KR20240015643A - 투사 패턴의 공액 선 거리로부터의 자동 교정 - Google Patents

투사 패턴의 공액 선 거리로부터의 자동 교정 Download PDF

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Publication number
KR20240015643A
KR20240015643A KR1020237041329A KR20237041329A KR20240015643A KR 20240015643 A KR20240015643 A KR 20240015643A KR 1020237041329 A KR1020237041329 A KR 1020237041329A KR 20237041329 A KR20237041329 A KR 20237041329A KR 20240015643 A KR20240015643 A KR 20240015643A
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KR
South Korea
Prior art keywords
feature
detector
features
evaluation device
image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
KR1020237041329A
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English (en)
Korean (ko)
Inventor
패트릭 쉰들러
프리드리히 쉬크
크리스티안 렌나르츠
피터 쉴렌
제이콥 엉거
Original Assignee
트리나미엑스 게엠베하
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Publication date
Application filed by 트리나미엑스 게엠베하 filed Critical 트리나미엑스 게엠베하
Publication of KR20240015643A publication Critical patent/KR20240015643A/ko
Pending legal-status Critical Current

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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G06T7/521—Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2504—Calibration devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/03—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring coordinates of points
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2513—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/045—Correction of measurements
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/80—Analysis of captured images to determine intrinsic or extrinsic camera parameters, i.e. camera calibration
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/80—Analysis of captured images to determine intrinsic or extrinsic camera parameters, i.e. camera calibration
    • G06T7/85—Stereo camera calibration
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30204—Marker
    • G06T2207/30208—Marker matrix

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Optics & Photonics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Optical Distance (AREA)
KR1020237041329A 2021-05-31 2022-05-30 투사 패턴의 공액 선 거리로부터의 자동 교정 Pending KR20240015643A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP21176939 2021-05-31
EP21176939.3 2021-05-31
PCT/EP2022/064655 WO2022253777A1 (en) 2021-05-31 2022-05-30 Auto calibration from epipolar line distance in projection pattern

Publications (1)

Publication Number Publication Date
KR20240015643A true KR20240015643A (ko) 2024-02-05

Family

ID=76217681

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020237041329A Pending KR20240015643A (ko) 2021-05-31 2022-05-30 투사 패턴의 공액 선 거리로부터의 자동 교정

Country Status (7)

Country Link
US (1) US12087003B2 (enExample)
EP (1) EP4348174B1 (enExample)
JP (1) JP7855017B2 (enExample)
KR (1) KR20240015643A (enExample)
CN (1) CN117480355A (enExample)
ES (1) ES3033432T3 (enExample)
WO (1) WO2022253777A1 (enExample)

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CN121753079A (zh) 2023-08-21 2026-03-27 特里纳米克斯股份有限公司 面部认证参考测量定时
WO2025067924A1 (en) * 2023-09-28 2025-04-03 Ams-Osram International Gmbh Method for operating a driver monitoring system and driver monitoring system
CN117589062B (zh) * 2024-01-18 2024-05-17 宁德时代新能源科技股份有限公司 尺寸检测设备以及尺寸检测方法
WO2025233342A1 (en) 2024-05-06 2025-11-13 Trinamix Gmbh Determining calibration signal of optical sensor system
CN121170036B (zh) * 2025-11-21 2026-03-20 中国地震局工程力学研究所 基于单目相机与同心圆环的结构三维位移监测方法及装置

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US5712463A (en) * 1995-09-19 1998-01-27 International Business Machines Corporation Laser apparatus and method for adjusting the gram load static attitude and flying height of a slider in a head suspension assembly
JP3712847B2 (ja) * 1997-05-20 2005-11-02 株式会社リコー ３次元形状計測方法と３次元形状計測装置及び撮像手段の姿勢検出装置
US6798613B1 (en) * 2001-07-09 2004-09-28 Maxtor Corporation Method of correcting Z-height errors during assembly of a hard disk drive
US20030071121A1 (en) * 2001-10-12 2003-04-17 Kricorissian Gregg R. Optical data collection device with a combined targeting and focusing apparatus
JP3967935B2 (ja) * 2002-02-25 2007-08-29 株式会社日立製作所 合わせ精度計測装置及びその方法
JP2004354256A (ja) 2003-05-29 2004-12-16 Olympus Corp キャリブレーションずれ検出装置及びこの装置を備えたステレオカメラ並びにステレオカメラシステム
JP2005166785A (ja) * 2003-12-01 2005-06-23 Canon Inc 位置検出装置及び方法、並びに、露光装置
US7069156B2 (en) * 2004-01-23 2006-06-27 Hitachi Global Storage Technologies Netherlands B.V. Method for adjusting the pitch and roll static torques in a disk drive head suspension assembly
JP2006040949A (ja) * 2004-07-22 2006-02-09 Advanced Lcd Technologies Development Center Co Ltd レーザー結晶化装置及びレーザー結晶化方法
JP4887376B2 (ja) 2005-12-21 2012-02-29 テレコム・イタリア・エッセ・ピー・アー ステレオビジョンにおいて密な視差場を求める方法
JP4442661B2 (ja) 2007-08-29 2010-03-31 オムロン株式会社 ３次元計測方法および３次元計測装置
JP6415447B2 (ja) 2012-12-19 2018-10-31 ビーエーエスエフ ソシエタス・ヨーロピアＢａｓｆ Ｓｅ １つ以上の物体を光学的に検出するための検出器
US10219724B2 (en) * 2013-05-02 2019-03-05 VS Medtech, Inc. Systems and methods for measuring and characterizing interior surfaces of luminal structures
US11415661B2 (en) 2016-11-17 2022-08-16 Trinamix Gmbh Detector for optically detecting at least one object
EP3555685A1 (en) * 2016-12-19 2019-10-23 Cambridge Research & Instrumentation Inc. Surface sensing in optical microscopy and automated sample scanning systems
US10520742B1 (en) * 2017-02-13 2019-12-31 Facebook Technologies, Llc Beamsplitter assembly for eye tracking in head-mounted displays
US11025887B2 (en) * 2017-02-27 2021-06-01 Sony Corporation Field calibration of stereo cameras with a projector
US11668828B2 (en) * 2017-08-28 2023-06-06 Trinamix Gmbh Detector for determining a position of at least one object
US10788677B2 (en) * 2017-10-03 2020-09-29 Facebook Technologies, Llc Fresnel assembly for light redirection in eye tracking systems
JP7249919B2 (ja) 2019-09-17 2023-03-31 株式会社東芝 推定装置、推定方法及びプログラム
CN112819853B (zh) 2021-02-01 2023-07-25 太原理工大学 一种基于语义先验的视觉里程计方法

Also Published As

Publication number Publication date
US20240020864A1 (en) 2024-01-18
US12087003B2 (en) 2024-09-10
EP4348174A1 (en) 2024-04-10
JP2024520598A (ja) 2024-05-24
ES3033432T3 (en) 2025-08-04
CN117480355A (zh) 2024-01-30
WO2022253777A1 (en) 2022-12-08
JP7855017B2 (ja) 2026-05-07
EP4348174B1 (en) 2025-05-14

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PA0105 International application

Patent event date: 20231129

Patent event code: PA01051R01D

Comment text: International Patent Application

PG1501 Laying open of application
A201 Request for examination
PA0201 Request for examination

Patent event code: PA02012R01D

Patent event date: 20250529

Comment text: Request for Examination of Application