JP2020076715A - 塗工量の計測方法 - Google Patents
塗工量の計測方法 Download PDFInfo
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- JP2020076715A JP2020076715A JP2018211599A JP2018211599A JP2020076715A JP 2020076715 A JP2020076715 A JP 2020076715A JP 2018211599 A JP2018211599 A JP 2018211599A JP 2018211599 A JP2018211599 A JP 2018211599A JP 2020076715 A JP2020076715 A JP 2020076715A
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- coating
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
- G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
- G01B15/025—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness by measuring absorption
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
- G01B15/04—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/08—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
- G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
- G01B15/04—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures
- G01B15/045—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures by measuring absorption
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/20—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring contours or curvatures, e.g. determining profile
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01G—WEIGHING
- G01G17/00—Apparatus for or methods of weighing material of special form or property
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Coating Apparatus (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Abstract
Description
2、2’、2A、2B シート状基材
3、3’ 塗工物
10、10’、10A、10B 第1センサ
20、20’、20A、20B 第2センサ
30、30’ 塗工機
Claims (3)
- 搬送されるシート状基材に対して塗工機で塗布した塗工物の塗工量を計測する塗工量の計測方法であって、
前記塗工機の上流側で前記シート状基材の凹凸形状を示す第1計測情報を取得し、前記シート状基材に設定された計測範囲の第1凹凸プロファイルを作成する第1プロファイル作成工程と、
前記塗工機の下流側で前記シート状基材の凹凸形状を示す第2計測情報を取得し、前記計測範囲の第2凹凸プロファイルを作成する第2プロファイル作成工程と、
前記第1凹凸プロファイルの形状と前記第2凹凸プロファイルの形状をマッチングするときの位置関係に基づいて、前記第1計測情報と前記第2計測情報の差分から塗工量を算出する塗工量算出工程と、を含む塗工量の計測方法。 - 前記第1凹凸プロファイル及び前記第2凹凸プロファイルが、前記シート状基材の搬送方向のプロファイルである請求項1に記載の塗工量の計測方法。
- 前記第1凹凸プロファイル及び前記第2凹凸プロファイルが、前記シート状基材の搬送方向に直交する方向のプロファイルである請求項1または2に記載の塗工量の計測方法。
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2018211599A JP6867357B2 (ja) | 2018-11-09 | 2018-11-09 | 塗工量の計測方法 |
US16/671,662 US10982956B2 (en) | 2018-11-09 | 2019-11-01 | Method for measuring amount of applied coating |
CN201911079861.2A CN111174737B (zh) | 2018-11-09 | 2019-11-06 | 涂覆量的计测方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2018211599A JP6867357B2 (ja) | 2018-11-09 | 2018-11-09 | 塗工量の計測方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2020076715A true JP2020076715A (ja) | 2020-05-21 |
JP6867357B2 JP6867357B2 (ja) | 2021-04-28 |
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JP2018211599A Active JP6867357B2 (ja) | 2018-11-09 | 2018-11-09 | 塗工量の計測方法 |
Country Status (3)
Country | Link |
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US (1) | US10982956B2 (ja) |
JP (1) | JP6867357B2 (ja) |
CN (1) | CN111174737B (ja) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112880607B (zh) * | 2021-01-18 | 2022-10-04 | 中天科技精密材料有限公司 | 圆棒产品检测装置 |
US11982523B2 (en) | 2021-10-13 | 2024-05-14 | Honeywell International Inc. | Lib anode coating measurement with dual x-ray |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0890447B1 (en) * | 1997-07-11 | 2004-06-02 | Dai Nippon Printing Co., Ltd. | Image receiving sheet for thermal transfer printing and method for manufacturing same |
JP2000205830A (ja) | 1999-01-20 | 2000-07-28 | Kawatetsu Galvanizing Co Ltd | 塗装膜厚の測定方法および装置 |
US6805899B2 (en) * | 2002-01-30 | 2004-10-19 | Honeywell International Inc. | Multi-measurement/sensor coating consolidation detection method and system |
JP4010188B2 (ja) | 2002-05-31 | 2007-11-21 | 東レ株式会社 | 塗膜の厚さ測定方法および測定装置と塗膜形成部材の製造方法 |
JP4247890B2 (ja) * | 2003-08-12 | 2009-04-02 | 東京エレクトロン株式会社 | 塗布ノズル及び塗布装置 |
JP4262592B2 (ja) * | 2003-12-26 | 2009-05-13 | 株式会社日立ハイテクノロジーズ | パターン計測方法 |
JP4294713B1 (ja) * | 2008-03-14 | 2009-07-15 | 株式会社 英田エンジニアリング | 形状計測システム |
CN102271825B (zh) * | 2009-01-15 | 2013-11-13 | 丰田自动车株式会社 | 涂敷膜的宽度的检查方法以及用于该检查方法的检查装置 |
JP5368833B2 (ja) | 2009-03-05 | 2013-12-18 | トヨタ自動車株式会社 | 塗工機 |
TWI470184B (zh) * | 2011-08-20 | 2015-01-21 | Tonta Electro Optical Co Ltd | 表面輪廓偵測裝置及其對位方法以及全口徑量測資料的擷取方法 |
JP5739778B2 (ja) * | 2011-09-21 | 2015-06-24 | 株式会社日立製作所 | ペースト塗布方法 |
CN102865847B (zh) * | 2012-10-10 | 2015-06-24 | 北京精雕科技集团有限公司 | 基于路径单元的测量轮廓偏差的样条曲线补偿方法 |
RU2549211C1 (ru) * | 2013-11-05 | 2015-04-20 | федеральное государственное бюджетное научное учреждение "Научно-исследовательский радиофизический институт" | Способ удаленного контроля формы поверхности и толщины покрытий, получаемых в процессе магнетронного вакуумного напыления, и устройство для его осуществления |
KR102043459B1 (ko) * | 2013-11-11 | 2019-11-11 | 삼성에스디아이 주식회사 | 극판 두께 측정 장치 및 방법 |
CN105983582B (zh) * | 2015-02-28 | 2018-04-27 | 宝山钢铁股份有限公司 | 一种热连轧带钢的厚度反馈控制方法 |
JP6680552B2 (ja) * | 2016-02-08 | 2020-04-15 | Ntn株式会社 | 形状測定装置および被塗布対象物の製造方法 |
CN106767447B (zh) * | 2016-11-24 | 2019-07-23 | 杭州远流科技有限公司 | 一种提高皮带运输系统中物料外形检测精度的方法 |
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2018
- 2018-11-09 JP JP2018211599A patent/JP6867357B2/ja active Active
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2019
- 2019-11-01 US US16/671,662 patent/US10982956B2/en active Active
- 2019-11-06 CN CN201911079861.2A patent/CN111174737B/zh active Active
Also Published As
Publication number | Publication date |
---|---|
US10982956B2 (en) | 2021-04-20 |
CN111174737A (zh) | 2020-05-19 |
CN111174737B (zh) | 2021-08-24 |
JP6867357B2 (ja) | 2021-04-28 |
US20200149882A1 (en) | 2020-05-14 |
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