ES3033432T3 - Auto calibration from epipolar line distance in projection pattern - Google Patents

Auto calibration from epipolar line distance in projection pattern

Info

Publication number
ES3033432T3
ES3033432T3 ES22730557T ES22730557T ES3033432T3 ES 3033432 T3 ES3033432 T3 ES 3033432T3 ES 22730557 T ES22730557 T ES 22730557T ES 22730557 T ES22730557 T ES 22730557T ES 3033432 T3 ES3033432 T3 ES 3033432T3
Authority
ES
Spain
Prior art keywords
reflection
image
detector
evaluation device
feature
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
ES22730557T
Other languages
English (en)
Spanish (es)
Inventor
Patrick Schindler
Friedrich Schick
Christian Lennartz
Peter Schillen
Jakob Unger
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TrinamiX GmbH
Original Assignee
TrinamiX GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by TrinamiX GmbH filed Critical TrinamiX GmbH
Application granted granted Critical
Publication of ES3033432T3 publication Critical patent/ES3033432T3/es
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2504—Calibration devices
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G06T7/521—Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/03—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring coordinates of points
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2513—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/045—Correction of measurements
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/80—Analysis of captured images to determine intrinsic or extrinsic camera parameters, i.e. camera calibration
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/80—Analysis of captured images to determine intrinsic or extrinsic camera parameters, i.e. camera calibration
    • G06T7/85—Stereo camera calibration
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30204—Marker
    • G06T2207/30208—Marker matrix

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Optics & Photonics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Optical Distance (AREA)
ES22730557T 2021-05-31 2022-05-30 Auto calibration from epipolar line distance in projection pattern Active ES3033432T3 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP21176939 2021-05-31
PCT/EP2022/064655 WO2022253777A1 (en) 2021-05-31 2022-05-30 Auto calibration from epipolar line distance in projection pattern

Publications (1)

Publication Number Publication Date
ES3033432T3 true ES3033432T3 (en) 2025-08-04

Family

ID=76217681

Family Applications (1)

Application Number Title Priority Date Filing Date
ES22730557T Active ES3033432T3 (en) 2021-05-31 2022-05-30 Auto calibration from epipolar line distance in projection pattern

Country Status (7)

Country Link
US (1) US12087003B2 (enExample)
EP (1) EP4348174B1 (enExample)
JP (1) JP7855017B2 (enExample)
KR (1) KR20240015643A (enExample)
CN (1) CN117480355A (enExample)
ES (1) ES3033432T3 (enExample)
WO (1) WO2022253777A1 (enExample)

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CN121753079A (zh) 2023-08-21 2026-03-27 特里纳米克斯股份有限公司 面部认证参考测量定时
WO2025067924A1 (en) * 2023-09-28 2025-04-03 Ams-Osram International Gmbh Method for operating a driver monitoring system and driver monitoring system
CN117589062B (zh) * 2024-01-18 2024-05-17 宁德时代新能源科技股份有限公司 尺寸检测设备以及尺寸检测方法
WO2025233342A1 (en) 2024-05-06 2025-11-13 Trinamix Gmbh Determining calibration signal of optical sensor system
CN121170036B (zh) * 2025-11-21 2026-03-20 中国地震局工程力学研究所 基于单目相机与同心圆环的结构三维位移监测方法及装置

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JP3712847B2 (ja) * 1997-05-20 2005-11-02 株式会社リコー ３次元形状計測方法と３次元形状計測装置及び撮像手段の姿勢検出装置
US6798613B1 (en) * 2001-07-09 2004-09-28 Maxtor Corporation Method of correcting Z-height errors during assembly of a hard disk drive
US20030071121A1 (en) * 2001-10-12 2003-04-17 Kricorissian Gregg R. Optical data collection device with a combined targeting and focusing apparatus
JP3967935B2 (ja) * 2002-02-25 2007-08-29 株式会社日立製作所 合わせ精度計測装置及びその方法
JP2004354256A (ja) 2003-05-29 2004-12-16 Olympus Corp キャリブレーションずれ検出装置及びこの装置を備えたステレオカメラ並びにステレオカメラシステム
JP2005166785A (ja) * 2003-12-01 2005-06-23 Canon Inc 位置検出装置及び方法、並びに、露光装置
US7069156B2 (en) * 2004-01-23 2006-06-27 Hitachi Global Storage Technologies Netherlands B.V. Method for adjusting the pitch and roll static torques in a disk drive head suspension assembly
JP2006040949A (ja) * 2004-07-22 2006-02-09 Advanced Lcd Technologies Development Center Co Ltd レーザー結晶化装置及びレーザー結晶化方法
JP4887376B2 (ja) 2005-12-21 2012-02-29 テレコム・イタリア・エッセ・ピー・アー ステレオビジョンにおいて密な視差場を求める方法
JP4442661B2 (ja) 2007-08-29 2010-03-31 オムロン株式会社 ３次元計測方法および３次元計測装置
JP6415447B2 (ja) 2012-12-19 2018-10-31 ビーエーエスエフ ソシエタス・ヨーロピアＢａｓｆ Ｓｅ １つ以上の物体を光学的に検出するための検出器
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US10520742B1 (en) * 2017-02-13 2019-12-31 Facebook Technologies, Llc Beamsplitter assembly for eye tracking in head-mounted displays
US11025887B2 (en) * 2017-02-27 2021-06-01 Sony Corporation Field calibration of stereo cameras with a projector
US11668828B2 (en) * 2017-08-28 2023-06-06 Trinamix Gmbh Detector for determining a position of at least one object
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JP7249919B2 (ja) 2019-09-17 2023-03-31 株式会社東芝 推定装置、推定方法及びプログラム
CN112819853B (zh) 2021-02-01 2023-07-25 太原理工大学 一种基于语义先验的视觉里程计方法

Also Published As

Publication number Publication date
US20240020864A1 (en) 2024-01-18
US12087003B2 (en) 2024-09-10
KR20240015643A (ko) 2024-02-05
EP4348174A1 (en) 2024-04-10
JP2024520598A (ja) 2024-05-24
CN117480355A (zh) 2024-01-30
WO2022253777A1 (en) 2022-12-08
JP7855017B2 (ja) 2026-05-07
EP4348174B1 (en) 2025-05-14

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