JP4620228B2 - 光散乱透過シートの欠点検査装置 - Google Patents

光散乱透過シートの欠点検査装置 Download PDF

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Publication number
JP4620228B2
JP4620228B2 JP2000230146A JP2000230146A JP4620228B2 JP 4620228 B2 JP4620228 B2 JP 4620228B2 JP 2000230146 A JP2000230146 A JP 2000230146A JP 2000230146 A JP2000230146 A JP 2000230146A JP 4620228 B2 JP4620228 B2 JP 4620228B2
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Japan
Prior art keywords
light
transmission sheet
light scattering
scattering transmission
imaging
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JP2000230146A
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Japanese (ja)
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JP2002048726A5 (enExample
JP2002048726A (ja
Inventor
英人 坂田
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Dai Nippon Printing Co Ltd
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Dai Nippon Printing Co Ltd
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Priority to JP2000230146A priority Critical patent/JP4620228B2/ja
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JP2000230146A 2000-07-31 2000-07-31 光散乱透過シートの欠点検査装置 Expired - Fee Related JP4620228B2 (ja)

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JP2000230146A JP4620228B2 (ja) 2000-07-31 2000-07-31 光散乱透過シートの欠点検査装置

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JP2000230146A JP4620228B2 (ja) 2000-07-31 2000-07-31 光散乱透過シートの欠点検査装置

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JP2002048726A JP2002048726A (ja) 2002-02-15
JP2002048726A5 JP2002048726A5 (enExample) 2007-08-23
JP4620228B2 true JP4620228B2 (ja) 2011-01-26

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JP2000230146A Expired - Fee Related JP4620228B2 (ja) 2000-07-31 2000-07-31 光散乱透過シートの欠点検査装置

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104345062A (zh) * 2013-08-07 2015-02-11 日东电工株式会社 光学构件的检查方法、光学产品的制造方法以及光学构件的检查装置

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003294644A (ja) * 2002-04-02 2003-10-15 Dainippon Printing Co Ltd 光散乱透過シートの欠点検査装置
JP5375239B2 (ja) * 2009-03-24 2013-12-25 東京電力株式会社 画像処理装置、長尺物用検査装置及びコンピュータプログラム
JP2014234999A (ja) * 2013-05-30 2014-12-15 住友化学株式会社 欠陥検査装置及び光学表示デバイスの生産システム

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59150327A (ja) * 1983-01-28 1984-08-28 Fujitsu Ltd スル−ホ−ル検査装置
JPH01151359A (ja) * 1987-12-08 1989-06-14 Canon Inc 原稿読取装置
JPH03134932A (ja) * 1989-10-20 1991-06-07 Koito Mfg Co Ltd 放電ランプ装置
JPH0611457A (ja) * 1992-06-26 1994-01-21 Gunze Ltd フィルム中の異物検出方法及びその装置
JP3224623B2 (ja) * 1993-02-22 2001-11-05 三菱レイヨン株式会社 フィッシュアイ検査装置
JPH0815169A (ja) * 1994-06-28 1996-01-19 Canon Inc 異物検査装置及びそれを用いた半導体デバイスの製造 方法
JP3677133B2 (ja) * 1996-12-18 2005-07-27 株式会社ヒューテック 透明体検査装置
JPH11248643A (ja) * 1998-03-02 1999-09-17 Sekisui Chem Co Ltd 透明フィルムの異物検査装置
JPH11304724A (ja) * 1998-04-24 1999-11-05 Mitsubishi Rayon Co Ltd 光透過性シートの穴検出装置及び穴検出方法
JP2000137001A (ja) * 1998-11-02 2000-05-16 Toyobo Co Ltd フィルム光学欠点検査装置
JP2001208702A (ja) * 2000-01-31 2001-08-03 Nippon Sheet Glass Co Ltd 欠点検査方法及び欠点検査装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104345062A (zh) * 2013-08-07 2015-02-11 日东电工株式会社 光学构件的检查方法、光学产品的制造方法以及光学构件的检查装置
CN104345062B (zh) * 2013-08-07 2018-09-28 日东电工株式会社 光学构件的检查方法、光学产品的制造方法以及光学构件的检查装置

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JP2002048726A (ja) 2002-02-15

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