JP4105348B2 - 試料分析用モニタ装置及びそれを用いた燃焼制御システム - Google Patents

試料分析用モニタ装置及びそれを用いた燃焼制御システム Download PDF

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Publication number
JP4105348B2
JP4105348B2 JP32927799A JP32927799A JP4105348B2 JP 4105348 B2 JP4105348 B2 JP 4105348B2 JP 32927799 A JP32927799 A JP 32927799A JP 32927799 A JP32927799 A JP 32927799A JP 4105348 B2 JP4105348 B2 JP 4105348B2
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gas
standard
concentration
sample
ion
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Japanese (ja)
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JP2001147216A (ja
JP2001147216A5 (enExample
Inventor
益義 山田
雄一郎 橋本
実 坂入
安章 高田
将三 阪本
朋之 飛田
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Hitachi Ltd
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Hitachi Ltd
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Priority to JP32927799A priority Critical patent/JP4105348B2/ja
Priority to EP00124831A priority patent/EP1102004B1/en
Priority to US09/712,132 priority patent/US6580067B1/en
Publication of JP2001147216A publication Critical patent/JP2001147216A/ja
Publication of JP2001147216A5 publication Critical patent/JP2001147216A5/ja
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0009—Calibration of the apparatus
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F23—COMBUSTION APPARATUS; COMBUSTION PROCESSES
    • F23G—CREMATION FURNACES; CONSUMING WASTE PRODUCTS BY COMBUSTION
    • F23G5/00—Incineration of waste; Incinerator constructions; Details, accessories or control therefor
    • F23G5/50—Control or safety arrangements
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0422—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for gaseous samples
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/0004—Gaseous mixtures, e.g. polluted air
    • G01N33/0009—General constructional details of gas analysers, e.g. portable test equipment
    • G01N33/0027—General constructional details of gas analysers, e.g. portable test equipment concerning the detector
    • G01N33/0036—General constructional details of gas analysers, e.g. portable test equipment concerning the detector specially adapted to detect a particular component
    • G01N33/0047—Organic compounds
    • G01N33/0049—Halogenated organic compounds

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Incineration Of Waste (AREA)
  • Electron Tubes For Measurement (AREA)
JP32927799A 1999-11-19 1999-11-19 試料分析用モニタ装置及びそれを用いた燃焼制御システム Expired - Fee Related JP4105348B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP32927799A JP4105348B2 (ja) 1999-11-19 1999-11-19 試料分析用モニタ装置及びそれを用いた燃焼制御システム
EP00124831A EP1102004B1 (en) 1999-11-19 2000-11-14 Sample analyzing monitor and combustion control system using the same
US09/712,132 US6580067B1 (en) 1999-11-19 2000-11-15 Sample analyzing monitor and combustion control system using the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP32927799A JP4105348B2 (ja) 1999-11-19 1999-11-19 試料分析用モニタ装置及びそれを用いた燃焼制御システム

Publications (3)

Publication Number Publication Date
JP2001147216A JP2001147216A (ja) 2001-05-29
JP2001147216A5 JP2001147216A5 (enExample) 2005-07-21
JP4105348B2 true JP4105348B2 (ja) 2008-06-25

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Family Applications (1)

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JP32927799A Expired - Fee Related JP4105348B2 (ja) 1999-11-19 1999-11-19 試料分析用モニタ装置及びそれを用いた燃焼制御システム

Country Status (3)

Country Link
US (1) US6580067B1 (enExample)
EP (1) EP1102004B1 (enExample)
JP (1) JP4105348B2 (enExample)

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US6649909B2 (en) * 2002-02-20 2003-11-18 Agilent Technologies, Inc. Internal introduction of lock masses in mass spectrometer systems
JP3787116B2 (ja) 2002-11-06 2006-06-21 株式会社日立製作所 化学剤の探知方法
DE10301421A1 (de) * 2003-01-16 2004-07-29 Bayer Ag Prozessanalysensysteme mit automatischer Flüssigprobenvorbereitung und Anbindung zu Prozessleitsystemen
JP4603786B2 (ja) * 2003-09-22 2010-12-22 株式会社日立ハイテクノロジーズ 化学物質モニタ装置及び化学物質モニタ方法
US8685339B2 (en) 2003-11-21 2014-04-01 Pin/Nip, Inc. Field and storage chemical test kit
US20050112775A1 (en) * 2003-11-21 2005-05-26 Forsythe John M. Field and storage chemical test method
US7009176B2 (en) * 2004-03-08 2006-03-07 Thermo Finnigan Llc Titanium ion transfer components for use in mass spectrometry
JP4407337B2 (ja) * 2004-03-25 2010-02-03 株式会社島津製作所 クロマトグラフ質量分析装置
JP2006322899A (ja) * 2005-05-20 2006-11-30 Hitachi Ltd ガスモニタリング装置
JP2008139130A (ja) * 2006-12-01 2008-06-19 Hitachi Ltd リアルタイム分析装置及び方法
FR2910966B1 (fr) 2006-12-28 2009-04-17 Commissariat Energie Atomique Dispositif de mesures couplees permettant un suivi global et en continu de traces de goudrons presentes dans un flux gazeux
FR2910967B1 (fr) 2006-12-28 2009-04-03 Commissariat Energie Atomique Dispositif et procede de mesure continue de la concentration en goudrons dans un flux gazeux
JP5227556B2 (ja) * 2007-09-06 2013-07-03 株式会社日立製作所 分析装置
WO2010100816A1 (ja) * 2009-03-05 2010-09-10 株式会社 日立ハイテクノロジーズ 分析装置
JP4920067B2 (ja) * 2009-09-24 2012-04-18 株式会社日立ハイテクノロジーズ 化学物質モニタ装置及び化学物質モニタ方法
JP5413590B2 (ja) * 2009-11-11 2014-02-12 株式会社島津製作所 液体クロマトグラフ質量分析装置
JP5657904B2 (ja) * 2010-03-26 2015-01-21 株式会社日立ハイテクソリューションズ ガス分析装置及びガス分析方法
US9140653B2 (en) * 2010-10-08 2015-09-22 Tsi Incorporated Spark emission particle detector
JP2011081017A (ja) * 2011-01-24 2011-04-21 Hitachi High-Technologies Corp 化学物質モニタ装置及び化学物質モニタ方法
JP5697489B2 (ja) * 2011-03-02 2015-04-08 大陽日酸株式会社 酸素濃度の分析方法及び装置
JP5675442B2 (ja) 2011-03-04 2015-02-25 株式会社日立ハイテクノロジーズ 質量分析方法及び質量分析装置
US9448177B2 (en) 2012-10-25 2016-09-20 Agilent Technologies, Inc. Flame photometric detector
US11002684B2 (en) 2012-10-25 2021-05-11 Agilent Technologies, Inc. Chemiluminescent detector having coating to reduce excited species adsorption
JP6505268B1 (ja) * 2018-01-11 2019-04-24 株式会社日立ハイテクサイエンス 質量分析装置及び質量分析方法
CN110346187A (zh) * 2019-06-26 2019-10-18 浙江中通检测科技有限公司 一种二噁英检测采样装置
HUP1900246A1 (hu) * 2019-07-05 2021-01-28 Univ Szegedi Eljárás és berendezés szikrakisülési részecskegenerátor monitorozására
US20240006174A1 (en) * 2020-12-17 2024-01-04 Hitachi High-Tech Corporation Method for Controlling Mass Spectrometer
FR3162280A1 (fr) * 2024-05-15 2025-11-21 Totalenergies Onetech Système de détermination d’une composition d’un gaz industriel circulant dans une installation, installation et procédé de mesure associés

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JPH05312796A (ja) 1992-05-14 1993-11-22 Kubota Corp 排ガス中のダイオキシン類の代替指標としてのクロロベンゼン類の半連続測定監視装置
JP3367719B2 (ja) 1993-09-20 2003-01-20 株式会社日立製作所 質量分析計および静電レンズ
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Publication number Publication date
JP2001147216A (ja) 2001-05-29
EP1102004B1 (en) 2012-05-23
EP1102004A1 (en) 2001-05-23
US6580067B1 (en) 2003-06-17

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