JP2020516076A - 基板洗浄装置 - Google Patents
基板洗浄装置 Download PDFInfo
- Publication number
- JP2020516076A JP2020516076A JP2019553937A JP2019553937A JP2020516076A JP 2020516076 A JP2020516076 A JP 2020516076A JP 2019553937 A JP2019553937 A JP 2019553937A JP 2019553937 A JP2019553937 A JP 2019553937A JP 2020516076 A JP2020516076 A JP 2020516076A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- chuck
- ultrasonic
- mask
- cleaning apparatus
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
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Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70908—Hygiene, e.g. preventing apparatus pollution, mitigating effect of pollution or removing pollutants from apparatus
- G03F7/70925—Cleaning, i.e. actively freeing apparatus from pollutants, e.g. using plasma cleaning
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
- B08B3/04—Cleaning involving contact with liquid
- B08B3/10—Cleaning involving contact with liquid with additional treatment of the liquid or of the object being cleaned, e.g. by heat, by electricity or by vibration
- B08B3/12—Cleaning involving contact with liquid with additional treatment of the liquid or of the object being cleaned, e.g. by heat, by electricity or by vibration by sonic or ultrasonic vibrations
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/68—Preparation processes not covered by groups G03F1/20 - G03F1/50
- G03F1/82—Auxiliary processes, e.g. cleaning or inspecting
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/707—Chucks, e.g. chucking or un-chucking operations or structural details
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67051—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68728—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a plurality of separate clamping members, e.g. clamping fingers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68764—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a movable susceptor, stage or support, others than those only rotating on their own vertical axis, e.g. susceptors on a rotating caroussel
Abstract
Description
Claims (14)
- 基板を支持し且つクランプするチャックアセンブリと、
前記基板の上面に液体を噴射する少なくとも1つの第1ノズルと、
前記基板を超音波または高周波超音波洗浄するために前記基板の上面の上方に配置された超音波または高周波超音波装置であって、前記超音波または高周波超音波装置と前記基板の前記上面との間にはギャップが形成され、前記ギャップが液体によって十分に且つ連続的に満たされることによって、洗浄工程の期間中は、前記超音波または高周波超音波装置の下方全体が常に液体で満たされるように構成された超音波または高周波超音波装置とを備えていることを特徴とする基板洗浄装置。 - 前記チャックアセンブリが、
基板を保持するための受容キャビティを有するチャックと、
前記チャックに固定された回転スピンドルと、
前記回転スピンドルに接続されて前記回転スピンドル及び前記チャックを回転させる回転駆動機構と、
前記基板を支持するために前記チャックの受容キャビティ内に配置された複数の支持ピンと、
前記基板をクランプするために前記チャックに取り付けられた複数のクランプ装置とを備えており、
前記超音波または高周波超音波装置は、前記基板を超音波または高周波超音波洗浄するために前記基板の前記上面及び前記チャックの上面の上方に配置され、前記超音波または高周波超音波装置と前記基板の前記上面及び前記チャックの前記上面との間にはギャップが形成されることを特徴とする請求項1に記載の基板洗浄装置。 - 前記回転スピンドルは中空構造であって前記チャックの底部に固定されており、前記チャックの前記底部には前記受容キャビティ及び前記回転スピンドルに連通した貫通孔が設けられており、前記基板の底面を洗浄するために前記チャックの前記貫通孔及び前記回転スピンドルを第2ノズルが通過していることを特徴とする請求項2に記載の基板洗浄装置。
- 前記第2ノズルは、その下端から上端まで延在し且つ前記第2ノズルの前記上端を貫通した、前記基板の底面に液体を噴射する少なくとも1つの液体流路を有していることを特徴とする請求項3に記載の基板洗浄装置。
- 前記第2ノズルの前記下端には、前記液体流路に液体を供給するための入口が設けられていることを特徴とする請求項4に記載の基板洗浄装置。
- 前記チャックの底部には複数のドレイン孔が設けられており、前記複数のドレイン孔が前記受容キャビティと連通していることを特徴とする請求項2に記載の基板洗浄装置。
- 前記チャックの底部は前記受容キャビティ内に傾斜面を有しており、前記傾斜面は前記受容キャビティ内の液体を前記複数のドレイン孔に流すことが可能なものであることを特徴とする請求項6に記載の基板洗浄装置。
- 各クランプ装置が、遠心力によって前記基板をクランプするためのクランプピンを有していることを特徴とする請求項1に記載の基板洗浄装置。
- 前記受容キャビティの開口形状が前記基板の形状と一致していることを特徴とする請求項1に記載の基板洗浄装置。
- 前記基板がマスクであり、前記受容キャビティの開口形状が実質的に正方形であることを特徴とする請求項1に記載の基板洗浄装置。
- 4つの前記クランプ装置が前記チャックに取り付けられており、前記受容キャビティの四隅に位置していることを特徴とする請求項10に記載の基板洗浄装置。
- 各クランプ装置がクランプピンを有しており、前記クランプピンの上端には、前記マスクの角部をクランプするために実質的に直角のスロットが設けられていることを特徴とする請求項11に記載の基板洗浄装置。
- 4つの前記クランプ装置に対応して、4つの支持ピンが前記受容キャビティの四隅に位置していることを特徴とする請求項11に記載の基板洗浄装置。
- 前記基板の上面と前記チャックの上面とが同一平面上にあることを特徴とする請求項2に記載の基板洗浄装置。
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/CN2017/078732 WO2018176306A1 (en) | 2017-03-30 | 2017-03-30 | Substrate cleaning apparatus |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2020516076A true JP2020516076A (ja) | 2020-05-28 |
JP7056969B2 JP7056969B2 (ja) | 2022-04-19 |
Family
ID=63673935
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2019553937A Active JP7056969B2 (ja) | 2017-03-30 | 2017-03-30 | 基板洗浄装置 |
Country Status (6)
Country | Link |
---|---|
US (1) | US11298727B2 (ja) |
JP (1) | JP7056969B2 (ja) |
KR (1) | KR102415678B1 (ja) |
CN (1) | CN110461484B (ja) |
SG (1) | SG11201909037TA (ja) |
WO (1) | WO2018176306A1 (ja) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN116494270B (zh) * | 2023-06-29 | 2023-09-12 | 苏州安田丰科技有限公司 | 一种光掩膜版清洗用上下料机械手 |
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2017
- 2017-03-30 JP JP2019553937A patent/JP7056969B2/ja active Active
- 2017-03-30 US US16/499,705 patent/US11298727B2/en active Active
- 2017-03-30 CN CN201780089141.7A patent/CN110461484B/zh active Active
- 2017-03-30 KR KR1020197031665A patent/KR102415678B1/ko active IP Right Grant
- 2017-03-30 SG SG11201909037T patent/SG11201909037TA/en unknown
- 2017-03-30 WO PCT/CN2017/078732 patent/WO2018176306A1/en active Application Filing
Patent Citations (5)
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JPS62166517A (ja) * | 1986-01-20 | 1987-07-23 | Hitachi Electronics Eng Co Ltd | 半導体製造装置のスピンヘツド |
JPH09199458A (ja) * | 1996-01-22 | 1997-07-31 | Dainippon Screen Mfg Co Ltd | 基板処理装置 |
JP2007150172A (ja) * | 2005-11-30 | 2007-06-14 | Shibaura Mechatronics Corp | 基板の処理装置 |
JP2012511813A (ja) * | 2008-12-12 | 2012-05-24 | エーシーエム リサーチ (シャンハイ) インコーポレーテッド | 半導体ウェーハの洗浄方法、および装置 |
JP2013016857A (ja) * | 2012-09-27 | 2013-01-24 | Tokyo Electron Ltd | 超音波現像処理方法及び超音波現像処理装置 |
Also Published As
Publication number | Publication date |
---|---|
JP7056969B2 (ja) | 2022-04-19 |
CN110461484B (zh) | 2022-12-27 |
US11298727B2 (en) | 2022-04-12 |
SG11201909037TA (en) | 2019-10-30 |
KR102415678B1 (ko) | 2022-07-04 |
CN110461484A (zh) | 2019-11-15 |
KR20190135022A (ko) | 2019-12-05 |
US20210187563A1 (en) | 2021-06-24 |
WO2018176306A1 (en) | 2018-10-04 |
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