JP4666272B1 - 板材の平坦度測定方法及びこれを用いた鋼板の製造方法 - Google Patents

板材の平坦度測定方法及びこれを用いた鋼板の製造方法 Download PDF

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Publication number
JP4666272B1
JP4666272B1 JP2010541650A JP2010541650A JP4666272B1 JP 4666272 B1 JP4666272 B1 JP 4666272B1 JP 2010541650 A JP2010541650 A JP 2010541650A JP 2010541650 A JP2010541650 A JP 2010541650A JP 4666272 B1 JP4666272 B1 JP 4666272B1
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plate material
pattern
flatness
shape measurement
along
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JPWO2011048860A1 (ja
Inventor
良仁 伊勢居
朋也 加藤
正洋 大杉
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Nippon Steel Corp
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Sumitomo Metal Industries Ltd
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    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B21—MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL; PUNCHING METAL
    • B21B—ROLLING OF METAL
    • B21B38/00—Methods or devices for measuring, detecting or monitoring specially adapted for metal-rolling mills, e.g. position detection, inspection of the product
    • B21B38/02—Methods or devices for measuring, detecting or monitoring specially adapted for metal-rolling mills, e.g. position detection, inspection of the product for measuring flatness or profile of strips
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B21—MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL; PUNCHING METAL
    • B21C—MANUFACTURE OF METAL SHEETS, WIRE, RODS, TUBES, PROFILES OR LIKE SEMI-MANUFACTURED PRODUCTS OTHERWISE THAN BY ROLLING; AUXILIARY OPERATIONS USED IN CONNECTION WITH METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL
    • B21C51/00—Measuring, gauging, indicating, counting, or marking devices specially adapted for use in the production or manipulation of material in accordance with subclasses B21B - B21F
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2513—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/306—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces for measuring evenness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Textile Engineering (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Processing (AREA)
JP2010541650A 2009-10-19 2010-08-03 板材の平坦度測定方法及びこれを用いた鋼板の製造方法 Active JP4666272B1 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2009240574 2009-10-19
JP2009240574 2009-10-19
PCT/JP2010/063068 WO2011048860A1 (ja) 2009-10-19 2010-08-03 板材の平坦度測定方法及びこれを用いた鋼板の製造方法

Publications (2)

Publication Number Publication Date
JP4666272B1 true JP4666272B1 (ja) 2011-04-06
JPWO2011048860A1 JPWO2011048860A1 (ja) 2013-03-07

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US (2) US8459073B2 (https=)
EP (1) EP2492634B1 (https=)
JP (1) JP4666272B1 (https=)
KR (1) KR101307037B1 (https=)
CN (1) CN102667400B (https=)
IN (1) IN2012DN03206A (https=)
WO (1) WO2011048860A1 (https=)

Cited By (2)

* Cited by examiner, † Cited by third party
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WO2014185478A1 (ja) 2013-05-14 2014-11-20 新日鐵住金株式会社 板材の平坦度測定方法、板材の平坦度測定装置及び鋼板の製造方法
CN115511877A (zh) * 2022-11-02 2022-12-23 安徽工业大学科技园有限公司 卷状物平整检测方法、装置、系统、电子设备和存储介质

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IN2012DN03206A (https=) * 2009-10-19 2015-10-23 Sumitomo Electric Industries
JP2015505039A (ja) * 2011-12-12 2015-02-16 ザイゴ コーポレーションＺｙｇｏ Ｃｏｒｐｏｒａｔｉｏｎ 変調光を使用した非接触表面形状評価
CN102620663A (zh) * 2012-03-21 2012-08-01 莱芜钢铁集团有限公司 热轧板带坯料在线测长装置及其使用方法
US11509880B2 (en) 2012-11-14 2022-11-22 Qualcomm Incorporated Dynamic adjustment of light source power in structured light active depth sensing systems
KR101399886B1 (ko) * 2013-03-28 2014-05-27 현대제철 주식회사 캠버 제어 장치 및 그 방법
FI20135688L (fi) * 2013-06-24 2014-12-25 Outotec Finland Oy Menetelmä ja järjestely metallien elektrolyyttistä raffinointia varten valettujen anodien valmistamiseksi elektrolyyttistä raffinointivaihetta varten
CN103322948B (zh) * 2013-07-04 2015-12-23 上海宝锋工程技术有限公司 板坯表面凹凸点检测方法、检测装置与处理方法
WO2015027014A1 (en) * 2013-08-21 2015-02-26 Severstal Dearborn, Llc Method for measuring surface characteristics of hot dipped galvanneal steel sheet
US9250066B2 (en) * 2014-03-21 2016-02-02 Charles Thorndike System for measuring base edge bevel angles and conditions of base flatness for skis and snowboards
JP6341883B2 (ja) * 2014-06-27 2018-06-13 キヤノン株式会社 位置検出装置、位置検出方法、インプリント装置及び物品の製造方法
EP3270104B8 (en) * 2015-04-22 2019-07-17 Nippon Steel Corporation Shape measuring apparatus and shape measuring method
TWI651511B (zh) * 2015-05-15 2019-02-21 高準精密工業股份有限公司 偵測方法以及應用該偵測方法的光學裝置
CN105032784B (zh) * 2015-06-30 2017-07-14 张金丹 一种具有筛选功能的板材生产系统
EP3220101B1 (en) * 2016-03-16 2020-01-29 Ricoh Company, Ltd. Texture evaluation apparatus, texture evaluation method, and computer-readable recording medium
US20170274374A1 (en) * 2016-03-28 2017-09-28 Ilumina, Inc. Multi-plane microarrays
JP6772756B2 (ja) * 2016-10-21 2020-10-21 日本製鉄株式会社 鋼板形状の矯正装置、矯正方法、および、鋼板の連続酸洗装置
KR102400342B1 (ko) * 2016-12-06 2022-05-20 니폰 덴키 가라스 가부시키가이샤 띠 형상 유리 필름의 품질 검사 방법, 및 유리 롤
RU2720450C1 (ru) * 2017-03-14 2020-04-29 ДжФЕ СТИЛ КОРПОРЕЙШН Способ и устройство для определения величины отклонения полосы и способ и устройство для детектирования аномального отклонения полосы
TWI630366B (zh) * 2017-04-28 2018-07-21 中國鋼鐵股份有限公司 鋼板寬度量測系統及其方法
FR3066816B1 (fr) * 2017-05-24 2020-09-04 Centre Nat Rech Scient Dispositif optique de mesure de la courbure d'une surface reflechissante
US11481887B2 (en) * 2017-08-24 2022-10-25 C&B Tech Apparatuses and methods for warpage measurement
JP6849150B2 (ja) * 2018-05-22 2021-03-24 東芝三菱電機産業システム株式会社 産業プラント監視制御システム
BR112021017036A2 (pt) * 2019-03-20 2021-11-09 Bobst Mex Sa Sistema de geração de imagens de câmeras múltiplas usando uma linha de laser
CN109909366B (zh) * 2019-04-01 2020-12-29 哈尔滨工业大学 面向超声冲击加工的光路辅助显微视觉检测系统和方法
JP7007324B2 (ja) * 2019-04-25 2022-01-24 ファナック株式会社 画像処理装置、画像処理方法、及びロボットシステム
CN111272112B (zh) * 2019-06-26 2024-12-31 深圳市鸿合创新信息技术有限责任公司 平整度检测设备、检测件和平整度检测方法
CN110736751B (zh) * 2019-11-06 2022-04-19 合肥御微半导体技术有限公司 一种表面缺陷检测方法及装置
CN111024712A (zh) * 2019-12-26 2020-04-17 苏州伟信奥图智能科技有限公司 适用于表面缺陷检测方法
CN111229840B (zh) * 2020-01-13 2021-11-16 广东韶钢松山股份有限公司 中厚板轧后超快冷控制系统、方法以及调整水流量比补偿值的方法
CN212623504U (zh) * 2020-06-08 2021-02-26 三赢科技（深圳）有限公司 结构光投影仪
JP6808888B1 (ja) * 2020-11-05 2021-01-06 Ｐｒｉｍｅｔａｌｓ Ｔｅｃｈｎｏｌｏｇｉｅｓ Ｊａｐａｎ株式会社 不良判断装置および不良判断方法
CN112517646A (zh) * 2020-11-17 2021-03-19 娄底市洪申科技有限公司 一种钢板在线平整度检测设备及其检测方法
CN112880742A (zh) * 2021-01-24 2021-06-01 宝钢工程技术集团有限公司 板坯多功能监测仪及其使用方法
TWI826779B (zh) 2021-04-23 2023-12-21 達運精密工業股份有限公司 基材平坦度的檢測方法
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US20250139755A1 (en) * 2021-09-27 2025-05-01 Toray Industries, Inc. Unevenness measuring device for sheet-shaped material, and unevenness measuring method for sheet-shaped material
JP2023111881A (ja) * 2022-01-31 2023-08-10 大日本印刷株式会社 マスクの検査方法、マスクの製造方法、マスクの検査装置、プログラム、記録媒体及びマスク
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Cited By (4)

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Publication number Priority date Publication date Assignee Title
WO2014185478A1 (ja) 2013-05-14 2014-11-20 新日鐵住金株式会社 板材の平坦度測定方法、板材の平坦度測定装置及び鋼板の製造方法
JP5994937B2 (ja) * 2013-05-14 2016-09-21 新日鐵住金株式会社 板材の平坦度測定方法、板材の平坦度測定装置及び鋼板の製造方法
US9482520B2 (en) 2013-05-14 2016-11-01 Nippon Steel & Sumitomo Metal Corporation Method for measuring flatness of sheet, device for measuring flatness of sheet, and production method for steel sheet
CN115511877A (zh) * 2022-11-02 2022-12-23 安徽工业大学科技园有限公司 卷状物平整检测方法、装置、系统、电子设备和存储介质

Also Published As

Publication number Publication date
WO2011048860A1 (ja) 2011-04-28
CN102667400A (zh) 2012-09-12
EP2492634A4 (en) 2016-08-17
EP2492634A1 (en) 2012-08-29
EP2492634B1 (en) 2017-05-10
KR20120083478A (ko) 2012-07-25
KR101307037B1 (ko) 2013-09-11
CN102667400B (zh) 2014-11-05
IN2012DN03206A (https=) 2015-10-23
JPWO2011048860A1 (ja) 2013-03-07
US20140007634A1 (en) 2014-01-09
US9138790B2 (en) 2015-09-22
US20120204614A1 (en) 2012-08-16
US8459073B2 (en) 2013-06-11

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