JP4610965B2 - 電気化学式測定装置 - Google Patents

電気化学式測定装置 Download PDF

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Publication number
JP4610965B2
JP4610965B2 JP2004234315A JP2004234315A JP4610965B2 JP 4610965 B2 JP4610965 B2 JP 4610965B2 JP 2004234315 A JP2004234315 A JP 2004234315A JP 2004234315 A JP2004234315 A JP 2004234315A JP 4610965 B2 JP4610965 B2 JP 4610965B2
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Japan
Prior art keywords
value
specific component
environment
conversion coefficient
electrode
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Expired - Fee Related
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JP2004234315A
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English (en)
Japanese (ja)
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JP2006053019A5 (OSRAM
JP2006053019A (ja
Inventor
信一 播摩
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Tanita Corp
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Tanita Corp
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Priority to JP2004234315A priority Critical patent/JP4610965B2/ja
Priority to US11/196,280 priority patent/US20060032743A1/en
Publication of JP2006053019A publication Critical patent/JP2006053019A/ja
Publication of JP2006053019A5 publication Critical patent/JP2006053019A5/ja
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Publication of JP4610965B2 publication Critical patent/JP4610965B2/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/26—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
    • G01N27/416—Systems
    • G01N27/4166—Systems measuring a particular property of an electrolyte
    • G01N27/4168—Oxidation-reduction potential, e.g. for chlorination of water

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  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Molecular Biology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
JP2004234315A 2004-08-11 2004-08-11 電気化学式測定装置 Expired - Fee Related JP4610965B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2004234315A JP4610965B2 (ja) 2004-08-11 2004-08-11 電気化学式測定装置
US11/196,280 US20060032743A1 (en) 2004-08-11 2005-08-04 Electrochemical measurement apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004234315A JP4610965B2 (ja) 2004-08-11 2004-08-11 電気化学式測定装置

Publications (3)

Publication Number Publication Date
JP2006053019A JP2006053019A (ja) 2006-02-23
JP2006053019A5 JP2006053019A5 (OSRAM) 2007-05-10
JP4610965B2 true JP4610965B2 (ja) 2011-01-12

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ID=35798953

Family Applications (1)

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JP2004234315A Expired - Fee Related JP4610965B2 (ja) 2004-08-11 2004-08-11 電気化学式測定装置

Country Status (2)

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US (1) US20060032743A1 (OSRAM)
JP (1) JP4610965B2 (OSRAM)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102537921B1 (ko) * 2022-09-13 2023-05-30 주식회사 에스티엔 비선형 센서의 선형화 장치 및 방법

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8907384B2 (en) * 2006-01-26 2014-12-09 Nanoselect, Inc. CNT-based sensors: devices, processes and uses thereof
US20090278556A1 (en) * 2006-01-26 2009-11-12 Nanoselect, Inc. Carbon Nanostructure Electrode Based Sensors: Devices, Processes and Uses Thereof
US10962623B1 (en) 2017-05-17 2021-03-30 Heathkit Company, Inc. Accurate and model-based measurement and management systems and methods
US10788519B1 (en) * 2019-04-19 2020-09-29 Prova Instruments Inc. Current detecting module and current tester
KR102335865B1 (ko) * 2020-03-05 2021-12-03 김시원 기울기 보정을 통해 영점을 조정하는 염소농도측정기

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60174945A (ja) * 1984-02-21 1985-09-09 Fuji Photo Film Co Ltd イオン活量測定装置用プロ−ブアセンブリ−
JPH01292245A (ja) * 1988-05-20 1989-11-24 Nec Corp 半導体バイオセンサ出力の３点較正法
JP2540147Y2 (ja) * 1991-11-22 1997-07-02 理化工業株式会社 センサの補正装置
JPH06148134A (ja) * 1992-11-11 1994-05-27 Japan Organo Co Ltd ガラス電極式微量ナトリウムイオン測定装置
JP3654694B2 (ja) * 1995-12-28 2005-06-02 株式会社クボタ 残留塩素測定方法および残留塩素計
JPH09318594A (ja) * 1996-03-25 1997-12-12 Ngk Insulators Ltd ガスセンサおよび被測定ガス中の特定成分量の測定方法
JPH1123512A (ja) * 1997-07-02 1999-01-29 Riken Keiki Co Ltd 測定装置
EP0981046A1 (en) * 1998-08-10 2000-02-23 Ngk Spark Plug Co., Ltd Method for measuring concentration of a component in a gas
JP2000338075A (ja) * 1999-05-31 2000-12-08 Apurikusu:Kk 電気化学分析方法及びその装置
JP3792981B2 (ja) * 2000-03-22 2006-07-05 大日本スクリーン製造株式会社 塩素濃度測定装置
AU2003210957B2 (en) * 2002-02-10 2009-09-10 Agamatrix, Inc. Method and apparatus for assay of electrochemical properties
JP3705260B2 (ja) * 2002-10-30 2005-10-12 株式会社デンソー オイル劣化検出装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102537921B1 (ko) * 2022-09-13 2023-05-30 주식회사 에스티엔 비선형 센서의 선형화 장치 및 방법

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US20060032743A1 (en) 2006-02-16
JP2006053019A (ja) 2006-02-23

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