JP2981079B2 - 平面状物品の研磨装置 - Google Patents
平面状物品の研磨装置Info
- Publication number
- JP2981079B2 JP2981079B2 JP9844393A JP9844393A JP2981079B2 JP 2981079 B2 JP2981079 B2 JP 2981079B2 JP 9844393 A JP9844393 A JP 9844393A JP 9844393 A JP9844393 A JP 9844393A JP 2981079 B2 JP2981079 B2 JP 2981079B2
- Authority
- JP
- Japan
- Prior art keywords
- polishing
- slurry
- wafer
- polishing pad
- pad
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000005498 polishing Methods 0.000 title claims description 62
- 239000002002 slurry Substances 0.000 claims description 30
- 238000003756 stirring Methods 0.000 claims description 2
- 239000004065 semiconductor Substances 0.000 description 7
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 229910052451 lead zirconate titanate Inorganic materials 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000002093 peripheral effect Effects 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 241000233805 Phoenix Species 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 229910003460 diamond Inorganic materials 0.000 description 1
- 239000010432 diamond Substances 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- HFGPZNIAWCZYJU-UHFFFAOYSA-N lead zirconate titanate Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Ti+4].[Zr+4].[Pb+2] HFGPZNIAWCZYJU-UHFFFAOYSA-N 0.000 description 1
- 230000000873 masking effect Effects 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 235000012239 silicon dioxide Nutrition 0.000 description 1
- 239000000725 suspension Substances 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
- B24B37/07—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool
- B24B37/10—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for single side lapping
- B24B37/105—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for single side lapping the workpieces or work carriers being actively moved by a drive, e.g. in a combined rotary and translatory movement
- B24B37/107—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for single side lapping the workpieces or work carriers being actively moved by a drive, e.g. in a combined rotary and translatory movement in a rotary movement only, about an axis being stationary during lapping
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B1/00—Processes of grinding or polishing; Use of auxiliary equipment in connection with such processes
- B24B1/04—Processes of grinding or polishing; Use of auxiliary equipment in connection with such processes subjecting the grinding or polishing tools, the abrading or polishing medium or work to vibration, e.g. grinding with ultrasonic frequency
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Grinding And Polishing Of Tertiary Curved Surfaces And Surfaces With Complex Shapes (AREA)
- Grinding-Machine Dressing And Accessory Apparatuses (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US862044 | 1992-04-02 | ||
| US07/862,044 US5245796A (en) | 1992-04-02 | 1992-04-02 | Slurry polisher using ultrasonic agitation |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH068134A JPH068134A (ja) | 1994-01-18 |
| JP2981079B2 true JP2981079B2 (ja) | 1999-11-22 |
Family
ID=25337489
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9844393A Expired - Lifetime JP2981079B2 (ja) | 1992-04-02 | 1993-04-02 | 平面状物品の研磨装置 |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US5245796A (enExample) |
| EP (1) | EP0566258B1 (enExample) |
| JP (1) | JP2981079B2 (enExample) |
| KR (1) | KR930022483A (enExample) |
| DE (1) | DE69303109T2 (enExample) |
| ES (1) | ES2088228T3 (enExample) |
| HK (1) | HK180296A (enExample) |
| TW (1) | TW197531B (enExample) |
Families Citing this family (98)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5384986A (en) * | 1992-09-24 | 1995-01-31 | Ebara Corporation | Polishing apparatus |
| US5340036A (en) * | 1993-05-19 | 1994-08-23 | Emerson Electric Co. | Dry waste grinder |
| US5531861A (en) * | 1993-09-29 | 1996-07-02 | Motorola, Inc. | Chemical-mechanical-polishing pad cleaning process for use during the fabrication of semiconductor devices |
| US5456627A (en) * | 1993-12-20 | 1995-10-10 | Westech Systems, Inc. | Conditioner for a polishing pad and method therefor |
| US5551907A (en) * | 1994-03-14 | 1996-09-03 | Hughes Aircraft Company | System for ultrasonic lap grinding and polishing |
| US5562530A (en) * | 1994-08-02 | 1996-10-08 | Sematech, Inc. | Pulsed-force chemical mechanical polishing |
| US5783497A (en) * | 1994-08-02 | 1998-07-21 | Sematech, Inc. | Forced-flow wafer polisher |
| US5607341A (en) | 1994-08-08 | 1997-03-04 | Leach; Michael A. | Method and structure for polishing a wafer during manufacture of integrated circuits |
| US5522965A (en) * | 1994-12-12 | 1996-06-04 | Texas Instruments Incorporated | Compact system and method for chemical-mechanical polishing utilizing energy coupled to the polishing pad/water interface |
| US5688364A (en) * | 1994-12-22 | 1997-11-18 | Sony Corporation | Chemical-mechanical polishing method and apparatus using ultrasound applied to the carrier and platen |
| US5591068A (en) * | 1995-03-13 | 1997-01-07 | Regents Of The University Of California | Precision non-contact polishing tool |
| JP2647050B2 (ja) * | 1995-03-31 | 1997-08-27 | 日本電気株式会社 | ウェハ研磨装置 |
| US5672095A (en) * | 1995-09-29 | 1997-09-30 | Intel Corporation | Elimination of pad conditioning in a chemical mechanical polishing process |
| US5709593A (en) * | 1995-10-27 | 1998-01-20 | Applied Materials, Inc. | Apparatus and method for distribution of slurry in a chemical mechanical polishing system |
| KR100445139B1 (ko) * | 1996-01-23 | 2004-11-17 | 가부시키 가이샤 에바라 세이사꾸쇼 | 폴리싱장치 |
| US5915915A (en) * | 1996-03-07 | 1999-06-29 | Komag, Incorporated | End effector and method for loading and unloading disks at a processing station |
| US5954570A (en) * | 1996-05-31 | 1999-09-21 | Kabushiki Kaisha Toshiba | Conditioner for a polishing tool |
| US5868608A (en) | 1996-08-13 | 1999-02-09 | Lsi Logic Corporation | Subsonic to supersonic and ultrasonic conditioning of a polishing pad in a chemical mechanical polishing apparatus |
| US6245679B1 (en) | 1996-08-16 | 2001-06-12 | Rodel Holdings, Inc | Apparatus and methods for chemical-mechanical polishing of semiconductor wafers |
| US6210525B1 (en) | 1996-08-16 | 2001-04-03 | Rodel Holdings, Inc. | Apparatus and methods for chemical-mechanical polishing of semiconductor wafers |
| US5932486A (en) * | 1996-08-16 | 1999-08-03 | Rodel, Inc. | Apparatus and methods for recirculating chemical-mechanical polishing of semiconductor wafers |
| US6537137B2 (en) | 1996-08-16 | 2003-03-25 | Rodel Holdings, Inc | Methods for chemical-mechanical polishing of semiconductor wafers |
| US6769967B1 (en) | 1996-10-21 | 2004-08-03 | Micron Technology, Inc. | Apparatus and method for refurbishing polishing pads used in chemical-mechanical planarization of semiconductor wafers |
| US5782675A (en) * | 1996-10-21 | 1998-07-21 | Micron Technology, Inc. | Apparatus and method for refurbishing fixed-abrasive polishing pads used in chemical-mechanical planarization of semiconductor wafers |
| KR19980064179A (ko) * | 1996-12-19 | 1998-10-07 | 윌리엄비.켐플러 | 웨이퍼 연마 공정시 실리콘 제거율을 안정화하는 방법 |
| JPH10217149A (ja) * | 1997-02-05 | 1998-08-18 | Ebara Corp | ターンテーブル用クロスの剥離治具 |
| JP3130000B2 (ja) | 1997-09-04 | 2001-01-31 | 松下電子工業株式会社 | 半導体ウェハ研磨装置及び研磨方法 |
| US5968841A (en) * | 1997-05-06 | 1999-10-19 | International Business Machines Corporation | Device and method for preventing settlement of particles on a chemical-mechanical polishing pad |
| US5967881A (en) * | 1997-05-29 | 1999-10-19 | Tucker; Thomas N. | Chemical mechanical planarization tool having a linear polishing roller |
| US6036583A (en) | 1997-07-11 | 2000-03-14 | Applied Materials, Inc. | Conditioner head in a substrate polisher and method |
| US5904615A (en) * | 1997-07-18 | 1999-05-18 | Hankook Machine Tools Co., Ltd. | Pad conditioner for chemical mechanical polishing apparatus |
| DE19737849A1 (de) * | 1997-08-29 | 1999-03-11 | Siemens Ag | Vorrichtung und Verfahren zum Beheizen eines flüssigen oder zähflüssigen Poliermittels sowie Vorrichtung zum Polieren von Wafern |
| US5957754A (en) * | 1997-08-29 | 1999-09-28 | Applied Materials, Inc. | Cavitational polishing pad conditioner |
| TW404876B (en) * | 1997-09-26 | 2000-09-11 | Siemens Ag | Process for chemical-mechanical planarization and equipment for performing said process |
| US5916010A (en) * | 1997-10-30 | 1999-06-29 | International Business Machines Corporation | CMP pad maintenance apparatus and method |
| KR100567982B1 (ko) * | 1997-12-08 | 2006-04-05 | 가부시키가이샤 에바라 세이사꾸쇼 | 연마액 공급장치 |
| US6083085A (en) | 1997-12-22 | 2000-07-04 | Micron Technology, Inc. | Method and apparatus for planarizing microelectronic substrates and conditioning planarizing media |
| JPH11277434A (ja) * | 1998-03-30 | 1999-10-12 | Speedfam Co Ltd | Cmp装置のスラリリサイクルシステム及びその方法 |
| US6200199B1 (en) | 1998-03-31 | 2001-03-13 | Applied Materials, Inc. | Chemical mechanical polishing conditioner |
| US6024829A (en) * | 1998-05-21 | 2000-02-15 | Lucent Technologies Inc. | Method of reducing agglomerate particles in a polishing slurry |
| KR100302482B1 (ko) * | 1998-06-23 | 2001-11-30 | 윤종용 | 반도체씨엠피공정의슬러리공급시스템 |
| US6106374A (en) * | 1998-07-16 | 2000-08-22 | International Business Machines Corporation | Acoustically agitated delivery |
| US6179693B1 (en) * | 1998-10-06 | 2001-01-30 | International Business Machines Corporation | In-situ/self-propelled polishing pad conditioner and cleaner |
| US6464571B2 (en) | 1998-12-01 | 2002-10-15 | Nutool, Inc. | Polishing apparatus and method with belt drive system adapted to extend the lifetime of a refreshing polishing belt provided therein |
| US6589105B2 (en) | 1998-12-01 | 2003-07-08 | Nutool, Inc. | Pad tensioning method and system in a bi-directional linear polisher |
| US6468139B1 (en) | 1998-12-01 | 2002-10-22 | Nutool, Inc. | Polishing apparatus and method with a refreshing polishing belt and loadable housing |
| US7425250B2 (en) * | 1998-12-01 | 2008-09-16 | Novellus Systems, Inc. | Electrochemical mechanical processing apparatus |
| US6103628A (en) | 1998-12-01 | 2000-08-15 | Nutool, Inc. | Reverse linear polisher with loadable housing |
| JP4030247B2 (ja) | 1999-05-17 | 2008-01-09 | 株式会社荏原製作所 | ドレッシング装置及びポリッシング装置 |
| US6488569B1 (en) | 1999-07-23 | 2002-12-03 | Florida State University | Method and apparatus for detecting micro-scratches in semiconductor wafers during polishing process |
| US6306008B1 (en) * | 1999-08-31 | 2001-10-23 | Micron Technology, Inc. | Apparatus and method for conditioning and monitoring media used for chemical-mechanical planarization |
| US6383934B1 (en) | 1999-09-02 | 2002-05-07 | Micron Technology, Inc. | Method and apparatus for chemical-mechanical planarization of microelectronic substrates with selected planarizing liquids |
| US6306768B1 (en) | 1999-11-17 | 2001-10-23 | Micron Technology, Inc. | Method for planarizing microelectronic substrates having apertures |
| US6313038B1 (en) | 2000-04-26 | 2001-11-06 | Micron Technology, Inc. | Method and apparatus for controlling chemical interactions during planarization of microelectronic substrates |
| US6387289B1 (en) | 2000-05-04 | 2002-05-14 | Micron Technology, Inc. | Planarizing machines and methods for mechanical and/or chemical-mechanical planarization of microelectronic-device substrate assemblies |
| US6612901B1 (en) * | 2000-06-07 | 2003-09-02 | Micron Technology, Inc. | Apparatus for in-situ optical endpointing of web-format planarizing machines in mechanical or chemical-mechanical planarization of microelectronic-device substrate assemblies |
| US6875091B2 (en) * | 2001-01-04 | 2005-04-05 | Lam Research Corporation | Method and apparatus for conditioning a polishing pad with sonic energy |
| US6554688B2 (en) * | 2001-01-04 | 2003-04-29 | Lam Research Corporation | Method and apparatus for conditioning a polishing pad with sonic energy |
| US6722943B2 (en) | 2001-08-24 | 2004-04-20 | Micron Technology, Inc. | Planarizing machines and methods for dispensing planarizing solutions in the processing of microelectronic workpieces |
| US6666749B2 (en) * | 2001-08-30 | 2003-12-23 | Micron Technology, Inc. | Apparatus and method for enhanced processing of microelectronic workpieces |
| KR20030053375A (ko) * | 2001-12-22 | 2003-06-28 | 동부전자 주식회사 | 초음파 발생장치를 구비한 패드 컨디셔닝 장치 |
| US7131889B1 (en) | 2002-03-04 | 2006-11-07 | Micron Technology, Inc. | Method for planarizing microelectronic workpieces |
| US6939203B2 (en) * | 2002-04-18 | 2005-09-06 | Asm Nutool, Inc. | Fluid bearing slide assembly for workpiece polishing |
| KR20030096766A (ko) * | 2002-06-17 | 2003-12-31 | 동부전자 주식회사 | 메가소닉 트랜스듀서를 이용한 슬러리 안정화 방법 |
| US6869335B2 (en) | 2002-07-08 | 2005-03-22 | Micron Technology, Inc. | Retaining rings, planarizing apparatuses including retaining rings, and methods for planarizing micro-device workpieces |
| US7341502B2 (en) | 2002-07-18 | 2008-03-11 | Micron Technology, Inc. | Methods and systems for planarizing workpieces, e.g., microelectronic workpieces |
| US6860798B2 (en) | 2002-08-08 | 2005-03-01 | Micron Technology, Inc. | Carrier assemblies, planarizing apparatuses including carrier assemblies, and methods for planarizing micro-device workpieces |
| US7094695B2 (en) | 2002-08-21 | 2006-08-22 | Micron Technology, Inc. | Apparatus and method for conditioning a polishing pad used for mechanical and/or chemical-mechanical planarization |
| US7004817B2 (en) | 2002-08-23 | 2006-02-28 | Micron Technology, Inc. | Carrier assemblies, planarizing apparatuses including carrier assemblies, and methods for planarizing micro-device workpieces |
| US7011566B2 (en) | 2002-08-26 | 2006-03-14 | Micron Technology, Inc. | Methods and systems for conditioning planarizing pads used in planarizing substrates |
| US7008299B2 (en) | 2002-08-29 | 2006-03-07 | Micron Technology, Inc. | Apparatus and method for mechanical and/or chemical-mechanical planarization of micro-device workpieces |
| US6841991B2 (en) * | 2002-08-29 | 2005-01-11 | Micron Technology, Inc. | Planarity diagnostic system, E.G., for microelectronic component test systems |
| US7074114B2 (en) | 2003-01-16 | 2006-07-11 | Micron Technology, Inc. | Carrier assemblies, polishing machines including carrier assemblies, and methods for polishing micro-device workpieces |
| US6884152B2 (en) | 2003-02-11 | 2005-04-26 | Micron Technology, Inc. | Apparatuses and methods for conditioning polishing pads used in polishing micro-device workpieces |
| US6872132B2 (en) | 2003-03-03 | 2005-03-29 | Micron Technology, Inc. | Systems and methods for monitoring characteristics of a polishing pad used in polishing micro-device workpieces |
| US6864181B2 (en) * | 2003-03-27 | 2005-03-08 | Lam Research Corporation | Method and apparatus to form a planarized Cu interconnect layer using electroless membrane deposition |
| US7367872B2 (en) * | 2003-04-08 | 2008-05-06 | Applied Materials, Inc. | Conditioner disk for use in chemical mechanical polishing |
| US7131891B2 (en) | 2003-04-28 | 2006-11-07 | Micron Technology, Inc. | Systems and methods for mechanical and/or chemical-mechanical polishing of microfeature workpieces |
| US6935929B2 (en) | 2003-04-28 | 2005-08-30 | Micron Technology, Inc. | Polishing machines including under-pads and methods for mechanical and/or chemical-mechanical polishing of microfeature workpieces |
| US7030603B2 (en) | 2003-08-21 | 2006-04-18 | Micron Technology, Inc. | Apparatuses and methods for monitoring rotation of a conductive microfeature workpiece |
| US7648622B2 (en) | 2004-02-27 | 2010-01-19 | Novellus Systems, Inc. | System and method for electrochemical mechanical polishing |
| US7086927B2 (en) | 2004-03-09 | 2006-08-08 | Micron Technology, Inc. | Methods and systems for planarizing workpieces, e.g., microelectronic workpieces |
| US7066792B2 (en) | 2004-08-06 | 2006-06-27 | Micron Technology, Inc. | Shaped polishing pads for beveling microfeature workpiece edges, and associate system and methods |
| US7033253B2 (en) | 2004-08-12 | 2006-04-25 | Micron Technology, Inc. | Polishing pad conditioners having abrasives and brush elements, and associated systems and methods |
| DE102004061193B3 (de) * | 2004-12-20 | 2006-07-20 | Kastriot Merlaku | Elektrische Handpoliermaschine für das Polieren von Fahrzeugen |
| US7264539B2 (en) | 2005-07-13 | 2007-09-04 | Micron Technology, Inc. | Systems and methods for removing microfeature workpiece surface defects |
| KR100727484B1 (ko) * | 2005-07-28 | 2007-06-13 | 삼성전자주식회사 | 화학기계적 연마 장치 및 패드 컨디셔닝 방법 |
| US7438626B2 (en) * | 2005-08-31 | 2008-10-21 | Micron Technology, Inc. | Apparatus and method for removing material from microfeature workpieces |
| US7326105B2 (en) | 2005-08-31 | 2008-02-05 | Micron Technology, Inc. | Retaining rings, and associated planarizing apparatuses, and related methods for planarizing micro-device workpieces |
| US7294049B2 (en) | 2005-09-01 | 2007-11-13 | Micron Technology, Inc. | Method and apparatus for removing material from microfeature workpieces |
| WO2007045267A1 (en) | 2005-10-19 | 2007-04-26 | Freescale Semiconductor, Inc. | A system and method for cleaning a conditioning device |
| WO2007054125A1 (en) * | 2005-11-08 | 2007-05-18 | Freescale Semiconductor, Inc. | A system and method for removing particles from a polishing pad |
| US7754612B2 (en) | 2007-03-14 | 2010-07-13 | Micron Technology, Inc. | Methods and apparatuses for removing polysilicon from semiconductor workpieces |
| JP2010179407A (ja) * | 2009-02-05 | 2010-08-19 | Elpida Memory Inc | Cmp装置 |
| US20110169520A1 (en) * | 2010-01-14 | 2011-07-14 | Mks Instruments, Inc. | Apparatus for measuring minority carrier lifetime and method for using the same |
| KR102401388B1 (ko) | 2016-06-24 | 2022-05-24 | 어플라이드 머티어리얼스, 인코포레이티드 | 화학적 기계적 연마를 위한 슬러리 분배 디바이스 |
| US10391609B1 (en) * | 2017-09-05 | 2019-08-27 | Optipro Systems, LLC | Modular contact assembly for rotating machine tool |
| US20240035192A1 (en) * | 2021-03-29 | 2024-02-01 | The 13Th Research Institute Of China Electronics Technology Group Corporation | Polishing Device for Indium Phosphide Substrate, and Polishing Process |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3123951A (en) * | 1964-03-10 | Ultrasonic cleaning of grinding wheels | ||
| US3093937A (en) * | 1962-11-30 | 1963-06-18 | Cavitron Ultrasonics Inc | Ultrasonic lapping machines |
| US3855441A (en) * | 1974-04-08 | 1974-12-17 | Braelow D | Method and apparatus for activation of an abrasive slurry by an electric arc |
| DE2435848C3 (de) * | 1974-07-25 | 1979-07-26 | Supfina Maschinenfabrik Hentzen Kg, 5630 Remscheid | Vorrichtung zur Sauberhaltung der Kontaktfläche eines Honsteins |
| US4069805A (en) * | 1977-01-25 | 1978-01-24 | Philip Sherman | Wire apparatus for abrasive powder machining |
| US4927432A (en) * | 1986-03-25 | 1990-05-22 | Rodel, Inc. | Pad material for grinding, lapping and polishing |
| DE3625286A1 (de) * | 1986-07-25 | 1988-02-04 | Flier Gustav | Schleifscheibenreinigung durch beaufschlagung des kuehlwassers mit ultraschall, insbesondere in anwendung fuer schleifmaschinen |
| JPS6362673A (ja) * | 1986-09-01 | 1988-03-18 | Speedfam Co Ltd | 定寸機構付き平面研磨装置 |
| JPS63185556A (ja) * | 1987-01-28 | 1988-08-01 | Toshiba Corp | 研磨装置 |
| AU619263B2 (en) * | 1988-03-10 | 1992-01-23 | Extrude Hone Corporation | Ultrasonic polishing |
| US5104828A (en) * | 1990-03-01 | 1992-04-14 | Intel Corporation | Method of planarizing a dielectric formed over a semiconductor substrate |
| US5055158A (en) * | 1990-09-25 | 1991-10-08 | International Business Machines Corporation | Planarization of Josephson integrated circuit |
| US5154021A (en) * | 1991-06-26 | 1992-10-13 | International Business Machines Corporation | Pneumatic pad conditioner |
| US5245790A (en) * | 1992-02-14 | 1993-09-21 | Lsi Logic Corporation | Ultrasonic energy enhanced chemi-mechanical polishing of silicon wafers |
-
1992
- 1992-04-02 US US07/862,044 patent/US5245796A/en not_active Expired - Lifetime
- 1992-05-13 TW TW081103708A patent/TW197531B/zh not_active IP Right Cessation
-
1993
- 1993-03-25 DE DE69303109T patent/DE69303109T2/de not_active Expired - Fee Related
- 1993-03-25 ES ES93302281T patent/ES2088228T3/es not_active Expired - Lifetime
- 1993-03-25 EP EP93302281A patent/EP0566258B1/en not_active Expired - Lifetime
- 1993-03-30 KR KR1019930005069A patent/KR930022483A/ko not_active Withdrawn
- 1993-04-02 JP JP9844393A patent/JP2981079B2/ja not_active Expired - Lifetime
-
1996
- 1996-09-26 HK HK180296A patent/HK180296A/en not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| EP0566258A1 (en) | 1993-10-20 |
| TW197531B (enExample) | 1993-01-01 |
| US5245796A (en) | 1993-09-21 |
| DE69303109T2 (de) | 1996-10-10 |
| HK180296A (en) | 1996-10-04 |
| ES2088228T3 (es) | 1996-08-01 |
| KR930022483A (ko) | 1993-11-24 |
| DE69303109D1 (de) | 1996-07-18 |
| JPH068134A (ja) | 1994-01-18 |
| EP0566258B1 (en) | 1996-06-12 |
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