JP2018009930A5 - - Google Patents

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JP2018009930A5
JP2018009930A5 JP2016140347A JP2016140347A JP2018009930A5 JP 2018009930 A5 JP2018009930 A5 JP 2018009930A5 JP 2016140347 A JP2016140347 A JP 2016140347A JP 2016140347 A JP2016140347 A JP 2016140347A JP 2018009930 A5 JP2018009930 A5 JP 2018009930A5
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JP
Japan
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signal
scfclk
clock signal
output
physical quantity
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JP2016140347A
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English (en)
Japanese (ja)
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JP6733381B2 (ja
JP2018009930A (ja
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Priority to JP2016140347A priority Critical patent/JP6733381B2/ja
Priority claimed from JP2016140347A external-priority patent/JP6733381B2/ja
Priority to CN201710521602.5A priority patent/CN107632169A/zh
Priority to US15/646,376 priority patent/US10116275B2/en
Publication of JP2018009930A publication Critical patent/JP2018009930A/ja
Publication of JP2018009930A5 publication Critical patent/JP2018009930A5/ja
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JP2016140347A 2016-07-15 2016-07-15 物理量検出回路、物理量検出装置、電子機器及び移動体 Active JP6733381B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2016140347A JP6733381B2 (ja) 2016-07-15 2016-07-15 物理量検出回路、物理量検出装置、電子機器及び移動体
CN201710521602.5A CN107632169A (zh) 2016-07-15 2017-06-30 物理量检测电路、物理量检测装置、电子设备和移动体
US15/646,376 US10116275B2 (en) 2016-07-15 2017-07-11 Physical quantity detection circuit, physical quantity detection device, electronic apparatus, and vehicle

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2016140347A JP6733381B2 (ja) 2016-07-15 2016-07-15 物理量検出回路、物理量検出装置、電子機器及び移動体

Publications (3)

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JP2018009930A JP2018009930A (ja) 2018-01-18
JP2018009930A5 true JP2018009930A5 (enExample) 2019-07-04
JP6733381B2 JP6733381B2 (ja) 2020-07-29

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JP2016140347A Active JP6733381B2 (ja) 2016-07-15 2016-07-15 物理量検出回路、物理量検出装置、電子機器及び移動体

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US (1) US10116275B2 (enExample)
JP (1) JP6733381B2 (enExample)
CN (1) CN107632169A (enExample)

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JP7119478B2 (ja) * 2018-03-23 2022-08-17 セイコーエプソン株式会社 回路装置、物理量測定装置、電子機器及び移動体
JP7234655B2 (ja) * 2019-01-29 2023-03-08 セイコーエプソン株式会社 物理量検出回路、物理量センサー、電子機器、移動体及び物理量検出回路の動作方法
US11211101B2 (en) * 2019-12-03 2021-12-28 Micron Technology, Inc. Differential amplifier schemes for sensing memory cells
EP3839833A1 (en) * 2019-12-16 2021-06-23 ams International AG Neural amplifier, neural network and sensor device
JP7322718B2 (ja) * 2020-01-17 2023-08-08 セイコーエプソン株式会社 物理量検出回路、物理量センサー、電子機器、移動体及び物理量検出回路の動作方法
JP7456284B2 (ja) 2020-05-25 2024-03-27 セイコーエプソン株式会社 物理量検出回路、物理量検出装置、電子機器及び移動体
JP2021185356A (ja) 2020-05-25 2021-12-09 セイコーエプソン株式会社 物理量検出回路、物理量検出装置、電子機器及び移動体
TWI806420B (zh) * 2022-02-11 2023-06-21 瑞鼎科技股份有限公司 電容變化量測電路
CN116026296B (zh) * 2022-12-29 2025-11-18 美新半导体(天津)有限公司 三通道分时复用检测电路的mems陀螺仪

Family Cites Families (15)

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US7995679B2 (en) * 2004-04-27 2011-08-09 Broadcom Corporation Method and system for charge sensing with variable gain, offset compensation, and demodulation
EP1793497B1 (en) 2005-12-02 2011-04-27 STMicroelectronics Srl Device and method for reading a capacitive sensor, in particular of a micro-electromechanical type
JP2007214613A (ja) * 2006-02-07 2007-08-23 Seiko Instruments Inc 増幅回路
WO2008042015A2 (en) 2006-09-28 2008-04-10 Medtronic, Inc. Capacitive interface circuit for low power sensor system
JP4821900B2 (ja) * 2009-09-11 2011-11-24 セイコーエプソン株式会社 検出装置、物理量測定装置及び電子機器
JP2011069628A (ja) * 2009-09-24 2011-04-07 Seiko Epson Corp 物理量測定装置及び電子機器
JP2012049599A (ja) * 2010-08-24 2012-03-08 Seiko Epson Corp スイッチドキャパシター回路、検出装置及び電子機器
JP5825624B2 (ja) * 2011-07-08 2015-12-02 セイコーエプソン株式会社 スイッチトキャパシター積分回路、フィルター回路、物理量測定装置、及び電子機器
US8742964B2 (en) * 2012-04-04 2014-06-03 Fairchild Semiconductor Corporation Noise reduction method with chopping for a merged MEMS accelerometer sensor
ITTO20130013A1 (it) * 2013-01-09 2014-07-10 St Microelectronics Srl Giroscopio microelettromeccanico con compensazione di componenti di segnale di quadratura e metodo di controllo di un giroscopio microelettromeccanico
JP6201774B2 (ja) 2014-01-16 2017-09-27 セイコーエプソン株式会社 物理量検出回路、物理量検出装置、電子機器および移動体
US9411987B2 (en) * 2014-08-18 2016-08-09 Qualcomm Incorporated Low noise and low power passive sampling network for a switched-capacitor ADC with a slow reference generator
JP5850121B2 (ja) * 2014-10-07 2016-02-03 セイコーエプソン株式会社 物理量測定装置及び電子機器
US9214949B1 (en) * 2014-12-08 2015-12-15 Broadcom Corporation Analog to digital converter having switched capacitor power supply
US9413377B1 (en) * 2015-12-15 2016-08-09 Lncku Research And Development Foundation Switched capacitor circuit and compensation method thereof, and analog to digital converter

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