JP3994346B2 - 発光ダイオードの表面実装方法 - Google Patents
発光ダイオードの表面実装方法 Download PDFInfo
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- JP3994346B2 JP3994346B2 JP2003333088A JP2003333088A JP3994346B2 JP 3994346 B2 JP3994346 B2 JP 3994346B2 JP 2003333088 A JP2003333088 A JP 2003333088A JP 2003333088 A JP2003333088 A JP 2003333088A JP 3994346 B2 JP3994346 B2 JP 3994346B2
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- emitting diode
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- 238000000034 method Methods 0.000 title claims description 44
- 229910052751 metal Inorganic materials 0.000 claims description 82
- 239000002184 metal Substances 0.000 claims description 82
- 239000000758 substrate Substances 0.000 claims description 81
- 229920005989 resin Polymers 0.000 claims description 38
- 239000011347 resin Substances 0.000 claims description 38
- 229910000679 solder Inorganic materials 0.000 claims description 13
- 239000011810 insulating material Substances 0.000 claims description 10
- 239000004642 Polyimide Substances 0.000 claims description 5
- 239000011521 glass Substances 0.000 claims description 5
- 238000002955 isolation Methods 0.000 claims description 5
- 229920001721 polyimide Polymers 0.000 claims description 5
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 4
- 229910052782 aluminium Inorganic materials 0.000 claims description 4
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 4
- 229910052802 copper Inorganic materials 0.000 claims description 4
- 239000010949 copper Substances 0.000 claims description 4
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical group [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 3
- 238000003698 laser cutting Methods 0.000 claims description 3
- 229910052710 silicon Inorganic materials 0.000 claims description 3
- 239000010703 silicon Substances 0.000 claims description 3
- 238000009760 electrical discharge machining Methods 0.000 claims 1
- 239000002105 nanoparticle Substances 0.000 claims 1
- 239000000463 material Substances 0.000 description 9
- 230000000694 effects Effects 0.000 description 7
- 238000004519 manufacturing process Methods 0.000 description 6
- 230000017525 heat dissipation Effects 0.000 description 5
- 239000004020 conductor Substances 0.000 description 4
- 238000007747 plating Methods 0.000 description 4
- 238000000926 separation method Methods 0.000 description 4
- 238000007796 conventional method Methods 0.000 description 3
- 238000009713 electroplating Methods 0.000 description 3
- 238000007789 sealing Methods 0.000 description 3
- 239000004593 Epoxy Substances 0.000 description 2
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 2
- 238000005229 chemical vapour deposition Methods 0.000 description 2
- 238000000151 deposition Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 239000003365 glass fiber Substances 0.000 description 2
- 239000012212 insulator Substances 0.000 description 2
- 238000003754 machining Methods 0.000 description 2
- 238000000059 patterning Methods 0.000 description 2
- 238000001259 photo etching Methods 0.000 description 2
- 229910052709 silver Inorganic materials 0.000 description 2
- 239000004332 silver Substances 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 238000007772 electroless plating Methods 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 239000002210 silicon-based material Substances 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 238000002207 thermal evaporation Methods 0.000 description 1
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- H01L33/00—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/483—Containers
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- H01L33/48—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/62—Arrangements for conducting electric current to or from the semiconductor body, e.g. lead-frames, wire-bonds or solder balls
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- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
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- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
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- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
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- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
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- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
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- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48225—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
- H01L2224/48227—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
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- H01L2224/732—Location after the connecting process
- H01L2224/73251—Location after the connecting process on different surfaces
- H01L2224/73265—Layer and wire connectors
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01006—Carbon [C]
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
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- H01L2924/01015—Phosphorus [P]
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
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- H01L2924/01047—Silver [Ag]
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/12—Passive devices, e.g. 2 terminal devices
- H01L2924/1204—Optical Diode
- H01L2924/12041—LED
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- H01L2924/181—Encapsulation
Description
域を形成して該基板を複数の部分に分けるステップと、該基板の上部表面に一対の金属コンタクトを形成し、かつそれぞれの一対の金属コンタクトの一つを該溝の左側に形成し、他の一つを該溝の右側に形成するステップと、
該基板の下部表面側から該基板の一部分を除去して該溝の底部を露出させるステップと、 少なくとも1以上の円錐型反射板を含んでなり、発光ダイオードを収納する複数の反射ユニットを該基板に設けるステップと、 少なくとも1以上の発光ダイオードをそれぞれ該反射ユニットに設置し、かつそれぞれの発光ダイオードのp型電極とn型電極とを該一対の金属コンタクトのそれぞれの金属コンタクトに電気的に接続するステップと、樹脂を該円錐型反射板に注入するステップとを特徴とする発光ダイオードの表面実装方法によって課題を解決できる点に着眼
し、係る知見に基づき本発明を完成させた。
以下、この発明について具体的に説明する。
該基板に複数の隔離領域を形成して該基板を複数の部分に分けるステップと、
該基板の上部表面に一対の金属コンタクトを複数形成し、、かつそれぞれの一対の金属コンタクトの一つを該溝の左側に形成し、他の一つを該溝の右側に形成するステップと、
円錐型反射板を含んでなり、発光ドダイオードを収納する複数の反射ユニットを該基板上に設けるステップと、
複数の発光ダイオードをそれぞれ該円錐型反射板内に設け、かつそれぞれの発光ダイオードのp型電極とn型電極とを該一対の金属コンタクトのそれぞれの金属コンタクトに電気的に接続するステップと、
透過性の樹脂か、もしくはエポキシ樹脂を該円錐型反射板に注入して該複数の発光ダイオードのパッケージを完成させるステップとを含む。
係る発光ダイオードの表面実装方法について、その特徴を詳述するために具体的な実施例を挙げ、以下に説明する。
12 基板
13、14 第1金属コンタクト
15 第1パッケージ樹脂層
17 円錐型反射板
20 ハンダ層
22 発光ダイオードチップ
23 リード
27 第2パッケージ樹脂層
28 ダイ
29 レンズ
33、34 第2金属コンタクト
40 コンタクトホール
41 導体メッキ層
42 切開線
72 基板
73、74 金属コンタクト
75 貫通孔
76A 上部表面
76B 下部表面
77 樹脂層
79 発光ダイオード
83、84 電極
85、86 リード
87 ハンダ層
88 密封体
91 マザーボード
92 ホール
100 基板
100A 上部表面
100B 下部表面
101、102 電極
103 発光ダイオードチップ
104 ハンダ層
105 絶縁溝
106 絶縁物質
110A 第1金属コンタクト
110AA 第1金属コンタクト
110AB 第1金属コンタクト
110B 第2金属コンタクト
120 反射ユニット
120A 円錐型反射板
130 パッケージ樹脂層
135 リード
140 分割線
Claims (6)
- 導電、熱伝導特性を有する基板を設けるステップと、
少なくとも1以上の溝を該基板に形成するステップと、
該溝に絶縁物質を充填するステップと、
該基板の上部表面に一対の金属コンタクトを形成し、かつそれぞれの一対の金属コンタクトの一つを該溝の左側に形成し、他の一つを該溝の右側に形成するステップと、
該基板の下部表面側から該基板の一部分を除去して該溝の底部を露出させるステップと、
少なくとも1以上の円錐型反射板を含んでなり、発光ダイオードを収納する複数の反射ユニットを該基板に設けるステップと、
少なくとも1以上の発行ダイオードをそれぞれ反射ユニットに設置し、かつそれぞれの発光ダイオードのp型電極とn型電極とを該一対の金属コンタクトのそれぞれの金属コンタクトに電気的に接続するステップと、
樹脂を該円錐型反射板に注入するステップとを特徴とする発光ダイオードの表面実装方法。 - 前記反射ユニットを設けるステップの前に、該基板の下部表面に、該隔離領域の左右の位置に対をなして設けられ、かつ外部の電極に接続する第2金属コンタクトを形成するステップを含むことを特徴とする請求項1に記載の発光ダイオードの表面実装方法。
- 前記溝がマイクロフォトエッチングの工程か、放電加工か、レーザカットか、もしくは工具などで形成し、かつ該の深さが約100〜500μmであることを特徴とする発光ダイオードの表面実装方法。
- 前記方法が、少なくとも1以上のパッケージした発光ダイオードにダイシングを行い、パッケージされた単一の発光ダイオードを形成するステップをさらに含むことを特徴とする請求項1に記載の発光ナノ粒子を有する発光ダイオード。
- 前記基板がケイ素か、銅か、もしくはアルミ材から選択され、前記絶縁物質がSOG膜(Spin of Glass)か、ポリイミドか、もしくはBCB
(bisbenzocyclobutene)樹脂などから選択されることを特徴とする請求項1に記載の発光ダイオードの表面実装方法。 - 前記発光ダイオードのp型電極とn型電極とが同一側に設けられている場合は、フリップチップ方式で該発光ダイオードのp型電極とn型電極とをハンダ、もしくはハンダボールを介して該一対をなす第1金属コンタクトに電気的に接続し、該発光ダイオードのp型電極とn型電極とがそれぞれ該発光ダイオードの底面と上面に設けられている場合は、ハンダ層を介して該発光ダイオードの底部の電極を該対をなす金属コンタクトの内の一金属コンタクトに電気的に接続し、該発光ダイオードの他の電極はリードを介して該対をなす金属コンタクトの内の他の金属コンタクトに接続することを特徴とする請求項1に記載の発光ダイオードの表面実装方法。
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TW091122418A TW563263B (en) | 2002-09-27 | 2002-09-27 | Surface mounting method for high power light emitting diode |
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JP2004119981A JP2004119981A (ja) | 2004-04-15 |
JP3994346B2 true JP3994346B2 (ja) | 2007-10-17 |
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DE (1) | DE10305021B4 (ja) |
TW (1) | TW563263B (ja) |
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JP4557613B2 (ja) * | 2004-06-28 | 2010-10-06 | 京セラ株式会社 | 発光素子収納用パッケージ、発光装置および照明装置 |
EP1810351B1 (en) | 2004-10-22 | 2013-08-07 | Seoul Opto Device Co., Ltd. | Gan compound semiconductor light emitting element |
JP4757477B2 (ja) * | 2004-11-04 | 2011-08-24 | 株式会社 日立ディスプレイズ | 光源ユニット、それを用いた照明装置及びそれを用いた表示装置 |
KR100696063B1 (ko) | 2005-01-05 | 2007-03-15 | 엘지이노텍 주식회사 | 어레이 발광장치 |
KR100600372B1 (ko) | 2005-06-08 | 2006-07-18 | 엘지전자 주식회사 | 발광소자 패키지 및 그 제조방법 |
KR100638868B1 (ko) | 2005-06-20 | 2006-10-27 | 삼성전기주식회사 | 금속 반사 층을 형성한 엘이디 패키지 및 그 제조 방법 |
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JP3146452B2 (ja) * | 1995-08-11 | 2001-03-19 | スタンレー電気株式会社 | 面実装型led素子及びその製造方法 |
DE19901918A1 (de) * | 1998-01-28 | 1999-07-29 | Rohm Co Ltd | Halbleitende lichtemittierende Vorrichtung |
JP4065051B2 (ja) * | 1998-04-17 | 2008-03-19 | スタンレー電気株式会社 | 表面実装ledとその製造方法 |
CN1196203C (zh) * | 1999-07-29 | 2005-04-06 | 西铁城电子股份有限公司 | 发光二极管 |
US6345903B1 (en) * | 2000-09-01 | 2002-02-12 | Citizen Electronics Co., Ltd. | Surface-mount type emitting diode and method of manufacturing same |
US20030057421A1 (en) * | 2001-09-27 | 2003-03-27 | Tzer-Perng Chen | High flux light emitting diode having flip-chip type light emitting diode chip with a transparent substrate |
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2002
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2003
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DE10305021A1 (de) | 2004-04-08 |
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JP2004119981A (ja) | 2004-04-15 |
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