CN117480355A - 根据投影图案中的对极线距离进行自动校准 - Google Patents

根据投影图案中的对极线距离进行自动校准 Download PDF

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Publication number
CN117480355A
CN117480355A CN202280038781.6A CN202280038781A CN117480355A CN 117480355 A CN117480355 A CN 117480355A CN 202280038781 A CN202280038781 A CN 202280038781A CN 117480355 A CN117480355 A CN 117480355A
Authority
CN
China
Prior art keywords
features
reflection
detector
image
evaluation device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202280038781.6A
Other languages
English (en)
Chinese (zh)
Inventor
P·辛德勒
F·希克
C·伦纳茨
P·希伦
J·昂格尔
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TrinamiX GmbH
Original Assignee
TrinamiX GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by TrinamiX GmbH filed Critical TrinamiX GmbH
Publication of CN117480355A publication Critical patent/CN117480355A/zh
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G06T7/521—Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2504—Calibration devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/03—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring coordinates of points
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/045—Correction of measurements
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/80—Analysis of captured images to determine intrinsic or extrinsic camera parameters, i.e. camera calibration
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/80—Analysis of captured images to determine intrinsic or extrinsic camera parameters, i.e. camera calibration
    • G06T7/85—Stereo camera calibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2513—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30204—Marker
    • G06T2207/30208—Marker matrix

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Optics & Photonics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Optical Distance (AREA)
CN202280038781.6A 2021-05-31 2022-05-30 根据投影图案中的对极线距离进行自动校准 Pending CN117480355A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP21176939 2021-05-31
EP21176939.3 2021-05-31
PCT/EP2022/064655 WO2022253777A1 (en) 2021-05-31 2022-05-30 Auto calibration from epipolar line distance in projection pattern

Publications (1)

Publication Number Publication Date
CN117480355A true CN117480355A (zh) 2024-01-30

Family

ID=76217681

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202280038781.6A Pending CN117480355A (zh) 2021-05-31 2022-05-30 根据投影图案中的对极线距离进行自动校准

Country Status (7)

Country Link
US (1) US12087003B2 (enExample)
EP (1) EP4348174B1 (enExample)
JP (1) JP7855017B2 (enExample)
KR (1) KR20240015643A (enExample)
CN (1) CN117480355A (enExample)
ES (1) ES3033432T3 (enExample)
WO (1) WO2022253777A1 (enExample)

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CN121753079A (zh) 2023-08-21 2026-03-27 特里纳米克斯股份有限公司 面部认证参考测量定时
WO2025067924A1 (en) * 2023-09-28 2025-04-03 Ams-Osram International Gmbh Method for operating a driver monitoring system and driver monitoring system
CN117589062B (zh) * 2024-01-18 2024-05-17 宁德时代新能源科技股份有限公司 尺寸检测设备以及尺寸检测方法
WO2025233342A1 (en) 2024-05-06 2025-11-13 Trinamix Gmbh Determining calibration signal of optical sensor system
CN121170036B (zh) * 2025-11-21 2026-03-20 中国地震局工程力学研究所 基于单目相机与同心圆环的结构三维位移监测方法及装置

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US6798613B1 (en) * 2001-07-09 2004-09-28 Maxtor Corporation Method of correcting Z-height errors during assembly of a hard disk drive
US20030071121A1 (en) * 2001-10-12 2003-04-17 Kricorissian Gregg R. Optical data collection device with a combined targeting and focusing apparatus
JP3967935B2 (ja) * 2002-02-25 2007-08-29 株式会社日立製作所 合わせ精度計測装置及びその方法
JP2004354256A (ja) 2003-05-29 2004-12-16 Olympus Corp キャリブレーションずれ検出装置及びこの装置を備えたステレオカメラ並びにステレオカメラシステム
JP2005166785A (ja) * 2003-12-01 2005-06-23 Canon Inc 位置検出装置及び方法、並びに、露光装置
US7069156B2 (en) * 2004-01-23 2006-06-27 Hitachi Global Storage Technologies Netherlands B.V. Method for adjusting the pitch and roll static torques in a disk drive head suspension assembly
JP2006040949A (ja) * 2004-07-22 2006-02-09 Advanced Lcd Technologies Development Center Co Ltd レーザー結晶化装置及びレーザー結晶化方法
JP4887376B2 (ja) 2005-12-21 2012-02-29 テレコム・イタリア・エッセ・ピー・アー ステレオビジョンにおいて密な視差場を求める方法
JP4442661B2 (ja) 2007-08-29 2010-03-31 オムロン株式会社 ３次元計測方法および３次元計測装置
JP6415447B2 (ja) 2012-12-19 2018-10-31 ビーエーエスエフ ソシエタス・ヨーロピアＢａｓｆ Ｓｅ １つ以上の物体を光学的に検出するための検出器
US10219724B2 (en) * 2013-05-02 2019-03-05 VS Medtech, Inc. Systems and methods for measuring and characterizing interior surfaces of luminal structures
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CN112819853B (zh) 2021-02-01 2023-07-25 太原理工大学 一种基于语义先验的视觉里程计方法

Also Published As

Publication number Publication date
US20240020864A1 (en) 2024-01-18
US12087003B2 (en) 2024-09-10
KR20240015643A (ko) 2024-02-05
EP4348174A1 (en) 2024-04-10
JP2024520598A (ja) 2024-05-24
ES3033432T3 (en) 2025-08-04
WO2022253777A1 (en) 2022-12-08
JP7855017B2 (ja) 2026-05-07
EP4348174B1 (en) 2025-05-14

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