JP4366163B2 - 照明装置及び露光装置 - Google Patents
照明装置及び露光装置 Download PDFInfo
- Publication number
- JP4366163B2 JP4366163B2 JP2003333627A JP2003333627A JP4366163B2 JP 4366163 B2 JP4366163 B2 JP 4366163B2 JP 2003333627 A JP2003333627 A JP 2003333627A JP 2003333627 A JP2003333627 A JP 2003333627A JP 4366163 B2 JP4366163 B2 JP 4366163B2
- Authority
- JP
- Japan
- Prior art keywords
- light
- cylindrical lens
- optical
- lens group
- illumination
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Images
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70075—Homogenization of illumination intensity in the mask plane by using an integrator, e.g. fly's eye lens, facet mirror or glass rod, by using a diffusing optical element or by beam deflection
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70191—Optical correction elements, filters or phase plates for controlling intensity, wavelength, polarisation, phase or the like
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Microscoopes, Condenser (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2003333627A JP4366163B2 (ja) | 2003-09-25 | 2003-09-25 | 照明装置及び露光装置 |
| US10/948,700 US7236239B2 (en) | 2003-09-25 | 2004-09-23 | Illumination system and exposure apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2003333627A JP4366163B2 (ja) | 2003-09-25 | 2003-09-25 | 照明装置及び露光装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2005101314A JP2005101314A (ja) | 2005-04-14 |
| JP2005101314A5 JP2005101314A5 (enExample) | 2006-10-26 |
| JP4366163B2 true JP4366163B2 (ja) | 2009-11-18 |
Family
ID=34461583
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2003333627A Expired - Fee Related JP4366163B2 (ja) | 2003-09-25 | 2003-09-25 | 照明装置及び露光装置 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US7236239B2 (enExample) |
| JP (1) | JP4366163B2 (enExample) |
Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7773070B2 (en) | 2004-05-21 | 2010-08-10 | Cypress Semiconductor Corporation | Optical positioning device using telecentric imaging |
| EP1837895B1 (en) * | 2004-12-27 | 2016-02-24 | Nikon Corporation | Optical integrator, illumination optical apparatus, exposure apparatus, exposure method, and device manufacturing method |
| US7765251B2 (en) * | 2005-12-16 | 2010-07-27 | Cypress Semiconductor Corporation | Signal averaging circuit and method for sample averaging |
| US8587764B2 (en) * | 2007-03-13 | 2013-11-19 | Nikon Corporation | Optical integrator system, illumination optical apparatus, exposure apparatus, and device manufacturing method |
| DE102008007449A1 (de) * | 2008-02-01 | 2009-08-13 | Carl Zeiss Smt Ag | Beleuchtungsoptik zur Beleuchtung eines Objektfeldes einer Projektionsbelichtungsanlage für die Mikrolithographie |
| KR100993539B1 (ko) * | 2008-09-19 | 2010-11-10 | 오에프티 주식회사 | 노광기용 광원장치 |
| US8541727B1 (en) | 2008-09-30 | 2013-09-24 | Cypress Semiconductor Corporation | Signal monitoring and control system for an optical navigation sensor |
| US8711096B1 (en) | 2009-03-27 | 2014-04-29 | Cypress Semiconductor Corporation | Dual protocol input device |
| WO2010123484A1 (en) | 2009-04-20 | 2010-10-28 | Hewlett-Packard Development Company, L.P. | Collection optics for a color sensor |
| JP2011216863A (ja) * | 2010-03-17 | 2011-10-27 | Hitachi Via Mechanics Ltd | ビームサイズ可変照明光学装置及びビームサイズ変更方法 |
| US8937770B2 (en) * | 2012-07-24 | 2015-01-20 | Coherent Gmbh | Excimer laser apparatus projecting a beam with a selectively variable short-axis beam profile |
| JP6980443B2 (ja) * | 2017-07-28 | 2021-12-15 | キヤノン株式会社 | 露光装置及び物品製造方法 |
Family Cites Families (24)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60232552A (ja) * | 1984-05-02 | 1985-11-19 | Canon Inc | 照明光学系 |
| US4733944A (en) * | 1986-01-24 | 1988-03-29 | Xmr, Inc. | Optical beam integration system |
| JPS6461716A (en) * | 1987-08-31 | 1989-03-08 | Canon Kk | Illuminator |
| JP3428055B2 (ja) * | 1992-11-05 | 2003-07-22 | 株式会社ニコン | 照明光学装置、露光装置、半導体製造方法および露光方法 |
| JP3254680B2 (ja) * | 1993-03-16 | 2002-02-12 | セイコーエプソン株式会社 | 投写型表示装置 |
| JPH08179237A (ja) * | 1994-12-26 | 1996-07-12 | Nikon Corp | 照明光学装置 |
| JPH08293461A (ja) | 1995-04-21 | 1996-11-05 | Nikon Corp | 照明装置および該装置を備えた投影露光装置 |
| KR960042227A (ko) | 1995-05-19 | 1996-12-21 | 오노 시게오 | 투영노광장치 |
| JP3743576B2 (ja) * | 1995-07-11 | 2006-02-08 | 株式会社ニコン | 投影露光装置、及びそれを用いた半導体素子又は液晶表示素子の製造方法 |
| DE29510514U1 (de) * | 1995-06-29 | 1995-10-26 | Alpirsbacher Maschinenbau GmbH & Co.KG, 72275 Alpirsbach | Sammelbehälter mit Transportpumpe |
| US5786939A (en) * | 1996-02-26 | 1998-07-28 | Fuji Photo Optical Co., Ltd. | Illumination optical system |
| JP3563888B2 (ja) * | 1996-09-12 | 2004-09-08 | キヤノン株式会社 | 照明装置及びそれを用いた投影露光装置 |
| JPH1092729A (ja) * | 1996-09-12 | 1998-04-10 | Canon Inc | 照明装置及びそれを用いた走査型投影露光装置 |
| JPH10275771A (ja) * | 1997-02-03 | 1998-10-13 | Nikon Corp | 照明光学装置 |
| JP3005203B2 (ja) * | 1997-03-24 | 2000-01-31 | キヤノン株式会社 | 照明装置、露光装置及びデバイス製造方法 |
| JP3262039B2 (ja) | 1997-07-18 | 2002-03-04 | キヤノン株式会社 | 露光装置及びそれを用いたデバイスの製造方法 |
| US6333777B1 (en) | 1997-07-18 | 2001-12-25 | Canon Kabushiki Kaisha | Exposure apparatus and device manufacturing method |
| JP3264224B2 (ja) * | 1997-08-04 | 2002-03-11 | キヤノン株式会社 | 照明装置及びそれを用いた投影露光装置 |
| JP4238390B2 (ja) * | 1998-02-27 | 2009-03-18 | 株式会社ニコン | 照明装置、該照明装置を備えた露光装置および該露光装置を用いて半導体デバイスを製造する方法 |
| US6563567B1 (en) * | 1998-12-17 | 2003-05-13 | Nikon Corporation | Method and apparatus for illuminating a surface using a projection imaging apparatus |
| DE60035710T2 (de) * | 2000-02-16 | 2007-12-06 | Asml Holding, N.V. | Zoom-beleuchtungssystem zur verwendung in der photolithographie |
| JP3599629B2 (ja) * | 2000-03-06 | 2004-12-08 | キヤノン株式会社 | 照明光学系及び前記照明光学系を用いた露光装置 |
| JP3599648B2 (ja) | 2000-08-03 | 2004-12-08 | キヤノン株式会社 | 照明装置、投影露光装置並びにそれを用いたデバイス製造方法 |
| JP3634782B2 (ja) * | 2001-09-14 | 2005-03-30 | キヤノン株式会社 | 照明装置、それを用いた露光装置及びデバイス製造方法 |
-
2003
- 2003-09-25 JP JP2003333627A patent/JP4366163B2/ja not_active Expired - Fee Related
-
2004
- 2004-09-23 US US10/948,700 patent/US7236239B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JP2005101314A (ja) | 2005-04-14 |
| US20050117137A1 (en) | 2005-06-02 |
| US7236239B2 (en) | 2007-06-26 |
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