JP3426107B2 - 容量型センサのインターフェース回路 - Google Patents

容量型センサのインターフェース回路

Info

Publication number
JP3426107B2
JP3426107B2 JP12742497A JP12742497A JP3426107B2 JP 3426107 B2 JP3426107 B2 JP 3426107B2 JP 12742497 A JP12742497 A JP 12742497A JP 12742497 A JP12742497 A JP 12742497A JP 3426107 B2 JP3426107 B2 JP 3426107B2
Authority
JP
Japan
Prior art keywords
operational amplifier
capacitor
inverting input
terminal
capacitors
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP12742497A
Other languages
English (en)
Japanese (ja)
Other versions
JPH10319036A (ja
Inventor
政広 番
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP12742497A priority Critical patent/JP3426107B2/ja
Priority to US08/962,357 priority patent/US5986497A/en
Priority to DE1997153682 priority patent/DE19753682C2/de
Publication of JPH10319036A publication Critical patent/JPH10319036A/ja
Application granted granted Critical
Publication of JP3426107B2 publication Critical patent/JP3426107B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2605—Measuring capacitance

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Transmission And Conversion Of Sensor Element Output (AREA)
JP12742497A 1997-05-16 1997-05-16 容量型センサのインターフェース回路 Expired - Fee Related JP3426107B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP12742497A JP3426107B2 (ja) 1997-05-16 1997-05-16 容量型センサのインターフェース回路
US08/962,357 US5986497A (en) 1997-05-16 1997-10-31 Interface circuit for capacitive sensor
DE1997153682 DE19753682C2 (de) 1997-05-16 1997-12-03 Schnittstellenschaltung für einen kapazitiven Sensor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12742497A JP3426107B2 (ja) 1997-05-16 1997-05-16 容量型センサのインターフェース回路

Publications (2)

Publication Number Publication Date
JPH10319036A JPH10319036A (ja) 1998-12-04
JP3426107B2 true JP3426107B2 (ja) 2003-07-14

Family

ID=14959623

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12742497A Expired - Fee Related JP3426107B2 (ja) 1997-05-16 1997-05-16 容量型センサのインターフェース回路

Country Status (2)

Country Link
JP (1) JP3426107B2 (de)
DE (1) DE19753682C2 (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3264884B2 (ja) * 1998-05-11 2002-03-11 三菱電機株式会社 容量検出回路
DE10035192C1 (de) 2000-07-20 2001-10-11 Carl Mahr Holding Gmbh Kapazitiver Wegaufnehmer für stromsparende Messgeräte
DE10134680A1 (de) * 2001-07-20 2003-02-06 Endress & Hauser Gmbh & Co Kg Schaltungsanrdnung für einen kapazitiven Sensor
EP1548409A1 (de) 2003-12-23 2005-06-29 Dialog Semiconductor GmbH Kapazitive Differenzmessung
CN108918980B (zh) * 2018-07-25 2021-04-06 济南大学 一种电容信号测量电路及测量方法
CN113063964B (zh) * 2021-03-23 2023-07-14 西安微电子技术研究所 一种温度补偿型石英挠性加速度计伺服电路及石英挠性加速度计

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3579524B2 (ja) * 1995-09-08 2004-10-20 セイコープレシジョン株式会社 測距装置および測距方法

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
Ｈ．ＬＥＵＴＨＯＬＤ ａｎｄ Ｆ．ＲＵＤＯＬＦ，Ａｎ ＡＳＩＣ ｆｏｒ Ｈｉｇｈ−ｒｅｓｏｌｕｔｉｏｎ Ｃａｐａｃｉｔｉｖｅ Ｍｉｃｒｏａｃｃｅｌｅｒｏｍｅｔｅｒ，Ｓｅｎｓｏｒｓ ａｎｄ Ａｃｔｕａｔｏｒｓ，１９９０年，Ａ２１−Ａ２３，２７８−２８１
ＫＥＮＺＯ ＷＡＴＡＮＡＢＥ ａｎｄ ＷＯＮ−ＳＵＰ ＣＨＵＮＧ，Ａ Ｓｗｉｔｃｈｅｄ−Ｃａｐａｃｉｔｏｒ Ｉｎｔｅｒｆａｃｅ ｆｏｒ Ｉｎｔｅｌｌｉｇｅｎｔ Ｃａｐａｃｉｔｉｖｅ Ｔｒａｎｓｄｕｃｅｒｓ，ＩＥＥＥ ＴＲＡＮＳＡＣＴＩＯＮ ＩＮＳＴＲＵＭＥＮＴＡＴＩＯＮ ＡＮＤ ＭＥＡＳＵＲＥＭＥＮＴ，１９８６年１２月，ＶＯＬ．ＩＭ−３５／Ｎｏ．４，４７２−４７６

Also Published As

Publication number Publication date
JPH10319036A (ja) 1998-12-04
DE19753682A1 (de) 1998-11-19
DE19753682C2 (de) 2000-02-10

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