KR20170080696A - 재생된(제조된) 광학 장치의 품질을 결정하는 시스템 및 방법 - Google Patents

재생된(제조된) 광학 장치의 품질을 결정하는 시스템 및 방법 Download PDF

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Publication number
KR20170080696A
KR20170080696A KR1020177015920A KR20177015920A KR20170080696A KR 20170080696 A KR20170080696 A KR 20170080696A KR 1020177015920 A KR1020177015920 A KR 1020177015920A KR 20177015920 A KR20177015920 A KR 20177015920A KR 20170080696 A KR20170080696 A KR 20170080696A
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South Korea
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frequency
surface profile
offset
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Korean (ko)
Inventor
페이비언 콘래드
라비 찬드라 바카라주
클라우즈 에르만
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브리엔 홀덴 비전 인스티튜트
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Publication of KR20170080696A publication Critical patent/KR20170080696A/ko
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0228—Testing optical properties by measuring refractive power
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/42—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect
    • G02B27/4205—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect having a diffractive optical element [DOE] contributing to image formation, e.g. whereby modulation transfer function MTF or optical aberrations are relevant
    • G02B27/4211—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect having a diffractive optical element [DOE] contributing to image formation, e.g. whereby modulation transfer function MTF or optical aberrations are relevant correcting chromatic aberrations
    • G—PHYSICS
    • G02—OPTICS
    • G02C—SPECTACLES; SUNGLASSES OR GOGGLES INSOFAR AS THEY HAVE THE SAME FEATURES AS SPECTACLES; CONTACT LENSES
    • G02C7/00—Optical parts

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Geometry (AREA)
  • Health & Medical Sciences (AREA)
  • Ophthalmology & Optometry (AREA)
  • General Health & Medical Sciences (AREA)
  • Eyeglasses (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Lenses (AREA)
KR1020177015920A 2014-11-11 2015-11-11 재생된(제조된) 광학 장치의 품질을 결정하는 시스템 및 방법 Withdrawn KR20170080696A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201462078310P 2014-11-11 2014-11-11
US62/078,310 2014-11-11
PCT/AU2015/050700 WO2016074034A2 (en) 2014-11-11 2015-11-11 Systems and methods for determining the quality of a reproduced (manufactured) optic device

Publications (1)

Publication Number Publication Date
KR20170080696A true KR20170080696A (ko) 2017-07-10

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ID=55955207

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020177015920A Withdrawn KR20170080696A (ko) 2014-11-11 2015-11-11 재생된(제조된) 광학 장치의 품질을 결정하는 시스템 및 방법

Country Status (10)

Country Link
US (2) US10352816B2 (enExample)
EP (1) EP3218685B1 (enExample)
JP (3) JP2018503100A (enExample)
KR (1) KR20170080696A (enExample)
CN (1) CN107110740B (enExample)
ES (1) ES2887113T3 (enExample)
HU (1) HUE055799T2 (enExample)
SG (1) SG11201703751YA (enExample)
TW (1) TWI679466B (enExample)
WO (1) WO2016074034A2 (enExample)

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CN107110740B (zh) * 2014-11-11 2021-04-30 华柏恩视觉研究中心 用于确定制造的光学器件的质量的系统和方法
US10036685B2 (en) * 2016-05-18 2018-07-31 Jand, Inc. Fixtureless lensmeter and methods of operating same
US10557773B2 (en) 2016-05-18 2020-02-11 Jand, Inc. Fixtureless lensmeter system
US11488239B2 (en) 2019-08-26 2022-11-01 Warby Parker Inc. Virtual fitting systems and methods for spectacles
CN115803750B (zh) 2020-04-15 2024-01-30 沃比帕克公司 使用参考框架的眼镜的虚拟试戴系统
CN115697183B (zh) 2020-06-17 2026-03-17 沃比帕克公司 用于测量瞳孔距离的系统和方法及其使用

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EP1759167A2 (en) * 2004-05-10 2007-03-07 Koninklijke Philips Electronics N.V. Device and method for optical precision measurement
JP2006105717A (ja) * 2004-10-04 2006-04-20 Matsushita Electric Ind Co Ltd 高さデータ推定方法、高さデータ推定用プログラム及び3次元形状測定装置
JP2007170888A (ja) * 2005-12-20 2007-07-05 Olympus Corp 光学素子検査装置
JP2007281003A (ja) * 2006-04-03 2007-10-25 Canon Inc 測定方法及び装置、並びに、露光装置
US7416300B2 (en) * 2006-05-25 2008-08-26 Coopervision International Holding Company, Lp Measurement of lenses and lens molds using optical coherence tomography
AU2007336799B2 (en) * 2006-12-21 2013-10-24 Arizona Board Of Regents On Behalf Of The University Of Arizona Interferometry testing of lenses, and systems and devices for same
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JP5154565B2 (ja) * 2007-10-31 2013-02-27 Hoya株式会社 眼鏡レンズ設計方法、眼鏡レンズ製造方法、眼鏡レンズ製造システム
US20090190463A1 (en) * 2008-01-30 2009-07-30 Jds Uniphase Corporation, Optical pick-up unit with two-mirror phase shifter
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US9201250B2 (en) * 2012-10-17 2015-12-01 Brien Holden Vision Institute Lenses, devices, methods and systems for refractive error
CA2887655C (en) * 2012-10-17 2021-11-02 Brien Holden Vision Institute Lenses, devices, methods and systems for refractive error
WO2014076155A1 (en) 2012-11-14 2014-05-22 Essilor International (Compagnie Generale D'optique) Method of determining optical parameters of an opthalmic lens
GB2508219A (en) * 2012-11-26 2014-05-28 Taylor Hobson Ltd Analysing and machining an optical profile
CN107110740B (zh) * 2014-11-11 2021-04-30 华柏恩视觉研究中心 用于确定制造的光学器件的质量的系统和方法

Also Published As

Publication number Publication date
HUE055799T2 (hu) 2021-12-28
EP3218685A2 (en) 2017-09-20
US20170322110A1 (en) 2017-11-09
WO2016074034A3 (en) 2016-06-23
JP2021060420A (ja) 2021-04-15
CN107110740B (zh) 2021-04-30
EP3218685A4 (en) 2018-07-04
US20190391039A1 (en) 2019-12-26
CN107110740A (zh) 2017-08-29
EP3218685B1 (en) 2021-06-16
WO2016074034A2 (en) 2016-05-19
US10670495B2 (en) 2020-06-02
JP2023078153A (ja) 2023-06-06
US10352816B2 (en) 2019-07-16
JP2018503100A (ja) 2018-02-01
SG11201703751YA (en) 2017-06-29
TW201632953A (zh) 2016-09-16
TWI679466B (zh) 2019-12-11
ES2887113T3 (es) 2021-12-21

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PA0105 International application

Patent event date: 20170609

Patent event code: PA01051R01D

Comment text: International Patent Application

PG1501 Laying open of application
PC1203 Withdrawal of no request for examination