JP2019136810A - Cutting device and cut product manufacturing method - Google Patents

Cutting device and cut product manufacturing method Download PDF

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JP2019136810A
JP2019136810A JP2018021300A JP2018021300A JP2019136810A JP 2019136810 A JP2019136810 A JP 2019136810A JP 2018021300 A JP2018021300 A JP 2018021300A JP 2018021300 A JP2018021300 A JP 2018021300A JP 2019136810 A JP2019136810 A JP 2019136810A
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cutting
chamber
cut
atmospheric pressure
pressure
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JP7102157B2 (en
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山本 雅之
Masayuki Yamamoto
雅之 山本
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Towa Corp
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Towa Corp
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Priority to TW107144012A priority patent/TWI704611B/en
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67092Apparatus for mechanical treatment
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67739Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6838Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/77Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
    • H01L21/78Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices

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Abstract

To provide a cutting device that can keep strong holding force onto a table even after an object to be cut is cut off.SOLUTION: The cutting device includes a table 10, an air pressure maintaining mechanism and a cutting mechanism 30. An object 20 to be cut off is suctioned and held by the table 10, and air pressure outside the table 10 holding the object 20 to be cut off is maintained at air pressure higher than atmospheric pressure by the air pressure maintaining mechanism. The object 20 to be cut off held on the table 10 is cut off by the cutting mechanism 30.SELECTED DRAWING: Figure 4

Description

本発明は、切断装置及び切断品の製造方法に関する。   The present invention relates to a cutting apparatus and a method for manufacturing a cut product.

半導体パッケージの製造は、例えば、パッケージ基板を切断して製造される。パッケージ基板の切断においては、例えば、基板を、吸引によりテーブル上に保持して切断する(特許文献1等)。   For example, the semiconductor package is manufactured by cutting a package substrate. In the cutting of the package substrate, for example, the substrate is held on a table by suction and cut (Patent Document 1, etc.).

特開2011−114145号公報JP 2011-114145 A

しかしながら、パッケージ基板を切断して製造された半導体パッケージ(製品)のサイズが小さいと、吸引によるテーブル上への保持力が不十分となるおそれがある。具体的には、切断後の製品がテーブルから外れてしまい、歩留まり低下、製品不良等を引き起こすおそれがある。   However, if the size of the semiconductor package (product) manufactured by cutting the package substrate is small, the holding force on the table by suction may be insufficient. Specifically, the product after cutting may come off the table, which may cause a decrease in yield, product failure, and the like.

そこで、本発明は、切断対象物の切断後においてもテーブル上への保持力が強い切断装置及び切断品の製造方法を提供することを目的とする。   Then, an object of this invention is to provide the manufacturing method of the cutting device and cutting goods with strong holding | maintenance power on a table even after the cutting | disconnection target object is cut | disconnected.

前記目的を達成するために、本発明の切断装置は、
テーブルと、気圧保持機構と、切断機構とを含み、
前記テーブルにより、切断対象物が吸引されて保持され、
前記気圧保持機構により、前記切断対象物が保持された前記テーブルの外側の気圧が、大気圧よりも高い気圧に保持され、
前記切断機構により、前記テーブルに保持された前記切断対象物が切断されることを特徴とする。
In order to achieve the above object, the cutting device of the present invention comprises:
Including a table, a pressure holding mechanism, and a cutting mechanism;
The object to be cut is sucked and held by the table,
By the atmospheric pressure holding mechanism, the atmospheric pressure outside the table where the cutting object is held is held at an atmospheric pressure higher than atmospheric pressure,
The cutting object held on the table is cut by the cutting mechanism.

本発明の切断品の製造方法は、
テーブルにより、切断対象物を吸引して保持する切断対象物保持工程と、
前記切断対象物が保持された前記テーブルの外側の気圧を、大気圧よりも高い気圧に保持する気圧保持工程と、
前記テーブルに保持された前記切断対象物を切断する切断工程と、
を含むことを特徴とする。
The manufacturing method of the cut product of the present invention is
A cutting object holding step for sucking and holding the cutting object by a table; and
An atmospheric pressure maintaining step of maintaining an atmospheric pressure outside the table where the cutting object is held at an atmospheric pressure higher than an atmospheric pressure;
A cutting step of cutting the cutting object held on the table;
It is characterized by including.

本発明によれば、切断対象物の切断後においてもテーブル上への保持力が強い切断装置及び切断品の製造方法を提供することができる。   ADVANTAGE OF THE INVENTION According to this invention, the cutting apparatus with a strong holding force on a table even after the cutting | disconnection target object is cut | disconnected and the manufacturing method of a cut article can be provided.

図1は、本発明の切断品の製造方法の一例における一工程を模式的に示す工程断面図である。FIG. 1 is a process cross-sectional view schematically showing one process in an example of a method for manufacturing a cut product according to the present invention. 図2は、図1と同じ切断品の製造方法における別の一工程を模式的に示す工程断面図である。FIG. 2 is a process cross-sectional view schematically showing another process in the manufacturing method of the same cut product as FIG. 図3は、図1と同じ切断品の製造方法におけるさらに別の一工程を模式的に示す工程断面図である。FIG. 3 is a process cross-sectional view schematically showing still another process in the manufacturing method of the same cut product as in FIG. 図4は、図1と同じ切断品の製造方法におけるさらに別の一工程を模式的に示す工程断面図である。FIG. 4 is a process cross-sectional view schematically showing still another process in the same method for manufacturing a cut product as in FIG. 図5は、図1と同じ切断品の製造方法におけるさらに別の一工程を模式的に示す工程断面図である。FIG. 5 is a process cross-sectional view schematically showing still another process in the manufacturing method of the same cut product as in FIG. 図6は、図1と同じ切断品の製造方法におけるさらに別の一工程を模式的に示す工程断面図である。FIG. 6 is a process cross-sectional view schematically showing still another process in the manufacturing method of the same cut product as FIG. 図7は、本発明の切断装置の一例の構成を模式的に示す平面図である。FIG. 7 is a plan view schematically showing the configuration of an example of the cutting apparatus of the present invention. 図8は、本発明の切断装置の別の一例の構成を模式的に示す平面図である。FIG. 8 is a plan view schematically showing the configuration of another example of the cutting apparatus of the present invention.

つぎに、本発明について、例を挙げてさらに詳細に説明する。ただし、本発明は、以下の説明により限定されない。   Next, the present invention will be described in more detail with reference to examples. However, the present invention is not limited by the following description.

本発明の切断装置は、例えば、
さらに、切断室を含み、
前記切断室内では、前記気圧保持機構により前記テーブルの外側の気圧が大気圧よりも高い気圧に保持された状態とされ、前記テーブルに保持された前記切断対象物が前記切断機構により切断されて切断品が製造される、
切断装置であってもよい。
The cutting device of the present invention is, for example,
In addition, including a cutting chamber,
In the cutting chamber, the air pressure outside the table is maintained at a pressure higher than the atmospheric pressure by the air pressure holding mechanism, and the cutting object held on the table is cut by the cutting mechanism and cut. Products are manufactured,
A cutting device may be used.

本発明の切断装置は、例えば、
さらに、切断室と、加圧室と、減圧室とを含み、
前記切断室内で、前記切断対象物が切断されて切断品が製造され、
前記加圧室は、前記切断室の切断対象物搬入側に配置され、
前記減圧室は、前記切断室の切断品搬出側に配置され、
前記加圧室と前記切断室とが接続され、かつ、前記加圧室及び前記切断室内部が大気圧よりも高い気圧に保持された状態で、前記切断対象物が、前記加圧室から前記切断室に搬入され、
前記減圧室と前記切断室とが接続された状態で、前記切断品が、前記切断室から前記減圧室に搬出され、その後、前記減圧室と前記切断室との接続が遮断され、かつ、前記減圧室内部が前記切断対象物切断時よりも低い気圧に減圧された状態で、前記切断品が、前記減圧室内部から外部に搬出される、
切断装置であってもよい。
The cutting device of the present invention is, for example,
Furthermore, including a cutting chamber, a pressurizing chamber, and a decompression chamber,
In the cutting chamber, the cutting object is cut to produce a cut product,
The pressurizing chamber is disposed on the cutting object carry-in side of the cutting chamber,
The decompression chamber is disposed on the cut product delivery side of the cutting chamber,
In the state where the pressurizing chamber and the cutting chamber are connected, and the pressurizing chamber and the cutting chamber are maintained at a pressure higher than atmospheric pressure, the cutting object is moved from the pressurizing chamber to the pressure chamber. Carried into the cutting room,
In a state where the decompression chamber and the cutting chamber are connected, the cut product is carried out from the cutting chamber to the decompression chamber, and then the connection between the decompression chamber and the cutting chamber is interrupted, and In a state where the decompression chamber is decompressed to a pressure lower than that at the time of cutting the cutting object, the cut product is carried out from the decompression chamber to the outside.
A cutting device may be used.

本発明の切断装置は、例えば、
前記気圧保持機構が、格納室と、操作部とを含み、
前記格納室内部に、前記テーブルと前記切断機構とが格納され、
前記操作部により、前記格納室内部の気圧が、大気圧よりも高い気圧に保持される、
切断装置であってもよい。
The cutting device of the present invention is, for example,
The atmospheric pressure holding mechanism includes a storage chamber and an operation unit,
The table and the cutting mechanism are stored in the storage chamber,
The operation unit maintains the pressure inside the storage chamber at a pressure higher than atmospheric pressure.
A cutting device may be used.

本発明の切断装置は、例えば、前記気圧保持機構により、前記切断対象物が保持された前記テーブルの外側の気圧が、1.1×10Pa以上に保持されてもよい。 In the cutting apparatus of the present invention, for example, the air pressure outside the table on which the object to be cut is held may be held at 1.1 × 10 5 Pa or more by the air pressure holding mechanism.

本発明の切断品の製造方法は、例えば、
切断室を用い、
前記切断工程を、前記切断室内で行なう、
切断品の製造方法であってもよい。
The manufacturing method of the cut product of the present invention is, for example,
Using a cutting chamber,
Performing the cutting step in the cutting chamber;
It may be a method of manufacturing a cut product.

本発明の切断品の製造方法は、例えば、
切断室と、加圧室と、減圧室とを用い、
前記切断工程を、前記切断室内で行ない、
さらに、切断対象物搬入工程と、切断品搬出工程とを含み、
前記切断対象物搬入工程は、前記加圧室と前記切断室とが接続され、かつ、前記加圧室及び前記切断室内部が大気圧よりも高い気圧に保持された状態で、前記切断対象物を前記加圧室から前記切断室に搬入する工程であり、
前記切断品搬出工程は、前記減圧室と前記切断室とが接続された状態で、前記切断工程で前記切断対象物が切断された切断品を、前記切断室から前記減圧室に搬出し、その後、前記減圧室と前記切断室との接続を遮断してから、前記減圧室内部が前記切断対象物切断時よりも低い気圧に減圧された状態で、前記切断品を前記減圧室内部から外部に搬出する工程である、
切断品の製造方法であってもよい。
The manufacturing method of the cut product of the present invention is, for example,
Using a cutting chamber, a pressurizing chamber, and a decompression chamber,
Performing the cutting step in the cutting chamber;
Furthermore, a cutting object carrying-in process and a cut product carrying-out process are included,
In the cutting object carrying-in step, the cutting object is connected in a state where the pressurizing chamber and the cutting chamber are connected and the inside of the pressurizing chamber and the cutting chamber is maintained at a pressure higher than atmospheric pressure. Is carried into the cutting chamber from the pressurizing chamber,
The cut product unloading step carries out the cut product in which the object to be cut is cut in the cutting step from the cutting chamber to the decompression chamber in a state where the decompression chamber and the cutting chamber are connected, and then After cutting off the connection between the decompression chamber and the cutting chamber, the cut product is removed from the decompression chamber to the outside while the decompression chamber is decompressed to a pressure lower than that at the time of cutting the object to be cut. It is a process to carry out,
It may be a method of manufacturing a cut product.

本発明において、「大気圧よりも高い気圧」は、例えば、1atm(1.01325×10Pa)よりも高い気圧であってもよい。また、前記「大気圧よりも高い気圧」は、例えば、本発明の切断装置使用時における周囲の雰囲気圧(大気圧)よりも高い気圧であってもよく、又は、本発明の切断品の製造方法使用時における周囲の雰囲気圧(大気圧)よりも高い気圧であってもよい。また、前記「大気圧よりも高い気圧」は、少しでも大気圧よりも高い気圧であれば本発明の効果を得ることができるが、例えば、1.1×10Pa以上、1.2×10Pa以上、1.3×10Pa以上、1.4×10Pa以上、1.5×10Pa以上、2.0×10Pa以上、3.0×10Pa以上、又は4.0×10Pa以上であってもよく、例えば、1.0×10Pa(1.0MPa)以下、9.0×10Pa以下、8.0×10Pa以下、7.0×10Pa以下、6.0×10Pa以下、又は5.0×10Pa以下であってもよい。 In the present invention, “atmospheric pressure higher than atmospheric pressure” may be, for example, higher than 1 atm (1.01325 × 10 5 Pa). The “atmospheric pressure higher than the atmospheric pressure” may be, for example, an atmospheric pressure higher than the ambient atmospheric pressure (atmospheric pressure) when using the cutting apparatus of the present invention, or manufacture of the cut product of the present invention. The atmospheric pressure may be higher than the ambient atmospheric pressure (atmospheric pressure) when the method is used. The “atmospheric pressure higher than atmospheric pressure” can achieve the effect of the present invention as long as it is slightly higher than atmospheric pressure. For example, 1.1 × 10 5 Pa or more, 1.2 × 10 5 Pa or more, 1.3 × 10 5 Pa or more, 1.4 × 10 5 Pa or more, 1.5 × 10 5 Pa or more, 2.0 × 10 5 Pa or more, 3.0 × 10 5 Pa or more, Alternatively, it may be 4.0 × 10 5 Pa or more, for example, 1.0 × 10 6 Pa (1.0 MPa) or less, 9.0 × 10 5 Pa or less, 8.0 × 10 5 Pa or less, 7 It may be 0.0 × 10 5 Pa or less, 6.0 × 10 5 Pa or less, or 5.0 × 10 5 Pa or less.

本発明において、切断対象物は、特に限定されない。例えば、前記切断対象物は、パッケージ基板等であってもよいが、これに限定されず任意である。   In the present invention, the cutting object is not particularly limited. For example, the cutting object may be a package substrate or the like, but is not limited thereto and is arbitrary.

本発明において、切断品は、特に限定されないが、例えば、樹脂成形品でもよい。前記樹脂成形品は、特に限定されず、例えば、単に樹脂を成形した樹脂成形品でもよいし、チップ等の部品を樹脂封止した樹脂成形品でもよい。本発明において、樹脂成形品は、例えば、電子部品等であってもよい。また、本発明において、切断品は、例えば、完成品の製品であってもよいが、未完成の半製品であってもよい。   In the present invention, the cut product is not particularly limited, but may be a resin molded product, for example. The resin molded product is not particularly limited, and may be, for example, a resin molded product obtained by simply molding a resin, or a resin molded product obtained by resin-sealing a component such as a chip. In the present invention, the resin molded product may be, for example, an electronic component. In the present invention, the cut product may be, for example, a finished product or an unfinished semi-finished product.

本発明において、樹脂としては、特に制限されず、例えば、エポキシ樹脂やシリコーン樹脂などの熱硬化性樹脂であってもよいし、熱可塑性樹脂であってもよい。また、熱硬化性樹脂あるいは熱可塑性樹脂を一部に含んだ複合材料であってもよい。   In the present invention, the resin is not particularly limited, and may be a thermosetting resin such as an epoxy resin or a silicone resin, or may be a thermoplastic resin. Further, it may be a composite material partially including a thermosetting resin or a thermoplastic resin.

また、一般に、「電子部品」は、樹脂封止する前のチップをいう場合と、チップを樹脂封止した状態をいう場合とがあるが、本発明において、単に「電子部品」という場合は、特に断らない限り、前記チップが樹脂封止された電子部品(完成品としての電子部品)をいう。本発明において、「チップ」は、樹脂封止する前のチップをいい、具体的には、例えば、IC、半導体チップ、電力制御用の半導体素子等のチップが挙げられる。本発明において、樹脂封止する前のチップは、樹脂封止後の電子部品と区別するために、便宜上「チップ」という。しかし、本発明における「チップ」は、樹脂封止する前のチップであれば、特に限定されず、チップ状でなくてもよい。   In general, the term “electronic component” refers to a chip before resin-sealing and a state in which the chip is resin-sealed, but in the present invention, simply referred to as “electronic component” Unless otherwise specified, it means an electronic component (an electronic component as a finished product) in which the chip is sealed with a resin. In the present invention, “chip” refers to a chip before resin sealing, and specifically includes chips such as ICs, semiconductor chips, and semiconductor elements for power control. In the present invention, the chip before resin sealing is referred to as “chip” for convenience in order to distinguish it from the electronic component after resin sealing. However, the “chip” in the present invention is not particularly limited as long as it is a chip before resin sealing, and may not be in a chip shape.

本発明では、例えば、シリコン、化合物半導体等の基板上に回路素子、MEMS(Micro Electro Mechanical Systems)等の機能素子が配置された半導体ウェーハ(semiconductor wafer )を切断対象物とし、それを切断(個片化)して切断品としてもよい。また、本発明では、例えば、抵抗体、コンデンサ、センサ、表面弾性波デバイス等の機能素子を含むセラミックス基板、ガラス基板等を切断対象物とし、それを切断(個片化)してチップ抵抗、チップコンデンサ、チップ型のセンサ、表面弾性波デバイス等の製品(切断品)を製造してもよい。また、本発明では、例えば、樹脂成形品を切断対象物とし、それを切断(個片化)してレンズ、光学モジュール、導光板等の光学部品(切断品)を製造してもよい。また、本発明では、例えば、樹脂成形品を切断対象物とし、それを切断(個片化)して製品(切断品)としてもよい。また、本発明では、例えば、ガラス板を切断対象物とし、それを切断(個片化)し、様々な電子機器のカバー等として使用されるガラス板(切断品)を製造してもよい。さらに、本発明において、切断対象物は、これらに限定されず、前述のとおり、任意であり、切断品も、前述のとおり、特に限定されず任意である。   In the present invention, for example, a semiconductor wafer (semiconductor wafer) in which a functional element such as a circuit element or MEMS (Micro Electro Mechanical Systems) is arranged on a substrate such as silicon or a compound semiconductor is used as an object to be cut. It may be cut into pieces and cut into pieces. Further, in the present invention, for example, a ceramic substrate including a functional element such as a resistor, a capacitor, a sensor, and a surface acoustic wave device, a glass substrate or the like is an object to be cut, and it is cut (divided) into a chip resistor, A product (cut product) such as a chip capacitor, a chip-type sensor, or a surface acoustic wave device may be manufactured. Further, in the present invention, for example, a resin molded product may be a cutting object, and may be cut (divided) into an optical component (cut product) such as a lens, an optical module, or a light guide plate. In the present invention, for example, a resin molded product may be a cutting object, and the product (cut product) may be cut (separated). Further, in the present invention, for example, a glass plate may be used as an object to be cut, and the glass plate (cut product) used as a cover or the like for various electronic devices may be manufactured by cutting (dividing into pieces). Further, in the present invention, the object to be cut is not limited to these, and is arbitrary as described above, and the cut product is also not particularly limited and arbitrary as described above.

また、本発明において、切断対象物及び切断品の形状も、特に限定されず、任意である。例えば、切断対象物の形状は、長手方向と短手方向とを有する矩形であってもよいし、正方形、円形等であってもよい。   In the present invention, the shapes of the object to be cut and the cut product are not particularly limited and are arbitrary. For example, the shape of the object to be cut may be a rectangle having a longitudinal direction and a short direction, or may be a square, a circle, or the like.

また、本発明において、「載置」、「配置」又は「設置」は、「固定」を含む。   In the present invention, “placement”, “arrangement” or “installation” includes “fixed”.

以下、本発明の具体的な実施例を図面に基づいて説明する。各図は、説明の便宜のため、適宜省略、誇張等をして模式的に描いている。   Hereinafter, specific embodiments of the present invention will be described with reference to the drawings. For convenience of explanation, each drawing is schematically drawn with appropriate omission, exaggeration, and the like.

本実施例では、成形型及び樹脂成形装置の一例と、それを用いた樹脂成形品の製造方法の一例とについて説明する。   In the present embodiment, an example of a mold and a resin molding apparatus and an example of a method for producing a resin molded product using the same will be described.

図1〜6の工程断面図に、本発明の切断装置の一例における一部の構成と、前記切断装置を用いた切断品の製造方法における各工程とを、模式的に示す。   1 to 6 schematically show a partial configuration of an example of the cutting apparatus of the present invention and each process in a method for manufacturing a cut product using the cutting apparatus.

まず、図1に示すとおり、テーブル(治具)10を準備する。ここで、図1から6に図示する治具10は、実際には、テーブルの一部を構成するものであるが、図1から6を参照する説明では、便宜上、「テーブル10」と記載する。治具10を含むテーブル全体については、図示を省略する。図示のとおり、テーブル10は、その上部に溝11を有するとともに、上面(切断対象物保持面)から下面まで貫通する貫通孔12を有する。溝11は、後述するように、その内部に切断用の刃を通すための溝である。また、貫通孔12は、後述するように、切断対象物及びそれを切断して製造された切断品を、吸引してテーブル10の上面に保持するための貫通孔である。   First, as shown in FIG. 1, a table (jig) 10 is prepared. Here, the jig 10 illustrated in FIGS. 1 to 6 actually constitutes a part of the table, but in the description referring to FIGS. 1 to 6, it is described as “table 10” for convenience. . The illustration of the entire table including the jig 10 is omitted. As shown in the figure, the table 10 has a groove 11 in the upper part thereof and a through hole 12 that penetrates from the upper surface (cutting object holding surface) to the lower surface. The groove | channel 11 is a groove | channel for letting the blade for cutting pass through the inside so that it may mention later. Moreover, the through-hole 12 is a through-hole for attracting | sucking and hold | maintaining the cut object and the cut goods manufactured by cut | disconnecting it on the upper surface of the table 10 so that it may mention later.

つぎに、図2に示すとおり、テーブル10の上面に、パッケージ基板(切断対象物)20を載置する。図示のとおり、パッケージ基板20は、基板21の一方の面が樹脂(硬化樹脂)22で樹脂成形されている。パッケージ基板20は、基板21及び樹脂22のみから形成されていてもよいが、さらに、他の部材(部品)を含んでいてもよい。そして、前記他の部材が、樹脂22により封止(樹脂封止)されていてもよい。前記他の部材としては、特に限定されないが、例えば、電子部品、半導体部品等に用いられる一般的な部材でもよく、具体的には、例えば、チップ、ワイヤ等があげられる。また、同図では、パッケージ基板20は、樹脂22の側がテーブル10の上面に接するように載置されている。   Next, as shown in FIG. 2, the package substrate (cutting object) 20 is placed on the upper surface of the table 10. As illustrated, the package substrate 20 is formed by resin molding one surface of a substrate 21 with a resin (cured resin) 22. The package substrate 20 may be formed of only the substrate 21 and the resin 22, but may further include other members (components). The other member may be sealed (resin sealed) with the resin 22. Although it does not specifically limit as said other member, For example, the general member used for an electronic component, a semiconductor component, etc. may be sufficient, for example, a chip | tip, a wire, etc. are mention | raise | lifted specifically ,. Further, in the same figure, the package substrate 20 is placed so that the resin 22 side is in contact with the upper surface of the table 10.

つぎに、図3に示すとおり、吸引機構(図示せず)により、テーブル10内部の空気を、矢印X1の方向(テーブル10の内部方向)に吸引し、テーブル10の内部を減圧する。これにより、パッケージ基板20を吸引してテーブル10上面に保持する(切断対象物保持工程)。なお、前記吸引機構は、特に限定されないが、例えば、吸引ポンプ、又は真空エジェクタ等であってもよい。さらに、図示のとおり、気圧保持機構(図示せず)により、パッケージ基板20が保持されたテーブル10の外側の気圧を、大気圧よりも高い気圧に保持する(気圧保持工程)。これにより、パッケージ基板20に、矢印Y1の方向(テーブル10の方向)の圧力が加わり、テーブル10に押付けられる。この矢印Y1方向の圧力により、パッケージ基板20のテーブル10上への保持力がさらに強くなる。   Next, as shown in FIG. 3, the air inside the table 10 is sucked in the direction of the arrow X <b> 1 (inside the table 10) by a suction mechanism (not shown), and the inside of the table 10 is decompressed. Thereby, the package substrate 20 is sucked and held on the upper surface of the table 10 (cutting object holding step). The suction mechanism is not particularly limited, and may be, for example, a suction pump or a vacuum ejector. Furthermore, as shown in the figure, the atmospheric pressure holding mechanism (not shown) holds the atmospheric pressure outside the table 10 on which the package substrate 20 is held at an atmospheric pressure higher than atmospheric pressure (atmospheric pressure holding step). As a result, pressure is applied to the package substrate 20 in the direction of the arrow Y1 (the direction of the table 10), and the package substrate 20 is pressed against the table 10. The holding force of the package substrate 20 on the table 10 is further increased by the pressure in the arrow Y1 direction.

つぎに、図4に示すとおり、回転刃30を、パッケージ基板20上方の、溝11に対応する位置に配置する。図示のとおり、回転刃30は、刃本体31の両面が、一対のフランジ(固定部材)32により挟まれて構成されている。回転刃30は、本実施例の切断装置における「切断機構」の一部である。回転刃30は、前記切断機構に設けられた回転軸(図示せず)の先端に取付けられている。   Next, as shown in FIG. 4, the rotary blade 30 is disposed above the package substrate 20 at a position corresponding to the groove 11. As illustrated, the rotary blade 30 is configured by sandwiching both surfaces of a blade body 31 between a pair of flanges (fixing members) 32. The rotary blade 30 is a part of the “cutting mechanism” in the cutting apparatus of the present embodiment. The rotary blade 30 is attached to the tip of a rotary shaft (not shown) provided in the cutting mechanism.

つぎに、図5に示すとおり、回転刃30を回転させることにより、パッケージ基板20(基板21及び樹脂22)を切断する(切断工程)。このとき、図示のとおり、刃本体31を、パッケージ基板20を貫通させて溝11に食い込ませることにより、パッケージ基板20を完全に切断できる。   Next, as shown in FIG. 5, the package substrate 20 (the substrate 21 and the resin 22) is cut by rotating the rotary blade 30 (cutting step). At this time, as shown in the figure, the package substrate 20 can be completely cut by allowing the blade body 31 to penetrate the groove substrate 11 through the package substrate 20.

そして、図6に示すとおり、パッケージ基板20を、全ての所定位置(図において、溝11の位置)で切断することにより、パッケージ部品(切断品)20bを製造することができる。切断品20bは、図示のとおり、切断された基板21bの一方の面が、切断された樹脂(硬化樹脂)22bにより樹脂成形されている。このとき、図6に示すように、貫通孔12の上端は、切断品20bで塞がれた(密閉された)ままである。このため、切断品20bには、矢印X1方向(テーブル10の内部方向)の吸引による力が加わったままである。さらに、切断品20bには、矢印Y1の方向(テーブル10の方向)の圧力が加わり、テーブル10に押付けられている。これにより、切断品20bのテーブル10上への保持力がさらに強くなり、切断品20bがテーブル10上から外れることを抑制又は防止できる。   Then, as shown in FIG. 6, the package substrate 20 can be manufactured by cutting the package substrate 20 at all predetermined positions (positions of the grooves 11 in the drawing). In the cut product 20b, as shown in the drawing, one surface of the cut substrate 21b is resin-molded with a cut resin (cured resin) 22b. At this time, as shown in FIG. 6, the upper end of the through-hole 12 remains closed (sealed) with the cut product 20b. For this reason, the force by suction in the direction of the arrow X1 (inner direction of the table 10) is still applied to the cut product 20b. Furthermore, pressure in the direction of arrow Y1 (the direction of the table 10) is applied to the cut product 20b and is pressed against the table 10. Accordingly, the holding force of the cut product 20b on the table 10 is further increased, and it is possible to suppress or prevent the cut product 20b from being detached from the table 10.

なお、切断品20bは、そのまま流通可能な製品であってもよいが、未完成の半製品であってもよい。前記半製品は、例えば、さらに加工することにより製品としてもよい。前記製品は、特に限定されないが、例えば、前述のように、電子部品、半導体部品等があげられる。   The cut product 20b may be a product that can be distributed as it is, or may be an unfinished semi-finished product. The said semi-finished product is good also as a product by further processing, for example. Although the said product is not specifically limited, For example, as above-mentioned, an electronic component, a semiconductor component, etc. are mention | raise | lifted.

従来のパッケージ基板の切断方法(特許文献1等)では、切断後の切断品(部品)のサイズが小さいと(例えば、1辺の長さが2mm以下であると)、テーブル(治具)による保持力(吸着力)が不十分で、切断品がテーブルから外れてしまい、歩留まり低下、製品不良等を引き起こすおそれがあった。具体的には、例えば、切断品の飛び(飛散)、パッケージ基板のコーナー部でのチッピング(欠け)等が起こり、これらが歩留まり低下、製品不良等の原因となるおそれがあった。特に、1つの切断品がテーブル上から外れると、それにより、前記切断品を吸引しているテーブル上の孔が開放されるおそれがある。そして、テーブル内の空間が1つにつながっている場合、前記孔の開放により、テーブル内の前記空間の減圧が解除され、他の全ての切断品における前記テーブル上への保持力が低下するおそれがある。すなわち、1つの切断品がテーブル上から外れるのみでも、それにより、他の全ての切断品が前記テーブル上から外れてしまうおそれがある。   In a conventional package substrate cutting method (Patent Document 1 or the like), if the size of a cut product (component) after cutting is small (for example, the length of one side is 2 mm or less), a table (jig) is used. The holding force (adsorption force) is insufficient, and the cut product is detached from the table, which may cause a decrease in yield, product defects, and the like. Specifically, for example, a cut product may fly (scatter), chipping (chips) at a corner portion of the package substrate, and the like may cause a decrease in yield and a product defect. In particular, if one cut product comes off the table, there is a risk that a hole on the table sucking the cut product may be opened. And when the space in a table is connected to one, the decompression of the space in the table is released by opening the hole, and the holding force on the table in all other cut products may be reduced. There is. That is, even if one cut product is removed from the table, all other cut products may be removed from the table.

これに対し、本発明によれば、切断対象物が保持されたテーブルの外側の気圧が、大気圧よりも高い気圧に保持される。これにより、切断品の前記テーブル上への保持力が強化され、小サイズの切断品でも強固に保持(固定)できる。したがって、本発明によれば、前述の歩留まり低下、製品不良等の問題を抑制又は防止でき、切断品の生産性向上が可能である。   On the other hand, according to the present invention, the air pressure outside the table on which the object to be cut is held is held at a pressure higher than the atmospheric pressure. Thereby, the holding force of the cut product on the table is strengthened, and even a small-sized cut product can be firmly held (fixed). Therefore, according to the present invention, it is possible to suppress or prevent the above-described problems such as yield reduction and product failure, and it is possible to improve the productivity of cut products.

以上、本発明の切断装置及びそれを用いた切断品の製造方法の一例について説明した。しかし、本発明は、本実施例のみには限定されない。例えば、本実施例では、パッケージ基板を切断し、電子部品、半導体部品等の製品又はその半製品を製造する例を説明した。しかし、本発明において、前記切断対象物は、前述のとおり、パッケージ基板に限定されず、任意の切断対象物に適用可能である。また、前記切断品も、前述のとおり、電子部品、半導体部品等に限定されず、任意である。また、例えば、本発明の切断装置は、前記気圧保持機構により、前記切断対象物が保持された前記テーブルの外側の気圧が、大気圧よりも高い気圧に保持されること以外は、一般的な切断装置と同様又はそれに準じた構成であってもよい。本発明の切断品の製造方法は、例えば、前記切断対象物が保持された前記テーブルの外側の気圧を、大気圧よりも高い気圧に保持する前記「気圧保持工程」を行なう以外は、パッケージ基板等の一般的な切断方法と同様又はそれに準じて行なってもよい。パッケージ基板等の一般的な切断方法としては、例えば、特開2016−143861号公報等に記載の方法と同様又はそれに準じた方法でもよい。前記切断対象物が保持された前記テーブルの外側の気圧を、大気圧よりも高い気圧に保持するための具体的な装置の構成、方法等も、特に限定されないが、例えば、後述する実施例2又は3のとおりでもよい。   Heretofore, an example of the cutting apparatus of the present invention and a method for manufacturing a cut product using the same has been described. However, the present invention is not limited only to the present embodiment. For example, in the present embodiment, an example has been described in which a package substrate is cut to manufacture a product such as an electronic component or a semiconductor component or a semi-finished product thereof. However, in the present invention, the cutting object is not limited to the package substrate as described above, and can be applied to any cutting object. Further, as described above, the cut product is not limited to an electronic component, a semiconductor component, etc., and is arbitrary. Further, for example, the cutting apparatus of the present invention is general except that the air pressure outside the table where the object to be cut is held is held at a pressure higher than the atmospheric pressure by the air pressure holding mechanism. The configuration may be the same as or similar to the cutting device. The method for manufacturing a cut product according to the present invention includes, for example, a package substrate except that the “atmospheric pressure holding step” is performed to hold the air pressure outside the table on which the object to be cut is held at a pressure higher than the atmospheric pressure. It may be performed in the same manner or in accordance with a general cutting method such as. As a general method for cutting a package substrate or the like, for example, a method similar to or equivalent to the method described in JP-A-2006-143861 may be used. There is no particular limitation on the configuration, method, and the like of a specific apparatus for holding the pressure outside the table on which the cutting object is held at a pressure higher than the atmospheric pressure. Or it may be as 3.

本発明は、例えば、一辺が2mm以下、又は1mm以下等の小さい切断品の製造に好適に用いることができる。しかし、本発明は、これに限定されず、どのような大きさの切断品の製造に用いてもよい。   The present invention can be suitably used for manufacturing a small cut product having a side of 2 mm or less or 1 mm or less, for example. However, the present invention is not limited to this, and may be used for manufacturing a cut product of any size.

つぎに、本発明の別の実施例について説明する。   Next, another embodiment of the present invention will be described.

本実施例では、本発明の切断装置及び切断品の製造方法の、実施例1とは別の一例について説明する。   In the present embodiment, an example different from the first embodiment of the cutting device and the method for manufacturing a cut product according to the present invention will be described.

図7の平面図に、本実施例の切断装置の構成を模式的に示す。図示のとおり、この切断装置1000は、Aエリア、Bエリア及びCエリアの3つのエリア(領域)を含む。Aエリアは、加圧室1100を含む。Bエリアは、切断室1200を含む。Cエリアは、減圧室1300を含む。加圧室1100は、切断室1200の切断対象物搬入側に配置されている。減圧室1300は、切断室1200の切断品搬出側に配置されている。そして、後述するように、切断室1200内で、切断対象物が切断されて切断品が製造される。また、加圧室1200と切断室1100とが接続され、かつ、加圧室1200及び切断室1100内部が大気圧よりも高い気圧に保持された状態で、切断対象物が、加圧室1100から切断室1200に搬入される。さらに、減圧室1300と切断室1200とが接続された状態で、切断された前記切断対象物(切断品)が、前記切断室から前記減圧室に搬出される。そして、その後、前記減圧室と前記切断室との接続が遮断されてから、減圧室1300内部が前記切断対象物切断時よりも低い気圧に減圧された状態で、切断された前記切断対象物(切断品)が、減圧室1300内部から外部に搬出される。なお、前記切断品が減圧室1300内部から外部に搬出される時の気圧は、例えば、大気圧とほぼ同じでもよい。詳しくは後述する。切断室1200、加圧室1100及び減圧室1300は、例えば、スパッタリング装置等の成膜装置の真空チャンバ、搬入側ロードロック室及び搬出側ロードロック室と同様の構造を用いることができる。ただし、切断室、加圧室及び減圧室は、内部空間が大気圧よりも高い気圧に保持可能なように設計されている。   The plan view of FIG. 7 schematically shows the configuration of the cutting apparatus of the present embodiment. As illustrated, the cutting apparatus 1000 includes three areas (areas), an A area, a B area, and a C area. The A area includes a pressurizing chamber 1100. The B area includes a cutting chamber 1200. The C area includes a decompression chamber 1300. The pressurizing chamber 1100 is arranged on the cutting object carrying-in side of the cutting chamber 1200. The decompression chamber 1300 is disposed on the cut product delivery side of the cutting chamber 1200. Then, as will be described later, in the cutting chamber 1200, the cutting object is cut to produce a cut product. Further, in the state where the pressurizing chamber 1200 and the cutting chamber 1100 are connected and the inside of the pressurizing chamber 1200 and the cutting chamber 1100 is maintained at a pressure higher than the atmospheric pressure, the object to be cut is removed from the pressurizing chamber 1100. It is carried into the cutting chamber 1200. Further, in a state where the decompression chamber 1300 and the cutting chamber 1200 are connected, the cut object to be cut (cut product) is carried out from the cutting chamber to the decompression chamber. After that, after the connection between the decompression chamber and the cutting chamber is cut off, the cut object to be cut (in the state where the inside of the decompression chamber 1300 is decompressed to a pressure lower than that at the time of cutting the cutting object ( The cut product) is carried out from the inside of the decompression chamber 1300 to the outside. Note that the atmospheric pressure when the cut product is carried out from the decompression chamber 1300 to the outside may be, for example, substantially the same as the atmospheric pressure. Details will be described later. For the cutting chamber 1200, the pressurizing chamber 1100, and the decompression chamber 1300, for example, the same structure as the vacuum chamber, the loading-side load lock chamber, and the unloading-side load lock chamber of a film forming apparatus such as a sputtering apparatus can be used. However, the cutting chamber, the pressurizing chamber, and the decompression chamber are designed so that the internal space can be maintained at a pressure higher than the atmospheric pressure.

図7の切断装置1000において、Aエリアには、さらに、基板供給機構(切断対象物供給機構)1010、制御部1020及びゲートバルブ1030が含まれる。基板供給機構1010には、パッケージ基板(切断対象物)20が保管されており、加圧室1100にパッケージ基板20を供給可能である。なお、パッケージ基板20は、実施例1で説明したパッケージ基板20と同様でもよい。制御部1020は、切断装置1000全体の動作を制御可能である。制御部1020による制御方法は、特に限定されないが、例えば、コンピュータプログラム等を用いてもよい。ゲートバルブ1030は、加圧室1100と切断室1200とを接続するように配置されている。ゲートバルブ1030を開くことで、加圧室1100内の空間と切断室1200内の空間とをつなげることができる。ゲートバルブ1030を閉じることで、加圧室1100内の空間と切断室1200内の空間との接続を遮断してこれらを分離することができる。   In the cutting apparatus 1000 of FIG. 7, the A area further includes a substrate supply mechanism (cutting object supply mechanism) 1010, a control unit 1020, and a gate valve 1030. A package substrate (cutting object) 20 is stored in the substrate supply mechanism 1010, and the package substrate 20 can be supplied to the pressurizing chamber 1100. The package substrate 20 may be the same as the package substrate 20 described in the first embodiment. The control unit 1020 can control the operation of the entire cutting apparatus 1000. Although the control method by the control part 1020 is not specifically limited, For example, you may use a computer program etc. The gate valve 1030 is disposed so as to connect the pressurizing chamber 1100 and the cutting chamber 1200. By opening the gate valve 1030, the space in the pressurizing chamber 1100 and the space in the cutting chamber 1200 can be connected. By closing the gate valve 1030, the connection between the space in the pressurizing chamber 1100 and the space in the cutting chamber 1200 can be cut off and separated.

Bエリアには、さらに、テーブル10、気圧調整器1210、排水減圧器1220、スピンドル1230、蛇腹1241及び1242、受け板1250、排水流動部1260並びに排出口1270が含まれる。テーブル10は、実施例1(図1〜6)で説明したテーブル10と同様であり、前述の吸引機構(図示せず)に接続されている。気圧調整器1210は、例えば、外部の空気圧縮システムからの配管に接続された圧縮空気の流入量を調整可能な調整弁と、減圧の際に用いる開閉弁とを有する。なお、前記圧縮システム、配管、調整弁及び開閉弁は、図示を省略している。気圧調整器1210により、加圧室1100、切断室1200及び減圧室1300の内部の気圧が調整される。気圧調整器1210により、後述するように、パッケージ基板(切断対象物)20が保持されたテーブル10の外側の気圧(切断室1200内部の気圧)を、大気圧よりも高い気圧に保持することができる。すなわち、気圧調整器1210及び切断室1200は、切断装置1000における「気圧保持機構」に該当する。また、例えば、減圧時には、前記減圧用の開閉弁を開いて、切断装置1000が設置された施設に設けられた排気ダクトから排気させるようにすることができる。スピンドル1230には、実施例1(図1〜6)で説明した回転刃30(図7では、図示せず)が取り付けられている。スピンドル1230は、回転刃30とともに、前後左右及び上下に移動可能である。スピンドル1230により、回転刃30を回転させてパッケージ基板20を切断することができる。すなわち、スピンドル1230は、回転刃30とともに、切断装置1000における「切断機構」を構成する。また、回転刃30による摩擦熱をとるために、ノズル(図示せず)により冷却水を回転刃30にかけて冷却しながら、後述する切断工程を行なうことができる。前記ノズルは、例えば、スピンドル1230に設けることができる。前記冷却水は、例えば、室温(常温)の水であってもよい。前記冷却水は、使用後は、排水として切断室1200の外に排出することができる。その際、排水減圧器1220により、前記排水の圧力が減圧される。蛇腹1241の左端及び1242の右端は、それぞれ、切断室1200内部に固定されている。蛇腹1241の右端及び1242の左端は、それぞれ、受け板1250に接続されている。受け板1250は、パッケージ基板20及び切断品20bを載置し、搬送することができる。また、蛇腹1241及び1242を伸縮させることで、受け板1250を左右方向(切断対象物の搬入方向及び切断品の搬出方向に垂直な方向)に移動させることができる。排水流動部1260は、前記排水が流動する部分である。排出口1270からは、前記排水を切断室1200の外に排出することができる。   The B area further includes a table 10, a pressure regulator 1210, a drain pressure reducer 1220, a spindle 1230, bellows 1241 and 1242, a receiving plate 1250, a drainage flow part 1260 and a discharge port 1270. The table 10 is the same as the table 10 described in the first embodiment (FIGS. 1 to 6), and is connected to the aforementioned suction mechanism (not shown). The atmospheric pressure regulator 1210 includes, for example, an adjustment valve that can adjust the inflow amount of compressed air connected to a pipe from an external air compression system, and an on-off valve that is used for decompression. The compression system, piping, regulating valve, and on-off valve are not shown. The atmospheric pressure regulator 1210 adjusts the atmospheric pressure inside the pressurizing chamber 1100, the cutting chamber 1200, and the decompression chamber 1300. As will be described later, the atmospheric pressure regulator 1210 can maintain the atmospheric pressure outside the table 10 on which the package substrate (cutting object) 20 is held (the atmospheric pressure inside the cutting chamber 1200) at an atmospheric pressure higher than the atmospheric pressure. it can. That is, the atmospheric pressure regulator 1210 and the cutting chamber 1200 correspond to the “atmospheric pressure holding mechanism” in the cutting apparatus 1000. Further, for example, at the time of decompression, the decompression on-off valve may be opened to exhaust air from an exhaust duct provided in a facility where the cutting device 1000 is installed. The rotary blade 30 (not shown in FIG. 7) described in the first embodiment (FIGS. 1 to 6) is attached to the spindle 1230. The spindle 1230 is movable together with the rotary blade 30 in the front and rear, right and left, and up and down. With the spindle 1230, the rotary blade 30 can be rotated to cut the package substrate 20. That is, the spindle 1230 and the rotary blade 30 constitute a “cutting mechanism” in the cutting apparatus 1000. Moreover, in order to take the frictional heat by the rotary blade 30, the cutting process mentioned later can be performed, cooling a cooling water on the rotary blade 30 with a nozzle (not shown). The nozzle may be provided on the spindle 1230, for example. The cooling water may be, for example, room temperature (normal temperature) water. The cooling water can be discharged out of the cutting chamber 1200 as drainage after use. At that time, the pressure of the waste water is reduced by the drain pressure reducer 1220. The left end of the bellows 1241 and the right end of 1242 are fixed inside the cutting chamber 1200, respectively. The right end of the bellows 1241 and the left end of 1242 are connected to the receiving plate 1250, respectively. The receiving plate 1250 can place and transport the package substrate 20 and the cut product 20b. In addition, by extending and contracting the bellows 1241 and 1242, the receiving plate 1250 can be moved in the left-right direction (a direction perpendicular to the cutting object carrying-in direction and the cut product carrying-out direction). The drainage flow part 1260 is a part through which the drainage flows. From the discharge port 1270, the drainage can be discharged out of the cutting chamber 1200.

Cエリアには、さらに、ゲートバルブ1330、検査テーブル1400及びトレイ1500が含まれる。ゲートバルブ1330は、減圧室1300と切断室1200とを接続するように配置されている。ゲートバルブ1330を開くことで、減圧室1300内の空間と切断室1200内の空間とをつなげることができる。ゲートバルブ1330を閉じることで、減圧室1300内の空間と切断室1200内の空間との接続を遮断してこれらを分離することができる。検査テーブル1400では、パッケージ部品(切断品)20bが検査され、良品と不良品とに分離される。トレイ1500には、切断品20bのうち良品が収納されて保管(ストック)される。   The C area further includes a gate valve 1330, an inspection table 1400, and a tray 1500. Gate valve 1330 is arranged to connect decompression chamber 1300 and cutting chamber 1200. By opening the gate valve 1330, the space in the decompression chamber 1300 and the space in the cutting chamber 1200 can be connected. By closing the gate valve 1330, the connection between the space in the decompression chamber 1300 and the space in the cutting chamber 1200 can be cut off and separated. In the inspection table 1400, the package component (cut product) 20b is inspected and separated into a non-defective product and a defective product. In the tray 1500, non-defective products among the cut products 20b are stored and stored (stocked).

図7の切断装置を用いた切断品の製造方法は、例えば、以下のようにして行なうことができる。まず、気圧調整器1210を用いて切断室1200内に圧縮空気を供給し、切断室1200内部を大気圧よりも高い気圧にする。その後、後述する切断工程が終了するまで、切断室1200内部を大気圧よりも高い気圧に保持しておく(気圧保持工程)。   The method for manufacturing a cut product using the cutting apparatus of FIG. 7 can be performed, for example, as follows. First, compressed air is supplied into the cutting chamber 1200 using the atmospheric pressure regulator 1210, and the inside of the cutting chamber 1200 is made higher than atmospheric pressure. Thereafter, the inside of the cutting chamber 1200 is maintained at a pressure higher than the atmospheric pressure until a cutting step described later is completed (atmospheric pressure holding step).

一方、加圧室1100内部に、基板供給機構1010によりパッケージ基板20を搬入する。このとき、加圧室1100は開放されて内部と外部とがつながっているので、加圧室1100内部の圧力は、大気圧と同じままである。   On the other hand, the package substrate 20 is carried into the pressurizing chamber 1100 by the substrate supply mechanism 1010. At this time, since the pressurization chamber 1100 is opened and the inside and the outside are connected, the pressure inside the pressurization chamber 1100 remains the same as the atmospheric pressure.

つぎに、加圧室1100を密閉状態とする。その後、気圧調整器1210を用いて加圧室1100内に圧縮空気を供給して加圧する。これにより、加圧室1100内部の気圧を切断室1200内部の気圧とほぼ同じにする。加圧室1100内部の気圧が切断室1200内部の気圧とほぼ同じになったら、気圧調整器1210による圧縮空気の供給を停止する。その状態で、加圧室1100と切断室1200との間のゲートバルブ1030を開けてパッケージ基板20を切断室1200内に搬入する(切断対象物搬入工程)。その後、ゲートバルブ1030を閉じて加圧室1100内部と切断室1200内部との接続を遮断してこれらを分離する。   Next, the pressurizing chamber 1100 is sealed. Thereafter, compressed air is supplied into the pressurizing chamber 1100 using the atmospheric pressure regulator 1210 and pressurized. Thereby, the atmospheric pressure inside the pressurizing chamber 1100 is made substantially the same as the atmospheric pressure inside the cutting chamber 1200. When the pressure inside the pressurizing chamber 1100 becomes substantially the same as the pressure inside the cutting chamber 1200, the supply of compressed air by the pressure regulator 1210 is stopped. In this state, the gate valve 1030 between the pressurizing chamber 1100 and the cutting chamber 1200 is opened, and the package substrate 20 is carried into the cutting chamber 1200 (cutting object carrying step). Thereafter, the gate valve 1030 is closed, and the connection between the pressurizing chamber 1100 and the cutting chamber 1200 is cut off to separate them.

つぎに、切断室1200内に搬入されたパッケージ基板(切断対象物)20をテーブル(治具)10により吸引して保持する(切断対象物保持工程)。その後、パッケージ基板20を、スピンドル1230及び回転刃30(切断機構)により切断する(切断工程)。これにより、パッケージ基板(切断対象物)20が切断されて個片化されたパッケージ部品(切断品)20bを製造することができる。これら切断対象物保持工程及び切断工程は、例えば、実施例1(図1〜6)と同様にして行なってもよいし、一般的なパッケージ基板の切断方法と同様又はそれに準じて行なってもよい。   Next, the package substrate (cutting object) 20 carried into the cutting chamber 1200 is sucked and held by the table (jig) 10 (cutting object holding process). Thereafter, the package substrate 20 is cut by the spindle 1230 and the rotary blade 30 (cutting mechanism) (cutting step). Thereby, the package component (cut product) 20b obtained by cutting the package substrate (cut object) 20 into individual pieces can be manufactured. These cutting object holding step and cutting step may be performed, for example, in the same manner as in Example 1 (FIGS. 1 to 6), or may be performed in the same manner or in accordance with a general method for cutting a package substrate. .

なお、前記切断工程は、例えば、前述のとおり、ノズル(図示せず)により冷却水を回転刃30にかけて冷却しながら行なうことができる。前記冷却水は、使用後は、前述のとおり、排水として排水流動部1260を流動させ、排出口1270から切断室1200の外に排出することができる。   The cutting step can be performed, for example, while cooling the rotating blade 30 with cooling water using a nozzle (not shown) as described above. After use, as described above, the cooling water can flow through the drainage flow part 1260 as drainage and be discharged out of the cutting chamber 1200 from the discharge port 1270.

一方、気圧調整器1210を用いて減圧室1300内に圧縮空気を供給して加圧する。そして、減圧室1300の内部の気圧が切断室1200内部の気圧とほぼ同じになったら、気圧調整器1210による圧縮空気の供給を停止する。この操作は、前記切断工程(パッケージ基板20の切断)終了後に行なうこともできるが、前記切断工程が終了する前に(例えば、前記切断工程と並行して)行なうと、効率がよい。   On the other hand, compressed air is supplied into the decompression chamber 1300 using the atmospheric pressure regulator 1210 and pressurized. When the pressure inside the decompression chamber 1300 becomes substantially the same as the pressure inside the cutting chamber 1200, the supply of compressed air by the pressure regulator 1210 is stopped. This operation can be performed after the cutting step (cutting the package substrate 20) is completed, but it is efficient if performed before the cutting step is completed (for example, in parallel with the cutting step).

そして、前記切断工程(パッケージ基板20の切断)が終了し、かつ、減圧室1300の内部の気圧が切断室1200内部の気圧とほぼ同じになった状態で、ゲートバルブ1330を開く。この状態で、パッケージ部品(切断品)20bを切断室1200から搬出し、減圧室1300内に収納する。その後、ゲートバルブ1330を閉じて減圧室1300内の空間と切断室1200内の空間との接続を遮断してこれらを分離する。さらに、気圧調整器1210を用いて減圧室1300内の空気を外部に排出して減圧する。減圧室1300内の気圧が大気圧とほぼ同じになったら、パッケージ部品(切断品)20bを減圧室1300の外部に搬出する(切断品搬出工程)。その後、パッケージ部品(切断品)20bを検査テーブル1400で検査し、トレイ1500に収納する。   Then, the gate valve 1330 is opened in a state where the cutting step (cutting the package substrate 20) is finished and the pressure inside the decompression chamber 1300 is substantially the same as the pressure inside the cutting chamber 1200. In this state, the package component (cut product) 20 b is carried out from the cutting chamber 1200 and stored in the decompression chamber 1300. Thereafter, the gate valve 1330 is closed to disconnect the space in the decompression chamber 1300 and the space in the cutting chamber 1200 to separate them. Further, the air in the decompression chamber 1300 is discharged to the outside using the atmospheric pressure regulator 1210 to reduce the pressure. When the pressure in the decompression chamber 1300 becomes substantially the same as the atmospheric pressure, the package component (cut product) 20b is carried out of the decompression chamber 1300 (cut product delivery step). Thereafter, the package component (cut product) 20 b is inspected by the inspection table 1400 and stored in the tray 1500.

なお、本実施例(実施例2)の変形例として、例えば、図7の切断装置1000から加圧室1100及び減圧室1300を省略した構成とすることができる。この場合、例えば、ゲートバルブ1030及びゲートバルブ1330の開閉により、切断室1200内部空間と外部空間とを連結(接続)又は分離可能であってもよい。そして、この場合、基板供給機構(切断対象物供給機構)1010から、加圧室1100を介さずに切断室1200にパッケージ基板(切断対象物)20が搬入され、かつ、切断室1200から、減圧室1300を介さずに外部にパッケージ部品(切断品)20bが搬出されることになる。したがって、切断対象物搬入工程では、切断室1200の内部が大気圧の状態で、切断室1200に設けられた搬入部からパッケージ基板(切断対象物)20を搬入する。その後に切断室1200を密閉状態とし、気圧調整器1210を用いて圧縮空気を切断室1200内に供給して、切断室1200内の気圧を大気圧よりも高い状態とする。この切断室1200内の気圧が大気圧よりも高い状態で、前記切断工程を行なう。切断品搬出工程は、前記切断工程の後に、気圧調整器1210を用いて切断室1200内の空気を外部に排出して減圧し、切断室1200内の気圧が大気圧とほぼ同じになったら、パッケージ部品(切断品)20bを切断室1200に設けられた搬出部からの外部に搬出する。これら以外は、図7の切断装置1000から加圧室1100及び減圧室1300を省略した変形例における切断品の製造方法は、図7の切断装置1000を用いた切断品の製造方法と同様に行なうことができる。   As a modification of the present embodiment (embodiment 2), for example, a configuration in which the pressurizing chamber 1100 and the decompression chamber 1300 are omitted from the cutting apparatus 1000 of FIG. In this case, for example, the internal space and the external space of the cutting chamber 1200 may be connected (connected) or separated by opening and closing the gate valve 1030 and the gate valve 1330. In this case, the package substrate (cutting object) 20 is carried into the cutting chamber 1200 from the substrate supply mechanism (cutting object supply mechanism) 1010 without passing through the pressurizing chamber 1100, and the pressure is reduced from the cutting chamber 1200. The package component (cut product) 20b is carried outside without passing through the chamber 1300. Therefore, in the cutting object carrying-in process, the package substrate (cutting object) 20 is carried in from the carrying-in portion provided in the cutting chamber 1200 while the inside of the cutting chamber 1200 is at atmospheric pressure. Thereafter, the cutting chamber 1200 is hermetically sealed, and compressed air is supplied into the cutting chamber 1200 using the atmospheric pressure regulator 1210 so that the atmospheric pressure in the cutting chamber 1200 is higher than the atmospheric pressure. The cutting step is performed in a state where the atmospheric pressure in the cutting chamber 1200 is higher than the atmospheric pressure. In the cut product unloading process, after the cutting process, the air in the cutting chamber 1200 is discharged to the outside using the atmospheric pressure regulator 1210 to reduce the pressure, and when the atmospheric pressure in the cutting chamber 1200 becomes substantially the same as the atmospheric pressure, The package component (cut product) 20b is carried out from the carry-out section provided in the cutting chamber 1200. Except for these, the manufacturing method of the cut product in the modification in which the pressurizing chamber 1100 and the decompression chamber 1300 are omitted from the cutting device 1000 of FIG. 7 is performed in the same manner as the manufacturing method of the cut product using the cutting device 1000 of FIG. be able to.

つぎに、本発明のさらに別の実施例について説明する。   Next, still another embodiment of the present invention will be described.

本実施例では、本発明の切断装置及び切断品の製造方法の、実施例1及び2とは別の一例について説明する。   In the present embodiment, an example different from the first and second embodiments of the cutting device and the method for manufacturing a cut product according to the present invention will be described.

図8の平面図に、本実施例の切断装置の構成を模式的に示す。図示のとおり、この切断装置1000bは、実施例2(図7)の切断装置と同様、Aエリア、Bエリア及びCエリアの3つのエリア(領域)を含む。この切断装置1000bは、加圧室1100、切断室1200、及び減圧室1300を含まず、Aエリア、Bエリア及びCエリアの3つのエリアが1つにつながっている。したがって、この切断装置1000bは、ゲートバルブ1030及び1330を含まない。また、この切断装置1000bは、Aエリア、Bエリア及びCエリアの3つのエリア全体が、格納室2000内部に格納されている。気圧調整器1210及び排水減圧器1220は、格納室2000の外側に配置されている。さらに、格納室2000の外側には、操作部2100が配置されている。操作部2100により、格納室2000内部の気圧が、大気圧よりも高い気圧に保持される。このため、操作部2100及び格納室2000は、切断装置1000bにおける「気圧保持機構」に該当する。また、切断品の製造方法を実施しない時は、例えば、操作部2100により、格納室2000内部の気圧を大気圧とほぼ同じにすることもできる。格納室2000は、開閉可能である。切断品の製造方法を実施する時は、格納室2000を閉じて、格納室2000内部の空間と外部の空間とを分離することができる。一方、切断品の製造方法を実施しない時は、格納室2000を開いて、格納室2000内部の空間と外部の空間とをつなげることもできる。これら以外は、図8の切断装置1000bは、図7(実施例2)の切断装置1000と同様である。   The plan view of FIG. 8 schematically shows the configuration of the cutting apparatus of the present embodiment. As illustrated, the cutting apparatus 1000b includes three areas (regions), an A area, a B area, and a C area, as in the cutting apparatus of the second embodiment (FIG. 7). This cutting apparatus 1000b does not include the pressurizing chamber 1100, the cutting chamber 1200, and the decompression chamber 1300, and the three areas A area, B area, and C area are connected to one. Therefore, the cutting apparatus 1000b does not include the gate valves 1030 and 1330. In the cutting apparatus 1000b, the entire three areas of the A area, the B area, and the C area are stored in the storage chamber 2000. The pressure regulator 1210 and the drain pressure reducer 1220 are disposed outside the storage chamber 2000. Furthermore, an operation unit 2100 is disposed outside the storage chamber 2000. The operation unit 2100 maintains the pressure inside the storage chamber 2000 at a pressure higher than the atmospheric pressure. For this reason, the operation unit 2100 and the storage chamber 2000 correspond to the “atmospheric pressure holding mechanism” in the cutting apparatus 1000b. Further, when the method for manufacturing a cut product is not performed, the pressure inside the storage chamber 2000 can be made substantially the same as the atmospheric pressure by the operation unit 2100, for example. The storage chamber 2000 can be opened and closed. When the manufacturing method of the cut product is performed, the storage chamber 2000 can be closed to separate the space inside the storage chamber 2000 from the space outside. On the other hand, when the manufacturing method of the cut product is not performed, the storage chamber 2000 can be opened to connect the space inside the storage chamber 2000 and the outside space. Except for these, the cutting device 1000b in FIG. 8 is the same as the cutting device 1000 in FIG. 7 (Example 2).

格納室2000は、例えば、内部のメンテナンス作業が可能なスペースを確保したサイズでもよい。具体的には、例えば、格納室2000内部に人が立ち入ることにより、切断装置1000bのメンテナンス作業が可能であってもよい。格納室2000の構造は特に限定されないが、例えば、気密性の高い業務用冷蔵庫又は冷凍庫と同様の構造を用いることができる。ただし、気密性を維持するためのものではない断熱材等は、省略可能である。また、操作部2100は、例えば、格納室2000内部と無線又は有線により通信することにより、切断装置1000bを操作できる。具体的には、例えば、操作部2100と制御部1020とを無線又は有線により通信することにより、切断装置1000b全体の動作を制御してもよい。また、操作部2100の形態も、特に限定されない。例えば、図8では、操作部2100は、格納室2000の壁部外側に取付けられた操作パネルとして図示している。しかし、操作部2100は、これに限定されず。例えば、タブレット端末等であってもよい。   The storage chamber 2000 may be, for example, a size that secures a space where internal maintenance work can be performed. Specifically, for example, when a person enters the storage chamber 2000, the maintenance work of the cutting apparatus 1000b may be possible. Although the structure of the storage chamber 2000 is not specifically limited, For example, the structure similar to a highly airtight commercial refrigerator or freezer can be used. However, a heat insulating material or the like that is not for maintaining airtightness can be omitted. In addition, the operation unit 2100 can operate the cutting device 1000b by communicating with the inside of the storage room 2000 by wireless or wired, for example. Specifically, for example, the operation of the cutting device 1000b may be controlled by communicating the operation unit 2100 and the control unit 1020 wirelessly or by wire. Further, the form of the operation unit 2100 is not particularly limited. For example, in FIG. 8, the operation unit 2100 is illustrated as an operation panel attached to the outside of the wall portion of the storage chamber 2000. However, the operation unit 2100 is not limited to this. For example, it may be a tablet terminal.

図8の切断装置1000bを用いた切断品の製造方法は、例えば、実施例2で説明した全ての工程を、格納室2000内部を大気圧よりも高い気圧に保持した状態で行なうことができる。例えば、気圧調整機構(図示せず、例えば圧縮ポンプ等)を用いて格納室2000内部に圧縮空気を供給し、格納室2000内部を大気圧よりも気圧に保持してもよい。前述のとおり、この切断装置1000bは、加圧室1100、切断室1200、及び減圧室1300を含まず、Aエリア、Bエリア及びCエリアの3つのエリアが1つにつながっている。したがって、パッケージ基板(切断対象物)20及びパッケージ部品(切断品)20bを搬送する際に、加圧室1100、切断室1200、及び減圧室1300の気圧を変化させる工程が不要である。これ以外は、図8の切断装置1000bを用いた切断品の製造方法は、図7(実施例2)の切断装置1000を用いた切断品の製造方法と同様にして行なうことができる。   In the manufacturing method of a cut product using the cutting apparatus 1000b of FIG. 8, for example, all the steps described in the second embodiment can be performed in a state where the inside of the storage chamber 2000 is maintained at a pressure higher than the atmospheric pressure. For example, compressed air may be supplied to the inside of the storage chamber 2000 using an atmospheric pressure adjusting mechanism (not shown, for example, a compression pump), and the inside of the storage chamber 2000 may be held at atmospheric pressure rather than atmospheric pressure. As described above, the cutting apparatus 1000b does not include the pressurizing chamber 1100, the cutting chamber 1200, and the decompression chamber 1300, and the three areas A area, B area, and C area are connected to one. Therefore, when the package substrate (cutting object) 20 and the package component (cut product) 20b are transported, there is no need to change the pressure in the pressurizing chamber 1100, the cutting chamber 1200, and the decompression chamber 1300. Except this, the manufacturing method of the cut product using the cutting device 1000b of FIG. 8 can be performed in the same manner as the manufacturing method of the cut product using the cutting device 1000 of FIG. 7 (Example 2).

なお、前記気圧調整機構は、特に限定されず、例えば、切断装置1000bが設置された施設(例えば工場等)に設けられた既存の空気圧縮システム等を用いてもよい。また、例えば、前記既存の空気圧縮システムとは別に、空気圧縮機及びレシーバタンクを含む空気圧縮システムを設けてもよい。このようにすると、格納室2000内部を速やかに高圧にすることができるので好ましい。   The air pressure adjusting mechanism is not particularly limited, and for example, an existing air compression system provided in a facility (for example, a factory) where the cutting device 1000b is installed may be used. Further, for example, an air compression system including an air compressor and a receiver tank may be provided separately from the existing air compression system. This is preferable because the inside of the storage chamber 2000 can be quickly brought to a high pressure.

また、前述のとおり、切断品の製造方法を実施しない時は、例えば、操作部2100により、格納室2000内部の気圧を大気圧とほぼ同じにすることもできる。例えば、切断装置1000bのメンテナンス時には、前記気圧調整機構を用いて格納室2000内部の空気を外部に排出し、格納室2000内部の気圧を大気圧と同程度に減圧してもよい。これにより、メンテナンス作業者が高圧室内で作業することを回避できる。   Further, as described above, when the manufacturing method of the cut product is not performed, the pressure inside the storage chamber 2000 can be made substantially the same as the atmospheric pressure by the operation unit 2100, for example. For example, at the time of maintenance of the cutting apparatus 1000b, the air inside the storage chamber 2000 may be discharged to the outside using the air pressure adjusting mechanism, and the air pressure inside the storage chamber 2000 may be reduced to the same level as the atmospheric pressure. Thereby, it can avoid that a maintenance worker works in a high pressure room.

実施例2(図7)の切断装置1000を用いた切断品の製造方法は、前述のとおり、1回毎に、加圧室1100、切断室1200、及び減圧室1300の気圧を変化させる工程が必要である。これに対し、本実施例(図8)の切断装置1000bを用いた切断品の製造方法は、前述のとおり、加圧室1100、切断室1200、及び減圧室1300の気圧を変化させる工程が不要である。このため、本実施例(図8)の切断装置1000bによれば、切断品の製造方法を、実施例2(図7)の切断装置1000よりもさらに効率よく行なうことができる。一方、本実施例(図8)の切断装置1000bは、格納室2000を設置するためのスペースが必要である。   As described above, the manufacturing method of the cut product using the cutting apparatus 1000 of Example 2 (FIG. 7) includes the step of changing the pressure in the pressurizing chamber 1100, the cutting chamber 1200, and the decompression chamber 1300 every time. is necessary. On the other hand, the manufacturing method of the cut product using the cutting apparatus 1000b of the present embodiment (FIG. 8) does not require a step of changing the pressure in the pressurizing chamber 1100, the cutting chamber 1200, and the decompression chamber 1300 as described above. It is. For this reason, according to the cutting apparatus 1000b of the present embodiment (FIG. 8), the method for manufacturing a cut product can be performed more efficiently than the cutting apparatus 1000 of the second embodiment (FIG. 7). On the other hand, the cutting apparatus 1000b of this embodiment (FIG. 8) requires a space for installing the storage chamber 2000.

なお、図8の格納室2000は、前述のとおり、内部のメンテナンス作業(例えば、メンテナンス作業者の立ち入り)が可能なスペースを確保したサイズであるとして説明したが、これに限定されない。すなわち、本実施例(実施例3)の変形例として、例えば、切断装置本体の外側全体を覆うカバー部を設け、前記カバー部を「格納室」とし、その内部を密閉状態とすることが可能な構成としてもよい。   Although the storage chamber 2000 of FIG. 8 has been described as having a size that secures a space where internal maintenance work (for example, entry of maintenance workers) is possible, as described above, the present invention is not limited to this. That is, as a modification of the present embodiment (embodiment 3), for example, a cover portion that covers the entire outside of the cutting apparatus main body can be provided, the cover portion can be a “containment chamber”, and the inside can be sealed. It is good also as a simple structure.

さらに、本発明は、上述の実施例に限定されるものではなく、本発明の趣旨を逸脱しない範囲内で、必要に応じて、任意にかつ適宜に組み合わせ、変更し、又は選択して採用できるものである。   Furthermore, the present invention is not limited to the above-described embodiments, and can be arbitrarily combined, modified, or selected and adopted as necessary without departing from the spirit of the present invention. Is.

10 テーブル(治具)
11 溝
12 貫通孔
20 パッケージ基板(切断対象物)
20b パッケージ部品(切断品)
21 基板
21b 切断された基板
22 樹脂(硬化樹脂)
22b 切断された樹脂(硬化樹脂)
30 回転刃(切断機構)
31 刃本体
32 フランジ(固定部材)
1000、1000b 切断装置
1010 基板供給機構(切断対象物供給機構)
1020 制御部
1030 ゲートバルブ
1100 加圧室
1200 切断室(気圧保持機構)
1210 気圧調整器(気圧保持機構)
1220 排水減圧器
1230 スピンドル(切断機構)
1241、1242 蛇腹
1250 受け板
1260 排水流動部
1270 排出口
1300 減圧室
1330 ゲートバルブ
1400 検査テーブル
1500 トレイ
2000 格納室(気圧保持機構)
2100 操作部(気圧保持機構)
X1 テーブル10による吸引方向を表す矢印
Y1 パッケージ基板20に圧力がかかる方向を表す矢印
10 Table (Jig)
11 Groove 12 Through-hole 20 Package substrate (object to be cut)
20b Package parts (cut products)
21 Substrate 21b Cut substrate 22 Resin (cured resin)
22b Resin cut (cured resin)
30 rotary blade (cutting mechanism)
31 Blade body 32 Flange (fixing member)
1000, 1000b Cutting device 1010 Substrate supply mechanism (cutting object supply mechanism)
1020 Control unit 1030 Gate valve 1100 Pressurizing chamber 1200 Cutting chamber (atmospheric pressure holding mechanism)
1210 Barometric pressure regulator (barometric pressure holding mechanism)
1220 Drain pressure reducer 1230 Spindle (cutting mechanism)
1241, 1242 bellows 1250 receiving plate 1260 drainage flow part 1270 discharge port 1300 decompression chamber 1330 gate valve 1400 inspection table 1500 tray 2000 storage chamber (pressure holding mechanism)
2100 Operation unit (atmospheric pressure retention mechanism)
X1 Arrow representing the suction direction by the table 10 Y1 Arrow representing the direction in which pressure is applied to the package substrate 20

Claims (8)

テーブルと、気圧保持機構と、切断機構とを含み、
前記テーブルにより、切断対象物が吸引されて保持され、
前記気圧保持機構により、前記切断対象物が保持された前記テーブルの外側の気圧が、大気圧よりも高い気圧に保持され、
前記切断機構により、前記テーブルに保持された前記切断対象物が切断されることを特徴とする切断装置。
Including a table, a pressure holding mechanism, and a cutting mechanism;
The object to be cut is sucked and held by the table,
By the atmospheric pressure holding mechanism, the atmospheric pressure outside the table where the cutting object is held is held at an atmospheric pressure higher than atmospheric pressure,
The cutting apparatus characterized in that the cutting object held on the table is cut by the cutting mechanism.
さらに、切断室を含み、
前記切断室内では、前記気圧保持機構により前記テーブルの外側の気圧が大気圧よりも高い気圧に保持された状態とされ、前記テーブルに保持された前記切断対象物が前記切断機構により切断されて切断品が製造される、
請求項1記載の切断装置。
In addition, including a cutting chamber,
In the cutting chamber, the pressure outside the table is maintained at a pressure higher than the atmospheric pressure by the pressure holding mechanism, and the cutting object held on the table is cut by the cutting mechanism and cut. Products are manufactured,
The cutting device according to claim 1.
さらに、加圧室と、減圧室とを含み、
前記加圧室は、前記切断室の切断対象物搬入側に配置され、
前記減圧室は、前記切断室の切断品搬出側に配置され、
前記加圧室と前記切断室とが接続され、かつ、前記加圧室及び前記切断室内部が大気圧よりも高い気圧に保持された状態で、前記切断対象物が、前記加圧室から前記切断室に搬入され、
前記減圧室と前記切断室とが接続された状態で、前記切断品が、前記切断室から前記減圧室に搬出され、その後、前記減圧室と前記切断室との接続が遮断され、かつ、前記減圧室内部が前記切断対象物切断時よりも低い気圧に減圧された状態で、前記切断品が、前記減圧室内部から外部に搬出される、
請求項2記載の切断装置。
Furthermore, a pressurizing chamber and a decompression chamber are included,
The pressurizing chamber is disposed on the cutting object carry-in side of the cutting chamber,
The decompression chamber is disposed on the cut product delivery side of the cutting chamber,
In the state where the pressurizing chamber and the cutting chamber are connected, and the pressurizing chamber and the cutting chamber are maintained at a pressure higher than atmospheric pressure, the cutting object is moved from the pressurizing chamber to the pressure chamber. Carried into the cutting room,
In a state where the decompression chamber and the cutting chamber are connected, the cut product is carried out from the cutting chamber to the decompression chamber, and then the connection between the decompression chamber and the cutting chamber is interrupted, and In a state where the decompression chamber is decompressed to a pressure lower than that at the time of cutting the cutting object, the cut product is carried out from the decompression chamber to the outside.
The cutting device according to claim 2.
前記気圧保持機構が、格納室と、操作部とを含み、
前記格納室内部に、前記テーブルと前記切断機構とが格納され、
前記操作部により、前記格納室内部の気圧が、大気圧よりも高い気圧に保持される、
請求項1から3のいずれか一項に記載の切断装置。
The atmospheric pressure holding mechanism includes a storage chamber and an operation unit,
The table and the cutting mechanism are stored in the storage chamber,
The operation unit maintains the pressure inside the storage chamber at a pressure higher than atmospheric pressure.
The cutting device according to any one of claims 1 to 3.
前記気圧保持機構により、前記切断対象物が保持された前記テーブルの外側の気圧が、1.1×10Pa以上に保持される、請求項1から4のいずれか一項に記載の切断装置。 The cutting apparatus according to any one of claims 1 to 4, wherein an atmospheric pressure outside the table on which the cutting object is held is held at 1.1 x 10 5 Pa or more by the atmospheric pressure holding mechanism. . テーブルにより、切断対象物を吸引して保持する切断対象物保持工程と、
前記切断対象物が保持された前記テーブルの外側の気圧を、大気圧よりも高い気圧に保持する気圧保持工程と、
前記テーブルに保持された前記切断対象物を切断する切断工程と、
を含むことを特徴とする切断品の製造方法。
A cutting object holding step for sucking and holding the cutting object by a table; and
An atmospheric pressure maintaining step of maintaining an atmospheric pressure outside the table where the cutting object is held at an atmospheric pressure higher than an atmospheric pressure;
A cutting step of cutting the cutting object held on the table;
The manufacturing method of the cut goods characterized by including.
切断室を用い、
前記切断工程を、前記切断室内で行なう、
請求項6記載の切断品の製造方法。
Using a cutting chamber,
Performing the cutting step in the cutting chamber;
The method for manufacturing a cut product according to claim 6.
さらに、加圧室と、減圧室とを用い、
さらに、切断対象物搬入工程と、切断品搬出工程とを含み、
前記切断対象物搬入工程は、前記加圧室と前記切断室とが接続され、かつ、前記加圧室及び前記切断室内部が大気圧よりも高い気圧に保持された状態で、前記切断対象物を前記加圧室から前記切断室に搬入する工程であり、
前記切断品搬出工程は、前記減圧室と前記切断室とが接続された状態で、前記切断工程で前記切断対象物が切断された切断品を、前記切断室から前記減圧室に搬出し、その後、前記減圧室と前記切断室との接続を遮断してから、前記減圧室内部が前記切断対象物切断時よりも低い気圧に減圧された状態で、前記切断品を前記減圧室内部から外部に搬出する工程である、
請求項7記載の切断品の製造方法。
Furthermore, using a pressurizing chamber and a decompression chamber,
Furthermore, a cutting object carrying-in process and a cut product carrying-out process are included,
In the cutting object carrying-in step, the cutting object is connected in a state where the pressurizing chamber and the cutting chamber are connected and the inside of the pressurizing chamber and the cutting chamber is maintained at a pressure higher than atmospheric pressure. Is carried into the cutting chamber from the pressurizing chamber,
The cut product unloading step carries out the cut product in which the object to be cut is cut in the cutting step from the cutting chamber to the decompression chamber in a state where the decompression chamber and the cutting chamber are connected, and then After cutting off the connection between the decompression chamber and the cutting chamber, the cut product is removed from the decompression chamber to the outside while the decompression chamber is decompressed to a pressure lower than that at the time of cutting the object to be cut. It is a process to carry out,
The manufacturing method of the cut article of Claim 7.
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