JP2018503100A5 - - Google Patents
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- JP2018503100A5 JP2018503100A5 JP2017543853A JP2017543853A JP2018503100A5 JP 2018503100 A5 JP2018503100 A5 JP 2018503100A5 JP 2017543853 A JP2017543853 A JP 2017543853A JP 2017543853 A JP2017543853 A JP 2017543853A JP 2018503100 A5 JP2018503100 A5 JP 2018503100A5
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- JP
- Japan
- Prior art keywords
- profile
- configuration
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- surface profile
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- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000034 method Methods 0.000 description 23
- 230000003287 optical effect Effects 0.000 description 20
- 238000005259 measurement Methods 0.000 description 12
- 238000003908 quality control method Methods 0.000 description 10
- 230000004075 alteration Effects 0.000 description 8
- 238000004519 manufacturing process Methods 0.000 description 6
- 230000003121 nonmonotonic effect Effects 0.000 description 2
- 238000000418 atomic force spectrum Methods 0.000 description 1
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201462078310P | 2014-11-11 | 2014-11-11 | |
| US62/078,310 | 2014-11-11 | ||
| PCT/AU2015/050700 WO2016074034A2 (en) | 2014-11-11 | 2015-11-11 | Systems and methods for determining the quality of a reproduced (manufactured) optic device |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2021000650A Division JP2021060420A (ja) | 2014-11-11 | 2021-01-06 | 複製（製造）光学デバイスの品質を判断するためのシステム及び方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2018503100A JP2018503100A (ja) | 2018-02-01 |
| JP2018503100A5 true JP2018503100A5 (enExample) | 2018-12-20 |
Family
ID=55955207
Family Applications (3)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2017543853A Pending JP2018503100A (ja) | 2014-11-11 | 2015-11-11 | 複製（製造）光学デバイスの品質を判断するためのシステム及び方法 |
| JP2021000650A Pending JP2021060420A (ja) | 2014-11-11 | 2021-01-06 | 複製（製造）光学デバイスの品質を判断するためのシステム及び方法 |
| JP2023027890A Pending JP2023078153A (ja) | 2014-11-11 | 2023-02-27 | 複製（製造）光学デバイスの品質を判断するためのシステム及び方法 |
Family Applications After (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2021000650A Pending JP2021060420A (ja) | 2014-11-11 | 2021-01-06 | 複製（製造）光学デバイスの品質を判断するためのシステム及び方法 |
| JP2023027890A Pending JP2023078153A (ja) | 2014-11-11 | 2023-02-27 | 複製（製造）光学デバイスの品質を判断するためのシステム及び方法 |
Country Status (10)
| Country | Link |
|---|---|
| US (2) | US10352816B2 (enExample) |
| EP (1) | EP3218685B1 (enExample) |
| JP (3) | JP2018503100A (enExample) |
| KR (1) | KR20170080696A (enExample) |
| CN (1) | CN107110740B (enExample) |
| ES (1) | ES2887113T3 (enExample) |
| HU (1) | HUE055799T2 (enExample) |
| SG (1) | SG11201703751YA (enExample) |
| TW (1) | TWI679466B (enExample) |
| WO (1) | WO2016074034A2 (enExample) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107110740B (zh) * | 2014-11-11 | 2021-04-30 | 华柏恩视觉研究中心 | 用于确定制造的光学器件的质量的系统和方法 |
| US10036685B2 (en) * | 2016-05-18 | 2018-07-31 | Jand, Inc. | Fixtureless lensmeter and methods of operating same |
| US10557773B2 (en) | 2016-05-18 | 2020-02-11 | Jand, Inc. | Fixtureless lensmeter system |
| US11488239B2 (en) | 2019-08-26 | 2022-11-01 | Warby Parker Inc. | Virtual fitting systems and methods for spectacles |
| CN115803750B (zh) | 2020-04-15 | 2024-01-30 | 沃比帕克公司 | 使用参考框架的眼镜的虚拟试戴系统 |
| CN115697183B (zh) | 2020-06-17 | 2026-03-17 | 沃比帕克公司 | 用于测量瞳孔距离的系统和方法及其使用 |
Family Cites Families (28)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| ES2101465T3 (es) * | 1993-09-17 | 1997-07-01 | Essilor Int | Procedimiento de medicion absoluta de la estructura geometrica u optica de un componente optico y dispositivo para su puesta en practica. |
| SG74157A1 (en) * | 1998-07-27 | 2000-07-18 | Matsushita Electric Industrial Co Ltd | Method and apparatus for evaluating aberrations of optical element for use with optical device |
| US6750958B1 (en) * | 1999-06-09 | 2004-06-15 | Optikos Corporation | Automated optical measurement apparatus and method |
| JP3681321B2 (ja) * | 2000-04-03 | 2005-08-10 | 大日本スクリーン製造株式会社 | 薄膜の開口比測定方法及びその装置 |
| JP2005525725A (ja) * | 2002-01-21 | 2005-08-25 | シーメンス モービル コミュニケイションズ ソシエタ ペル アチオニ | タイムスロットシステムにおいて初期セルサーチを行う方法及び移動局 |
| US7158222B2 (en) | 2002-05-16 | 2007-01-02 | Hoya Corporation | Method and device for evaluating spectacle lens or mold for molding spectacle lens, and method and system for manufacturing spectacle lens |
| JP2004138504A (ja) * | 2002-10-17 | 2004-05-13 | Toshiba Corp | 参照データ補正方法及びその装置、パターン検査装置 |
| EP1759167A2 (en) * | 2004-05-10 | 2007-03-07 | Koninklijke Philips Electronics N.V. | Device and method for optical precision measurement |
| JP2006105717A (ja) * | 2004-10-04 | 2006-04-20 | Matsushita Electric Ind Co Ltd | 高さデータ推定方法、高さデータ推定用プログラム及び３次元形状測定装置 |
| JP2007170888A (ja) * | 2005-12-20 | 2007-07-05 | Olympus Corp | 光学素子検査装置 |
| JP2007281003A (ja) * | 2006-04-03 | 2007-10-25 | Canon Inc | 測定方法及び装置、並びに、露光装置 |
| US7416300B2 (en) * | 2006-05-25 | 2008-08-26 | Coopervision International Holding Company, Lp | Measurement of lenses and lens molds using optical coherence tomography |
| AU2007336799B2 (en) * | 2006-12-21 | 2013-10-24 | Arizona Board Of Regents On Behalf Of The University Of Arizona | Interferometry testing of lenses, and systems and devices for same |
| JP2008172004A (ja) * | 2007-01-11 | 2008-07-24 | Nikon Corp | 収差評価方法、調整方法、露光装置、露光方法、およびデバイス製造方法 |
| AU2008215164B2 (en) * | 2007-02-14 | 2012-06-07 | Brien Holden Vision Institute | Characterization of optical systems |
| JP2009031109A (ja) * | 2007-07-26 | 2009-02-12 | Tokyo Institute Of Technology | 画像解析方法 |
| US8285505B2 (en) | 2007-08-31 | 2012-10-09 | Hoya Corporation | Lens evaluation method, lens evaluation device, lens manufacturing method, and lens characteristic display method |
| JP5154565B2 (ja) * | 2007-10-31 | 2013-02-27 | Ｈｏｙａ株式会社 | 眼鏡レンズ設計方法、眼鏡レンズ製造方法、眼鏡レンズ製造システム |
| US20090190463A1 (en) * | 2008-01-30 | 2009-07-30 | Jds Uniphase Corporation, | Optical pick-up unit with two-mirror phase shifter |
| CN102413999A (zh) * | 2009-02-27 | 2012-04-11 | Hoya株式会社 | 透镜用铸模的制造方法及眼镜透镜的制造方法 |
| JP5540213B2 (ja) * | 2010-12-20 | 2014-07-02 | 東海光学株式会社 | 眼鏡レンズの評価方法 |
| WO2013119775A1 (en) * | 2012-02-10 | 2013-08-15 | Johnson & Johnson Vision Care, Inc. | Method and apparatus for determining a thickness profile of an ophthalmic lens using a single point thickness and refractive index measurements |
| TWI588560B (zh) * | 2012-04-05 | 2017-06-21 | 布萊恩荷登視覺協會 | 用於屈光不正之鏡片、裝置、方法及系統 |
| US9201250B2 (en) * | 2012-10-17 | 2015-12-01 | Brien Holden Vision Institute | Lenses, devices, methods and systems for refractive error |
| CA2887655C (en) * | 2012-10-17 | 2021-11-02 | Brien Holden Vision Institute | Lenses, devices, methods and systems for refractive error |
| WO2014076155A1 (en) | 2012-11-14 | 2014-05-22 | Essilor International (Compagnie Generale D'optique) | Method of determining optical parameters of an opthalmic lens |
| GB2508219A (en) * | 2012-11-26 | 2014-05-28 | Taylor Hobson Ltd | Analysing and machining an optical profile |
| CN107110740B (zh) * | 2014-11-11 | 2021-04-30 | 华柏恩视觉研究中心 | 用于确定制造的光学器件的质量的系统和方法 |
-
2015
- 2015-11-11 CN CN201580072477.3A patent/CN107110740B/zh not_active Expired - Fee Related
- 2015-11-11 EP EP15858689.1A patent/EP3218685B1/en active Active
- 2015-11-11 US US15/526,205 patent/US10352816B2/en active Active
- 2015-11-11 KR KR1020177015920A patent/KR20170080696A/ko not_active Withdrawn
- 2015-11-11 WO PCT/AU2015/050700 patent/WO2016074034A2/en not_active Ceased
- 2015-11-11 TW TW104137222A patent/TWI679466B/zh not_active IP Right Cessation
- 2015-11-11 JP JP2017543853A patent/JP2018503100A/ja active Pending
- 2015-11-11 ES ES15858689T patent/ES2887113T3/es active Active
- 2015-11-11 SG SG11201703751YA patent/SG11201703751YA/en unknown
- 2015-11-11 HU HUE15858689A patent/HUE055799T2/hu unknown
-
2019
- 2019-06-03 US US16/430,060 patent/US10670495B2/en active Active
-
2021
- 2021-01-06 JP JP2021000650A patent/JP2021060420A/ja active Pending
-
2023
- 2023-02-27 JP JP2023027890A patent/JP2023078153A/ja active Pending
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