JP2023180486A - 圧電膜積層体およびその製造方法 - Google Patents

圧電膜積層体およびその製造方法 Download PDF

Info

Publication number
JP2023180486A
JP2023180486A JP2022093842A JP2022093842A JP2023180486A JP 2023180486 A JP2023180486 A JP 2023180486A JP 2022093842 A JP2022093842 A JP 2022093842A JP 2022093842 A JP2022093842 A JP 2022093842A JP 2023180486 A JP2023180486 A JP 2023180486A
Authority
JP
Japan
Prior art keywords
film
scaln
base material
base
crystal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2022093842A
Other languages
English (en)
Japanese (ja)
Other versions
JP2023180486A5 (https=
Inventor
明彦 勅使河原
Akihiko Teshigawara
英雄 山田
Hideo Yamada
竜一郎 阿部
Ryuichiro Abe
健治 木嶋
Kenji Kijima
哲也 榎本
Tetsuya Enomoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Denso Corp
Toyota Motor Corp
Mirise Technologies Corp
Original Assignee
Denso Corp
Toyota Motor Corp
Mirise Technologies Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Denso Corp, Toyota Motor Corp, Mirise Technologies Corp filed Critical Denso Corp
Priority to JP2022093842A priority Critical patent/JP2023180486A/ja
Priority to CN202310646405.1A priority patent/CN117222301A/zh
Priority to US18/330,988 priority patent/US20230413675A1/en
Publication of JP2023180486A publication Critical patent/JP2023180486A/ja
Publication of JP2023180486A5 publication Critical patent/JP2023180486A5/ja
Pending legal-status Critical Current

Links

Images

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N30/00Piezoelectric or electrostrictive devices
    • H10N30/704Piezoelectric or electrostrictive devices based on piezoelectric or electrostrictive films or coatings
    • H10N30/706Piezoelectric or electrostrictive devices based on piezoelectric or electrostrictive films or coatings characterised by the underlying bases, e.g. substrates
    • H10N30/708Intermediate layers, e.g. barrier, adhesion or growth control buffer layers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N30/00Piezoelectric or electrostrictive devices
    • H10N30/01Manufacture or treatment
    • H10N30/07Forming of piezoelectric or electrostrictive parts or bodies on an electrical element or another base
    • H10N30/074Forming of piezoelectric or electrostrictive parts or bodies on an electrical element or another base by depositing piezoelectric or electrostrictive layers, e.g. aerosol or screen printing
    • H10N30/076Forming of piezoelectric or electrostrictive parts or bodies on an electrical element or another base by depositing piezoelectric or electrostrictive layers, e.g. aerosol or screen printing by vapour phase deposition
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N30/00Piezoelectric or electrostrictive devices
    • H10N30/01Manufacture or treatment
    • H10N30/07Forming of piezoelectric or electrostrictive parts or bodies on an electrical element or another base
    • H10N30/074Forming of piezoelectric or electrostrictive parts or bodies on an electrical element or another base by depositing piezoelectric or electrostrictive layers, e.g. aerosol or screen printing
    • H10N30/079Forming of piezoelectric or electrostrictive parts or bodies on an electrical element or another base by depositing piezoelectric or electrostrictive layers, e.g. aerosol or screen printing using intermediate layers, e.g. for growth control
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N30/00Piezoelectric or electrostrictive devices
    • H10N30/80Constructional details
    • H10N30/85Piezoelectric or electrostrictive active materials
    • H10N30/853Ceramic compositions

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Chemical & Material Sciences (AREA)
  • Ceramic Engineering (AREA)
  • Surface Acoustic Wave Elements And Circuit Networks Thereof (AREA)
  • Piezo-Electric Or Mechanical Vibrators, Or Delay Or Filter Circuits (AREA)
JP2022093842A 2022-06-09 2022-06-09 圧電膜積層体およびその製造方法 Pending JP2023180486A (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2022093842A JP2023180486A (ja) 2022-06-09 2022-06-09 圧電膜積層体およびその製造方法
CN202310646405.1A CN117222301A (zh) 2022-06-09 2023-06-02 压电膜层叠体及其制造方法
US18/330,988 US20230413675A1 (en) 2022-06-09 2023-06-07 Piezoelectric film laminated body and manufacturing method of the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2022093842A JP2023180486A (ja) 2022-06-09 2022-06-09 圧電膜積層体およびその製造方法

Publications (2)

Publication Number Publication Date
JP2023180486A true JP2023180486A (ja) 2023-12-21
JP2023180486A5 JP2023180486A5 (https=) 2024-08-02

Family

ID=89039569

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022093842A Pending JP2023180486A (ja) 2022-06-09 2022-06-09 圧電膜積層体およびその製造方法

Country Status (3)

Country Link
US (1) US20230413675A1 (https=)
JP (1) JP2023180486A (https=)
CN (1) CN117222301A (https=)

Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004505441A (ja) * 2000-07-20 2004-02-19 インフィネオン テクノロジーズ アクチエンゲゼルシャフト 音響信号または熱信号と電圧変化とを互いに変換するための層配列を備えた半導体素子、および、その製造方法
JP2005179167A (ja) * 2003-06-30 2005-07-07 Kenichiro Miyahara 薄膜形成用基板、薄膜基板及び発光素子
JP2009010926A (ja) * 2007-05-31 2009-01-15 National Institute Of Advanced Industrial & Technology 圧電体薄膜、圧電体およびそれらの製造方法、ならびに当該圧電体薄膜を用いた圧電体共振子、アクチュエータ素子および物理センサー
JP2011015148A (ja) * 2009-07-01 2011-01-20 National Institute Of Advanced Industrial Science & Technology 圧電体薄膜の製造方法および当該製造方法により製造される圧電体薄膜
JP2013014806A (ja) * 2011-07-04 2013-01-24 Denso Corp 結晶軸傾斜膜の製造方法
JP2013191870A (ja) * 2006-09-15 2013-09-26 Canon Inc 圧電素子及び液体吐出ヘッド
JP2017043518A (ja) * 2015-08-27 2017-03-02 国立研究開発法人物質・材料研究機構 SiC繊維を含むハイブリッド複合材料およびその製造方法
WO2017163722A1 (ja) * 2016-03-25 2017-09-28 日本碍子株式会社 接合方法
JP2019161634A (ja) * 2018-03-07 2019-09-19 住友金属鉱山株式会社 表面弾性波素子用複合基板とその製造方法
JP2020033629A (ja) * 2018-08-31 2020-03-05 Tdk株式会社 強誘電性薄膜、強誘電性薄膜素子、圧電アクチュエータ、圧電センサ、ヘッドアセンブリ、ヘッドスタックアセンブリ、ハードディスクドライブ、プリンタヘッド、及びインクジェットプリンタ装置
JP2022075451A (ja) * 2020-11-03 2022-05-18 株式会社デンソー 圧電素子、圧電装置、および圧電素子の製造方法

Patent Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004505441A (ja) * 2000-07-20 2004-02-19 インフィネオン テクノロジーズ アクチエンゲゼルシャフト 音響信号または熱信号と電圧変化とを互いに変換するための層配列を備えた半導体素子、および、その製造方法
JP2005179167A (ja) * 2003-06-30 2005-07-07 Kenichiro Miyahara 薄膜形成用基板、薄膜基板及び発光素子
JP2013191870A (ja) * 2006-09-15 2013-09-26 Canon Inc 圧電素子及び液体吐出ヘッド
JP2009010926A (ja) * 2007-05-31 2009-01-15 National Institute Of Advanced Industrial & Technology 圧電体薄膜、圧電体およびそれらの製造方法、ならびに当該圧電体薄膜を用いた圧電体共振子、アクチュエータ素子および物理センサー
JP2011015148A (ja) * 2009-07-01 2011-01-20 National Institute Of Advanced Industrial Science & Technology 圧電体薄膜の製造方法および当該製造方法により製造される圧電体薄膜
JP2013014806A (ja) * 2011-07-04 2013-01-24 Denso Corp 結晶軸傾斜膜の製造方法
JP2017043518A (ja) * 2015-08-27 2017-03-02 国立研究開発法人物質・材料研究機構 SiC繊維を含むハイブリッド複合材料およびその製造方法
WO2017163722A1 (ja) * 2016-03-25 2017-09-28 日本碍子株式会社 接合方法
JP2019161634A (ja) * 2018-03-07 2019-09-19 住友金属鉱山株式会社 表面弾性波素子用複合基板とその製造方法
JP2020033629A (ja) * 2018-08-31 2020-03-05 Tdk株式会社 強誘電性薄膜、強誘電性薄膜素子、圧電アクチュエータ、圧電センサ、ヘッドアセンブリ、ヘッドスタックアセンブリ、ハードディスクドライブ、プリンタヘッド、及びインクジェットプリンタ装置
JP2022075451A (ja) * 2020-11-03 2022-05-18 株式会社デンソー 圧電素子、圧電装置、および圧電素子の製造方法

Also Published As

Publication number Publication date
CN117222301A (zh) 2023-12-12
US20230413675A1 (en) 2023-12-21

Similar Documents

Publication Publication Date Title
US8318268B2 (en) AA stacked graphene-diamond hybrid material by high temperature treatment of diamond and the fabrication method thereof
CN101842508B (zh) 晶体织构化的金属衬底、晶体织构化的器件、包括这样的器件的电池和光伏模块以及薄层沉积方法
JP3344441B2 (ja) 表面弾性波素子
Auner et al. Microstructure of low temperature grown AlN thin films on Si (111)
KR102931304B1 (ko) 기울어진 c축 배향을 가진 압전 벌크 층 및 그 제조 방법
WO1991009161A1 (fr) Procede de formation de pellicules epitaxiales
JP2004221622A (ja) 圧電共振子、圧電フィルタ、デュプレクサ、通信装置および圧電共振子の製造方法
JP7487659B2 (ja) Soiウェーハの製造方法
KR20220036855A (ko) 저 결함 Al1-xScxN 막 성막 방법
CN1840748B (zh) 金刚石衬底及其制造方法
JP3549228B2 (ja) 高配向性ダイヤモンド放熱基板
JP2023180486A (ja) 圧電膜積層体およびその製造方法
Felmetsger et al. Reactive sputtering of highly c-axis textured Ti-doped AlN thin films
Gaire et al. Morphology and texture evolution of nanostructured CaF2 films on amorphous substrates under oblique incidence flux
JP6248458B2 (ja) 貼り合わせウェーハの製造方法および貼り合わせウェーハ
Kamiya et al. Comparison of microstructure and crystal structure of polycrystalline silicon exhibiting varied textures fabricated by microwave and very high frequency plasma enhanced chemical vapor deposition and their transport properties
JPH0566753B2 (https=)
Felmetsger et al. Deposition of smooth and highly (111) textured Al bottom electrodes for AlN-based electroacoustic devices
JP2004119938A (ja) 酸化シリコン膜製造方法及び装置
US20220320417A1 (en) Method of manufacturing aluminum nitride films
EP1918428B1 (en) Crystalline tantalum film and method of forming it
Vikharev et al. Combined single-crystalline and polycrystalline CVD diamond substrates for diamond electronics
JP6502399B2 (ja) 単結晶シリコンスパッタリングターゲット
Rodbell et al. Film Crystallographic Texture and Substrate Urface Roughness in Layered Aluminum Metallization
US7781849B2 (en) Semiconductor devices and methods of fabricating the same

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20240725

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20241028

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20250822

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20250909

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20251107

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20260106

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20260306