JP3804619B2 - 放射線検査装置 - Google Patents
放射線検査装置 Download PDFInfo
- Publication number
- JP3804619B2 JP3804619B2 JP2003067103A JP2003067103A JP3804619B2 JP 3804619 B2 JP3804619 B2 JP 3804619B2 JP 2003067103 A JP2003067103 A JP 2003067103A JP 2003067103 A JP2003067103 A JP 2003067103A JP 3804619 B2 JP3804619 B2 JP 3804619B2
- Authority
- JP
- Japan
- Prior art keywords
- inspection
- exclusion
- radiation
- common area
- image processing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/043—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using fluoroscopic examination, with visual observation or video transmission of fluoroscopic images
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/59—Transmissivity
- G01N21/5907—Densitometers
- G01N2021/5957—Densitometers using an image detector type detector, e.g. CCD
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/652—Specific applications or type of materials impurities, foreign matter, trace amounts
Landscapes
- Health & Medical Sciences (AREA)
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Sorting Of Articles (AREA)
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003067103A JP3804619B2 (ja) | 2003-03-12 | 2003-03-12 | 放射線検査装置 |
CNB2004100012039A CN100353159C (zh) | 2003-03-12 | 2004-01-02 | 放射线检查装置 |
KR1020040009895A KR100687171B1 (ko) | 2003-03-12 | 2004-02-16 | 방사선 검사장치 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003067103A JP3804619B2 (ja) | 2003-03-12 | 2003-03-12 | 放射線検査装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2004279059A JP2004279059A (ja) | 2004-10-07 |
JP3804619B2 true JP3804619B2 (ja) | 2006-08-02 |
Family
ID=33284814
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2003067103A Expired - Fee Related JP3804619B2 (ja) | 2003-03-12 | 2003-03-12 | 放射線検査装置 |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP3804619B2 (zh) |
KR (1) | KR100687171B1 (zh) |
CN (1) | CN100353159C (zh) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4531547B2 (ja) * | 2004-12-14 | 2010-08-25 | アンリツ産機システム株式会社 | X線異物検出装置 |
JP5933199B2 (ja) * | 2011-07-07 | 2016-06-08 | アンリツインフィビス株式会社 | X線検査装置 |
JP2017167059A (ja) * | 2016-03-17 | 2017-09-21 | 株式会社イシダ | 光検査装置 |
CN107321646B (zh) * | 2017-07-26 | 2019-04-30 | 成都理工大学 | 放射性矿石分选系统 |
JP7182927B2 (ja) * | 2018-07-18 | 2022-12-05 | 株式会社ニチレイフーズ | 莢豆の検査方法及び莢豆食品の製造方法 |
WO2020161828A1 (ja) * | 2019-02-06 | 2020-08-13 | 株式会社Fuji | ワーク検査装置およびワーク検査方法 |
JP2022107386A (ja) | 2021-01-08 | 2022-07-21 | 株式会社イシダ | X線検査システム、x線検査装置、x線検査方法 |
CN115482171B (zh) * | 2022-09-27 | 2023-05-02 | 瑞石心禾(河北)医疗科技有限公司 | 一种用于伽马相机的均匀性的校正方法与装置 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH09240830A (ja) * | 1996-03-01 | 1997-09-16 | Nikka Densoku Kk | 軟質物搬送装置および軟質物検査装置 |
JPH10208046A (ja) * | 1997-01-21 | 1998-08-07 | Shimadzu Corp | X線異物検出方法 |
CN1047848C (zh) * | 1997-02-26 | 1999-12-29 | 中国科学院上海技术物理研究所 | 光电子棉花杂质自动在线检测方法与装置 |
CN1143630C (zh) * | 1999-06-08 | 2004-03-31 | 日本烟草产业株式会社 | 原料中的夹杂物检测装置及其检测方法 |
KR100636090B1 (ko) * | 1999-06-11 | 2006-10-19 | 삼성전자주식회사 | 액정 프로젝션 시스템 |
JP3656566B2 (ja) * | 2001-04-17 | 2005-06-08 | 株式会社島津製作所 | 放射線検査装置 |
-
2003
- 2003-03-12 JP JP2003067103A patent/JP3804619B2/ja not_active Expired - Fee Related
-
2004
- 2004-01-02 CN CNB2004100012039A patent/CN100353159C/zh not_active Expired - Fee Related
- 2004-02-16 KR KR1020040009895A patent/KR100687171B1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
CN1530644A (zh) | 2004-09-22 |
KR20040080961A (ko) | 2004-09-20 |
CN100353159C (zh) | 2007-12-05 |
KR100687171B1 (ko) | 2007-02-27 |
JP2004279059A (ja) | 2004-10-07 |
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