JP2020522716A5 - - Google Patents

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JP2020522716A5
JP2020522716A5 JP2019568108A JP2019568108A JP2020522716A5 JP 2020522716 A5 JP2020522716 A5 JP 2020522716A5 JP 2019568108 A JP2019568108 A JP 2019568108A JP 2019568108 A JP2019568108 A JP 2019568108A JP 2020522716 A5 JP2020522716 A5 JP 2020522716A5
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Japan
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interference pattern
holographic
rays
imaging device
holographic interferometer
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JP2019568108A
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JP2020522716A (ja
JP7276987B2 (ja
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JP2019568108A 2017-06-06 2018-06-06 ホログラフィ干渉測定分野の方法およびシステム Active JP7276987B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US15/614,687 US10725428B2 (en) 2017-06-06 2017-06-06 Methods and systems of holographic interferometry
US15/614,687 2017-06-06
PCT/IL2018/050617 WO2018225068A1 (en) 2017-06-06 2018-06-06 Methods and systems of holographic interferometry

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JP2020522716A JP2020522716A (ja) 2020-07-30
JP2020522716A5 true JP2020522716A5 (enExample) 2021-07-26
JP7276987B2 JP7276987B2 (ja) 2023-05-18

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JP2019568108A Active JP7276987B2 (ja) 2017-06-06 2018-06-06 ホログラフィ干渉測定分野の方法およびシステム

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US (1) US10725428B2 (enExample)
EP (1) EP3635328B1 (enExample)
JP (1) JP7276987B2 (enExample)
KR (1) KR102604960B1 (enExample)
CN (1) CN110914634B (enExample)
IL (1) IL271219B2 (enExample)
WO (1) WO2018225068A1 (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10725428B2 (en) 2017-06-06 2020-07-28 RD Synergy Ltd. Methods and systems of holographic interferometry
US11892292B2 (en) 2017-06-06 2024-02-06 RD Synergy Ltd. Methods and systems of holographic interferometry
CN112969899B (zh) 2018-10-30 2023-03-10 Rd 辛纳基有限公司 全息干涉法的系统和方法
JP7227604B2 (ja) * 2019-03-20 2023-02-22 株式会社日立ハイテクサイエンス 三次元形状測定方法および三次元形状測定装置
CN111459004B (zh) * 2020-04-14 2021-09-14 清华大学 双光路合成孔径全息图拼接方法
US11499815B2 (en) 2020-12-08 2022-11-15 International Business Machines Corporation Visual quality assessment augmentation employing holographic interferometry
CN113472985B (zh) * 2021-06-28 2023-03-24 平湖莱顿光学仪器制造有限公司 一种基于微分干涉显微镜采集图像的视频处理方法和装置
KR102780556B1 (ko) * 2022-10-12 2025-03-12 (주)힉스컴퍼니 디지털 홀로그래픽 현미경의 빔 세기와 빔 경로 길이를 조절하는 방법 및 장치
US12467737B1 (en) * 2025-03-06 2025-11-11 Camtek Ltd. Self-referencing interferometric microscope

Family Cites Families (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4478481A (en) 1982-02-12 1984-10-23 University Of Dayton Production of diffraction limited holographic images
JPH04204032A (ja) * 1990-11-30 1992-07-24 Hitachi Ltd レンズ光学性能測定装置
US5515183A (en) * 1991-08-08 1996-05-07 Citizen Watch Co., Ltd. Real-time holography system
JPH08219718A (ja) * 1995-02-08 1996-08-30 Nikon Corp 面位置検出装置
US7471430B1 (en) 1997-12-15 2008-12-30 The United States Of America As Represented By The Secretary Of The Air Force Holographic image corrector
JP2000346612A (ja) 1999-06-04 2000-12-15 Sony Corp 干渉計および干渉測定方法
US6512385B1 (en) 1999-07-26 2003-01-28 Paul Pfaff Method for testing a device under test including the interference of two beams
JP2001227907A (ja) 2000-02-16 2001-08-24 Fuji Photo Optical Co Ltd フーリエ変換を用いた縞解析方法
JP4583611B2 (ja) 2001-01-11 2010-11-17 富士フイルム株式会社 斜入射干渉計装置
JP2003167500A (ja) * 2001-11-30 2003-06-13 Art Nau:Kk ホログラム作成方法
JP2003302205A (ja) 2002-02-07 2003-10-24 Nikon Corp シアリング干渉測定方法及びシアリング干渉計、投影光学系の製造方法、投影光学系、及び投影露光装置
EP1411321B1 (en) 2002-10-15 2017-04-19 Mitutoyo Corporation Interferometer using an integrated imaging array, a high-density polarizer and a phase-shifting array
FR2852409B1 (fr) 2003-03-11 2005-06-17 Dispositif pour la generation d'une porteuse dans un interferogramme
JP2004309402A (ja) 2003-04-10 2004-11-04 Mitsutoyo Corp 干渉測定装置及び位相シフト縞解析装置
PL1631788T3 (pl) 2003-05-16 2007-08-31 Univ Bruxelles Cyfrowy mikroskop holograficzny do trójwymiarowego obrazowania i sposób jego stosowania
KR20060052699A (ko) 2003-06-11 2006-05-19 솔비젼 인코포레이티드 감도 및 다이내믹 레인지가 증가된 3d 및 2d 측정장치 및방법
JP2005233772A (ja) 2004-02-19 2005-09-02 Mitsutoyo Corp 干渉計
DE102006049612A1 (de) * 2006-10-20 2008-04-30 Carl Zeiss Smt Ag Beleuchtungseinrichtung und Maske für eine Mikrolithographie-Projektionsbelichtungsanlage sowie Verfahren zur lithographischen Belichtung eines Gegenstandes
JP2008304567A (ja) * 2007-06-05 2008-12-18 Tdk Corp ホログラム記録媒体及びその製造方法
US20110255097A1 (en) 2010-03-18 2011-10-20 Gilad Golan Method and system for evaluating a height of structures
US9360423B2 (en) * 2011-07-01 2016-06-07 Canon Kabushiki Kaisha Optical system for a holographic microscope including a spatial filter
JP5954979B2 (ja) * 2011-12-15 2016-07-20 キヤノン株式会社 多波長干渉計を有する計測装置
JP6202499B2 (ja) 2012-09-27 2017-09-27 国立大学法人北海道大学 光位相測定方法、光位相測定装置および光通信装置
CN106164784B (zh) * 2014-02-06 2019-07-12 林瑟科技公司 数字全息设备
EP3303985A4 (en) * 2015-05-28 2018-06-27 Cylite Pty Ltd High resolution 3-d spectral domain optical imaging apparatus and method
US10725428B2 (en) 2017-06-06 2020-07-28 RD Synergy Ltd. Methods and systems of holographic interferometry

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