JP7855017B2 - 投影パターン内のエピポーラ線距離からの自動較正 - Google Patents

投影パターン内のエピポーラ線距離からの自動較正

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Publication number
JP7855017B2
JP7855017B2 JP2023574161A JP2023574161A JP7855017B2 JP 7855017 B2 JP7855017 B2 JP 7855017B2 JP 2023574161 A JP2023574161 A JP 2023574161A JP 2023574161 A JP2023574161 A JP 2023574161A JP 7855017 B2 JP7855017 B2 JP 7855017B2
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JP
Japan
Prior art keywords
reflection
features
image
detector
evaluation device
Prior art date
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JP2023574161A
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English (en)
Japanese (ja)
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JP2024520598A (ja
JP2024520598A5 (enExample
Inventor
シンドラー，パトリク
シック，フリードリヒ
レンナルツ，クリスティアン
シレン，ペーター
ウンガー，ヤコブ
Original Assignee
トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング
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Publication of JP2024520598A publication Critical patent/JP2024520598A/ja
Publication of JP2024520598A5 publication Critical patent/JP2024520598A5/ja
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2504—Calibration devices
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G06T7/521—Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/03—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring coordinates of points
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2513—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/045—Correction of measurements
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/80—Analysis of captured images to determine intrinsic or extrinsic camera parameters, i.e. camera calibration
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/80—Analysis of captured images to determine intrinsic or extrinsic camera parameters, i.e. camera calibration
    • G06T7/85—Stereo camera calibration
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30204—Marker
    • G06T2207/30208—Marker matrix

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Optics & Photonics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Optical Distance (AREA)
JP2023574161A 2021-05-31 2022-05-30 投影パターン内のエピポーラ線距離からの自動較正 Active JP7855017B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP21176939 2021-05-31
EP21176939.3 2021-05-31
PCT/EP2022/064655 WO2022253777A1 (en) 2021-05-31 2022-05-30 Auto calibration from epipolar line distance in projection pattern

Publications (3)

Publication Number Publication Date
JP2024520598A JP2024520598A (ja) 2024-05-24
JP2024520598A5 JP2024520598A5 (enExample) 2025-06-03
JP7855017B2 true JP7855017B2 (ja) 2026-05-07

Family

ID=76217681

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2023574161A Active JP7855017B2 (ja) 2021-05-31 2022-05-30 投影パターン内のエピポーラ線距離からの自動較正

Country Status (7)

Country Link
US (1) US12087003B2 (enExample)
EP (1) EP4348174B1 (enExample)
JP (1) JP7855017B2 (enExample)
KR (1) KR20240015643A (enExample)
CN (1) CN117480355A (enExample)
ES (1) ES3033432T3 (enExample)
WO (1) WO2022253777A1 (enExample)

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CN115908723B (zh) * 2023-03-09 2023-06-16 中国科学技术大学 基于区间感知的极线引导多视图立体重建方法
CN121753079A (zh) 2023-08-21 2026-03-27 特里纳米克斯股份有限公司 面部认证参考测量定时
WO2025067924A1 (en) * 2023-09-28 2025-04-03 Ams-Osram International Gmbh Method for operating a driver monitoring system and driver monitoring system
CN117589062B (zh) * 2024-01-18 2024-05-17 宁德时代新能源科技股份有限公司 尺寸检测设备以及尺寸检测方法
WO2025233342A1 (en) 2024-05-06 2025-11-13 Trinamix Gmbh Determining calibration signal of optical sensor system
CN121170036B (zh) * 2025-11-21 2026-03-20 中国地震局工程力学研究所 基于单目相机与同心圆环的结构三维位移监测方法及装置

Citations (6)

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JP2004354256A (ja) 2003-05-29 2004-12-16 Olympus Corp キャリブレーションずれ検出装置及びこの装置を備えたステレオカメラ並びにステレオカメラシステム
JP2009053136A (ja) 2007-08-29 2009-03-12 Omron Corp ３次元計測方法および３次元計測装置
JP2009520975A (ja) 2005-12-21 2009-05-28 テレコム・イタリア・エッセ・ピー・アー ステレオビジョンにおいて密な視差場を求める方法
JP2020503500A (ja) 2016-11-17 2020-01-30 トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング 少なくとも１つの物体を光学的に検出するための検出器
JP2021047479A (ja) 2019-09-17 2021-03-25 株式会社東芝 推定装置、推定方法及びプログラム
CN112819853A (zh) 2021-02-01 2021-05-18 太原理工大学 一种基于语义先验的视觉里程计方法

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JP3712847B2 (ja) * 1997-05-20 2005-11-02 株式会社リコー ３次元形状計測方法と３次元形状計測装置及び撮像手段の姿勢検出装置
US6798613B1 (en) * 2001-07-09 2004-09-28 Maxtor Corporation Method of correcting Z-height errors during assembly of a hard disk drive
US20030071121A1 (en) * 2001-10-12 2003-04-17 Kricorissian Gregg R. Optical data collection device with a combined targeting and focusing apparatus
JP3967935B2 (ja) * 2002-02-25 2007-08-29 株式会社日立製作所 合わせ精度計測装置及びその方法
JP2005166785A (ja) * 2003-12-01 2005-06-23 Canon Inc 位置検出装置及び方法、並びに、露光装置
US7069156B2 (en) * 2004-01-23 2006-06-27 Hitachi Global Storage Technologies Netherlands B.V. Method for adjusting the pitch and roll static torques in a disk drive head suspension assembly
JP2006040949A (ja) * 2004-07-22 2006-02-09 Advanced Lcd Technologies Development Center Co Ltd レーザー結晶化装置及びレーザー結晶化方法
JP6415447B2 (ja) 2012-12-19 2018-10-31 ビーエーエスエフ ソシエタス・ヨーロピアＢａｓｆ Ｓｅ １つ以上の物体を光学的に検出するための検出器
US10219724B2 (en) * 2013-05-02 2019-03-05 VS Medtech, Inc. Systems and methods for measuring and characterizing interior surfaces of luminal structures
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Publication number Priority date Publication date Assignee Title
JP2004354256A (ja) 2003-05-29 2004-12-16 Olympus Corp キャリブレーションずれ検出装置及びこの装置を備えたステレオカメラ並びにステレオカメラシステム
JP2009520975A (ja) 2005-12-21 2009-05-28 テレコム・イタリア・エッセ・ピー・アー ステレオビジョンにおいて密な視差場を求める方法
JP2009053136A (ja) 2007-08-29 2009-03-12 Omron Corp ３次元計測方法および３次元計測装置
JP2020503500A (ja) 2016-11-17 2020-01-30 トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング 少なくとも１つの物体を光学的に検出するための検出器
JP2021047479A (ja) 2019-09-17 2021-03-25 株式会社東芝 推定装置、推定方法及びプログラム
CN112819853A (zh) 2021-02-01 2021-05-18 太原理工大学 一种基于语义先验的视觉里程计方法

Also Published As

Publication number Publication date
US20240020864A1 (en) 2024-01-18
US12087003B2 (en) 2024-09-10
KR20240015643A (ko) 2024-02-05
EP4348174A1 (en) 2024-04-10
JP2024520598A (ja) 2024-05-24
ES3033432T3 (en) 2025-08-04
CN117480355A (zh) 2024-01-30
WO2022253777A1 (en) 2022-12-08
EP4348174B1 (en) 2025-05-14

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