JP3833984B2 - テストベクタの生成装置、テストベクタの生成方法、半導体集積回路の故障解析装置、およびテストベクタを生成するためのプログラム - Google Patents

テストベクタの生成装置、テストベクタの生成方法、半導体集積回路の故障解析装置、およびテストベクタを生成するためのプログラム Download PDF

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JP3833984B2
JP3833984B2 JP2002313172A JP2002313172A JP3833984B2 JP 3833984 B2 JP3833984 B2 JP 3833984B2 JP 2002313172 A JP2002313172 A JP 2002313172A JP 2002313172 A JP2002313172 A JP 2002313172A JP 3833984 B2 JP3833984 B2 JP 3833984B2
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path
test vector
search
semiconductor integrated
list
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JP2004150820A5 (enExample
JP2004150820A (ja
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浩司 浦田
顕一 安藏
哲 長谷川
千佳子 徳永
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Toshiba Corp
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Toshiba Corp
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Publication of JP2004150820A5 publication Critical patent/JP2004150820A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31919—Storing and outputting test patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/31813—Test pattern generators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
JP2002313172A 2002-10-28 2002-10-28 テストベクタの生成装置、テストベクタの生成方法、半導体集積回路の故障解析装置、およびテストベクタを生成するためのプログラム Expired - Fee Related JP3833984B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2002313172A JP3833984B2 (ja) 2002-10-28 2002-10-28 テストベクタの生成装置、テストベクタの生成方法、半導体集積回路の故障解析装置、およびテストベクタを生成するためのプログラム
US10/695,698 US7120890B2 (en) 2002-10-28 2003-10-28 Apparatus for delay fault testing of integrated circuits

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002313172A JP3833984B2 (ja) 2002-10-28 2002-10-28 テストベクタの生成装置、テストベクタの生成方法、半導体集積回路の故障解析装置、およびテストベクタを生成するためのプログラム

Publications (3)

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JP2004150820A JP2004150820A (ja) 2004-05-27
JP2004150820A5 JP2004150820A5 (enExample) 2005-03-17
JP3833984B2 true JP3833984B2 (ja) 2006-10-18

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JP2002313172A Expired - Fee Related JP3833984B2 (ja) 2002-10-28 2002-10-28 テストベクタの生成装置、テストベクタの生成方法、半導体集積回路の故障解析装置、およびテストベクタを生成するためのプログラム

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US (1) US7120890B2 (enExample)
JP (1) JP3833984B2 (enExample)

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JP4554340B2 (ja) * 2004-11-19 2010-09-29 株式会社半導体理工学研究センター テストパターンの圧縮方法および装置、並びに、テストパターンの圧縮プログラムおよび該プログラムを記録した媒体
US7516430B2 (en) * 2004-12-23 2009-04-07 International Business Machines Corporation Generating testcases based on numbers of testcases previously generated
JP2006250651A (ja) * 2005-03-09 2006-09-21 Fujitsu Ltd テストパターン生成支援装置、テストパターン生成支援方法、テストパターン生成支援プログラム、および記録媒体
US7401317B1 (en) * 2005-05-12 2008-07-15 Altera Corporation Method and system for rapidly identifying silicon manufacturing defects
US7970594B2 (en) * 2005-06-30 2011-06-28 The Mathworks, Inc. System and method for using model analysis to generate directed test vectors
US7428715B2 (en) * 2005-10-27 2008-09-23 International Business Machines Corporation Hole query for functional coverage analysis
JP4861734B2 (ja) 2006-03-30 2012-01-25 富士通株式会社 故障解析プログラム、該プログラムを記録した記録媒体、故障解析方法、および故障解析装置
US8423226B2 (en) 2006-06-14 2013-04-16 Service Solutions U.S. Llc Dynamic decision sequencing method and apparatus for optimizing a diagnostic test plan
US8762165B2 (en) 2006-06-14 2014-06-24 Bosch Automotive Service Solutions Llc Optimizing test procedures for a subject under test
US9081883B2 (en) 2006-06-14 2015-07-14 Bosch Automotive Service Solutions Inc. Dynamic decision sequencing method and apparatus for optimizing a diagnostic test plan
US8428813B2 (en) 2006-06-14 2013-04-23 Service Solutions Us Llc Dynamic decision sequencing method and apparatus for optimizing a diagnostic test plan
US7643916B2 (en) 2006-06-14 2010-01-05 Spx Corporation Vehicle state tracking method and apparatus for diagnostic testing
US7958407B2 (en) * 2006-06-30 2011-06-07 Spx Corporation Conversion of static diagnostic procedure to dynamic test plan method and apparatus
JP2008224315A (ja) * 2007-03-09 2008-09-25 Nec Electronics Corp テストパターン生成装置およびテストパターン生成方法
JP4886615B2 (ja) 2007-06-22 2012-02-29 ルネサスエレクトロニクス株式会社 テスト装置及びパタン生成装置
US7480882B1 (en) * 2008-03-16 2009-01-20 International Business Machines Corporation Measuring and predicting VLSI chip reliability and failure
US8239094B2 (en) 2008-04-23 2012-08-07 Spx Corporation Test requirement list for diagnostic tests
JP5032395B2 (ja) * 2008-05-16 2012-09-26 川崎マイクロエレクトロニクス株式会社 テスト条件の生成方法およびテスト条件生成装置
US8060852B1 (en) * 2009-06-23 2011-11-15 Cadence Design Systems, Inc. Method and system for screening nets in a post-layout environment
US8648700B2 (en) 2009-06-23 2014-02-11 Bosch Automotive Service Solutions Llc Alerts issued upon component detection failure
JP5625297B2 (ja) * 2009-09-25 2014-11-19 富士通株式会社 ディレイテスト装置、ディレイテスト方法及びディレイテストプログラム
US8386866B2 (en) * 2010-08-17 2013-02-26 Eigenix Methods for implementing variable speed scan testing
CN102231687A (zh) * 2011-06-29 2011-11-02 华为技术有限公司 一种链路故障探测方法及装置
US8543953B2 (en) * 2012-01-04 2013-09-24 Apple Inc. Automated stimulus steering during simulation of an integrated circuit design
CN103064013B (zh) * 2012-12-19 2014-12-31 北京自动测试技术研究所 一种基于故障模型的集成电路测试方法
JP2015056166A (ja) * 2013-09-13 2015-03-23 株式会社東芝 Ｉｏ回路設計方法
CN120522548B (zh) * 2025-07-21 2025-10-21 武汉衡惯科技发展有限公司 一种晶圆级惯性器件测试路径规划方法及系统

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JP2004150820A (ja) 2004-05-27
US7120890B2 (en) 2006-10-10

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