JP4638382B2 - 接合方法 - Google Patents
接合方法 Download PDFInfo
- Publication number
- JP4638382B2 JP4638382B2 JP2006156085A JP2006156085A JP4638382B2 JP 4638382 B2 JP4638382 B2 JP 4638382B2 JP 2006156085 A JP2006156085 A JP 2006156085A JP 2006156085 A JP2006156085 A JP 2006156085A JP 4638382 B2 JP4638382 B2 JP 4638382B2
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- Prior art keywords
- joining
- metal
- powder
- metal powder
- bonding
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01079—Gold [Au]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/013—Alloys
- H01L2924/014—Solder alloys
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/102—Material of the semiconductor or solid state bodies
- H01L2924/1025—Semiconducting materials
- H01L2924/1026—Compound semiconductors
- H01L2924/1032—III-V
- H01L2924/10329—Gallium arsenide [GaAs]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/30—Technical effects
- H01L2924/35—Mechanical effects
- H01L2924/351—Thermal stress
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- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Powder Metallurgy (AREA)
- Die Bonding (AREA)
- Wire Bonding (AREA)
Description
(a)一方の接合部材に、純度が99.9重量%以上であり、平均粒径が0.005μm〜1.0μmである金粉、銀粉、白金粉、又はパラジウム粉から選択される一種以上の金属粉末と、有機溶剤とからなる金属ペーストを塗布する工程。
(b)前記金属ペーストを乾燥し、80〜300℃の温度で焼結させて金属粉末焼結体とする工程。
(c)前記金属粉末焼結体を介して前記一方の接合部材と他方の接合部材とを配置し、少なくとも金属粉末焼結体を加熱しながら一方向又は双方向から加圧して接合する工程。
Claims (2)
- 一対の接合部材を接合する方法において、下記工程を含むことを特徴とする方法。
(a)一方の接合部材に、純度が99.9重量%以上であり、平均粒径が0.005μm〜1.0μmである金粉、銀粉、白金粉、又はパラジウム粉から選択される一種以上の金属粉末と、有機溶剤とからなる金属ペーストを塗布する工程。
(b)前記金属ペーストを乾燥し、80〜300℃の温度で焼結させて金属粉末焼結体とする工程。
(c)前記金属粉末焼結体を介して前記一方の接合部材と他方の接合部材とを配置し、少なくとも金属粉末焼結体を加熱すると共に、超音波を印加しながら一方向又は双方向から加圧して接合する工程。 - (c)工程での加熱温度を80〜300℃とする請求項1記載の接合方法。
Priority Applications (6)
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JP2006156085A JP4638382B2 (ja) | 2006-06-05 | 2006-06-05 | 接合方法 |
PCT/JP2007/061266 WO2007142175A1 (ja) | 2006-06-05 | 2007-06-04 | 接合方法 |
EP07744651.6A EP1916709A4 (en) | 2006-06-05 | 2007-06-04 | BINDING METHOD |
CN2007800008088A CN101341585B (zh) | 2006-06-05 | 2007-06-04 | 接合方法 |
US12/063,264 US7789287B2 (en) | 2006-06-05 | 2007-06-04 | Method of bonding |
KR1020087001991A KR100976026B1 (ko) | 2006-06-05 | 2007-06-04 | 접합방법 |
Applications Claiming Priority (1)
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JP2006156085A JP4638382B2 (ja) | 2006-06-05 | 2006-06-05 | 接合方法 |
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JP2007324523A JP2007324523A (ja) | 2007-12-13 |
JP4638382B2 true JP4638382B2 (ja) | 2011-02-23 |
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JP2006156085A Active JP4638382B2 (ja) | 2006-06-05 | 2006-06-05 | 接合方法 |
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US (1) | US7789287B2 (ja) |
EP (1) | EP1916709A4 (ja) |
JP (1) | JP4638382B2 (ja) |
KR (1) | KR100976026B1 (ja) |
CN (1) | CN101341585B (ja) |
WO (1) | WO2007142175A1 (ja) |
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Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH09326416A (ja) * | 1996-06-05 | 1997-12-16 | Kokusai Electric Co Ltd | 半導体素子の実装方法およびその製品 |
JP2006054212A (ja) * | 2004-08-09 | 2006-02-23 | Matsushita Electric Ind Co Ltd | 基板および電子部品組立体ならびに電子部品組立体の製造方法 |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5427811B2 (ja) * | 1973-02-07 | 1979-09-12 | ||
TW215079B (ja) * | 1990-10-11 | 1993-10-21 | Boc Group Inc | |
JP3891838B2 (ja) * | 2001-12-26 | 2007-03-14 | 株式会社ルネサステクノロジ | 半導体装置およびその製造方法 |
JP4179805B2 (ja) | 2002-05-31 | 2008-11-12 | Juki株式会社 | ダイボンディング装置 |
AU2002342490A1 (en) * | 2002-07-23 | 2004-02-09 | Elmicron Ag | Method for fastening microtool components to objects |
JP4175197B2 (ja) * | 2003-06-27 | 2008-11-05 | 株式会社デンソー | フリップチップ実装構造 |
JP2005116612A (ja) * | 2003-10-03 | 2005-04-28 | Murata Mfg Co Ltd | フリップチップ実装方法およびこの方法を用いた電子回路装置 |
TW200520123A (en) * | 2003-10-07 | 2005-06-16 | Matsushita Electric Ind Co Ltd | Method for mounting semiconductor chip and semiconductor chip-mounted board |
JP4255847B2 (ja) * | 2004-01-27 | 2009-04-15 | 田中貴金属工業株式会社 | 金属ペーストを用いた半導体ウェハーへのバンプの形成方法 |
KR20070033329A (ko) * | 2004-02-18 | 2007-03-26 | 버지니아 테크 인터렉추얼 프라퍼티스, 인크. | 인터커넥트를 위한 나노 크기의 금속 페이스트 및 이의사용 방법 |
EP1575099A1 (de) * | 2004-03-09 | 2005-09-14 | RWE SCHOTT Solar GmbH | Verfahren zum Ausbilden einer Struktur |
JP4706637B2 (ja) * | 2004-11-29 | 2011-06-22 | Dic株式会社 | 導電性ペースト、及び導電性ペーストの製造方法 |
-
2006
- 2006-06-05 JP JP2006156085A patent/JP4638382B2/ja active Active
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- 2007-06-04 KR KR1020087001991A patent/KR100976026B1/ko active IP Right Grant
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- 2007-06-04 EP EP07744651.6A patent/EP1916709A4/en not_active Ceased
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Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH09326416A (ja) * | 1996-06-05 | 1997-12-16 | Kokusai Electric Co Ltd | 半導体素子の実装方法およびその製品 |
JP2006054212A (ja) * | 2004-08-09 | 2006-02-23 | Matsushita Electric Ind Co Ltd | 基板および電子部品組立体ならびに電子部品組立体の製造方法 |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2021024769A1 (ja) | 2019-08-05 | 2021-02-11 | 田中貴金属工業株式会社 | 金粉末及び該金粉末の製造方法並びに金ペースト |
KR20220019787A (ko) | 2019-08-05 | 2022-02-17 | 다나카 기킨조쿠 고교 가부시키가이샤 | 금 분말 및 해당 금 분말의 제조 방법 그리고 금 페이스트 |
US12000019B2 (en) | 2019-08-05 | 2024-06-04 | Tanaka Kikinzoku Kogyo K.K. | Gold powder, production method for gold powder, and gold paste |
Also Published As
Publication number | Publication date |
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EP1916709A4 (en) | 2014-07-09 |
WO2007142175A1 (ja) | 2007-12-13 |
KR100976026B1 (ko) | 2010-08-17 |
CN101341585A (zh) | 2009-01-07 |
US7789287B2 (en) | 2010-09-07 |
EP1916709A1 (en) | 2008-04-30 |
JP2007324523A (ja) | 2007-12-13 |
KR20080027883A (ko) | 2008-03-28 |
CN101341585B (zh) | 2010-06-02 |
US20090230172A1 (en) | 2009-09-17 |
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Free format text: JAPANESE INTERMEDIATE CODE: R250 |
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R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
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R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |