JP2019508808A - ダイナミック・ランダム・アクセス・メモリ(dram)及びセルフリフレッシュ方法 - Google Patents
ダイナミック・ランダム・アクセス・メモリ(dram)及びセルフリフレッシュ方法 Download PDFInfo
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- 238000000034 method Methods 0.000 title claims description 15
- 238000003491 array Methods 0.000 claims abstract description 30
- 238000012937 correction Methods 0.000 claims abstract description 10
- 238000001514 detection method Methods 0.000 claims abstract description 10
- 230000015654 memory Effects 0.000 claims description 12
- 230000006870 function Effects 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 5
- 238000013461 design Methods 0.000 description 4
- 239000003990 capacitor Substances 0.000 description 3
- 238000004458 analytical method Methods 0.000 description 2
- 238000013500 data storage Methods 0.000 description 2
- 230000003111 delayed effect Effects 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000000280 densification Methods 0.000 description 1
- 230000007334 memory performance Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
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- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
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- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Databases & Information Systems (AREA)
- Dram (AREA)
- Memory System (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
Abstract
Description
Claims (10)
- セルフリフレッシュ機能を有するとともに、付加コードビットを含み、
a)複数のサブアレイを備えるバンクと、
b)コードビット発生器回路と、
c)読み出されたデータに対する誤り検出訂正回路と、
d)セルフリフレッシュコントローラと、
e)ユーザコントローラと
を有することを特徴とするダイナミック・ランダム・アクセス・メモリ(DRAM)。 - 前記複数のサブアレイは、複数のユーザデータサブアレイと少なくとも1つのコードビットサブアレイとにより構成されることを特徴とする請求項1に記載のダイナミック・ランダム・アクセス・メモリ。
- 前記コードビット発生器回路は、少なくとも1つのコードビットを生成し、前記コードビットをNビットのユーザデータに加えることにより、新たなコードデータを形成することを特徴とする請求項1に記載のダイナミック・ランダム・アクセス・メモリ。
- 前記誤り検出訂正回路は、サブアレイ選択信号に基づいてコードデータにおける誤りビットを検出訂正することを特徴とする請求項1に記載のダイナミック・ランダム・アクセス・メモリ。
- コードビット発生器回路を利用してコードビットを生成し、該コードビットをNビットのユーザデータに加えて新たなコードデータを形成するaステップと、
インナバスを介して前記コードデータを複数のサブアレイに分配し、一つのユーザアドレスにつき、サブアレイのそれぞれに少なくとも1つのビットを記憶し、セルフリフレッシュ操作又はユーザ読取/書込操作において、各サブアレイに対して個別にコントロールするbステップと、
を含む、ダイナミック・ランダム・アクセス・メモリにデータを記憶する方法。 - 前記Nビットのユーザデータは、複数のサブアレイに分配されることを特徴とする請求項5に記載のダイナミック・ランダム・アクセス・メモリにデータを記憶する方法。
- 前記コードデータは、Nビットのユーザデータと付加コードビットを含むことを特徴とする請求項5に記載のダイナミック・ランダム・アクセス・メモリにデータを記憶する方法。
- リフレッシュ操作に用いられる少なくとも1つのサブアレイを選択するとともに、読取操作に用いられる複数のサブアレイを選択するステップを含むことを特徴とするダイナミック・ランダム・アクセス・メモリに対して読取及びリフレッシュを同時に実行する方法。
- 全ての選択されたサブアレイが1つのユーザアドレスにつき少なくとも1つのコードビットデータを提供し、そのうち、各サブアレイが1つのユーザアドレスにつき少なくとも1ビットを提供することを特徴とする請求項8に記載のダイナミック・ランダム・アクセス・メモリに対して読取及びリフレッシュを同時に実行する方法。
- コードデータを、誤り検出訂正回路によって、コードデータの誤りビットの位置を表すリフレッシュを実行するサブアレイのアドレス情報に基づいて訂正することができることを特徴とする請求項8に記載のダイナミック・ランダム・アクセス・メモリに対して読取及びリフレッシュを同時に実行する方法。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US15/081,849 | 2016-03-26 | ||
US15/081,849 US9514800B1 (en) | 2016-03-26 | 2016-03-26 | DRAM and self-refresh method |
PCT/CN2016/107914 WO2017166842A1 (en) | 2016-03-26 | 2016-11-30 | Dynamic random access memory (dram) and self-refresh method |
Publications (2)
Publication Number | Publication Date |
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JP2019508808A true JP2019508808A (ja) | 2019-03-28 |
JP6556957B2 JP6556957B2 (ja) | 2019-08-07 |
Family
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Application Number | Title | Priority Date | Filing Date |
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JP2018541400A Expired - Fee Related JP6556957B2 (ja) | 2016-03-26 | 2016-11-30 | ダイナミック・ランダム・アクセス・メモリ(dram)及びセルフリフレッシュ方法 |
Country Status (7)
Country | Link |
---|---|
US (1) | US9514800B1 (ja) |
JP (1) | JP6556957B2 (ja) |
KR (1) | KR101853608B1 (ja) |
CN (1) | CN106782633B (ja) |
DE (1) | DE112016006657T5 (ja) |
TW (1) | TWI626650B (ja) |
WO (1) | WO2017166842A1 (ja) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
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US10127967B1 (en) * | 2017-11-09 | 2018-11-13 | Nanya Technology Corporation | DRAM and method for operating the same |
CN108647161B (zh) * | 2018-04-17 | 2020-07-14 | 北京控制工程研究所 | 一种记录访存地址历史的硬件监测电路 |
CN110781100B (zh) * | 2019-10-23 | 2021-09-21 | 新华三信息安全技术有限公司 | 一种数据检测方法、逻辑芯片及网络设备 |
US11670356B2 (en) | 2021-07-16 | 2023-06-06 | Micron Technology, Inc. | Apparatuses and methods for refresh address masking |
CN117636991A (zh) * | 2022-08-10 | 2024-03-01 | 长鑫存储技术有限公司 | 地址刷新校验方法及装置、存储介质及电子设备 |
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2016
- 2016-03-26 US US15/081,849 patent/US9514800B1/en not_active Expired - Fee Related
- 2016-11-30 DE DE112016006657.0T patent/DE112016006657T5/de not_active Withdrawn
- 2016-11-30 JP JP2018541400A patent/JP6556957B2/ja not_active Expired - Fee Related
- 2016-11-30 WO PCT/CN2016/107914 patent/WO2017166842A1/en active Application Filing
- 2016-12-01 CN CN201611088874.2A patent/CN106782633B/zh active Active
- 2016-12-23 TW TW105142998A patent/TWI626650B/zh active
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2017
- 2017-03-14 KR KR1020170032047A patent/KR101853608B1/ko active IP Right Grant
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JP2002116953A (ja) * | 2000-10-10 | 2002-04-19 | Hitachi Electronics Eng Co Ltd | Dram制御装置及び制御方法 |
JP2003173676A (ja) * | 2001-08-03 | 2003-06-20 | Fujitsu Ltd | 半導体記憶装置 |
US20040205433A1 (en) * | 2003-04-14 | 2004-10-14 | International Business Machines Corporation | High reliability memory module with a fault tolerant address and command bus |
JP2008500676A (ja) * | 2004-05-26 | 2008-01-10 | フリースケール セミコンダクター インコーポレイテッド | キャッシュラインメモリ及びその方法 |
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US9514800B1 (en) | 2016-12-06 |
KR20170113115A (ko) | 2017-10-12 |
TWI626650B (zh) | 2018-06-11 |
CN106782633B (zh) | 2019-12-17 |
WO2017166842A1 (en) | 2017-10-05 |
CN106782633A (zh) | 2017-05-31 |
KR101853608B1 (ko) | 2018-06-08 |
TW201802811A (zh) | 2018-01-16 |
DE112016006657T5 (de) | 2018-12-27 |
JP6556957B2 (ja) | 2019-08-07 |
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