JP2019508886A - 基板処理システム内の1つ以上の環境状態の存在を検出するためのシステムおよび方法 - Google Patents
基板処理システム内の1つ以上の環境状態の存在を検出するためのシステムおよび方法 Download PDFInfo
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- 239000000758 substrate Substances 0.000 title claims abstract description 188
- 238000012545 processing Methods 0.000 title claims abstract description 77
- 238000000034 method Methods 0.000 title claims abstract description 62
- 230000007613 environmental effect Effects 0.000 title description 4
- 238000003860 storage Methods 0.000 claims abstract description 118
- 230000004044 response Effects 0.000 claims abstract description 13
- 238000012546 transfer Methods 0.000 claims description 70
- 230000008569 process Effects 0.000 claims description 25
- 238000012544 monitoring process Methods 0.000 claims description 23
- 239000000356 contaminant Substances 0.000 claims description 8
- 239000012855 volatile organic compound Substances 0.000 claims description 7
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims description 5
- 239000001301 oxygen Substances 0.000 claims description 5
- 229910052760 oxygen Inorganic materials 0.000 claims description 5
- 238000010926 purge Methods 0.000 claims description 5
- 238000009529 body temperature measurement Methods 0.000 claims description 4
- 239000011261 inert gas Substances 0.000 claims description 4
- 230000003213 activating effect Effects 0.000 claims description 3
- 239000002923 metal particle Substances 0.000 claims description 3
- 229910052751 metal Inorganic materials 0.000 claims description 2
- 239000002184 metal Substances 0.000 claims description 2
- 238000004891 communication Methods 0.000 description 20
- 230000006870 function Effects 0.000 description 11
- 239000007789 gas Substances 0.000 description 7
- 238000010586 diagram Methods 0.000 description 6
- 230000002093 peripheral effect Effects 0.000 description 6
- 238000004590 computer program Methods 0.000 description 5
- 238000012864 cross contamination Methods 0.000 description 5
- 238000005259 measurement Methods 0.000 description 5
- 238000012986 modification Methods 0.000 description 5
- 230000004048 modification Effects 0.000 description 5
- 238000010943 off-gassing Methods 0.000 description 5
- 230000003287 optical effect Effects 0.000 description 5
- 230000005540 biological transmission Effects 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 230000000875 corresponding effect Effects 0.000 description 3
- 238000005468 ion implantation Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 230000002688 persistence Effects 0.000 description 3
- 238000005086 pumping Methods 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 238000009825 accumulation Methods 0.000 description 2
- 238000007792 addition Methods 0.000 description 2
- 230000008901 benefit Effects 0.000 description 2
- WYEMLYFITZORAB-UHFFFAOYSA-N boscalid Chemical compound C1=CC(Cl)=CC=C1C1=CC=CC=C1NC(=O)C1=CC=CN=C1Cl WYEMLYFITZORAB-UHFFFAOYSA-N 0.000 description 2
- 238000005229 chemical vapour deposition Methods 0.000 description 2
- 150000001875 compounds Chemical class 0.000 description 2
- 230000001276 controlling effect Effects 0.000 description 2
- 238000011143 downstream manufacturing Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- 239000000835 fiber Substances 0.000 description 2
- 230000036541 health Effects 0.000 description 2
- 238000007689 inspection Methods 0.000 description 2
- 238000001459 lithography Methods 0.000 description 2
- 238000012423 maintenance Methods 0.000 description 2
- 239000013307 optical fiber Substances 0.000 description 2
- 230000002085 persistent effect Effects 0.000 description 2
- 238000005240 physical vapour deposition Methods 0.000 description 2
- 229920001690 polydopamine Polymers 0.000 description 2
- 235000012431 wafers Nutrition 0.000 description 2
- 208000027418 Wounds and injury Diseases 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 238000000149 argon plasma sintering Methods 0.000 description 1
- 230000001413 cellular effect Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 230000002596 correlated effect Effects 0.000 description 1
- 230000006378 damage Effects 0.000 description 1
- 230000001934 delay Effects 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 238000003795 desorption Methods 0.000 description 1
- 230000001627 detrimental effect Effects 0.000 description 1
- 239000002019 doping agent Substances 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 230000000977 initiatory effect Effects 0.000 description 1
- 208000014674 injury Diseases 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 238000004949 mass spectrometry Methods 0.000 description 1
- 238000010295 mobile communication Methods 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 238000000059 patterning Methods 0.000 description 1
- 229920002120 photoresistant polymer Polymers 0.000 description 1
- 238000007670 refining Methods 0.000 description 1
- 230000006903 response to temperature Effects 0.000 description 1
- 230000002441 reversible effect Effects 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 230000002459 sustained effect Effects 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
- 238000011144 upstream manufacturing Methods 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
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Abstract
Description
Claims (15)
- 基板処理クラスタツールを作動させる方法であって、
1つ以上の基板を受け入れるように寸法決めされ構成された内部容積部を画定する基板収納カセットを、前記基板処理クラスタツールのファクトリインターフェース内に配置することと、
前記内部容積部内の複数の状態のうちの1つの状態の発生と、前記内部容積部内の前記複数の状態のうちの1つの状態の持続とのうちの少なくとも一方を、複数のセンサと作動的に関連付けられたプロセッサによる格納された命令の実行により、感知することと、
前記感知することに応答して、アラートを生成することと、前記基板収納カセットに関する代替的工程を実行することとのうちの少なくとも一方を行うことと、
を含む方法。 - 前記感知することが、前記基板収納カセット内の温度を感知することを含み、リアルタイム温度測定値が、前記温度を感知することに応答して、記録されることと、表示されることとのうちの少なくとも一方である、請求項1に記載の基板処理クラスタツールを作動させる方法。
- 感知された温度が、選択された温度閾値と温度持続閾値のうちの少なくとも一方を超えていることに応答して、前記アラートが、生成されることと、
感知された温度が、所定の温度未満である場合に、前記アラートが、前記基板収納カセットの取り扱い安全状態を含むことと、
のうちの少なくとも一方である、請求項2に記載の方法。 - 前記感知することが、前記基板収納カセットに関する第1のプロセスの終了と前記基板収納カセットに関する第2のプロセスの開始との間の経過時間を測定することと、表示することとのうちの少なくとも一方を含む、請求項1に記載の方法。
- 前記アラートが、可視の経過時間表示と可聴の経過時間超過表示のうちの少なくとも一方を含む、請求項4に記載の方法。
- 前記感知することが、
光源を作動させて、前記基板収納カセットおよび前記ファクトリインターフェースのうちの少なくとも一方の中の1種以上の空中浮遊汚染物質の濃度を測定することと、監視することとのうちの少なくとも一方を行うことと、
前記基板収納カセットおよび前記ファクトリインターフェースのうちの少なくとも一方の中の空中浮遊揮発性有機化合物、酸素濃度および空中浮遊金属微粒子のうちの少なくとも1つを監視することと、
前記基板収納カセット内の相対湿度を監視することと、
のうちの1つ以上を含む、請求項1に記載の方法。 - 前記代替的工程が、
基板を前記クラスタツールの処理チャンバから前記内部容積部に移送する前に、不活性ガス内で前記基板収納カセットの前記内部容積部をパージすることと、
前記基板収納カセットの前記内部容積部から前記クラスタツールの処理チャンバ内への基板の移送を一時停止することと、
のうちの少なくとも一方を含む、請求項1に記載の方法。 - 基板処理チャンバを含む少なくとも1つのツールと、
複数の基板収納カセットを受け入れるように寸法決めされ構成された密封された内部キャビティを画定するファクトリインターフェースと、
前記内部キャビティ内に配置された少なくとも1つの基板収納カセットであって、各基板収納カセットが、1つ以上の基板を受け入れるように寸法決めされ構成された内部容積部を画定する、少なくとも1つの基板収納カセットと、
複数のセンサと、
前記複数のセンサおよび命令を含むメモリと作動的に関連付けられたプロセッサであって、前記命令が、
前記内部容積部内の複数の状態のうちの1つの状態の発生と、前記内部容積部内の前記複数の状態のうちの1つの状態の持続とのうちの少なくとも一方を感知し、
前記感知に応答して、アラートを生成することと、前記基板収納カセットに関する代替的工程を実行することとのうちの少なくとも一方を行うように、
前記プロセッサによって実行可能である、プロセッサと、
を備える基板処理クラスタツール。 - 前記メモリが、前記基板収納カセット内の温度を感知し、前記温度感知に応答して、リアルタイム温度測定値を記録することと表示することのうちの少なくとも一方を行うように、前記プロセッサーによって実行可能である命令を含む、請求項8に記載の基板処理クラスタツール。
- 前記感知された温度が、選択された温度閾値と温度持続閾値のうちの少なくとも一方を超えていることに応答して、前記メモリに格納され前記プロセッサによって実行可能な前記命令が、アラートを生成する、請求項9に記載の基板処理クラスタツール。
- 前記感知された温度が、所定の温度未満である場合に、前記メモリに格納され前記プロセッサによって実行可能な前記命令が、基板収納カセット取り扱い安全アラートを生成する、請求項9に記載の基板処理クラスタツール。
- 前記メモリが、前記少なくとも1つの基板収納カセットに関する第1のプロセスの終了と前記少なくとも1つの基板収納カセットに関する第2のプロセスの開始との間の経過時間を測定することと表示することのうちの少なくとも1つを行うように、前記プロセッサによって実行可能である命令を含み、
前記アラートが、可視の経過時間表示と可聴の経過時間超過表示のうちの少なくとも一方を含む、
請求項8に記載の基板処理クラスタツール。 - 前記メモリに格納された前記代替的工程のための命令が、
基板を前記処理チャンバから前記少なくとも1つの基板収納カセットの前記内部容積部に移送する前に、不活性ガスで前記基板収納カセットの前記内部容積部をパージすることと、
前記少なくとも1つの基板収納カセットの前記内部容積部から前記処理チャンバ内への基板の移送を一時停止することと、
のうちの少なくとも一方を行なうように、前記プロセッサによって実行可能である、請求項8に記載の基板処理クラスタツール。 - 基板処理ツールとともに使用するための基板収納監視システムであって、
前記基板処理ツールのファクトリインターフェースの内部キャビティ内に配置されるように寸法決めされ構成された少なくとも1つの基板収納カセットであって、各基板収納カセットが、1つ以上の基板を受け入れるように寸法決めされ構成された内部容積部を画定する、少なくとも1つの基板収納カセットと、
複数のセンサと、
前記複数のセンサおよび命令を含むメモリと作動的に関連付けられたプロセッサであって、前記命令が、
前記内部容積部内の複数の状態のうちの1つの状態の発生と、前記内部容積部内の前記複数の状態のうちの1つの状態の持続とのうちの少なくとも一方を感知し、
前記感知に応答して、アラートを生成することと、前記基板収納カセットに関する代替的工程を実行することとのうちの少なくとも一方を行うように、
前記プロセッサによって実行可能である、プロセッサと、
を備える基板収納監視システム。 - 前記複数のセンサが、温度センサと、湿度センサと、1つ以上の空中浮遊成分センサとのうちの少なくとも1つを含み、前記1つ以上の空中浮遊成分センサが、空中浮遊金属微粒子センサと、酸素センサと、揮発性有機化合物センサとのうちの少なくとも1つを含む、請求項14に記載の基板収納監視システム。
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Application Number | Priority Date | Filing Date | Title |
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US201662287429P | 2016-01-26 | 2016-01-26 | |
US62/287,429 | 2016-01-26 | ||
US15/048,258 US10192762B2 (en) | 2016-01-26 | 2016-02-19 | Systems and methods for detecting the existence of one or more environmental conditions within a substrate processing system |
US15/048,258 | 2016-02-19 | ||
PCT/US2017/014842 WO2017132203A1 (en) | 2016-01-26 | 2017-01-25 | Systems and methods for detecting the existence of one or more environmental conditions within a substrate processing system |
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JP2019508886A5 JP2019508886A5 (ja) | 2020-04-02 |
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JP6945357B2 (ja) * | 2017-06-08 | 2021-10-06 | 東京エレクトロン株式会社 | 制御装置。 |
WO2019140200A1 (en) * | 2018-01-15 | 2019-07-18 | Applied Materials, Inc. | Advanced temperature monitoring system and methods for semiconductor manufacture productivity |
CN112074940A (zh) * | 2018-03-20 | 2020-12-11 | 东京毅力科创株式会社 | 结合有集成半导体加工模块的自感知校正异构平台及其使用方法 |
JP7411641B2 (ja) * | 2018-09-12 | 2024-01-11 | ラム リサーチ コーポレーション | 粒子測定方法および粒子測定装置 |
US11037838B2 (en) * | 2018-09-18 | 2021-06-15 | Applied Materials, Inc. | In-situ integrated chambers |
US11469123B2 (en) * | 2019-08-19 | 2022-10-11 | Applied Materials, Inc. | Mapping of a replacement parts storage container |
US11688616B2 (en) * | 2020-07-22 | 2023-06-27 | Applied Materials, Inc. | Integrated substrate measurement system to improve manufacturing process performance |
US20220269177A1 (en) * | 2021-02-23 | 2022-08-25 | Tokyo Electron Limited | Sensor technology integration into coating track |
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US10192762B2 (en) | 2019-01-29 |
TW201732984A (zh) | 2017-09-16 |
US20170213750A1 (en) | 2017-07-27 |
JP6989510B2 (ja) | 2022-01-05 |
WO2017132203A1 (en) | 2017-08-03 |
TWI745343B (zh) | 2021-11-11 |
CN108604565B (zh) | 2024-01-12 |
KR20180099909A (ko) | 2018-09-05 |
CN108604565A (zh) | 2018-09-28 |
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