JP2017201707A - 高エネルギー密度蓄電装置 - Google Patents
高エネルギー密度蓄電装置 Download PDFInfo
- Publication number
- JP2017201707A JP2017201707A JP2017125494A JP2017125494A JP2017201707A JP 2017201707 A JP2017201707 A JP 2017201707A JP 2017125494 A JP2017125494 A JP 2017125494A JP 2017125494 A JP2017125494 A JP 2017125494A JP 2017201707 A JP2017201707 A JP 2017201707A
- Authority
- JP
- Japan
- Prior art keywords
- layer
- batio
- dlc
- layers
- electrode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000003860 storage Methods 0.000 title description 9
- 230000005611 electricity Effects 0.000 title 1
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims abstract description 18
- 229910052799 carbon Inorganic materials 0.000 claims abstract description 17
- 239000010432 diamond Substances 0.000 claims abstract description 14
- 229910003460 diamond Inorganic materials 0.000 claims abstract description 14
- 239000012777 electrically insulating material Substances 0.000 claims abstract description 10
- 239000002245 particle Substances 0.000 claims description 20
- 239000000463 material Substances 0.000 abstract description 23
- 238000000034 method Methods 0.000 abstract description 21
- 230000015556 catabolic process Effects 0.000 abstract description 17
- 238000013461 design Methods 0.000 abstract description 8
- 238000004146 energy storage Methods 0.000 abstract description 8
- 238000000576 coating method Methods 0.000 abstract description 4
- 239000003989 dielectric material Substances 0.000 abstract description 4
- JRPBQTZRNDNNOP-UHFFFAOYSA-N barium titanate Chemical compound [Ba+2].[Ba+2].[O-][Ti]([O-])([O-])[O-] JRPBQTZRNDNNOP-UHFFFAOYSA-N 0.000 abstract description 3
- 229910002113 barium titanate Inorganic materials 0.000 abstract description 3
- 239000011248 coating agent Substances 0.000 abstract description 3
- 239000004020 conductor Substances 0.000 abstract 1
- 239000010410 layer Substances 0.000 description 109
- 229910052751 metal Inorganic materials 0.000 description 41
- 239000002184 metal Substances 0.000 description 41
- 239000011521 glass Substances 0.000 description 16
- 239000011888 foil Substances 0.000 description 11
- 238000004549 pulsed laser deposition Methods 0.000 description 11
- 238000010586 diagram Methods 0.000 description 10
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 9
- 230000000694 effects Effects 0.000 description 7
- 230000005684 electric field Effects 0.000 description 7
- 238000010276 construction Methods 0.000 description 6
- 239000011159 matrix material Substances 0.000 description 6
- 238000002844 melting Methods 0.000 description 6
- 239000000843 powder Substances 0.000 description 6
- 239000000758 substrate Substances 0.000 description 6
- 230000008901 benefit Effects 0.000 description 5
- 239000003990 capacitor Substances 0.000 description 5
- 239000000203 mixture Substances 0.000 description 5
- 239000004033 plastic Substances 0.000 description 5
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 4
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 4
- 125000004432 carbon atom Chemical group C* 0.000 description 4
- 238000005229 chemical vapour deposition Methods 0.000 description 4
- XEEYBQQBJWHFJM-UHFFFAOYSA-N iron Substances [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 4
- 230000008018 melting Effects 0.000 description 4
- 229910052750 molybdenum Inorganic materials 0.000 description 4
- 239000011733 molybdenum Substances 0.000 description 4
- PXHVJJICTQNCMI-UHFFFAOYSA-N nickel Substances [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 4
- 238000012546 transfer Methods 0.000 description 4
- 239000011787 zinc oxide Substances 0.000 description 4
- 239000000919 ceramic Substances 0.000 description 3
- 238000001816 cooling Methods 0.000 description 3
- 238000010292 electrical insulation Methods 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 238000010438 heat treatment Methods 0.000 description 3
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- 229910052779 Neodymium Inorganic materials 0.000 description 2
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 2
- 229910045601 alloy Inorganic materials 0.000 description 2
- 239000000956 alloy Substances 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 239000011651 chromium Substances 0.000 description 2
- 239000002131 composite material Substances 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- 239000013078 crystal Substances 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 229910052742 iron Inorganic materials 0.000 description 2
- 229910000833 kovar Inorganic materials 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 150000002739 metals Chemical class 0.000 description 2
- 238000000465 moulding Methods 0.000 description 2
- QEFYFXOXNSNQGX-UHFFFAOYSA-N neodymium atom Chemical compound [Nd] QEFYFXOXNSNQGX-UHFFFAOYSA-N 0.000 description 2
- 229910052759 nickel Inorganic materials 0.000 description 2
- 238000000623 plasma-assisted chemical vapour deposition Methods 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 238000000926 separation method Methods 0.000 description 2
- 239000010936 titanium Substances 0.000 description 2
- 229910052719 titanium Inorganic materials 0.000 description 2
- 229910052684 Cerium Inorganic materials 0.000 description 1
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 1
- 229910001313 Cobalt-iron alloy Inorganic materials 0.000 description 1
- 229910001374 Invar Inorganic materials 0.000 description 1
- 229910001030 Iron–nickel alloy Inorganic materials 0.000 description 1
- HBBGRARXTFLTSG-UHFFFAOYSA-N Lithium ion Chemical compound [Li+] HBBGRARXTFLTSG-UHFFFAOYSA-N 0.000 description 1
- KGWWEXORQXHJJQ-UHFFFAOYSA-N [Fe].[Co].[Ni] Chemical compound [Fe].[Co].[Ni] KGWWEXORQXHJJQ-UHFFFAOYSA-N 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- JNDMLEXHDPKVFC-UHFFFAOYSA-N aluminum;oxygen(2-);yttrium(3+) Chemical compound [O-2].[O-2].[O-2].[Al+3].[Y+3] JNDMLEXHDPKVFC-UHFFFAOYSA-N 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 230000004888 barrier function Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 229910052797 bismuth Inorganic materials 0.000 description 1
- JCXGWMGPZLAOME-UHFFFAOYSA-N bismuth atom Chemical compound [Bi] JCXGWMGPZLAOME-UHFFFAOYSA-N 0.000 description 1
- 239000005388 borosilicate glass Substances 0.000 description 1
- 239000011203 carbon fibre reinforced carbon Substances 0.000 description 1
- -1 carbon ion Chemical class 0.000 description 1
- GWXLDORMOJMVQZ-UHFFFAOYSA-N cerium Chemical compound [Ce] GWXLDORMOJMVQZ-UHFFFAOYSA-N 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 229910052804 chromium Inorganic materials 0.000 description 1
- 229910017052 cobalt Inorganic materials 0.000 description 1
- 239000010941 cobalt Substances 0.000 description 1
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 description 1
- 230000008602 contraction Effects 0.000 description 1
- 238000005336 cracking Methods 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 239000007772 electrode material Substances 0.000 description 1
- 238000005538 encapsulation Methods 0.000 description 1
- 229910002804 graphite Inorganic materials 0.000 description 1
- 239000010439 graphite Substances 0.000 description 1
- 230000020169 heat generation Effects 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 229910052746 lanthanum Inorganic materials 0.000 description 1
- FZLIPJUXYLNCLC-UHFFFAOYSA-N lanthanum atom Chemical compound [La] FZLIPJUXYLNCLC-UHFFFAOYSA-N 0.000 description 1
- 229910001416 lithium ion Inorganic materials 0.000 description 1
- 239000000696 magnetic material Substances 0.000 description 1
- 238000001755 magnetron sputter deposition Methods 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
- 239000000615 nonconductor Substances 0.000 description 1
- 230000001590 oxidative effect Effects 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
- 238000010248 power generation Methods 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 238000003672 processing method Methods 0.000 description 1
- 230000001737 promoting effect Effects 0.000 description 1
- 150000003839 salts Chemical class 0.000 description 1
- 239000000523 sample Substances 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 238000010561 standard procedure Methods 0.000 description 1
- 229910019655 synthetic inorganic crystalline material Inorganic materials 0.000 description 1
- 230000002277 temperature effect Effects 0.000 description 1
- 231100000331 toxic Toxicity 0.000 description 1
- 230000002588 toxic effect Effects 0.000 description 1
- QWVYNEUUYROOSZ-UHFFFAOYSA-N trioxido(oxo)vanadium;yttrium(3+) Chemical compound [Y+3].[O-][V]([O-])([O-])=O QWVYNEUUYROOSZ-UHFFFAOYSA-N 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
- 229910052720 vanadium Inorganic materials 0.000 description 1
- LEONUFNNVUYDNQ-UHFFFAOYSA-N vanadium atom Chemical compound [V] LEONUFNNVUYDNQ-UHFFFAOYSA-N 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
- 229910019901 yttrium aluminum garnet Inorganic materials 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/30—Stacked capacitors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/002—Details
- H01G4/005—Electrodes
- H01G4/012—Form of non-self-supporting electrodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/002—Details
- H01G4/018—Dielectrics
- H01G4/06—Solid dielectrics
- H01G4/08—Inorganic dielectrics
- H01G4/12—Ceramic dielectrics
- H01G4/1209—Ceramic dielectrics characterised by the ceramic dielectric material
- H01G4/1218—Ceramic dielectrics characterised by the ceramic dielectric material based on titanium oxides or titanates
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/002—Details
- H01G4/018—Dielectrics
- H01G4/06—Solid dielectrics
- H01G4/08—Inorganic dielectrics
- H01G4/12—Ceramic dielectrics
- H01G4/1209—Ceramic dielectrics characterised by the ceramic dielectric material
- H01G4/1218—Ceramic dielectrics characterised by the ceramic dielectric material based on titanium oxides or titanates
- H01G4/1227—Ceramic dielectrics characterised by the ceramic dielectric material based on titanium oxides or titanates based on alkaline earth titanates
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/002—Details
- H01G4/018—Dielectrics
- H01G4/06—Solid dielectrics
- H01G4/08—Inorganic dielectrics
- H01G4/12—Ceramic dielectrics
- H01G4/1272—Semiconductive ceramic capacitors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/002—Details
- H01G4/018—Dielectrics
- H01G4/06—Solid dielectrics
- H01G4/08—Inorganic dielectrics
- H01G4/12—Ceramic dielectrics
- H01G4/129—Ceramic dielectrics containing a glassy phase, e.g. glass ceramic
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/002—Details
- H01G4/258—Temperature compensation means
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L28/00—Passive two-terminal components without a potential-jump or surface barrier for integrated circuits; Details thereof; Multistep manufacturing processes therefor
- H01L28/40—Capacitors
- H01L28/55—Capacitors with a dielectric comprising a perovskite structure material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L28/00—Passive two-terminal components without a potential-jump or surface barrier for integrated circuits; Details thereof; Multistep manufacturing processes therefor
- H01L28/40—Capacitors
- H01L28/55—Capacitors with a dielectric comprising a perovskite structure material
- H01L28/56—Capacitors with a dielectric comprising a perovskite structure material the dielectric comprising two or more layers, e.g. comprising buffer layers, seed layers, gradient layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/002—Details
- H01G4/018—Dielectrics
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02T—CLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO TRANSPORTATION
- Y02T10/00—Road transport of goods or passengers
- Y02T10/60—Other road transportation technologies with climate change mitigation effect
- Y02T10/70—Energy storage systems for electromobility, e.g. batteries
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Ceramic Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Inorganic Chemistry (AREA)
- Materials Engineering (AREA)
- Computer Hardware Design (AREA)
- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
- Ceramic Capacitors (AREA)
Abstract
Description
いずれの層も、特定の任務及び用途に向けて装置を適合させるために、設計者によって変更され得る。厚いDLC層を作製するためには、痕跡量のチタン、タングステン、コバルトなどの種々の金属、又は低いパーセンテージの種々のその他の金属を炭素と混合し、これを使用して、応力緩和層を作製することができる。さらに、純粋な炭素ターゲット上のレーザーの放射輝度水準を低減することにより、これも応力緩和層である、sp2(グラファイト)層が創生されることとなる。厚い層に対しては、割れを防止するために応力緩和が望まれる。
膨張をDLCに合致させた金属箔上に設けられた、被覆され絶縁された電極に基づく、すなわち、CTE収縮封入成形法である。この電極の概略が図2に示される。エネルギー貯蔵単位(ESU)装置と同様の幅を有する金属箔片5の両面及び両縁並びに片端が、DLCの層6によって被覆される。この例については、金属箔5の厚さは2ミル以下であり、望ましい値は実用上最も薄い厚さである。DLC層6の厚さは、1/40ミル〜1ミルであり、望ましい値は最大印加電圧によって決定される。
用途例
Claims (3)
- 電気エネルギーを貯蔵するための装置であって、
第1の導電電極層と、
第2の導電電極層と、
誘電体層と、
熱伝導性を有する電気絶縁材料を備え、且つ、前記第1の導電電極層を前記誘電体層から電気的に絶縁するために、前記第1の導電電極層と前記誘電体層との間に設けられた第1の絶縁層と、
熱伝導性を有する電気絶縁材料を備え、且つ、前記第2の導電電極層を前記誘電体層から電気的に絶縁するために、前記第2の導電電極層と前記誘電体層との間に設けられた第2の絶縁層と、
を備える、装置。 - 前記第1の絶縁層及び前記第2の絶縁層が、ダイアモンド又はダイアモンド様炭素を含む、請求項1に記載の装置。
- 前記誘電体層が、少なくとも部分的に六方晶系構造に組織化されるBaTiO3粒子を含む、請求項1又は2に記載の装置。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201161560461P | 2011-11-16 | 2011-11-16 | |
US61/560,461 | 2011-11-16 |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2014542389A Division JP6242337B2 (ja) | 2011-11-16 | 2012-11-14 | 高エネルギー密度蓄電装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2017201707A true JP2017201707A (ja) | 2017-11-09 |
JP6603688B2 JP6603688B2 (ja) | 2019-11-06 |
Family
ID=48430092
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2014542389A Expired - Fee Related JP6242337B2 (ja) | 2011-11-16 | 2012-11-14 | 高エネルギー密度蓄電装置 |
JP2017125494A Expired - Fee Related JP6603688B2 (ja) | 2011-11-16 | 2017-06-27 | 高エネルギー密度蓄電装置 |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2014542389A Expired - Fee Related JP6242337B2 (ja) | 2011-11-16 | 2012-11-14 | 高エネルギー密度蓄電装置 |
Country Status (6)
Country | Link |
---|---|
US (3) | US9230741B2 (ja) |
EP (1) | EP2780919B1 (ja) |
JP (2) | JP6242337B2 (ja) |
CN (1) | CN103946937B (ja) |
BR (1) | BR112014011422A2 (ja) |
WO (1) | WO2013074577A1 (ja) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2013074577A1 (en) * | 2011-11-16 | 2013-05-23 | Stuart Martin A | High energy density storage device |
US10373767B2 (en) * | 2017-11-21 | 2019-08-06 | Vactronix Scientific, Llc | Structural supercapacitor composite and method of making same |
WO2021247117A2 (en) * | 2020-03-19 | 2021-12-09 | Frank David L | Dielectric energy storage systems |
WO2020232693A1 (zh) * | 2019-05-23 | 2020-11-26 | 深圳先进技术研究院 | 埋入式电容材料、其制备方法及印制线路板 |
CN111739736B (zh) * | 2020-06-29 | 2021-11-30 | 陕西理工大学 | 一种具有高储能密度的柔性薄膜电容器及制备方法 |
JP2022073617A (ja) * | 2020-11-02 | 2022-05-17 | 株式会社村田製作所 | 積層セラミックコンデンサ |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH09213567A (ja) * | 1995-12-04 | 1997-08-15 | General Electric Co <Ge> | 薄膜コンデンサおよびその製造方法 |
JP2000164460A (ja) * | 1998-11-23 | 2000-06-16 | Microcoating Technologies Inc | 薄膜コンデンサの形成法 |
JP2001267751A (ja) * | 2000-03-22 | 2001-09-28 | Matsushita Electric Ind Co Ltd | コンデンサ内蔵基板およびその製造方法 |
JP2010062411A (ja) * | 2008-09-05 | 2010-03-18 | Panasonic Corp | 金属化フィルムコンデンサ |
JP2011108886A (ja) * | 2009-11-18 | 2011-06-02 | Tdk Corp | 薄膜コンデンサ及び薄膜コンデンサの製造方法 |
Family Cites Families (44)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS541918B1 (ja) * | 1966-11-22 | 1979-01-30 | ||
JPS5434160B1 (ja) * | 1968-10-12 | 1979-10-25 | ||
JPS6144415A (ja) * | 1984-08-09 | 1986-03-04 | マルコン電子株式会社 | 薄膜コンデンサ |
JPS61232604A (ja) * | 1985-04-08 | 1986-10-16 | 松下電器産業株式会社 | 金属化プラスチツクフイルムコンデンサ |
JPH01202806A (ja) * | 1988-02-08 | 1989-08-15 | Matsushita Electric Ind Co Ltd | コンデンサー |
US5636100A (en) | 1993-10-12 | 1997-06-03 | The United States Of America As Represented By The Secretary Of The Army | Capacitor having an enhanced dielectric breakdown strength |
US5576925A (en) | 1994-12-27 | 1996-11-19 | General Electric Company | Flexible multilayer thin film capacitors |
US5790368A (en) | 1995-06-27 | 1998-08-04 | Murata Manufacturing Co., Ltd. | Capacitor and manufacturing method thereof |
US5774326A (en) | 1995-08-25 | 1998-06-30 | General Electric Company | Multilayer capacitors using amorphous hydrogenated carbon |
US5638251A (en) | 1995-10-03 | 1997-06-10 | Advanced Refractory Technologies, Inc. | Capacitive thin films using diamond-like nanocomposite materials |
US5926359A (en) | 1996-04-01 | 1999-07-20 | International Business Machines Corporation | Metal-insulator-metal capacitor |
FR2748346B1 (fr) | 1996-05-06 | 1998-07-24 | Pixtech Sa | Realisation d'une anode d'ecran plat de visualisation |
JPH113834A (ja) * | 1996-07-25 | 1999-01-06 | Murata Mfg Co Ltd | 積層セラミックコンデンサおよびその製造方法 |
US5844770A (en) * | 1997-08-21 | 1998-12-01 | K Systems Corporation | Capacitor structures with dielectric coated conductive substrates |
US7033406B2 (en) * | 2001-04-12 | 2006-04-25 | Eestor, Inc. | Electrical-energy-storage unit (EESU) utilizing ceramic and integrated-circuit technologies for replacement of electrochemical batteries |
JP3785966B2 (ja) * | 2001-08-23 | 2006-06-14 | 株式会社村田製作所 | 積層セラミック電子部品の製造方法および積層セラミック電子部品 |
DE10221498A1 (de) * | 2002-05-14 | 2003-12-04 | Basf Ag | Kondensatoren hoher Energiedichte |
EP1738378A4 (en) | 2004-03-18 | 2010-05-05 | Nanosys Inc | NANOFIBRE SURFACE BASED CAPACITORS |
JP4578134B2 (ja) * | 2004-03-29 | 2010-11-10 | 京セラ株式会社 | コンデンサ内蔵ガラスセラミック多層配線基板 |
US7023089B1 (en) | 2004-03-31 | 2006-04-04 | Intel Corporation | Low temperature packaging apparatus and method |
US7180724B2 (en) | 2004-09-30 | 2007-02-20 | Intel Corporation | Electrolytic polymer capacitors for decoupling power delivery, packages made therewith, and systems containing same |
US8030219B1 (en) | 2005-02-07 | 2011-10-04 | Morgan Advanced Ceramics, Inc. | Dielectric coatings and use in capacitors |
US7580240B2 (en) * | 2005-11-24 | 2009-08-25 | Ngk Spark Plug Co., Ltd. | Via array capacitor, wiring board incorporating a via array capacitor, and method of manufacturing the same |
US7460352B2 (en) | 2006-01-09 | 2008-12-02 | Faradox Energy Storage, Inc. | Flexible dielectric film and method for making |
JP4880376B2 (ja) | 2006-06-14 | 2012-02-22 | 株式会社日立製作所 | 支援装置、プログラム、情報処理システム及び支援方法 |
US7990679B2 (en) | 2006-07-14 | 2011-08-02 | Dais Analytic Corporation | Nanoparticle ultracapacitor |
US8097557B2 (en) | 2006-08-08 | 2012-01-17 | Sd Lizenverwertungsgesellschaft Mbh & Co. Kg | Two-stage calcination for catalyst production |
JP2008227093A (ja) * | 2007-03-12 | 2008-09-25 | Tdk Corp | 積層型電子部品の製造方法 |
US20110110015A1 (en) | 2007-04-11 | 2011-05-12 | The Penn State Research Foundation | Methods to improve the efficiency and reduce the energy losses in high energy density capacitor films and articles comprising the same |
JP5204770B2 (ja) | 2007-06-26 | 2013-06-05 | 京セラ株式会社 | 誘電体磁器およびコンデンサ |
CN105931837B (zh) | 2007-10-05 | 2018-11-06 | 卡弗科技公司 | 高电容率低漏电的电容器和能量存储器件及其形成方法 |
US7781358B2 (en) | 2008-02-15 | 2010-08-24 | Trs Technologies, Inc. | Antiferroelectric multilayer ceramic capacitor |
WO2009136443A1 (ja) * | 2008-05-09 | 2009-11-12 | 独立行政法人宇宙航空研究開発機構 | 誘電体磁器組成物 |
JP5317538B2 (ja) | 2008-06-04 | 2013-10-16 | 京セラ株式会社 | 誘電体磁器およびコンデンサ |
JP5206440B2 (ja) * | 2009-01-16 | 2013-06-12 | Tdk株式会社 | セラミック電子部品 |
EP2392020A2 (en) | 2009-02-02 | 2011-12-07 | Space Charge, LLC | Capacitors using preformed electrode |
JP5532505B2 (ja) * | 2009-07-23 | 2014-06-25 | 日本電気硝子株式会社 | コンデンサー用ガラスフィルム |
US8263515B2 (en) | 2009-08-29 | 2012-09-11 | Fatih Dogan | Nanostructured dielectric materials for high energy density multi layer ceramic capacitors |
US20110051313A1 (en) * | 2009-09-02 | 2011-03-03 | Hwang Wein-Kuen | Magnetically enhanced capacitance for high performance thin film capacitors |
JP5779860B2 (ja) * | 2009-11-06 | 2015-09-16 | Tdk株式会社 | 六方晶系チタン酸バリウム粉末、その製造方法、誘電体磁器組成物および電子部品 |
JP5152308B2 (ja) * | 2010-03-09 | 2013-02-27 | Tdk株式会社 | セラミック電子部品 |
US8760844B2 (en) | 2010-08-13 | 2014-06-24 | Mesoscribe Technologies, Inc. | Devices having a diamond-like-carbon dielectric |
WO2013074577A1 (en) * | 2011-11-16 | 2013-05-23 | Stuart Martin A | High energy density storage device |
US9396880B2 (en) * | 2011-11-16 | 2016-07-19 | Martin A. Stuart | High energy density storage device |
-
2012
- 2012-11-14 WO PCT/US2012/064944 patent/WO2013074577A1/en active Application Filing
- 2012-11-14 JP JP2014542389A patent/JP6242337B2/ja not_active Expired - Fee Related
- 2012-11-14 EP EP12849600.7A patent/EP2780919B1/en not_active Not-in-force
- 2012-11-14 US US14/357,676 patent/US9230741B2/en not_active Expired - Fee Related
- 2012-11-14 BR BR112014011422A patent/BR112014011422A2/pt not_active IP Right Cessation
- 2012-11-14 CN CN201280056056.8A patent/CN103946937B/zh not_active Expired - Fee Related
-
2015
- 2015-10-23 US US14/921,199 patent/US10026555B2/en active Active
-
2017
- 2017-06-27 JP JP2017125494A patent/JP6603688B2/ja not_active Expired - Fee Related
-
2018
- 2018-07-12 US US16/033,871 patent/US10636573B2/en not_active Expired - Fee Related
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH09213567A (ja) * | 1995-12-04 | 1997-08-15 | General Electric Co <Ge> | 薄膜コンデンサおよびその製造方法 |
JP2000164460A (ja) * | 1998-11-23 | 2000-06-16 | Microcoating Technologies Inc | 薄膜コンデンサの形成法 |
JP2001267751A (ja) * | 2000-03-22 | 2001-09-28 | Matsushita Electric Ind Co Ltd | コンデンサ内蔵基板およびその製造方法 |
JP2010062411A (ja) * | 2008-09-05 | 2010-03-18 | Panasonic Corp | 金属化フィルムコンデンサ |
JP2011108886A (ja) * | 2009-11-18 | 2011-06-02 | Tdk Corp | 薄膜コンデンサ及び薄膜コンデンサの製造方法 |
Also Published As
Publication number | Publication date |
---|---|
US20180323012A1 (en) | 2018-11-08 |
US10026555B2 (en) | 2018-07-17 |
JP6242337B2 (ja) | 2017-12-06 |
EP2780919B1 (en) | 2017-07-19 |
WO2013074577A1 (en) | 2013-05-23 |
CN103946937B (zh) | 2017-03-15 |
US9230741B2 (en) | 2016-01-05 |
US20160042870A1 (en) | 2016-02-11 |
JP2015502040A (ja) | 2015-01-19 |
CN103946937A (zh) | 2014-07-23 |
US10636573B2 (en) | 2020-04-28 |
EP2780919A1 (en) | 2014-09-24 |
EP2780919A4 (en) | 2016-02-17 |
JP6603688B2 (ja) | 2019-11-06 |
US20140293504A1 (en) | 2014-10-02 |
BR112014011422A2 (pt) | 2017-05-16 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP6603688B2 (ja) | 高エネルギー密度蓄電装置 | |
Yao et al. | Homogeneous/inhomogeneous‐structured dielectrics and their energy‐storage performances | |
US5414588A (en) | High performance capacitors using nano-structure multilayer materials fabrication | |
JP4986398B2 (ja) | いわゆるクアンタム・バッテリに電気エネルギーを蓄積する新しい方法 | |
US10741334B2 (en) | Method and associated capacitors having engineered electrodes with very high energy density | |
ZA200506419B (en) | Electrical charge storage device having enhanced power characteristics | |
US9396880B2 (en) | High energy density storage device | |
US20140185187A1 (en) | Electrostatic energy storage device and preparation method thereof | |
CN104993095A (zh) | 一种层叠式全固态锂离子电池 | |
CN107275085A (zh) | 一种石墨烯基高压脉冲薄膜电容器 | |
WO2012157774A1 (ja) | 固体電解質電池および正極活物質 | |
Welton et al. | Ion source antenna development for the Spallation Neutron Source | |
Yan et al. | Influence of lithium iron phosphate positive electrode material to hybrid lithium-ion battery capacitor (H-LiBC) energy storage devices | |
CN111213271B (zh) | 固态薄膜混合电化学电池 | |
US10672564B2 (en) | Electret energy storage system | |
KR101509533B1 (ko) | 리튬 이온 이차전지용 실리콘/알루미늄 적층 다층 음극 박막 및 그 제조방법 | |
KR101918112B1 (ko) | 리튬 전지 및 그 제조방법 | |
KR102302821B1 (ko) | 집전체 구조 및 이를 포함하는 슈퍼 캐패시터 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20170720 |
|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20170720 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20180529 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20180605 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20180903 |
|
A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20190205 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20190603 |
|
A711 | Notification of change in applicant |
Free format text: JAPANESE INTERMEDIATE CODE: A712 Effective date: 20190603 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A821 Effective date: 20190710 |
|
A911 | Transfer to examiner for re-examination before appeal (zenchi) |
Free format text: JAPANESE INTERMEDIATE CODE: A911 Effective date: 20190830 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20190924 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20191011 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 6603688 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
LAPS | Cancellation because of no payment of annual fees |