JP2019504297A5 - - Google Patents

Download PDF

Info

Publication number
JP2019504297A5
JP2019504297A5 JP2018526916A JP2018526916A JP2019504297A5 JP 2019504297 A5 JP2019504297 A5 JP 2019504297A5 JP 2018526916 A JP2018526916 A JP 2018526916A JP 2018526916 A JP2018526916 A JP 2018526916A JP 2019504297 A5 JP2019504297 A5 JP 2019504297A5
Authority
JP
Japan
Prior art keywords
radiation
dark current
pixels
photon counting
radiation detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2018526916A
Other languages
English (en)
Japanese (ja)
Other versions
JP2019504297A (ja
JP6924755B2 (ja
Filing date
Publication date
Application filed filed Critical
Priority claimed from PCT/EP2016/078481 external-priority patent/WO2017089363A1/en
Publication of JP2019504297A publication Critical patent/JP2019504297A/ja
Publication of JP2019504297A5 publication Critical patent/JP2019504297A5/ja
Application granted granted Critical
Publication of JP6924755B2 publication Critical patent/JP6924755B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2018526916A 2015-11-26 2016-11-23 光子計数放射線検出器、撮像システム、およびスペクトル放射線検出方法 Expired - Fee Related JP6924755B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP15196524 2015-11-26
EP15196524.1 2015-11-26
PCT/EP2016/078481 WO2017089363A1 (en) 2015-11-26 2016-11-23 Dark current compensation

Publications (3)

Publication Number Publication Date
JP2019504297A JP2019504297A (ja) 2019-02-14
JP2019504297A5 true JP2019504297A5 (OSRAM) 2019-12-05
JP6924755B2 JP6924755B2 (ja) 2021-08-25

Family

ID=54705437

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2018526916A Expired - Fee Related JP6924755B2 (ja) 2015-11-26 2016-11-23 光子計数放射線検出器、撮像システム、およびスペクトル放射線検出方法

Country Status (6)

Country Link
US (1) US10267928B2 (OSRAM)
EP (1) EP3380870A1 (OSRAM)
JP (1) JP6924755B2 (OSRAM)
CN (1) CN108291973B (OSRAM)
RU (1) RU2734452C2 (OSRAM)
WO (1) WO2017089363A1 (OSRAM)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110914713B (zh) 2017-07-26 2023-07-18 深圳帧观德芯科技有限公司 能够管理周边电荷共享的x射线检测器
EP3444826A1 (en) * 2017-08-14 2019-02-20 Koninklijke Philips N.V. Low profile anti scatter and anti charge sharing grid for photon counting computed tomography
EP3704514A4 (en) * 2017-10-30 2021-04-21 Shenzhen Xpectvision Technology Co., Ltd. DARK NOISE COMPENSATION IN A RADIATION DETECTOR
EP3567405A1 (en) 2018-05-08 2019-11-13 Koninklijke Philips N.V. Photon counting spectral ct
US10813607B2 (en) * 2018-06-27 2020-10-27 Prismatic Sensors Ab X-ray sensor, method for constructing an x-ray sensor and an x-ray imaging system comprising such an x-ray sensor
DE112021004892T5 (de) * 2020-09-18 2023-08-17 Analog Devices, Inc. Deltamodulierte basislinienwiederherstellung für photonenzählcomputertomographie
US11985438B2 (en) 2021-03-18 2024-05-14 Taiwan Semiconductor Manufacturing Company, Ltd. Pixel array including dark pixel sensors
JP7439027B2 (ja) * 2021-09-08 2024-02-27 富士フイルムヘルスケア株式会社 放射線撮像装置及び放射線検出器
CN118604868A (zh) * 2024-05-28 2024-09-06 福建福清核电有限公司 一种位置灵敏型门式辐射探测器干扰隔离装置

Family Cites Families (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4100739B2 (ja) 1996-10-24 2008-06-11 キヤノン株式会社 光電変換装置
DE19734717A1 (de) * 1997-08-11 1999-02-25 Sirona Dental Systems Gmbh Verfahren zur Kompensation des Dunkelstroms bei der Erstellung von zahnärztlichen Panorama- und/oder cephalometrischen Schichtaufnahmen
JP3832615B2 (ja) * 1999-08-26 2006-10-11 株式会社島津製作所 放射線検出装置
GB2370960A (en) * 2001-01-05 2002-07-10 Spectral Fusion Technologies L Partially shielded photodiode array
JP2001340324A (ja) * 2001-03-16 2001-12-11 Toshiba Medical System Co Ltd Ｘ線検出器及びそれを使ったｘ線診断装置
JP4723767B2 (ja) * 2001-09-13 2011-07-13 株式会社東芝 Ｘ線画像診断装置
JP2003209665A (ja) 2002-01-16 2003-07-25 Fuji Photo Film Co Ltd 画像読取方法および画像記録読取装置
WO2004019411A1 (ja) * 2002-08-09 2004-03-04 Hamamatsu Photonics K.K. フォトダイオードアレイ、その製造方法、及び放射線検出器
CN101137899A (zh) 2005-01-06 2008-03-05 皇家飞利浦电子股份有限公司 像素实现的电流放大器
BRPI0610720B1 (pt) * 2005-04-22 2018-01-16 Koninklijke Philips N. V. “pixel detector para uso em conjunto com um cintilador que converte uma partícula de radiação para uma rajada de luz, detector de radiação, sistema de geração de imagem de tomografia por emissão de pósitron de duração de trajetória (tof-pet), 5 método executado em conjunto com um cintilador que converte uma partícula de radiação para uma rajada de luz, e detector de radiação que inclui um cintilador e circuitos”
JP4555785B2 (ja) 2006-02-10 2010-10-06 シャープ株式会社 固定パターン雑音除去装置、固体撮像装置、電子機器、及び固定パターン雑音除去プログラム
JP5458260B2 (ja) 2006-09-25 2014-04-02 コーニンクレッカ フィリップス エヌ ヴェ 直接型ｘ線変換に基づく積分検出器に関する漏れ電流及び残留信号の補償
US7829860B2 (en) 2006-10-31 2010-11-09 Dxray, Inc. Photon counting imaging detector system
JP4462299B2 (ja) * 2007-07-17 2010-05-12 ソニー株式会社 撮像装置、および画像処理方法、並びにコンピュータ・プログラム
US8873703B2 (en) * 2008-05-08 2014-10-28 Arineta Ltd. X ray imaging system with scatter radiation correction and method of using same
JP2009284424A (ja) 2008-05-26 2009-12-03 Sony Corp 撮像装置、撮像方法及びプログラム
WO2010007544A1 (en) * 2008-07-14 2010-01-21 Koninklijke Philips Electronics N.V. Anti-scatter grid
JP2012508375A (ja) * 2008-11-10 2012-04-05 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 放射線検出器用のコンバータ・エレメント
CN102246058B (zh) * 2008-12-15 2014-06-11 皇家飞利浦电子股份有限公司 用于硅光电倍增管和其他单光子计数器的温度补偿电路
RU2518589C2 (ru) 2009-03-06 2014-06-10 Конинклейке Филипс Электроникс Н.В. Усовершенствованная температурная компенсация и схема управления для однофотонных счетчиков
JP2012045044A (ja) * 2010-08-24 2012-03-08 Fujifilm Corp 放射線画像検出装置
US9176238B2 (en) 2011-01-10 2015-11-03 Koninklijke Philips N.V. Detection device for detecting photons emitted by a radiation source
KR20140010553A (ko) * 2012-07-13 2014-01-27 삼성전자주식회사 픽셀 어레이, 이를 포함하는 이미지 센서, 및 상기 이미지 센서의 로컬 다크 전류 보상 방법
JP2014048171A (ja) * 2012-08-31 2014-03-17 Tele Systems:Kk 放射線検出器に駆動用のバイアス電圧を供給する装置及びその方法
US9510792B2 (en) * 2013-05-17 2016-12-06 Toshiba Medical Systems Corporation Apparatus and method for collimating X-rays in spectral computer tomography imaging
JP2015021843A (ja) * 2013-07-19 2015-02-02 株式会社島津製作所 放射線検出器、放射線検出装置及び放射線分析装置

Similar Documents

Publication Publication Date Title
JP2019504297A5 (OSRAM)
RU2018122963A (ru) Компенсация темнового тока
EP2871496A3 (en) Radiation detector and computed tomography apparatus using the same
EP3577495B1 (en) Coincidence-enabling photon-counting detector
Konstantinidis et al. The Dexela 2923 CMOS X-ray detector: A flat panel detector based on CMOS active pixel sensors for medical imaging applications
US10222489B2 (en) Pixel-design for use in a radiation detector
US9002084B2 (en) Systems and methods for summing signals from an imaging detector
US8373135B2 (en) Counting detector and computed tomography system
US20150346354A1 (en) Photon counting ct apparatus
JP2013034086A5 (OSRAM)
CN105593701B (zh) 混合光子计数数据采集系统
WO2012098477A3 (en) Photon counting detector pixel having an anode including two or more alternatively selectable and separate sub-anodes
US11147522B2 (en) Photon counting detector and x-ray computed tomography apparatus
JP2018527981A5 (OSRAM)
KR20200024299A (ko) x-선 영상화 시스템에서 기하학적 오정렬 관리
WO2013126649A3 (en) X-ray imager with sparse detector array
WO2015196074A3 (en) X-ray detector operable in a mixed photon-counting/analog output mode
US20160206255A1 (en) Hybrid passive/active multi-layer energy discriminating photon-counting detector
JP2015187567A5 (OSRAM)
JP6619258B2 (ja) Ｘ線検出器、ｘ線ｃｔ装置、ｘ線検出方法、及びｘ線検出プログラム
US20160095564A1 (en) X-ray ct apparatus, image processing apparatus, and image processing method
JP2016131886A (ja) Ｘ線ｃｔ装置
US9433391B2 (en) Scintillator and radiation detection device
CN105581804B (zh) 通过量子计数检测器来优化信号检测
US10175368B2 (en) Detector for Compton camera and Compton camera