JP3804974B2 - スパッタリングターゲット組立体のオートクレーブボンディング - Google Patents
スパッタリングターゲット組立体のオートクレーブボンディング Download PDFInfo
- Publication number
- JP3804974B2 JP3804974B2 JP52282796A JP52282796A JP3804974B2 JP 3804974 B2 JP3804974 B2 JP 3804974B2 JP 52282796 A JP52282796 A JP 52282796A JP 52282796 A JP52282796 A JP 52282796A JP 3804974 B2 JP3804974 B2 JP 3804974B2
- Authority
- JP
- Japan
- Prior art keywords
- temperature
- bonding
- pressure
- unbonded sandwich
- unbonded
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000005477 sputtering target Methods 0.000 title claims description 53
- 230000000712 assembly Effects 0.000 title description 4
- 238000000429 assembly Methods 0.000 title description 4
- 238000000034 method Methods 0.000 claims description 93
- 229910000679 solder Inorganic materials 0.000 claims description 90
- 239000013077 target material Substances 0.000 claims description 54
- 239000000463 material Substances 0.000 claims description 44
- 239000007789 gas Substances 0.000 claims description 40
- 239000000853 adhesive Substances 0.000 claims description 31
- 230000001070 adhesive effect Effects 0.000 claims description 31
- 238000001816 cooling Methods 0.000 claims description 24
- 230000008569 process Effects 0.000 claims description 18
- 125000006850 spacer group Chemical group 0.000 claims description 16
- 238000003825 pressing Methods 0.000 claims description 14
- 238000005476 soldering Methods 0.000 claims description 13
- 239000012809 cooling fluid Substances 0.000 claims description 12
- 238000003466 welding Methods 0.000 claims description 12
- 238000000151 deposition Methods 0.000 claims description 11
- 238000004519 manufacturing process Methods 0.000 claims description 10
- 239000011261 inert gas Substances 0.000 claims description 9
- 238000002844 melting Methods 0.000 claims description 9
- 230000008018 melting Effects 0.000 claims description 9
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims description 7
- 238000007872 degassing Methods 0.000 claims description 7
- 239000001301 oxygen Substances 0.000 claims description 7
- 229910052760 oxygen Inorganic materials 0.000 claims description 7
- UGFAIRIUMAVXCW-UHFFFAOYSA-N Carbon monoxide Chemical compound [O+]#[C-] UGFAIRIUMAVXCW-UHFFFAOYSA-N 0.000 claims description 5
- 229910002091 carbon monoxide Inorganic materials 0.000 claims description 5
- 238000010438 heat treatment Methods 0.000 claims description 5
- 238000007789 sealing Methods 0.000 claims description 5
- 238000009826 distribution Methods 0.000 claims description 4
- 239000000155 melt Substances 0.000 claims description 4
- 239000011800 void material Substances 0.000 claims description 4
- 239000012530 fluid Substances 0.000 claims description 3
- 238000010030 laminating Methods 0.000 claims 5
- 238000009736 wetting Methods 0.000 claims 3
- 238000002360 preparation method Methods 0.000 claims 2
- 238000007711 solidification Methods 0.000 claims 1
- 230000008023 solidification Effects 0.000 claims 1
- 239000010408 film Substances 0.000 description 48
- 239000010410 layer Substances 0.000 description 31
- 238000004544 sputter deposition Methods 0.000 description 21
- 239000000565 sealant Substances 0.000 description 18
- 239000004593 Epoxy Substances 0.000 description 14
- 239000000758 substrate Substances 0.000 description 14
- 238000012545 processing Methods 0.000 description 12
- 239000004677 Nylon Substances 0.000 description 10
- 229920001778 nylon Polymers 0.000 description 10
- 230000004888 barrier function Effects 0.000 description 9
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 8
- 229910052738 indium Inorganic materials 0.000 description 8
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 8
- 239000004952 Polyamide Substances 0.000 description 7
- 229920002647 polyamide Polymers 0.000 description 7
- 229910052751 metal Inorganic materials 0.000 description 6
- 239000002184 metal Substances 0.000 description 6
- 229910052710 silicon Inorganic materials 0.000 description 6
- 229910000838 Al alloy Inorganic materials 0.000 description 5
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 5
- 229910052782 aluminium Inorganic materials 0.000 description 5
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 5
- 230000008859 change Effects 0.000 description 5
- 239000011248 coating agent Substances 0.000 description 5
- 238000000576 coating method Methods 0.000 description 5
- 229910052719 titanium Inorganic materials 0.000 description 5
- 239000010936 titanium Substances 0.000 description 5
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 4
- 239000012298 atmosphere Substances 0.000 description 4
- 239000011324 bead Substances 0.000 description 4
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 4
- 229910052757 nitrogen Inorganic materials 0.000 description 4
- 239000010703 silicon Substances 0.000 description 4
- 238000004381 surface treatment Methods 0.000 description 4
- 235000012431 wafers Nutrition 0.000 description 4
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 3
- 239000002313 adhesive film Substances 0.000 description 3
- 238000011109 contamination Methods 0.000 description 3
- 230000008878 coupling Effects 0.000 description 3
- 238000010168 coupling process Methods 0.000 description 3
- 238000005859 coupling reaction Methods 0.000 description 3
- 230000009977 dual effect Effects 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 238000010292 electrical insulation Methods 0.000 description 3
- 238000010894 electron beam technology Methods 0.000 description 3
- 150000002500 ions Chemical class 0.000 description 3
- 238000001755 magnetron sputter deposition Methods 0.000 description 3
- 150000002739 metals Chemical class 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 238000005086 pumping Methods 0.000 description 3
- 238000010926 purge Methods 0.000 description 3
- 239000010409 thin film Substances 0.000 description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 3
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 2
- 239000002253 acid Substances 0.000 description 2
- 239000012790 adhesive layer Substances 0.000 description 2
- 230000002411 adverse Effects 0.000 description 2
- 229910052799 carbon Inorganic materials 0.000 description 2
- 239000000356 contaminant Substances 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 238000007373 indentation Methods 0.000 description 2
- 239000002245 particle Substances 0.000 description 2
- 238000007747 plating Methods 0.000 description 2
- 239000011347 resin Substances 0.000 description 2
- 229920005989 resin Polymers 0.000 description 2
- -1 Inc. Substances 0.000 description 1
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 1
- 229920002302 Nylon 6,6 Polymers 0.000 description 1
- 230000002745 absorbent Effects 0.000 description 1
- 239000002250 absorbent Substances 0.000 description 1
- 239000011825 aerospace material Substances 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 238000011074 autoclave method Methods 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000006664 bond formation reaction Methods 0.000 description 1
- 230000001680 brushing effect Effects 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 239000012141 concentrate Substances 0.000 description 1
- 230000003750 conditioning effect Effects 0.000 description 1
- 239000000110 cooling liquid Substances 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 238000005238 degreasing Methods 0.000 description 1
- 238000005137 deposition process Methods 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 229920001971 elastomer Polymers 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 239000004744 fabric Substances 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 238000007667 floating Methods 0.000 description 1
- NBVXSUQYWXRMNV-UHFFFAOYSA-N fluoromethane Chemical compound FC NBVXSUQYWXRMNV-UHFFFAOYSA-N 0.000 description 1
- 239000011888 foil Substances 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 229910003437 indium oxide Inorganic materials 0.000 description 1
- PJXISJQVUVHSOJ-UHFFFAOYSA-N indium(iii) oxide Chemical compound [O-2].[O-2].[O-2].[In+3].[In+3] PJXISJQVUVHSOJ-UHFFFAOYSA-N 0.000 description 1
- 238000010849 ion bombardment Methods 0.000 description 1
- 230000013011 mating Effects 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 239000011733 molybdenum Substances 0.000 description 1
- 238000000465 moulding Methods 0.000 description 1
- 229920006284 nylon film Polymers 0.000 description 1
- 239000003921 oil Substances 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 230000001590 oxidative effect Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000000053 physical method Methods 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 229920000728 polyester Polymers 0.000 description 1
- 229920006267 polyester film Polymers 0.000 description 1
- 229920001296 polysiloxane Polymers 0.000 description 1
- 239000004810 polytetrafluoroethylene Substances 0.000 description 1
- 229920001343 polytetrafluoroethylene Polymers 0.000 description 1
- 230000037452 priming Effects 0.000 description 1
- 238000004064 recycling Methods 0.000 description 1
- 239000003870 refractory metal Substances 0.000 description 1
- 239000005060 rubber Substances 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 229910021332 silicide Inorganic materials 0.000 description 1
- 235000012239 silicon dioxide Nutrition 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 239000013464 silicone adhesive Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000000992 sputter etching Methods 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 229920003051 synthetic elastomer Polymers 0.000 description 1
- 239000005061 synthetic rubber Substances 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 1
- MAKDTFFYCIMFQP-UHFFFAOYSA-N titanium tungsten Chemical compound [Ti].[W] MAKDTFFYCIMFQP-UHFFFAOYSA-N 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
- 238000013022 venting Methods 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3488—Constructional details of particle beam apparatus not otherwise provided for, e.g. arrangement, mounting, housing, environment; special provisions for cleaning or maintenance of the apparatus
- H01J37/3491—Manufacturing of targets
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Organic Chemistry (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- Physical Vapour Deposition (AREA)
- Electrodes Of Semiconductors (AREA)
- Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/US1995/001089 WO1996023085A1 (en) | 1995-01-25 | 1995-01-25 | Autoclave bonding of sputtering target assembly |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH10502707A JPH10502707A (ja) | 1998-03-10 |
JP3804974B2 true JP3804974B2 (ja) | 2006-08-02 |
Family
ID=22248573
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP52282796A Expired - Lifetime JP3804974B2 (ja) | 1995-01-25 | 1995-01-25 | スパッタリングターゲット組立体のオートクレーブボンディング |
Country Status (5)
Country | Link |
---|---|
EP (1) | EP0752017A1 (enrdf_load_stackoverflow) |
JP (1) | JP3804974B2 (enrdf_load_stackoverflow) |
AU (1) | AU1834795A (enrdf_load_stackoverflow) |
TW (1) | TW317518B (enrdf_load_stackoverflow) |
WO (1) | WO1996023085A1 (enrdf_load_stackoverflow) |
Families Citing this family (28)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3983862B2 (ja) * | 1997-10-24 | 2007-09-26 | Dowaホールディングス株式会社 | スパッタリングターゲットとその接合方法及び接合装置 |
US6506289B2 (en) * | 2000-08-07 | 2003-01-14 | Symmorphix, Inc. | Planar optical devices and methods for their manufacture |
US7469558B2 (en) | 2001-07-10 | 2008-12-30 | Springworks, Llc | As-deposited planar optical waveguides with low scattering loss and methods for their manufacture |
US7404877B2 (en) | 2001-11-09 | 2008-07-29 | Springworks, Llc | Low temperature zirconia based thermal barrier layer by PVD |
US7378356B2 (en) | 2002-03-16 | 2008-05-27 | Springworks, Llc | Biased pulse DC reactive sputtering of oxide films |
US6884327B2 (en) | 2002-03-16 | 2005-04-26 | Tao Pan | Mode size converter for a planar waveguide |
US20070264564A1 (en) | 2006-03-16 | 2007-11-15 | Infinite Power Solutions, Inc. | Thin film battery on an integrated circuit or circuit board and method thereof |
US9793523B2 (en) | 2002-08-09 | 2017-10-17 | Sapurast Research Llc | Electrochemical apparatus with barrier layer protected substrate |
WO2004021532A1 (en) | 2002-08-27 | 2004-03-11 | Symmorphix, Inc. | Optically coupling into highly uniform waveguides |
EP1597408B1 (en) | 2003-02-27 | 2012-12-05 | Symmorphix, Inc. | Method for forming dielectric barrier layers |
US7238628B2 (en) | 2003-05-23 | 2007-07-03 | Symmorphix, Inc. | Energy conversion and storage films and devices by physical vapor deposition of titanium and titanium oxides and sub-oxides |
WO2006063308A2 (en) | 2004-12-08 | 2006-06-15 | Symmorphix, Inc. | DEPOSITION OF LICoO2 |
US7959769B2 (en) | 2004-12-08 | 2011-06-14 | Infinite Power Solutions, Inc. | Deposition of LiCoO2 |
US7838133B2 (en) | 2005-09-02 | 2010-11-23 | Springworks, Llc | Deposition of perovskite and other compound ceramic films for dielectric applications |
US8342383B2 (en) | 2006-07-06 | 2013-01-01 | Praxair Technology, Inc. | Method for forming sputter target assemblies having a controlled solder thickness |
US8197781B2 (en) | 2006-11-07 | 2012-06-12 | Infinite Power Solutions, Inc. | Sputtering target of Li3PO4 and method for producing same |
JP5551612B2 (ja) | 2007-12-21 | 2014-07-16 | インフィニット パワー ソリューションズ, インコーポレイテッド | 電解質膜のための標的をスパッタリングする方法 |
US8518581B2 (en) | 2008-01-11 | 2013-08-27 | Inifinite Power Solutions, Inc. | Thin film encapsulation for thin film batteries and other devices |
US20100012488A1 (en) * | 2008-07-15 | 2010-01-21 | Koenigsmann Holger J | Sputter target assembly having a low-temperature high-strength bond |
EP2319101B1 (en) | 2008-08-11 | 2015-11-04 | Sapurast Research LLC | Energy device with integral collector surface for electromagnetic energy harvesting and method thereof |
EP2474056B1 (en) | 2009-09-01 | 2016-05-04 | Sapurast Research LLC | Printed circuit board with integrated thin film battery |
EP2577777B1 (en) | 2010-06-07 | 2016-12-28 | Sapurast Research LLC | Rechargeable, high-density electrochemical device |
KR101240204B1 (ko) * | 2011-12-19 | 2013-03-07 | 주식회사 나노신소재 | 원통형 스퍼터링 타겟의 제조방법 |
CN107914075A (zh) * | 2017-11-14 | 2018-04-17 | 宁波江丰电子材料股份有限公司 | 靶材焊接方法 |
JP7311290B2 (ja) * | 2019-03-27 | 2023-07-19 | Jx金属株式会社 | 分割スパッタリングターゲット及びその製造方法 |
JP7250723B2 (ja) | 2020-03-31 | 2023-04-03 | Jx金属株式会社 | スパッタリングターゲット及びスパッタリングターゲットの製造方法 |
CN113070685B (zh) * | 2021-03-26 | 2022-05-03 | 安徽江淮汽车集团股份有限公司 | 包边与点焊一体化模具 |
CN113458523A (zh) * | 2021-07-05 | 2021-10-01 | 宁波江丰电子材料股份有限公司 | 一种钽靶材组件的焊接方法 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63270459A (ja) * | 1987-04-24 | 1988-11-08 | Matsushita Electric Ind Co Ltd | スパツタ用タ−ゲツトのボンデイング方法 |
JP2731152B2 (ja) * | 1987-11-17 | 1998-03-25 | 日立金属株式会社 | 冷却部材付きスパッタリング用ターゲット |
JPH03140464A (ja) * | 1989-10-26 | 1991-06-14 | Kobe Steel Ltd | ターゲットのバッキング装置 |
GB9108553D0 (en) * | 1991-04-22 | 1991-06-05 | Ion Coat Ltd | Ionised vapour source |
-
1995
- 1995-01-25 AU AU18347/95A patent/AU1834795A/en not_active Abandoned
- 1995-01-25 JP JP52282796A patent/JP3804974B2/ja not_active Expired - Lifetime
- 1995-01-25 WO PCT/US1995/001089 patent/WO1996023085A1/en not_active Application Discontinuation
- 1995-01-25 EP EP95910130A patent/EP0752017A1/en not_active Withdrawn
- 1995-05-22 TW TW084105089A patent/TW317518B/zh not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
EP0752017A1 (en) | 1997-01-08 |
AU1834795A (en) | 1996-08-14 |
JPH10502707A (ja) | 1998-03-10 |
WO1996023085A1 (en) | 1996-08-01 |
TW317518B (enrdf_load_stackoverflow) | 1997-10-11 |
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