JP4126096B2 - 感光性被覆を有する基板上に集束レーザ放射により構造物を製作する方法と装置 - Google Patents
感光性被覆を有する基板上に集束レーザ放射により構造物を製作する方法と装置 Download PDFInfo
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- JP4126096B2 JP4126096B2 JP53188698A JP53188698A JP4126096B2 JP 4126096 B2 JP4126096 B2 JP 4126096B2 JP 53188698 A JP53188698 A JP 53188698A JP 53188698 A JP53188698 A JP 53188698A JP 4126096 B2 JP4126096 B2 JP 4126096B2
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- Expired - Fee Related
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- 238000000034 method Methods 0.000 title claims description 36
- 239000000758 substrate Substances 0.000 title description 12
- 239000011248 coating agent Substances 0.000 title description 7
- 238000000576 coating method Methods 0.000 title description 7
- 230000005855 radiation Effects 0.000 title description 2
- 230000007704 transition Effects 0.000 claims description 14
- 230000001360 synchronised effect Effects 0.000 claims description 7
- 230000008859 change Effects 0.000 claims description 6
- 238000002156 mixing Methods 0.000 claims description 3
- 230000001934 delay Effects 0.000 claims 1
- 238000007781 pre-processing Methods 0.000 claims 1
- 230000006870 function Effects 0.000 description 24
- 239000011521 glass Substances 0.000 description 8
- 238000003860 storage Methods 0.000 description 8
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical group [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 7
- 238000012545 processing Methods 0.000 description 6
- 239000004065 semiconductor Substances 0.000 description 6
- 230000008569 process Effects 0.000 description 5
- 230000000694 effects Effects 0.000 description 4
- 238000010894 electron beam technology Methods 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 4
- 229910052804 chromium Inorganic materials 0.000 description 3
- 239000011651 chromium Substances 0.000 description 3
- 230000006835 compression Effects 0.000 description 3
- 238000007906 compression Methods 0.000 description 3
- 238000012937 correction Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 230000007246 mechanism Effects 0.000 description 3
- 239000000203 mixture Substances 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 3
- 238000006073 displacement reaction Methods 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000000206 photolithography Methods 0.000 description 2
- 239000000872 buffer Substances 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 230000003111 delayed effect Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 239000012634 fragment Substances 0.000 description 1
- 238000001093 holography Methods 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 230000001788 irregular Effects 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
- 238000005459 micromachining Methods 0.000 description 1
- 238000012806 monitoring device Methods 0.000 description 1
- 229920002120 photoresistant polymer Polymers 0.000 description 1
Images
Classifications
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70383—Direct write, i.e. pattern is written directly without the use of a mask by one or multiple beams
- G03F7/704—Scanned exposure beam, e.g. raster-, rotary- and vector scanning
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/38—Masks having auxiliary features, e.g. special coatings or marks for alignment or testing; Preparation thereof
- G03F1/48—Protective coatings
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/68—Preparation processes not covered by groups G03F1/20 - G03F1/50
- G03F1/76—Patterning of masks by imaging
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/002—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor using materials containing microcapsules; Preparing or processing such materials, e.g. by pressure; Devices or apparatus specially designed therefor
- G03F7/0022—Devices or apparatus
- G03F7/0025—Devices or apparatus characterised by means for coating the developer
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/16—Coating processes; Apparatus therefor
- G03F7/161—Coating processes; Apparatus therefor using a previously coated surface, e.g. by stamping or by transfer lamination
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70008—Production of exposure light, i.e. light sources
- G03F7/70025—Production of exposure light, i.e. light sources by lasers
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N1/00—Scanning, transmission or reproduction of documents or the like, e.g. facsimile transmission; Details thereof
- H04N1/04—Scanning arrangements, i.e. arrangements for the displacement of active reading or reproducing elements relative to the original or reproducing medium, or vice versa
- H04N1/10—Scanning arrangements, i.e. arrangements for the displacement of active reading or reproducing elements relative to the original or reproducing medium, or vice versa using flat picture-bearing surfaces
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N2201/00—Indexing scheme relating to scanning, transmission or reproduction of documents or the like, and to details thereof
- H04N2201/04—Scanning arrangements
- H04N2201/0402—Arrangements not specific to a particular one of the scanning methods covered by groups H04N1/04 - H04N1/207
- H04N2201/0414—Scanning an image in a series of overlapping zones
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Optics & Photonics (AREA)
- Plasma & Fusion (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Manufacturing Of Printed Circuit Boards (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/SE1997/000134 WO1998033096A1 (en) | 1997-01-29 | 1997-01-29 | Method and apparatus for the production of a structure by focused laser radiation on a photosensitively coated substrate |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2002512702A JP2002512702A (ja) | 2002-04-23 |
| JP2002512702A5 JP2002512702A5 (https=) | 2004-10-28 |
| JP4126096B2 true JP4126096B2 (ja) | 2008-07-30 |
Family
ID=20405454
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP53188698A Expired - Fee Related JP4126096B2 (ja) | 1997-01-29 | 1997-01-29 | 感光性被覆を有する基板上に集束レーザ放射により構造物を製作する方法と装置 |
Country Status (7)
| Country | Link |
|---|---|
| EP (1) | EP0956516B1 (https=) |
| JP (1) | JP4126096B2 (https=) |
| KR (1) | KR100459813B1 (https=) |
| AT (1) | ATE216091T1 (https=) |
| AU (1) | AU2048097A (https=) |
| DE (1) | DE69711929T2 (https=) |
| WO (1) | WO1998033096A1 (https=) |
Families Citing this family (316)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6373565B1 (en) | 1999-05-27 | 2002-04-16 | Spectra Physics Lasers, Inc. | Method and apparatus to detect a flaw in a surface of an article |
| US6822978B2 (en) | 1999-05-27 | 2004-11-23 | Spectra Physics, Inc. | Remote UV laser system and methods of use |
| US6734387B2 (en) | 1999-05-27 | 2004-05-11 | Spectra Physics Lasers, Inc. | Method and apparatus for micro-machining of articles that include polymeric materials |
| US6421573B1 (en) | 1999-05-27 | 2002-07-16 | Spectra Physics Lasers, Inc. | Quasi-continuous wave lithography apparatus and method |
| US6246706B1 (en) | 1999-05-27 | 2001-06-12 | Spectra Physics Lasers, Inc. | Laser writing method and apparatus |
| US7508487B2 (en) | 2000-06-01 | 2009-03-24 | Asml Netherlands B.V. | Lithographic apparatus, device manufacturing method, and device manufactured thereby |
| AU2001284926A1 (en) * | 2000-08-14 | 2002-02-25 | Applied Materials, Inc. | Scan butting error reduction in a raster scan pattern generation system |
| US7113258B2 (en) | 2001-01-15 | 2006-09-26 | Asml Netherlands B.V. | Lithographic apparatus |
| TWI253682B (en) | 2001-05-23 | 2006-04-21 | Asml Netherlands Bv | Substrate provided with an alignment mark, method of designing a mask, computer program, mask for exposing said mark, device manufacturing method, and device manufactured thereby |
| US6879374B2 (en) | 2001-06-20 | 2005-04-12 | Asml Netherlands B.V. | Device manufacturing method, device manufactured thereby and a mask for use in the method |
| TW529172B (en) | 2001-07-24 | 2003-04-21 | Asml Netherlands Bv | Imaging apparatus |
| JP4324645B2 (ja) * | 2001-08-21 | 2009-09-02 | 株式会社オーク製作所 | 多重露光描画装置および多重露光描画方法 |
| JP3980469B2 (ja) | 2001-10-19 | 2007-09-26 | エーエスエムエル ネザーランズ ビー.ブイ. | リソグラフィック装置及びデバイス製造方法 |
| US7333178B2 (en) | 2002-03-18 | 2008-02-19 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| US7170587B2 (en) | 2002-03-18 | 2007-01-30 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
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| KR100552638B1 (ko) | 2002-07-11 | 2006-02-20 | 에이에스엠엘 네델란즈 비.브이. | 리소그래피장치 및 디바이스제조방법 |
| EP1383007A1 (en) | 2002-07-16 | 2004-01-21 | ASML Netherlands B.V. | Lithographic apparatus, and device manufacturing method |
| JP4105616B2 (ja) | 2002-08-15 | 2008-06-25 | エーエスエムエル ネザーランズ ビー.ブイ. | リソグラフ投影装置およびこの装置用の反射鏡アセンブリ |
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Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5221422A (en) * | 1988-06-06 | 1993-06-22 | Digital Equipment Corporation | Lithographic technique using laser scanning for fabrication of electronic components and the like |
| DK294189D0 (da) * | 1989-06-15 | 1989-06-15 | Andersen Allan V | Fremgangsmaade og scanningapparat til praeparering af store arbejdsflader, navnlig trykmoenstre paa serigrafi rammer |
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1997
- 1997-01-29 JP JP53188698A patent/JP4126096B2/ja not_active Expired - Fee Related
- 1997-01-29 DE DE69711929T patent/DE69711929T2/de not_active Expired - Lifetime
- 1997-01-29 AU AU20480/97A patent/AU2048097A/en not_active Abandoned
- 1997-01-29 EP EP97908608A patent/EP0956516B1/en not_active Expired - Lifetime
- 1997-01-29 AT AT97908608T patent/ATE216091T1/de not_active IP Right Cessation
- 1997-01-29 WO PCT/SE1997/000134 patent/WO1998033096A1/en not_active Ceased
- 1997-01-29 KR KR10-1999-7006852A patent/KR100459813B1/ko not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| EP0956516B1 (en) | 2002-04-10 |
| KR100459813B1 (ko) | 2004-12-04 |
| EP0956516A1 (en) | 1999-11-17 |
| WO1998033096A1 (en) | 1998-07-30 |
| KR20010049157A (ko) | 2001-06-15 |
| DE69711929D1 (de) | 2002-05-16 |
| AU2048097A (en) | 1998-08-18 |
| ATE216091T1 (de) | 2002-04-15 |
| JP2002512702A (ja) | 2002-04-23 |
| DE69711929T2 (de) | 2002-09-05 |
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