JP2021506131A5 - - Google Patents

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Publication number
JP2021506131A5
JP2021506131A5 JP2020531513A JP2020531513A JP2021506131A5 JP 2021506131 A5 JP2021506131 A5 JP 2021506131A5 JP 2020531513 A JP2020531513 A JP 2020531513A JP 2020531513 A JP2020531513 A JP 2020531513A JP 2021506131 A5 JP2021506131 A5 JP 2021506131A5
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JP
Japan
Prior art keywords
fluoride
ammonium
acid
mass
fluorosilicate
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JP2020531513A
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English (en)
Japanese (ja)
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JP2021506131A (ja
JP7330972B2 (ja
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Priority claimed from PCT/EP2018/083684 external-priority patent/WO2019110681A1/en
Publication of JP2021506131A publication Critical patent/JP2021506131A/ja
Publication of JP2021506131A5 publication Critical patent/JP2021506131A5/ja
Application granted granted Critical
Publication of JP7330972B2 publication Critical patent/JP7330972B2/ja
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JP2020531513A 2017-12-08 2018-12-05 半導体基板からエッチング後または灰化後の残留物を除去するための洗浄剤組成物、およびそれに対応する製造方法 Active JP7330972B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP17206097.2 2017-12-08
EP17206097 2017-12-08
PCT/EP2018/083684 WO2019110681A1 (en) 2017-12-08 2018-12-05 Cleaning composition for post-etch or post ash residue removal from a semiconductor substrate and corresponding manufacturing process

Publications (3)

Publication Number Publication Date
JP2021506131A JP2021506131A (ja) 2021-02-18
JP2021506131A5 true JP2021506131A5 (enExample) 2021-12-16
JP7330972B2 JP7330972B2 (ja) 2023-08-22

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ID=60654767

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2020531513A Active JP7330972B2 (ja) 2017-12-08 2018-12-05 半導体基板からエッチング後または灰化後の残留物を除去するための洗浄剤組成物、およびそれに対応する製造方法

Country Status (8)

Country Link
US (1) US11377624B2 (enExample)
EP (1) EP3720938A1 (enExample)
JP (1) JP7330972B2 (enExample)
KR (1) KR102786662B1 (enExample)
CN (1) CN111465679A (enExample)
IL (1) IL274877B2 (enExample)
TW (1) TWI799476B (enExample)
WO (1) WO2019110681A1 (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112005345B (zh) 2018-04-27 2025-01-28 三菱瓦斯化学株式会社 水性组合物和使用其的清洗方法
KR20220058069A (ko) * 2020-10-30 2022-05-09 주식회사 이엔에프테크놀로지 세정제 조성물 및 이를 이용한 세정방법
KR20220061628A (ko) 2020-11-06 2022-05-13 주식회사 케이씨텍 연마 입자 용해용 조성물 및 이를 이용한 세정 방법
US20250235900A1 (en) * 2024-01-23 2025-07-24 Applied Materials, Inc. Water-based, high-efficiency chemical reagent for substrate surface particle removal

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6696222B2 (en) 2001-07-24 2004-02-24 Silicon Integrated Systems Corp. Dual damascene process using metal hard mask
TW200505975A (en) * 2003-04-18 2005-02-16 Ekc Technology Inc Aqueous fluoride compositions for cleaning semiconductor devices
CN100442449C (zh) 2003-05-02 2008-12-10 Ekc技术公司 半导体工艺中后蚀刻残留物的去除
JP4390616B2 (ja) 2004-04-27 2009-12-24 Necエレクトロニクス株式会社 洗浄液及び半導体装置の製造方法
US7888302B2 (en) 2005-02-03 2011-02-15 Air Products And Chemicals, Inc. Aqueous based residue removers comprising fluoride
KR20160085902A (ko) 2006-12-21 2016-07-18 엔테그리스, 아이엔씨. 에칭 후 잔류물의 제거를 위한 액체 세정제
KR20100082012A (ko) * 2007-11-16 2010-07-15 이케이씨 테크놀로지, 인코포레이티드 반도체 기판으로부터의 금속 하드 마스크 에칭 잔류물의 제거를 위한 조성물
TWI435932B (zh) * 2007-11-23 2014-05-01 Anji Microelectronics Co Ltd 用以清洗等離子蝕刻殘留物之清洗液
CN102197124B (zh) 2008-10-21 2013-12-18 高级技术材料公司 铜清洁及保护调配物
US8114773B2 (en) 2010-07-06 2012-02-14 United Microelectronics Corp. Cleaning solution, cleaning method and damascene process using the same
KR20130088847A (ko) * 2010-07-16 2013-08-08 어드밴스드 테크놀러지 머티리얼즈, 인코포레이티드 에칭 후 잔류물을 제거하기 위한 수성 세정제
WO2013136318A1 (en) * 2012-03-16 2013-09-19 Basf Se Photoresist stripping and cleaning composition, method of its preparation and its use
EP2850651A4 (en) 2012-05-18 2016-03-09 Entegris Inc AQUEOUS CLEANING SOLUTION HAVING LOW COPPER ATTACK SPEED FOR MORE EFFICIENT REMOVAL OF ORGANIC RESIDUES
US9536730B2 (en) * 2012-10-23 2017-01-03 Air Products And Chemicals, Inc. Cleaning formulations
SG10201708364XA (en) 2013-06-06 2017-11-29 Entegris Inc Compositions and methods for selectively etching titanium nitride
CN106459850A (zh) 2014-05-13 2017-02-22 巴斯夫欧洲公司 Tin障碍和清洁组合物
SG11201707787SA (en) * 2015-03-31 2017-10-30 Versum Mat Us Llc Cleaning formulations
WO2018061582A1 (ja) 2016-09-29 2018-04-05 富士フイルム株式会社 処理液および積層体の処理方法
JP7383614B2 (ja) * 2017-12-08 2023-11-20 ビーエーエスエフ ソシエタス・ヨーロピア 低k値の材料、銅、および/またはコバルトの層の存在下で、アルミニウム化合物を含む層を選択的にエッチングするための組成物および方法

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