JP4118500B2 - ポイントコンタクト・アレー - Google Patents

ポイントコンタクト・アレー Download PDF

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Publication number
JP4118500B2
JP4118500B2 JP2000334686A JP2000334686A JP4118500B2 JP 4118500 B2 JP4118500 B2 JP 4118500B2 JP 2000334686 A JP2000334686 A JP 2000334686A JP 2000334686 A JP2000334686 A JP 2000334686A JP 4118500 B2 JP4118500 B2 JP 4118500B2
Authority
JP
Japan
Prior art keywords
point contact
electrode
contact array
conductance
array according
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2000334686A
Other languages
English (en)
Japanese (ja)
Other versions
JP2002141494A5 (fr
JP2002141494A (ja
Inventor
正和 青野
知信 中山
一弥 寺部
剛 長谷川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Japan Science and Technology Agency
RIKEN Institute of Physical and Chemical Research
National Institute of Japan Science and Technology Agency
Original Assignee
Japan Science and Technology Agency
RIKEN Institute of Physical and Chemical Research
National Institute of Japan Science and Technology Agency
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to JP2000334686A priority Critical patent/JP4118500B2/ja
Application filed by Japan Science and Technology Agency, RIKEN Institute of Physical and Chemical Research, National Institute of Japan Science and Technology Agency filed Critical Japan Science and Technology Agency
Priority to EP06001940A priority patent/EP1662575B1/fr
Priority to EP01980925A priority patent/EP1331671B1/fr
Priority to KR1020037004682A priority patent/KR100751736B1/ko
Priority to DE60126310T priority patent/DE60126310T2/de
Priority to DE60131036T priority patent/DE60131036T2/de
Priority to US10/363,259 priority patent/US7026911B2/en
Priority to TW090126677A priority patent/TW523983B/zh
Priority to PCT/JP2001/009464 priority patent/WO2002037572A1/fr
Publication of JP2002141494A publication Critical patent/JP2002141494A/ja
Priority to US10/918,360 priority patent/US7473982B2/en
Publication of JP2002141494A5 publication Critical patent/JP2002141494A5/ja
Priority to US11/165,037 priority patent/US7525410B2/en
Application granted granted Critical
Publication of JP4118500B2 publication Critical patent/JP4118500B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Measuring Leads Or Probes (AREA)
  • Semiconductor Memories (AREA)
  • Logic Circuits (AREA)
JP2000334686A 2000-11-01 2000-11-01 ポイントコンタクト・アレー Expired - Fee Related JP4118500B2 (ja)

Priority Applications (11)

Application Number Priority Date Filing Date Title
JP2000334686A JP4118500B2 (ja) 2000-11-01 2000-11-01 ポイントコンタクト・アレー
PCT/JP2001/009464 WO2002037572A1 (fr) 2000-11-01 2001-10-29 Reseau a pointes, circuit non, et circuit electronique contenant ceux-ci
KR1020037004682A KR100751736B1 (ko) 2000-11-01 2001-10-29 포인트 컨택트 어레이, ｎｏｔ 회로, 및 이를 이용한 전자회로
DE60126310T DE60126310T2 (de) 2000-11-01 2001-10-29 Punktkontaktarray, Not-Schaltung und elektronische Schaltung damit
DE60131036T DE60131036T2 (de) 2000-11-01 2001-10-29 Ein NOT-Schaltkreis
US10/363,259 US7026911B2 (en) 2000-11-01 2001-10-29 Point contact array, not circuit, and electronic circuit comprising the same
EP06001940A EP1662575B1 (fr) 2000-11-01 2001-10-29 Un circuit NOT
EP01980925A EP1331671B1 (fr) 2000-11-01 2001-10-29 Réseau à pointes et circuit électronique conténant celui-ci
TW090126677A TW523983B (en) 2000-11-01 2001-10-29 Point contact array, NOT circuit and electronic circuit using the same
US10/918,360 US7473982B2 (en) 2000-11-01 2004-08-16 Point contact array, not circuit, and electronic circuit comprising the same
US11/165,037 US7525410B2 (en) 2000-11-01 2005-06-24 Point contact array, not circuit, and electronic circuit using the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000334686A JP4118500B2 (ja) 2000-11-01 2000-11-01 ポイントコンタクト・アレー

Publications (3)

Publication Number Publication Date
JP2002141494A JP2002141494A (ja) 2002-05-17
JP2002141494A5 JP2002141494A5 (fr) 2005-04-07
JP4118500B2 true JP4118500B2 (ja) 2008-07-16

Family

ID=18810557

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000334686A Expired - Fee Related JP4118500B2 (ja) 2000-11-01 2000-11-01 ポイントコンタクト・アレー

Country Status (1)

Country Link
JP (1) JP4118500B2 (fr)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7875883B2 (en) 2001-09-25 2011-01-25 Japan Science And Technology Agency Electric device using solid electrolyte
US6849868B2 (en) * 2002-03-14 2005-02-01 Micron Technology, Inc. Methods and apparatus for resistance variable material cells
US6798068B2 (en) * 2002-11-26 2004-09-28 Advanced Micro Devices, Inc. MOCVD formation of Cu2S
DE112004000060B4 (de) * 2003-07-18 2011-01-27 Nec Corp. Schaltelemente
JP4992858B2 (ja) * 2003-08-27 2012-08-08 日本電気株式会社 半導体装置
JP4356542B2 (ja) 2003-08-27 2009-11-04 日本電気株式会社 半導体装置
JP5434967B2 (ja) * 2003-11-28 2014-03-05 ソニー株式会社 記憶素子及び記憶装置
JP4792714B2 (ja) 2003-11-28 2011-10-12 ソニー株式会社 記憶素子及び記憶装置
JP2005286084A (ja) * 2004-03-30 2005-10-13 Univ Waseda 量子化コンダクタンス素子、これを用いた磁場変化検出方法及び磁気検出方法、並びに量子化コンダクタンス素子の製造方法
US8320154B2 (en) 2007-08-08 2012-11-27 National Institute For Materials Science Switching element and application of the same
KR101418434B1 (ko) * 2008-03-13 2014-08-14 삼성전자주식회사 비휘발성 메모리 장치, 이의 제조 방법, 및 이를 포함하는프로세싱 시스템
JP5699666B2 (ja) * 2011-02-16 2015-04-15 日本電気株式会社 半導体装置
JP5696988B2 (ja) * 2011-06-08 2015-04-08 独立行政法人物質・材料研究機構 シナプス動作素子
JP2014075424A (ja) * 2012-10-03 2014-04-24 Toshiba Corp 不揮発性可変抵抗素子、制御装置および記憶装置

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Publication number Publication date
JP2002141494A (ja) 2002-05-17

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