JP2022061531A - ガラス板の製造方法 - Google Patents

ガラス板の製造方法 Download PDF

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Publication number
JP2022061531A
JP2022061531A JP2020169492A JP2020169492A JP2022061531A JP 2022061531 A JP2022061531 A JP 2022061531A JP 2020169492 A JP2020169492 A JP 2020169492A JP 2020169492 A JP2020169492 A JP 2020169492A JP 2022061531 A JP2022061531 A JP 2022061531A
Authority
JP
Japan
Prior art keywords
glass plate
inspection step
inspection
manufacturing
defect
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2020169492A
Other languages
English (en)
Japanese (ja)
Inventor
翔 北川
Sho Kitagawa
直樹 熊崎
Naoki Kumazaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Electric Glass Co Ltd
Original Assignee
Nippon Electric Glass Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Glass Co Ltd filed Critical Nippon Electric Glass Co Ltd
Priority to JP2020169492A priority Critical patent/JP2022061531A/ja
Priority to KR1020237011336A priority patent/KR20230078689A/ko
Priority to CN202180068777.XA priority patent/CN116324390A/zh
Priority to PCT/JP2021/033758 priority patent/WO2022075018A1/ja
Publication of JP2022061531A publication Critical patent/JP2022061531A/ja
Pending legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8803Visual inspection
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901Optical details; Scanning details
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958Inspecting transparent materials or objects, e.g. windscreens
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854Grading and classifying of flaws
    • G01N2021/8861Determining coordinates of flaws
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/10Scanning
    • G01N2201/104Mechano-optical scan, i.e. object and beam moving

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  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP2020169492A 2020-10-07 2020-10-07 ガラス板の製造方法 Pending JP2022061531A (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2020169492A JP2022061531A (ja) 2020-10-07 2020-10-07 ガラス板の製造方法
KR1020237011336A KR20230078689A (ko) 2020-10-07 2021-09-14 유리판의 제조 방법
CN202180068777.XA CN116324390A (zh) 2020-10-07 2021-09-14 玻璃板的制造方法
PCT/JP2021/033758 WO2022075018A1 (ja) 2020-10-07 2021-09-14 ガラス板の製造方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2020169492A JP2022061531A (ja) 2020-10-07 2020-10-07 ガラス板の製造方法

Publications (1)

Publication Number Publication Date
JP2022061531A true JP2022061531A (ja) 2022-04-19

Family

ID=81126483

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2020169492A Pending JP2022061531A (ja) 2020-10-07 2020-10-07 ガラス板の製造方法

Country Status (4)

Country Link
JP (1) JP2022061531A (zh)
KR (1) KR20230078689A (zh)
CN (1) CN116324390A (zh)
WO (1) WO2022075018A1 (zh)

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001255232A (ja) * 2000-03-10 2001-09-21 Micronics Japan Co Ltd 表示用パネル基板の検査装置
AU2002361368A1 (en) * 2002-12-05 2004-06-23 Peter Lisec Device for securing material plates, such as glass sheets, during the working thereof
KR20050026253A (ko) * 2003-09-09 2005-03-15 로체 시스템즈(주) 직립형 유리판절단장치
JP2006194858A (ja) * 2004-12-17 2006-07-27 Micronics Japan Co Ltd 表示用パネルの検査装置
CN101718714B (zh) * 2009-11-25 2012-07-11 东旭集团有限公司 一种检测平板玻璃表面缺陷的系统及方法
JP6119398B2 (ja) * 2013-04-22 2017-04-26 日本電気硝子株式会社 板ガラス搬送装置、及び板ガラス搬送方法、並びに板ガラス検査装置
JP2015105930A (ja) * 2013-12-02 2015-06-08 旭硝子株式会社 透光性基板の微小欠陥検査方法および透光性基板の微小欠陥検査装置
JP6587211B2 (ja) * 2015-12-17 2019-10-09 日本電気硝子株式会社 ガラス板の製造方法
JP6765639B2 (ja) * 2016-12-26 2020-10-07 日本電気硝子株式会社 ガラス板の製造方法
KR20180112411A (ko) 2017-04-04 2018-10-12 원영식 챔버 잔류가스 배기장치

Also Published As

Publication number Publication date
CN116324390A (zh) 2023-06-23
WO2022075018A1 (ja) 2022-04-14
KR20230078689A (ko) 2023-06-02

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