JP4684372B1 - 半導体発光素子基板の製造方法 - Google Patents
半導体発光素子基板の製造方法 Download PDFInfo
- Publication number
- JP4684372B1 JP4684372B1 JP2010535564A JP2010535564A JP4684372B1 JP 4684372 B1 JP4684372 B1 JP 4684372B1 JP 2010535564 A JP2010535564 A JP 2010535564A JP 2010535564 A JP2010535564 A JP 2010535564A JP 4684372 B1 JP4684372 B1 JP 4684372B1
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- cooling
- temperature
- vacuum chamber
- reflective layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/08—Mirrors
- G02B5/0816—Multilayer mirrors, i.e. having two or more reflecting layers
- G02B5/085—Multilayer mirrors, i.e. having two or more reflecting layers at least one of the reflecting layers comprising metal
- G02B5/0858—Multilayer mirrors, i.e. having two or more reflecting layers at least one of the reflecting layers comprising metal the reflecting layers comprising a single metallic layer with one or more dielectric layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/81—Bodies
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/24—Vacuum evaporation
- C23C14/32—Vacuum evaporation by explosion; by evaporation and subsequent ionisation of the vapours, e.g. ion-plating
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/50—Substrate holders
- C23C14/505—Substrate holders for rotation of the substrates
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/54—Controlling or regulating the coating process
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/54—Controlling or regulating the coating process
- C23C14/541—Heating or cooling of the substrates
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/84—Coatings, e.g. passivation layers or antireflective coatings
- H10H20/841—Reflective coatings, e.g. dielectric Bragg reflectors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/01—Manufacture or treatment
- H10H20/034—Manufacture or treatment of coatings
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Physical Vapour Deposition (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/JP2010/057435 WO2011135667A1 (ja) | 2010-04-27 | 2010-04-27 | 半導体発光素子基板の製造方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP4684372B1 true JP4684372B1 (ja) | 2011-05-18 |
| JPWO2011135667A1 JPWO2011135667A1 (ja) | 2013-07-18 |
Family
ID=44193868
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2010535564A Active JP4684372B1 (ja) | 2010-04-27 | 2010-04-27 | 半導体発光素子基板の製造方法 |
Country Status (5)
| Country | Link |
|---|---|
| JP (1) | JP4684372B1 (https=) |
| KR (1) | KR101087821B1 (https=) |
| CN (1) | CN102439195B (https=) |
| TW (1) | TW201138139A (https=) |
| WO (1) | WO2011135667A1 (https=) |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2013073096A1 (ja) * | 2011-11-15 | 2013-05-23 | パナソニック株式会社 | 真空装置、真空中の熱源を冷却する方法及び薄膜製造方法 |
| WO2013099064A1 (ja) * | 2011-12-28 | 2013-07-04 | キヤノンアネルバ株式会社 | 真空処理装置 |
| US9869013B2 (en) * | 2014-04-25 | 2018-01-16 | Applied Materials, Inc. | Ion assisted deposition top coat of rare-earth oxide |
| WO2017070488A1 (en) * | 2015-10-22 | 2017-04-27 | Richard Devito | Deposition system with integrated cooling on a rotating drum |
| US12057297B2 (en) | 2015-10-22 | 2024-08-06 | Richard DeVito | Deposition system with integrated cooling on a rotating drum |
| JP6524904B2 (ja) | 2015-12-22 | 2019-06-05 | 日亜化学工業株式会社 | 発光装置 |
| JP6588418B2 (ja) | 2016-12-07 | 2019-10-09 | 株式会社神戸製鋼所 | 成膜装置およびそれを用いた成膜物の製造方法、ならびに冷却パネル |
| JP2020007587A (ja) * | 2018-07-04 | 2020-01-16 | 株式会社アルバック | 蒸着装置、および、蒸着方法 |
| JP7316877B2 (ja) * | 2019-08-19 | 2023-07-28 | 株式会社オプトラン | 真空プロセス装置および真空プロセス装置におけるプロセス対象物の冷却方法 |
| WO2021188754A1 (en) * | 2020-03-18 | 2021-09-23 | Richard Devito | Deposition system with integrated cooling on a rotating drum |
| JP2022021080A (ja) * | 2020-07-21 | 2022-02-02 | 株式会社アルバック | 真空成膜装置用の部品及び真空成膜装置 |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH06347620A (ja) * | 1993-06-11 | 1994-12-22 | Canon Inc | レプリカミラーの製造方法および製造用型 |
| JPH10310862A (ja) * | 1997-05-13 | 1998-11-24 | Canon Inc | 堆積膜製造方法及び光起電力素子の製造方法 |
| JPH11149005A (ja) * | 1997-11-14 | 1999-06-02 | Canon Inc | 内面反射ミラーおよびその製造方法 |
| JP2009076818A (ja) * | 2007-09-25 | 2009-04-09 | Mitsubishi Electric Corp | 半導体デバイスの成膜用ホルダ及び成膜用装置 |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4545504B2 (ja) * | 2004-07-15 | 2010-09-15 | 株式会社半導体エネルギー研究所 | 膜形成方法、発光装置の作製方法 |
| JP4780983B2 (ja) * | 2005-03-17 | 2011-09-28 | 株式会社アルバック | 有機el素子製造方法 |
| JP4873455B2 (ja) * | 2006-03-16 | 2012-02-08 | 株式会社シンクロン | 光学薄膜形成方法および装置 |
| JP4597149B2 (ja) * | 2007-01-26 | 2010-12-15 | 株式会社シンクロン | 薄膜形成装置及び薄膜形成方法 |
| JP2009013435A (ja) * | 2007-06-29 | 2009-01-22 | Fujifilm Corp | 基板ホルダ及び真空成膜装置 |
| CN101197417B (zh) * | 2008-01-07 | 2010-09-15 | 普光科技(广州)有限公司 | 氮化镓基发光二极管芯片及其制作方法 |
-
2010
- 2010-04-27 JP JP2010535564A patent/JP4684372B1/ja active Active
- 2010-04-27 KR KR1020117003108A patent/KR101087821B1/ko active Active
- 2010-04-27 WO PCT/JP2010/057435 patent/WO2011135667A1/ja not_active Ceased
- 2010-04-27 CN CN201080002384.0A patent/CN102439195B/zh active Active
- 2010-05-13 TW TW099115220A patent/TW201138139A/zh unknown
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH06347620A (ja) * | 1993-06-11 | 1994-12-22 | Canon Inc | レプリカミラーの製造方法および製造用型 |
| JPH10310862A (ja) * | 1997-05-13 | 1998-11-24 | Canon Inc | 堆積膜製造方法及び光起電力素子の製造方法 |
| JPH11149005A (ja) * | 1997-11-14 | 1999-06-02 | Canon Inc | 内面反射ミラーおよびその製造方法 |
| JP2009076818A (ja) * | 2007-09-25 | 2009-04-09 | Mitsubishi Electric Corp | 半導体デバイスの成膜用ホルダ及び成膜用装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2011135667A1 (ja) | 2011-11-03 |
| JPWO2011135667A1 (ja) | 2013-07-18 |
| TW201138139A (en) | 2011-11-01 |
| HK1168392A1 (en) | 2012-12-28 |
| KR101087821B1 (ko) | 2011-11-30 |
| KR20110125629A (ko) | 2011-11-21 |
| TWI355093B (https=) | 2011-12-21 |
| CN102439195A (zh) | 2012-05-02 |
| CN102439195B (zh) | 2014-09-03 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP4684372B1 (ja) | 半導体発光素子基板の製造方法 | |
| JP2013211138A (ja) | 蒸発源、及びそれを用いた真空蒸着装置 | |
| TW201220426A (en) | Substrate processing apparatus and method of manufacturing a semiconductor device | |
| JP4597149B2 (ja) | 薄膜形成装置及び薄膜形成方法 | |
| JPWO2013073096A1 (ja) | 真空装置、真空中の熱源を冷却する方法及び薄膜製造方法 | |
| JP2012207238A (ja) | 蒸着方法および蒸着装置 | |
| JP5670262B2 (ja) | 薄膜リチウム二次電池の製造方法、及び薄膜リチウム二次電池 | |
| WO2021093650A1 (zh) | 溅射装置 | |
| TW202100781A (zh) | 形成金屬容納材料的方法 | |
| CN111411324A (zh) | 氧化铪薄膜沉积方法 | |
| CN114561616A (zh) | 一种多腔体pvd-rta混合薄膜沉积系统 | |
| CN217052364U (zh) | 一种多腔体pvd-rta混合薄膜沉积系统 | |
| JP4494126B2 (ja) | 成膜装置および製造装置 | |
| CN102743894A (zh) | 冷阱及真空排气装置 | |
| HK1168392B (en) | Process for production of semiconductor light-emitting element substrate | |
| CN117051367B (zh) | 磁控溅射设备 | |
| JP2017508062A (ja) | 金属マグネシウムの予備処理装置と方法 | |
| KR101871899B1 (ko) | 산화 알루미늄막의 성막 방법 및 형성 방법 및 스퍼터링 장치 | |
| US20140186551A1 (en) | Smooth solder deposition process | |
| TW201241212A (en) | Cathode | |
| WO2005017988A1 (ja) | 基板処理装置および半導体デバイスの製造方法 | |
| KR20120121961A (ko) | 콜드트랩 및 진공배기장치 | |
| JP4820897B2 (ja) | ネジ | |
| JP2019183180A (ja) | 蒸着装置 | |
| JP5976344B2 (ja) | 有機el素子の電極膜形成方法、有機el素子の電極膜形成装置 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| TRDD | Decision of grant or rejection written | ||
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20110201 |
|
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20140218 Year of fee payment: 3 |
|
| R150 | Certificate of patent or registration of utility model |
Ref document number: 4684372 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |