JP2024520598A5 - - Google Patents

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Publication number
JP2024520598A5
JP2024520598A5 JP2023574161A JP2023574161A JP2024520598A5 JP 2024520598 A5 JP2024520598 A5 JP 2024520598A5 JP 2023574161 A JP2023574161 A JP 2023574161A JP 2023574161 A JP2023574161 A JP 2023574161A JP 2024520598 A5 JP2024520598 A5 JP 2024520598A5
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JP
Japan
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detector
features
reflection
evaluation device
applications
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JP2023574161A
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English (en)
Japanese (ja)
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JP2024520598A (ja
JP7855017B2 (ja
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Priority claimed from PCT/EP2022/064655 external-priority patent/WO2022253777A1/en
Publication of JP2024520598A publication Critical patent/JP2024520598A/ja
Publication of JP2024520598A5 publication Critical patent/JP2024520598A5/ja
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Publication of JP7855017B2 publication Critical patent/JP7855017B2/ja
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JP2023574161A 2021-05-31 2022-05-30 投影パターン内のエピポーラ線距離からの自動較正 Active JP7855017B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP21176939 2021-05-31
EP21176939.3 2021-05-31
PCT/EP2022/064655 WO2022253777A1 (en) 2021-05-31 2022-05-30 Auto calibration from epipolar line distance in projection pattern

Publications (3)

Publication Number Publication Date
JP2024520598A JP2024520598A (ja) 2024-05-24
JP2024520598A5 true JP2024520598A5 (enExample) 2025-06-03
JP7855017B2 JP7855017B2 (ja) 2026-05-07

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JP2023574161A Active JP7855017B2 (ja) 2021-05-31 2022-05-30 投影パターン内のエピポーラ線距離からの自動較正

Country Status (7)

Country Link
US (1) US12087003B2 (enExample)
EP (1) EP4348174B1 (enExample)
JP (1) JP7855017B2 (enExample)
KR (1) KR20240015643A (enExample)
CN (1) CN117480355A (enExample)
ES (1) ES3033432T3 (enExample)
WO (1) WO2022253777A1 (enExample)

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CN121753079A (zh) 2023-08-21 2026-03-27 特里纳米克斯股份有限公司 面部认证参考测量定时
WO2025067924A1 (en) * 2023-09-28 2025-04-03 Ams-Osram International Gmbh Method for operating a driver monitoring system and driver monitoring system
CN117589062B (zh) * 2024-01-18 2024-05-17 宁德时代新能源科技股份有限公司 尺寸检测设备以及尺寸检测方法
WO2025233342A1 (en) 2024-05-06 2025-11-13 Trinamix Gmbh Determining calibration signal of optical sensor system
CN121170036B (zh) * 2025-11-21 2026-03-20 中国地震局工程力学研究所 基于单目相机与同心圆环的结构三维位移监测方法及装置

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JP3712847B2 (ja) * 1997-05-20 2005-11-02 株式会社リコー ３次元形状計測方法と３次元形状計測装置及び撮像手段の姿勢検出装置
US6798613B1 (en) * 2001-07-09 2004-09-28 Maxtor Corporation Method of correcting Z-height errors during assembly of a hard disk drive
US20030071121A1 (en) * 2001-10-12 2003-04-17 Kricorissian Gregg R. Optical data collection device with a combined targeting and focusing apparatus
JP3967935B2 (ja) * 2002-02-25 2007-08-29 株式会社日立製作所 合わせ精度計測装置及びその方法
JP2004354256A (ja) 2003-05-29 2004-12-16 Olympus Corp キャリブレーションずれ検出装置及びこの装置を備えたステレオカメラ並びにステレオカメラシステム
JP2005166785A (ja) * 2003-12-01 2005-06-23 Canon Inc 位置検出装置及び方法、並びに、露光装置
US7069156B2 (en) * 2004-01-23 2006-06-27 Hitachi Global Storage Technologies Netherlands B.V. Method for adjusting the pitch and roll static torques in a disk drive head suspension assembly
JP2006040949A (ja) * 2004-07-22 2006-02-09 Advanced Lcd Technologies Development Center Co Ltd レーザー結晶化装置及びレーザー結晶化方法
JP4887376B2 (ja) 2005-12-21 2012-02-29 テレコム・イタリア・エッセ・ピー・アー ステレオビジョンにおいて密な視差場を求める方法
JP4442661B2 (ja) 2007-08-29 2010-03-31 オムロン株式会社 ３次元計測方法および３次元計測装置
JP6415447B2 (ja) 2012-12-19 2018-10-31 ビーエーエスエフ ソシエタス・ヨーロピアＢａｓｆ Ｓｅ １つ以上の物体を光学的に検出するための検出器
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CN112819853B (zh) 2021-02-01 2023-07-25 太原理工大学 一种基于语义先验的视觉里程计方法

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