JP4151271B2 - 分光装置 - Google Patents

分光装置 Download PDF

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Publication number
JP4151271B2
JP4151271B2 JP2002015920A JP2002015920A JP4151271B2 JP 4151271 B2 JP4151271 B2 JP 4151271B2 JP 2002015920 A JP2002015920 A JP 2002015920A JP 2002015920 A JP2002015920 A JP 2002015920A JP 4151271 B2 JP4151271 B2 JP 4151271B2
Authority
JP
Japan
Prior art keywords
light
support member
wavelength dispersion
arm
spectroscopic device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2002015920A
Other languages
English (en)
Japanese (ja)
Other versions
JP2003214952A (ja
JP2003214952A5 (enExample
Inventor
淳 勝沼
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nikon Corp
Original Assignee
Nikon Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nikon Corp filed Critical Nikon Corp
Priority to JP2002015920A priority Critical patent/JP4151271B2/ja
Priority to CNB028270525A priority patent/CN100425958C/zh
Priority to PCT/JP2002/013506 priority patent/WO2003062776A1/ja
Priority to US10/502,345 priority patent/US7173695B2/en
Publication of JP2003214952A publication Critical patent/JP2003214952A/ja
Publication of JP2003214952A5 publication Critical patent/JP2003214952A5/ja
Application granted granted Critical
Publication of JP4151271B2 publication Critical patent/JP4151271B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12—Generating the spectrum; Monochromators
    • G01J3/18—Generating the spectrum; Monochromators using diffraction elements, e.g. grating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0202—Mechanical elements; Supports for optical elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0208—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using focussing or collimating elements, e.g. lenses or mirrors; performing aberration correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0286—Constructional arrangements for compensating for fluctuations caused by temperature, humidity or pressure, or using cooling or temperature stabilization of parts of the device; Controlling the atmosphere inside a spectrometer, e.g. vacuum
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0291—Housings; Spectrometer accessories; Spatial arrangement of elements, e.g. folded path arrangements

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectrometry And Color Measurement (AREA)
JP2002015920A 2002-01-24 2002-01-24 分光装置 Expired - Fee Related JP4151271B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2002015920A JP4151271B2 (ja) 2002-01-24 2002-01-24 分光装置
CNB028270525A CN100425958C (zh) 2002-01-24 2002-12-25 分光镜
PCT/JP2002/013506 WO2003062776A1 (fr) 2002-01-24 2002-12-25 Spectroscope
US10/502,345 US7173695B2 (en) 2002-01-24 2002-12-25 Spectroscope with thermal compensation mechanism

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002015920A JP4151271B2 (ja) 2002-01-24 2002-01-24 分光装置

Publications (3)

Publication Number Publication Date
JP2003214952A JP2003214952A (ja) 2003-07-30
JP2003214952A5 JP2003214952A5 (enExample) 2005-08-11
JP4151271B2 true JP4151271B2 (ja) 2008-09-17

Family

ID=27606122

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002015920A Expired - Fee Related JP4151271B2 (ja) 2002-01-24 2002-01-24 分光装置

Country Status (4)

Country Link
US (1) US7173695B2 (enExample)
JP (1) JP4151271B2 (enExample)
CN (1) CN100425958C (enExample)
WO (1) WO2003062776A1 (enExample)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7595876B2 (en) * 2006-01-11 2009-09-29 Baker Hughes Incorporated Method and apparatus for estimating a property of a fluid downhole
US7576856B2 (en) * 2006-01-11 2009-08-18 Baker Hughes Incorporated Method and apparatus for estimating a property of a fluid downhole
JP2008159718A (ja) * 2006-12-21 2008-07-10 Sharp Corp マルチチップモジュールおよびその製造方法、並びにマルチチップモジュールの搭載構造およびその製造方法
EP2149028B1 (de) * 2007-05-21 2012-09-26 Micro-Epsilon Messtechnik GmbH & Co. KG Verfahren zur kompensation von temperaturbedingten messfehlern in einem konfokal chromatisch messenden abstandssensor
JP4891840B2 (ja) * 2007-06-08 2012-03-07 浜松ホトニクス株式会社 分光モジュール
JP5424957B2 (ja) * 2009-04-30 2014-02-26 キヤノン株式会社 分光測色装置およびそれを用いた画像形成装置
JP5781188B1 (ja) * 2014-03-26 2015-09-16 株式会社フジクラ 導光装置、製造方法、及び、ｌｄモジュール
WO2018011893A1 (ja) * 2016-07-12 2018-01-18 三菱電機株式会社 光部品および光モジュール
JP7164814B2 (ja) * 2018-12-25 2022-11-02 日本電信電話株式会社 光波長選択フィルタモジュール及び光波長選択方法
CN110596846B (zh) * 2019-09-20 2022-04-08 武汉光迅科技股份有限公司 一种标准具封装结构及波长锁定装置
JP7729053B2 (ja) * 2021-03-18 2025-08-26 セイコーエプソン株式会社 測色装置

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57125825A (en) 1981-01-29 1982-08-05 Nippon Kogaku Kk <Nikon> Diffraction grating spectroscope
JP2753310B2 (ja) 1989-03-03 1998-05-20 アンリツ株式会社 分光器
JPH06331850A (ja) * 1993-05-25 1994-12-02 Matsushita Electric Ind Co Ltd 光フィルタおよび光フィルタに用いる回折素子
DE19504835C1 (de) 1995-02-14 1996-03-21 Hewlett Packard Gmbh Diodenzeilen-Spektralphotometer
DE19504834C1 (de) 1995-02-14 1996-06-13 Hewlett Packard Gmbh Diodenzeilen-Spektralphotometer
JPH0915048A (ja) * 1995-06-28 1997-01-17 Shimadzu Corp 分光光度計
JP3085179B2 (ja) 1995-12-28 2000-09-04 株式会社島津製作所 発光分光分析装置
JPH09218091A (ja) 1996-02-08 1997-08-19 Hewlett Packard Co <Hp> ダイオードアレー分光測光器
EP1041372B1 (de) 1999-04-01 2006-03-01 Gretag-Macbeth AG Spektrometer
JP2001108523A (ja) 1999-10-14 2001-04-20 Matsushita Electric Ind Co Ltd 分光測定装置
JP3692523B2 (ja) * 1999-12-28 2005-09-07 横河電機株式会社 分光装置
JP2002031572A (ja) 2000-07-17 2002-01-31 Ando Electric Co Ltd 分光器及びこれを備えた光スペクトラムアナライザ

Also Published As

Publication number Publication date
JP2003214952A (ja) 2003-07-30
CN1613004A (zh) 2005-05-04
CN100425958C (zh) 2008-10-15
US20050088649A1 (en) 2005-04-28
WO2003062776A1 (fr) 2003-07-31
US7173695B2 (en) 2007-02-06

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