスタ(LFSR)とを有するデコンプレッサー、を有し、
前記レジスタは、圧縮テストパターンのビットをロードし、該圧縮テストパターンのビットを前記デコンプレッサーの前記LFSRへ入力し、
前記デコンプレッサーは、前記圧縮テストパターンデータのビットを解凍し、解凍されたテストパターンのビットにする、集積回路。 - 前記レジスタは、当該集積回路の外部に位置する自動テスト装置(ATE)と結合される、請求項6記載の集積回路。
- 前記位相シフターと結合された走査チェーンを更に有する、請求項6記載の集積回路。
- 前記位相シフターはXORゲートのみで形成される、請求項6記載の集積回路。
- 前記レジスタは、当該集積回路の外部に位置する自動テスト装置(ATE)と結合され、
前記レジスタは、該ATEから前記圧縮テストパターンをロードし、該圧縮テストパターンを前記LFSRへ出力する、請求項6記載の集積回路。 - 前記レジスタはシフトレジスタである、請求項6記載の集積回路。
- 方法であって、
集積回路内にあるレジスタに圧縮テストパターンのビットをロードする段階、
前記レジスタから線形のフィードバック・シフトレジスタ(LFSR)を有するデコンプレッサーへ前記圧縮テストパターンのビットを転送する段階及び
前記圧縮テストパターンのビットを前記デコンプレッサーで解凍する段階を有し、
該解凍する段階は、前記圧縮テストパターンのビットを前記デコンプレッサー内に格納されたビットと論理的に結合する段階を有する、方法。 - 前記デコンプレッサーは、位相シフターを更に有する、請求項12記載の方法。
- 前記解凍する段階は、前記圧縮テストパターンのビットが前記レジスタから前記デコンプレッサーへ転送されるときに前記デコンプレッサー内で行われる、請求項12記載の方法。
- 前記ロードする段階は、外部の自動テスト装置(ATE)から前記レジスタへ前記圧縮テストパターンのビットをロードする段階を有する、請求項12記載の方法。
- 走査チェーンに前記圧縮テストパターンのビットをロードする段階を更に有する、請求項12記載の方法。
- 前記ロードする段階は、前記圧縮テストパターンのビットを前記レジスタに並列にロードする段階を有し、
前記転送する段階は、前記圧縮テストパターンのビットを前記レジスタから前記デコンプレッサーにシリアルにシフトする段階を有する、請求項12記載の方法。
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US16713199P | 1999-11-23 | 1999-11-23 | |
US09/620,021 US7493540B1 (en) | 1999-11-23 | 2000-07-20 | Continuous application and decompression of test patterns to a circuit-under-test |
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JP2001540825A Division JP3845016B2 (ja) | 1999-11-23 | 2000-11-15 | テスト中回路技術分野へのテストパターンの連続的な適用およびデコンプレッション |
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JP2006078493A JP2006078493A (ja) | 2006-03-23 |
JP2006078493A5 JP2006078493A5 (ja) | 2006-06-15 |
JP4684829B2 true JP4684829B2 (ja) | 2011-05-18 |
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JP2005284623A Expired - Fee Related JP4684829B2 (ja) | 1999-11-23 | 2005-09-29 | テスト中回路技術分野へのテストパターンの連続的な適用およびデコンプレッション |
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US10168386B2 (en) | 2017-01-13 | 2019-01-01 | International Business Machines Corporation | Scan chain latency reduction |
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US7478296B2 (en) | 2009-01-13 |
WO2001039254A3 (en) | 2001-12-13 |
WO2001039254A2 (en) | 2001-05-31 |
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US7877656B2 (en) | 2011-01-25 |
EP1242885A2 (en) | 2002-09-25 |
US20030120988A1 (en) | 2003-06-26 |
JP2003526778A (ja) | 2003-09-09 |
EP1242885B1 (en) | 2009-10-07 |
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