JP2021125276A5 - - Google Patents

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JP2021125276A5
JP2021125276A5 JP2020016356A JP2020016356A JP2021125276A5 JP 2021125276 A5 JP2021125276 A5 JP 2021125276A5 JP 2020016356 A JP2020016356 A JP 2020016356A JP 2020016356 A JP2020016356 A JP 2020016356A JP 2021125276 A5 JP2021125276 A5 JP 2021125276A5
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JP2020016356A
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JP2021125276A (ja
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Priority to JP2020016356A priority Critical patent/JP2021125276A/ja
Priority claimed from JP2020016356A external-priority patent/JP2021125276A/ja
Priority to US17/158,301 priority patent/US11568908B2/en
Priority to EP21154726.0A priority patent/EP3907738B1/en
Priority to CN202110144294.5A priority patent/CN113284546A/zh
Publication of JP2021125276A publication Critical patent/JP2021125276A/ja
Publication of JP2021125276A5 publication Critical patent/JP2021125276A5/ja
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JP2020016356A 2020-02-03 2020-02-03 半導体装置 Pending JP2021125276A (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2020016356A JP2021125276A (ja) 2020-02-03 2020-02-03 半導体装置
US17/158,301 US11568908B2 (en) 2020-02-03 2021-01-26 Semiconductor device for detecting failure in address decoder
EP21154726.0A EP3907738B1 (en) 2020-02-03 2021-02-02 Semiconductor memory with detection of address circuit failures
CN202110144294.5A CN113284546A (zh) 2020-02-03 2021-02-02 半导体装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2020016356A JP2021125276A (ja) 2020-02-03 2020-02-03 半導体装置

Publications (2)

Publication Number Publication Date
JP2021125276A JP2021125276A (ja) 2021-08-30
JP2021125276A5 true JP2021125276A5 (enExample) 2022-07-28

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Family Applications (1)

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JP2020016356A Pending JP2021125276A (ja) 2020-02-03 2020-02-03 半導体装置

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US (1) US11568908B2 (enExample)
EP (1) EP3907738B1 (enExample)
JP (1) JP2021125276A (enExample)
CN (1) CN113284546A (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20230162794A1 (en) * 2021-11-22 2023-05-25 Silicon Storage Technology, Inc. Address fault detection in a memory system
KR20230077016A (ko) * 2021-11-24 2023-06-01 삼성디스플레이 주식회사 표시 장치 및 표시 장치의 데이터 보상 방법
EP4413572B1 (en) * 2021-11-30 2025-07-23 Silicon Storage Technology Inc. Hierarchical rom encoder system for performing address fault detection in a memory system
CN116206664B (zh) * 2021-11-30 2025-08-12 硅存储技术股份有限公司 存储器系统中执行地址故障检测的分层rom编码器系统
US12417798B2 (en) * 2022-04-27 2025-09-16 Invention And Collaboration Laboratory Pte. Ltd. Semiconductor memory structure
US20250308578A1 (en) * 2024-04-02 2025-10-02 Nanya Technology Corporation Data verification device and data verification method
US20250383947A1 (en) * 2024-06-17 2025-12-18 Advanced Micro Devices, Inc. Per row activation counting error handling

Family Cites Families (11)

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Publication number Priority date Publication date Assignee Title
US4912710A (en) * 1988-02-29 1990-03-27 Harris Corporation Self-checking random access memory
JPH04341998A (ja) * 1991-05-16 1992-11-27 Nec Corp メモリ回路
JPH06201792A (ja) * 1993-01-06 1994-07-22 Nec Corp テスト回路
EP1734536A1 (fr) * 2005-06-15 2006-12-20 STMicroelectronics SA Mémoire protégée contre des attaques par injection d'erreur dans des signaux de sélection de cellules mémoire
EP2100308B1 (de) * 2006-12-07 2011-07-06 Continental Teves AG & Co. oHG Verfahren und halbleiterspeicher mit einer einrichtung zur erkennung von adressierungsfehlern
KR100915812B1 (ko) 2007-08-14 2009-09-07 주식회사 하이닉스반도체 멀티 칼럼 디코더 스트레스 테스트 회로
US9263152B1 (en) * 2014-07-23 2016-02-16 Freescale Semiconductor, Inc. Address fault detection circuit
JP2016184189A (ja) 2015-03-25 2016-10-20 ルネサスエレクトロニクス株式会社 診断プログラム、診断方法および半導体装置
US9824732B2 (en) * 2015-08-03 2017-11-21 Atmel Corporation Memory system with encoding
US10141059B2 (en) * 2016-11-30 2018-11-27 Taiwan Semiconductor Manufacturing Co., Ltd. Failure detection circuitry for address decoder for a data storage device
US10553300B2 (en) * 2017-06-09 2020-02-04 Taiwan Semiconductor Manufacturing Company, Ltd. Method of detecting address decoding error and address decoder error detection system

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