JP4667571B2 - レーザ走査顕微鏡 - Google Patents

レーザ走査顕微鏡 Download PDF

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Publication number
JP4667571B2
JP4667571B2 JP2000280886A JP2000280886A JP4667571B2 JP 4667571 B2 JP4667571 B2 JP 4667571B2 JP 2000280886 A JP2000280886 A JP 2000280886A JP 2000280886 A JP2000280886 A JP 2000280886A JP 4667571 B2 JP4667571 B2 JP 4667571B2
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Japan
Prior art keywords
signal
laser
pulse
scanning microscope
synchronization
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Expired - Lifetime
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JP2000280886A
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English (en)
Japanese (ja)
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JP2001159734A (ja
JP2001159734A5 (enExample
Inventor
泰生 大平
佳弘 島田
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Olympus Corp
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Olympus Corp
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Priority to JP2000280886A priority Critical patent/JP4667571B2/ja
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Publication of JP2001159734A5 publication Critical patent/JP2001159734A5/ja
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JP2000280886A 1999-09-24 2000-09-14 レーザ走査顕微鏡 Expired - Lifetime JP4667571B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2000280886A JP4667571B2 (ja) 1999-09-24 2000-09-14 レーザ走査顕微鏡

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP11-271293 1999-09-24
JP27129399 1999-09-24
JP2000280886A JP4667571B2 (ja) 1999-09-24 2000-09-14 レーザ走査顕微鏡

Publications (3)

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JP2001159734A JP2001159734A (ja) 2001-06-12
JP2001159734A5 JP2001159734A5 (enExample) 2007-10-25
JP4667571B2 true JP4667571B2 (ja) 2011-04-13

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JP2000280886A Expired - Lifetime JP4667571B2 (ja) 1999-09-24 2000-09-14 レーザ走査顕微鏡

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JP (1) JP4667571B2 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013122169A1 (ja) 2012-02-15 2013-08-22 オリンパス株式会社 レーザ走査型観察装置

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102005047884A1 (de) * 2005-10-06 2007-04-26 Leica Microsystems Cms Gmbh Scanmikroskop und Scanverfahren mit einem Scanmikroskop
JP6153340B2 (ja) * 2013-02-08 2017-06-28 オリンパス株式会社 レーザ顕微鏡装置
JP6281193B2 (ja) * 2013-05-30 2018-02-21 ソニー株式会社 レーザー走査型顕微鏡システム
JP6218596B2 (ja) * 2013-12-25 2017-10-25 オリンパス株式会社 走査型観察装置
JP2015230453A (ja) * 2014-06-06 2015-12-21 ソニー株式会社 走査型顕微鏡システム及び走査型顕微鏡システムの制御方法
JP7064315B2 (ja) 2017-11-07 2022-05-10 オリンパス株式会社 光検出装置およびレーザ走査型顕微鏡
WO2025206328A1 (ja) * 2024-03-28 2025-10-02 浜松ホトニクス株式会社 蛍光検出装置及び蛍光検出方法

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5521056A (en) * 1978-08-01 1980-02-14 Chiyou Lsi Gijutsu Kenkyu Kumiai Laser scanning microscopic apparatus
JPS5841337A (ja) * 1981-09-04 1983-03-10 Hamamatsu Tv Kk 発光現象の測定装置
US4877965A (en) * 1985-07-01 1989-10-31 Diatron Corporation Fluorometer
JPH03181910A (ja) * 1989-12-12 1991-08-07 Sumitomo Cement Co Ltd レーザ走査顕微鏡
JPH0833444B2 (ja) * 1990-10-05 1996-03-29 三菱電機株式会社 距離測定装置
JPH04256841A (ja) * 1991-02-08 1992-09-11 Hamamatsu Photonics Kk 空間・時間分解光解析装置
JP2823970B2 (ja) * 1991-04-05 1998-11-11 浜松ホトニクス株式会社 近接場走査光学顕微鏡
JP2931268B2 (ja) * 1993-06-03 1999-08-09 浜松ホトニクス株式会社 レーザスキャン光学装置
JP3644993B2 (ja) * 1994-12-08 2005-05-11 オリンパス株式会社 光電信号処理装置
US5822486A (en) * 1995-11-02 1998-10-13 General Scanning, Inc. Scanned remote imaging method and system and method of determining optimum design characteristics of a filter for use therein
JPH11132953A (ja) * 1997-10-29 1999-05-21 Bunshi Bio Photonics Kenkyusho:Kk 蛍光寿命測定方法および装置
JPH11271626A (ja) * 1998-03-23 1999-10-08 Olympus Optical Co Ltd 走査型レーザ顕微鏡

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013122169A1 (ja) 2012-02-15 2013-08-22 オリンパス株式会社 レーザ走査型観察装置
US9347871B2 (en) 2012-02-15 2016-05-24 Olympus Corporation Laser scanning type observation apparatus having a delay circuit unit, a multi-stage delay setting unit and a decision unit

Also Published As

Publication number Publication date
JP2001159734A (ja) 2001-06-12

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