JP3965373B2 - 可調整電流モード差動増幅器 - Google Patents

可調整電流モード差動増幅器 Download PDF

Info

Publication number
JP3965373B2
JP3965373B2 JP2003272462A JP2003272462A JP3965373B2 JP 3965373 B2 JP3965373 B2 JP 3965373B2 JP 2003272462 A JP2003272462 A JP 2003272462A JP 2003272462 A JP2003272462 A JP 2003272462A JP 3965373 B2 JP3965373 B2 JP 3965373B2
Authority
JP
Japan
Prior art keywords
memory cell
transistor
cell
voltage
output level
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2003272462A
Other languages
English (en)
Japanese (ja)
Other versions
JP2004039231A5 (https=
JP2004039231A (ja
Inventor
フレデリック・エイ・パーナー
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hewlett Packard Development Co LP
Original Assignee
Hewlett Packard Development Co LP
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Development Co LP filed Critical Hewlett Packard Development Co LP
Publication of JP2004039231A publication Critical patent/JP2004039231A/ja
Publication of JP2004039231A5 publication Critical patent/JP2004039231A5/ja
Application granted granted Critical
Publication of JP3965373B2 publication Critical patent/JP3965373B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C7/00Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/06Sense amplifiers; Associated circuits, e.g. timing or triggering circuits
    • G11C7/062Differential amplifiers of non-latching type, e.g. comparators, long-tailed pairs
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/02Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
    • G11C11/16Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/02Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
    • G11C11/16Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
    • G11C11/165Auxiliary circuits
    • G11C11/1673Reading or sensing circuits or methods
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C2207/00Indexing scheme relating to arrangements for writing information into, or reading information out from, a digital store
    • G11C2207/06Sense amplifier related aspects
    • G11C2207/063Current sense amplifiers

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Read Only Memory (AREA)
  • Semiconductor Memories (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
JP2003272462A 2002-07-16 2003-07-09 可調整電流モード差動増幅器 Expired - Fee Related JP3965373B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/198,278 US6590804B1 (en) 2002-07-16 2002-07-16 Adjustable current mode differential amplifier

Publications (3)

Publication Number Publication Date
JP2004039231A JP2004039231A (ja) 2004-02-05
JP2004039231A5 JP2004039231A5 (https=) 2005-05-26
JP3965373B2 true JP3965373B2 (ja) 2007-08-29

Family

ID=22732698

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003272462A Expired - Fee Related JP3965373B2 (ja) 2002-07-16 2003-07-09 可調整電流モード差動増幅器

Country Status (5)

Country Link
US (1) US6590804B1 (https=)
EP (1) EP1383132A1 (https=)
JP (1) JP3965373B2 (https=)
CN (1) CN100481249C (https=)
TW (1) TW200402068A (https=)

Families Citing this family (60)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6577525B2 (en) * 2001-08-28 2003-06-10 Micron Technology, Inc. Sensing method and apparatus for resistance memory device
US6650562B2 (en) * 2002-01-23 2003-11-18 Hewlett-Packard Development Company, L.P. System and method for determining the logic state of a memory cell in a magnetic tunnel junction memory device
US6674679B1 (en) * 2002-10-01 2004-01-06 Hewlett-Packard Development Company, L.P. Adjustable current mode differential amplifier for multiple bias point sensing of MRAM having equi-potential isolation
US6891768B2 (en) * 2002-11-13 2005-05-10 Hewlett-Packard Development Company, L.P. Power-saving reading of magnetic memory devices
JP2004164766A (ja) * 2002-11-14 2004-06-10 Renesas Technology Corp 不揮発性記憶装置
US6781906B2 (en) * 2002-11-19 2004-08-24 Hewlett-Packard Development Company, L.P. Memory cell sensing integrator
TWI223259B (en) * 2003-01-07 2004-11-01 Ind Tech Res Inst A reference mid-point current generator for a magnetic random access memory
FR2853444B1 (fr) * 2003-04-02 2005-07-15 St Microelectronics Sa Amplificateur de lecture a double etage de lecture
US7027318B2 (en) * 2003-05-30 2006-04-11 Hewlett-Packard Development Company, L.P. Method and system for adjusting offset voltage
EP1484764B1 (en) * 2003-06-04 2006-08-16 STMicroelectronics S.r.l. Method for generating a reference current for sense amplifiers connected to cells of a memory matrix, particularly in big-sized flash memories, and corresponding generator
US6839280B1 (en) * 2003-06-27 2005-01-04 Freescale Semiconductor, Inc. Variable gate bias for a reference transistor in a non-volatile memory
US7126844B2 (en) * 2003-11-30 2006-10-24 Union Semiconductor Technology Corporation Apparatus to improve stability of an MRAM over process and operational variations
US7082050B2 (en) * 2003-11-30 2006-07-25 Union Semiconductor Technology Corporation Method to equalize word current circuitry
US7054185B2 (en) * 2003-11-30 2006-05-30 Union Semiconductor Technology Corporation Optimized MRAM current sources
US7113422B2 (en) 2003-11-30 2006-09-26 Union Semiconductor Technology Corporation Method for optimizing MRAM circuit performance
US7023753B2 (en) * 2003-11-30 2006-04-04 Union Semiconductor Technology Corporation Current controlled word and sense source
US6862206B1 (en) * 2003-12-19 2005-03-01 Hewlett-Packard Development Company, L.P. Memory module hybridizing an atomic resolution storage (ARS) memory and a magnetic memory
US7091740B2 (en) * 2004-07-30 2006-08-15 Microchip Technology Incorporated Write protection using a two signal control protocol for an integrated circuit device having parameter change capability, chip select and selectable write to non-volatile memory
US7130235B2 (en) * 2004-09-03 2006-10-31 Hewlett-Packard Development Company, L.P. Method and apparatus for a sense amplifier
US7333383B2 (en) * 2005-08-23 2008-02-19 Infineon Technologies Ag Fuse resistance read-out circuit
KR100735754B1 (ko) 2006-02-03 2007-07-06 삼성전자주식회사 센스 앰프 플립 플롭
US8395199B2 (en) 2006-03-25 2013-03-12 4D-S Pty Ltd. Systems and methods for fabricating self-aligned memory cell
US7649793B1 (en) 2006-05-04 2010-01-19 Marvell International Ltd. Channel estimation for multi-level memories using pilot signals
US8645793B2 (en) * 2008-06-03 2014-02-04 Marvell International Ltd. Statistical tracking for flash memory
US7932548B2 (en) 2006-07-14 2011-04-26 4D-S Pty Ltd. Systems and methods for fabricating self-aligned memory cell
US7307911B1 (en) * 2006-07-27 2007-12-11 International Business Machines Corporation Apparatus and method for improving sensing margin of electrically programmable fuses
US20090126129A1 (en) * 2007-03-21 2009-05-21 D Agostino Michael J Precast Arch-Shaped Overfilled Structure
US7808834B1 (en) 2007-04-13 2010-10-05 Marvell International Ltd. Incremental memory refresh
TWI336079B (en) * 2007-07-02 2011-01-11 Ind Tech Res Inst Magnetic random access memory and data reading circuit therefor
US8031526B1 (en) 2007-08-23 2011-10-04 Marvell International Ltd. Write pre-compensation for nonvolatile memory
US8189381B1 (en) 2007-08-28 2012-05-29 Marvell International Ltd. System and method for reading flash memory cells
US8085605B2 (en) 2007-08-29 2011-12-27 Marvell World Trade Ltd. Sequence detection for flash memory with inter-cell interference
US9823090B2 (en) 2014-10-31 2017-11-21 Allegro Microsystems, Llc Magnetic field sensor for sensing a movement of a target object
JP5596296B2 (ja) * 2008-03-17 2014-09-24 ピーエスフォー ルクスコ エスエイアールエル 半導体装置
US7719884B2 (en) * 2008-05-19 2010-05-18 Qimonda Ag Integrated circuit, cell arrangement, method of manufacturing an integrated circuit, method of operating an integrated circuit, and memory module
JP5529450B2 (ja) * 2009-07-15 2014-06-25 スパンション エルエルシー ボディバイアス制御回路及びボディバイアス制御方法
CN102467967B (zh) * 2010-11-12 2015-05-20 上海复旦微电子集团股份有限公司 用于电可擦写只读存储器的读出电路和读出方法
GB2487723A (en) * 2011-01-26 2012-08-08 Nds Ltd Protection device for stored data values comprising a switching circuit
US9810519B2 (en) 2013-07-19 2017-11-07 Allegro Microsystems, Llc Arrangements for magnetic field sensors that act as tooth detectors
US10495699B2 (en) 2013-07-19 2019-12-03 Allegro Microsystems, Llc Methods and apparatus for magnetic sensor having an integrated coil or magnet to detect a non-ferromagnetic target
US9719806B2 (en) 2014-10-31 2017-08-01 Allegro Microsystems, Llc Magnetic field sensor for sensing a movement of a ferromagnetic target object
US9720054B2 (en) * 2014-10-31 2017-08-01 Allegro Microsystems, Llc Magnetic field sensor and electronic circuit that pass amplifier current through a magnetoresistance element
WO2016068980A1 (en) 2014-10-31 2016-05-06 Hewlett Packard Enterprise Development Lp Sensing circuit for resistive memory
US9823092B2 (en) 2014-10-31 2017-11-21 Allegro Microsystems, Llc Magnetic field sensor providing a movement detector
KR102354350B1 (ko) 2015-05-18 2022-01-21 삼성전자주식회사 메모리 장치 및 이를 포함하는 메모리 시스템
CN105049007B (zh) * 2015-06-19 2019-05-14 西安紫光国芯半导体有限公司 高精度抗干扰比较器及方法和应用该比较器的存储结构
US9728253B2 (en) * 2015-11-30 2017-08-08 Windbond Electronics Corp. Sense circuit for RRAM
WO2017176217A1 (en) * 2016-04-07 2017-10-12 Agency For Science, Technology And Research Circuit arrangement, memory column, memory array, and method of forming the same
US10260905B2 (en) 2016-06-08 2019-04-16 Allegro Microsystems, Llc Arrangements for magnetic field sensors to cancel offset variations
US10041810B2 (en) 2016-06-08 2018-08-07 Allegro Microsystems, Llc Arrangements for magnetic field sensors that act as movement detectors
CN109410997B (zh) * 2017-08-16 2021-04-30 华邦电子股份有限公司 电阻式存储器存储装置及其写入方法
CN110111821A (zh) * 2018-02-01 2019-08-09 上海磁宇信息科技有限公司 一种使用分布式参考单元的磁性随机存储器
US10866117B2 (en) 2018-03-01 2020-12-15 Allegro Microsystems, Llc Magnetic field influence during rotation movement of magnetic target
US11255700B2 (en) 2018-08-06 2022-02-22 Allegro Microsystems, Llc Magnetic field sensor
US11309005B2 (en) * 2018-10-31 2022-04-19 Taiwan Semiconductor Manufacturing Co., Ltd. Current steering in reading magnetic tunnel junction
US10823586B2 (en) 2018-12-26 2020-11-03 Allegro Microsystems, Llc Magnetic field sensor having unequally spaced magnetic field sensing elements
US11280637B2 (en) 2019-11-14 2022-03-22 Allegro Microsystems, Llc High performance magnetic angle sensor
US11237020B2 (en) 2019-11-14 2022-02-01 Allegro Microsystems, Llc Magnetic field sensor having two rows of magnetic field sensing elements for measuring an angle of rotation of a magnet
US11574678B2 (en) * 2020-09-17 2023-02-07 Fujitsu Semiconductor Memory Solution Limited Resistive random access memory, and method for manufacturing resistive random access memory
CN112579002B (zh) * 2020-12-14 2024-02-13 北京北大众志微系统科技有限责任公司 一种在位线结构中设置有传输门的sram及存取提升方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2694119B1 (fr) * 1992-07-24 1994-08-26 Sgs Thomson Microelectronics Circuit de lecture pour mémoire, avec recharge et équilibrage avant lecture.
JP2800740B2 (ja) * 1995-09-28 1998-09-21 日本電気株式会社 半導体記憶装置
US6262625B1 (en) 1999-10-29 2001-07-17 Hewlett-Packard Co Operational amplifier with digital offset calibration
US6169686B1 (en) 1997-11-20 2001-01-02 Hewlett-Packard Company Solid-state memory with magnetic storage cells
FR2801719B1 (fr) * 1999-11-30 2002-03-01 St Microelectronics Sa Dispositif de lecture pour memoire en circuit integre
US6191989B1 (en) * 2000-03-07 2001-02-20 International Business Machines Corporation Current sensing amplifier
JP3920565B2 (ja) * 2000-12-26 2007-05-30 株式会社東芝 磁気ランダムアクセスメモリ
TW520501B (en) * 2000-12-29 2003-02-11 Amic Technology Taiwan Inc Bias device for a magneto-resistive random access memory
US6501697B1 (en) * 2001-10-11 2002-12-31 Hewlett-Packard Company High density memory sense amplifier

Also Published As

Publication number Publication date
EP1383132A1 (en) 2004-01-21
JP2004039231A (ja) 2004-02-05
TW200402068A (en) 2004-02-01
CN1501401A (zh) 2004-06-02
US6590804B1 (en) 2003-07-08
CN100481249C (zh) 2009-04-22

Similar Documents

Publication Publication Date Title
JP3965373B2 (ja) 可調整電流モード差動増幅器
US6674679B1 (en) Adjustable current mode differential amplifier for multiple bias point sensing of MRAM having equi-potential isolation
US6754123B2 (en) Adjustable current mode differential amplifier for multiple bias point sensing of MRAM having diode isolation
EP1302948B1 (en) Memory sense amplifier
US7161861B2 (en) Sense amplifier bitline boost circuit
US6795340B2 (en) Non-volatile magnetic memory
US7251178B2 (en) Current sense amplifier
JP4048194B2 (ja) 抵抗性クロスポイントメモリ
CN100409363C (zh) 数据存储器件及其制造方法
US6185143B1 (en) Magnetic random access memory (MRAM) device including differential sense amplifiers
US20060092689A1 (en) Reference current source for current sense amplifier and programmable resistor configured with magnetic tunnel junction cells
KR100450464B1 (ko) Mram-메모리의 메모리 셀의 비파괴 판독을 위한 방법및 장치
JP4031447B2 (ja) オフセット調整可能な差動増幅器
US7187576B2 (en) Read out scheme for several bits in a single MRAM soft layer
KR100562203B1 (ko) Mram 셀을 위한 기준회로
US20090067233A1 (en) Magnetic random access memory and method of reading data from the same
US20050083747A1 (en) Reference generator for multilevel nonlinear resistivity memory storage elements
US20040095827A1 (en) Memory cell sensing integrator
US20100135072A1 (en) Spin-Torque Bit Cell With Unpinned Reference Layer and Unidirectional Write Current
US6894938B2 (en) System and method of calibrating a read circuit in a magnetic memory
Yamada et al. A novel sensing scheme for an MRAM with a 5% MR ratio
HK1065886A (en) Adjustable current mode differential amplifier

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20040607

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20040607

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20060928

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20061010

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20061228

A602 Written permission of extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A602

Effective date: 20070109

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20070402

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20070515

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20070528

R150 Certificate of patent or registration of utility model

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20100601

Year of fee payment: 3

S111 Request for change of ownership or part of ownership

Free format text: JAPANESE INTERMEDIATE CODE: R313113

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20100601

Year of fee payment: 3

R350 Written notification of registration of transfer

Free format text: JAPANESE INTERMEDIATE CODE: R350

LAPS Cancellation because of no payment of annual fees