JP2021168365A - 板状物の加工方法 - Google Patents
板状物の加工方法 Download PDFInfo
- Publication number
- JP2021168365A JP2021168365A JP2020071744A JP2020071744A JP2021168365A JP 2021168365 A JP2021168365 A JP 2021168365A JP 2020071744 A JP2020071744 A JP 2020071744A JP 2020071744 A JP2020071744 A JP 2020071744A JP 2021168365 A JP2021168365 A JP 2021168365A
- Authority
- JP
- Japan
- Prior art keywords
- resin
- sheet
- plate
- processing
- wafer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000003672 processing method Methods 0.000 title claims abstract description 7
- 239000011347 resin Substances 0.000 claims abstract description 131
- 229920005989 resin Polymers 0.000 claims abstract description 131
- 239000000463 material Substances 0.000 claims description 17
- 238000003825 pressing Methods 0.000 claims description 15
- 238000000034 method Methods 0.000 claims description 11
- NIXOWILDQLNWCW-UHFFFAOYSA-N acrylic acid group Chemical group C(C=C)(=O)O NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 claims description 8
- 239000004065 semiconductor Substances 0.000 abstract description 4
- 235000012431 wafers Nutrition 0.000 description 37
- NIXOWILDQLNWCW-UHFFFAOYSA-M Acrylate Chemical compound [O-]C(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-M 0.000 description 10
- 239000003822 epoxy resin Substances 0.000 description 8
- 229920000647 polyepoxide Polymers 0.000 description 8
- 239000007788 liquid Substances 0.000 description 6
- 239000004925 Acrylic resin Substances 0.000 description 5
- 229920000178 Acrylic resin Polymers 0.000 description 5
- -1 polyethylene terephthalate Polymers 0.000 description 5
- IISBACLAFKSPIT-UHFFFAOYSA-N bisphenol A Chemical compound C=1C=C(O)C=CC=1C(C)(C)C1=CC=C(O)C=C1 IISBACLAFKSPIT-UHFFFAOYSA-N 0.000 description 4
- JOYRKODLDBILNP-UHFFFAOYSA-N urethane group Chemical group NC(=O)OCC JOYRKODLDBILNP-UHFFFAOYSA-N 0.000 description 4
- 239000004593 Epoxy Substances 0.000 description 3
- 238000005498 polishing Methods 0.000 description 3
- PSGCQDPCAWOCSH-UHFFFAOYSA-N (4,7,7-trimethyl-3-bicyclo[2.2.1]heptanyl) prop-2-enoate Chemical compound C1CC2(C)C(OC(=O)C=C)CC1C2(C)C PSGCQDPCAWOCSH-UHFFFAOYSA-N 0.000 description 2
- PGDIJTMOHORACQ-UHFFFAOYSA-N 9-prop-2-enoyloxynonyl prop-2-enoate Chemical compound C=CC(=O)OCCCCCCCCCOC(=O)C=C PGDIJTMOHORACQ-UHFFFAOYSA-N 0.000 description 2
- KYXHKHDZJSDWEF-LHLOQNFPSA-N CCCCCCC1=C(CCCCCC)C(\C=C\CCCCCCCC(O)=O)C(CCCCCCCC(O)=O)CC1 Chemical compound CCCCCCC1=C(CCCCCC)C(\C=C\CCCCCCCC(O)=O)C(CCCCCCCC(O)=O)CC1 KYXHKHDZJSDWEF-LHLOQNFPSA-N 0.000 description 2
- CERQOIWHTDAKMF-UHFFFAOYSA-M Methacrylate Chemical compound CC(=C)C([O-])=O CERQOIWHTDAKMF-UHFFFAOYSA-M 0.000 description 2
- 125000001931 aliphatic group Chemical group 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 125000003700 epoxy group Chemical group 0.000 description 2
- 230000001678 irradiating effect Effects 0.000 description 2
- 238000002360 preparation method Methods 0.000 description 2
- MUTNCGKQJGXKEM-UHFFFAOYSA-N tamibarotene Chemical compound C=1C=C2C(C)(C)CCC(C)(C)C2=CC=1NC(=O)C1=CC=C(C(O)=O)C=C1 MUTNCGKQJGXKEM-UHFFFAOYSA-N 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- UHESRSKEBRADOO-UHFFFAOYSA-N ethyl carbamate;prop-2-enoic acid Chemical compound OC(=O)C=C.CCOC(N)=O UHESRSKEBRADOO-UHFFFAOYSA-N 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000003754 machining Methods 0.000 description 1
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 1
- 229910052753 mercury Inorganic materials 0.000 description 1
- 229920000139 polyethylene terephthalate Polymers 0.000 description 1
- 239000005020 polyethylene terephthalate Substances 0.000 description 1
- 229920001187 thermosetting polymer Polymers 0.000 description 1
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/34—Accessories
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6835—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2221/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
- H01L2221/67—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
- H01L2221/683—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L2221/68304—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L2221/68327—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used during dicing or grinding
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Mechanical Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2020071744A JP2021168365A (ja) | 2020-04-13 | 2020-04-13 | 板状物の加工方法 |
KR1020210034350A KR20210127083A (ko) | 2020-04-13 | 2021-03-17 | 판상물의 가공 방법 |
TW110112680A TW202138182A (zh) | 2020-04-13 | 2021-04-08 | 板狀物的加工方法 |
CN202110381139.5A CN113524015A (zh) | 2020-04-13 | 2021-04-09 | 板状物的加工方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2020071744A JP2021168365A (ja) | 2020-04-13 | 2020-04-13 | 板状物の加工方法 |
Publications (1)
Publication Number | Publication Date |
---|---|
JP2021168365A true JP2021168365A (ja) | 2021-10-21 |
Family
ID=78079959
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2020071744A Pending JP2021168365A (ja) | 2020-04-13 | 2020-04-13 | 板状物の加工方法 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP2021168365A (ko) |
KR (1) | KR20210127083A (ko) |
CN (1) | CN113524015A (ko) |
TW (1) | TW202138182A (ko) |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59174320A (ja) * | 1983-03-24 | 1984-10-02 | Yoshino Kogyosho Co Ltd | 円状形シ−ト体の成形方法 |
JP2011249652A (ja) * | 2010-05-28 | 2011-12-08 | Disco Abrasive Syst Ltd | ウェーハの平坦加工方法 |
JP2015518270A (ja) * | 2012-03-20 | 2015-06-25 | スリーエム イノベイティブ プロパティズ カンパニー | 一時的基板支持体及び支持体分離のための積層体、方法、並びに材料 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5957330B2 (ja) | 2012-08-01 | 2016-07-27 | 株式会社ディスコ | ウェーハ貼着装置 |
-
2020
- 2020-04-13 JP JP2020071744A patent/JP2021168365A/ja active Pending
-
2021
- 2021-03-17 KR KR1020210034350A patent/KR20210127083A/ko active Search and Examination
- 2021-04-08 TW TW110112680A patent/TW202138182A/zh unknown
- 2021-04-09 CN CN202110381139.5A patent/CN113524015A/zh active Pending
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59174320A (ja) * | 1983-03-24 | 1984-10-02 | Yoshino Kogyosho Co Ltd | 円状形シ−ト体の成形方法 |
JP2011249652A (ja) * | 2010-05-28 | 2011-12-08 | Disco Abrasive Syst Ltd | ウェーハの平坦加工方法 |
JP2015518270A (ja) * | 2012-03-20 | 2015-06-25 | スリーエム イノベイティブ プロパティズ カンパニー | 一時的基板支持体及び支持体分離のための積層体、方法、並びに材料 |
Also Published As
Publication number | Publication date |
---|---|
TW202138182A (zh) | 2021-10-16 |
KR20210127083A (ko) | 2021-10-21 |
CN113524015A (zh) | 2021-10-22 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TWI460215B (zh) | Resin coating method and resin coating device (2) | |
US9006085B2 (en) | Adhesive and protective member used in a wafer processing method | |
JP7071782B2 (ja) | ウェーハの加工方法 | |
JP6475519B2 (ja) | 保護部材の形成方法 | |
TWI754754B (zh) | 晶圓加工方法 | |
CN106992150A (zh) | 晶片的加工方法 | |
CN108022876B (zh) | 晶片的加工方法 | |
TW201029799A (en) | Resin coating method and resin coating device (1) | |
CN109300842A (zh) | 晶片的加工方法 | |
CN103302572B (zh) | 板状物的磨削方法 | |
JP2013041973A (ja) | 板状物の研削方法 | |
JP5912805B2 (ja) | 板状物の転写方法 | |
JP2021168365A (ja) | 板状物の加工方法 | |
KR102144137B1 (ko) | 판형물의 접착 방법 | |
KR102181999B1 (ko) | 확장 시트, 확장 시트의 제조 방법 및 확장 시트의 확장 방법 | |
JP6057616B2 (ja) | ウェーハの加工方法 | |
JP2013041908A (ja) | 光デバイスウェーハの分割方法 | |
US8580070B2 (en) | Method of applying an adhesive layer on thincut semiconductor chips of a semiconductor wafer | |
JP7132710B2 (ja) | ウェーハの加工方法 | |
JP2011140100A (ja) | 板状物の研削方法 | |
JP2004031535A (ja) | 粘着シートの剥離方法,粘着シートの剥離装置 | |
JP6132502B2 (ja) | ウェーハの加工方法 | |
JP6125170B2 (ja) | ウェーハの加工方法 | |
JP2017112162A (ja) | 紫外線照射方法 | |
KR20140125295A (ko) | 시트 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20230228 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20231116 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20231208 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20240123 |
|
A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20240422 |