JP3804619B2 - 放射線検査装置 - Google Patents

放射線検査装置 Download PDF

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Publication number
JP3804619B2
JP3804619B2 JP2003067103A JP2003067103A JP3804619B2 JP 3804619 B2 JP3804619 B2 JP 3804619B2 JP 2003067103 A JP2003067103 A JP 2003067103A JP 2003067103 A JP2003067103 A JP 2003067103A JP 3804619 B2 JP3804619 B2 JP 3804619B2
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JP
Japan
Prior art keywords
inspection
exclusion
radiation
common area
image processing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2003067103A
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English (en)
Japanese (ja)
Other versions
JP2004279059A (ja
Inventor
良一 澤田
俊道 政木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP2003067103A priority Critical patent/JP3804619B2/ja
Priority to CNB2004100012039A priority patent/CN100353159C/zh
Priority to KR1020040009895A priority patent/KR100687171B1/ko
Publication of JP2004279059A publication Critical patent/JP2004279059A/ja
Application granted granted Critical
Publication of JP3804619B2 publication Critical patent/JP3804619B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/043—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using fluoroscopic examination, with visual observation or video transmission of fluoroscopic images
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/59—Transmissivity
    • G01N21/5907—Densitometers
    • G01N2021/5957—Densitometers using an image detector type detector, e.g. CCD
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/652—Specific applications or type of materials impurities, foreign matter, trace amounts

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  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Sorting Of Articles (AREA)
JP2003067103A 2003-03-12 2003-03-12 放射線検査装置 Expired - Fee Related JP3804619B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2003067103A JP3804619B2 (ja) 2003-03-12 2003-03-12 放射線検査装置
CNB2004100012039A CN100353159C (zh) 2003-03-12 2004-01-02 放射线检查装置
KR1020040009895A KR100687171B1 (ko) 2003-03-12 2004-02-16 방사선 검사장치

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003067103A JP3804619B2 (ja) 2003-03-12 2003-03-12 放射線検査装置

Publications (2)

Publication Number Publication Date
JP2004279059A JP2004279059A (ja) 2004-10-07
JP3804619B2 true JP3804619B2 (ja) 2006-08-02

Family

ID=33284814

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003067103A Expired - Fee Related JP3804619B2 (ja) 2003-03-12 2003-03-12 放射線検査装置

Country Status (3)

Country Link
JP (1) JP3804619B2 (zh)
KR (1) KR100687171B1 (zh)
CN (1) CN100353159C (zh)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4531547B2 (ja) * 2004-12-14 2010-08-25 アンリツ産機システム株式会社 Ｘ線異物検出装置
JP5933199B2 (ja) * 2011-07-07 2016-06-08 アンリツインフィビス株式会社 Ｘ線検査装置
JP2017167059A (ja) * 2016-03-17 2017-09-21 株式会社イシダ 光検査装置
CN107321646B (zh) * 2017-07-26 2019-04-30 成都理工大学 放射性矿石分选系统
JP7182927B2 (ja) * 2018-07-18 2022-12-05 株式会社ニチレイフーズ 莢豆の検査方法及び莢豆食品の製造方法
WO2020161828A1 (ja) * 2019-02-06 2020-08-13 株式会社Ｆｕｊｉ ワーク検査装置およびワーク検査方法
JP2022107386A (ja) 2021-01-08 2022-07-21 株式会社イシダ Ｘ線検査システム、ｘ線検査装置、ｘ線検査方法
CN115482171B (zh) * 2022-09-27 2023-05-02 瑞石心禾(河北)医疗科技有限公司 一种用于伽马相机的均匀性的校正方法与装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09240830A (ja) * 1996-03-01 1997-09-16 Nikka Densoku Kk 軟質物搬送装置および軟質物検査装置
JPH10208046A (ja) * 1997-01-21 1998-08-07 Shimadzu Corp Ｘ線異物検出方法
CN1047848C (zh) * 1997-02-26 1999-12-29 中国科学院上海技术物理研究所 光电子棉花杂质自动在线检测方法与装置
CN1143630C (zh) * 1999-06-08 2004-03-31 日本烟草产业株式会社 原料中的夹杂物检测装置及其检测方法
KR100636090B1 (ko) * 1999-06-11 2006-10-19 삼성전자주식회사 액정 프로젝션 시스템
JP3656566B2 (ja) * 2001-04-17 2005-06-08 株式会社島津製作所 放射線検査装置

Also Published As

Publication number Publication date
CN1530644A (zh) 2004-09-22
KR20040080961A (ko) 2004-09-20
CN100353159C (zh) 2007-12-05
KR100687171B1 (ko) 2007-02-27
JP2004279059A (ja) 2004-10-07

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