JP2017157672A - 回路装置 - Google Patents
回路装置 Download PDFInfo
- Publication number
- JP2017157672A JP2017157672A JP2016039094A JP2016039094A JP2017157672A JP 2017157672 A JP2017157672 A JP 2017157672A JP 2016039094 A JP2016039094 A JP 2016039094A JP 2016039094 A JP2016039094 A JP 2016039094A JP 2017157672 A JP2017157672 A JP 2017157672A
- Authority
- JP
- Japan
- Prior art keywords
- lead frame
- circuit device
- surface side
- resin member
- thickness
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 229920005989 resin Polymers 0.000 claims abstract description 62
- 239000011347 resin Substances 0.000 claims abstract description 62
- 229910000679 solder Inorganic materials 0.000 claims abstract description 25
- 238000004519 manufacturing process Methods 0.000 description 5
- 230000004048 modification Effects 0.000 description 5
- 238000012986 modification Methods 0.000 description 5
- 230000001133 acceleration Effects 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 230000002093 peripheral effect Effects 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 230000005389 magnetism Effects 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 238000000465 moulding Methods 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 238000004080 punching Methods 0.000 description 1
- 229920001169 thermoplastic Polymers 0.000 description 1
- 229920001187 thermosetting polymer Polymers 0.000 description 1
- 239000004416 thermosoftening plastic Substances 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/30—Technical effects
- H01L2924/35—Mechanical effects
- H01L2924/351—Thermal stress
- H01L2924/3511—Warping
Landscapes
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
- Lead Frames For Integrated Circuits (AREA)
Abstract
Description
Claims (5)
- 実装素子(14)がはんだ(18)により接合されたリードフレーム(16)と、前記リードフレームを囲むように保持する、線膨張係数が前記リードフレームの線膨張係数に比して大きい固定樹脂部材(20)と、を備える回路装置(10)であって、
前記固定樹脂部材(20)は、前記リードフレームに対する前記実装素子が接合される実装面側(20a)の厚み(ta)が、前記リードフレームに対する前記実装面側とは逆側である反対面側(20b)の厚み(tb)に比して小さくなるように形成されている回路装置。 - 実装素子(14)がはんだ(18)により接合されたリードフレーム(16)と、前記リードフレームを囲むように保持する、線膨張係数が前記リードフレームの線膨張係数に比して大きい固定樹脂部材(20)と、を備える回路装置(10)であって、
前記リードフレーム(16)は、前記固定樹脂部材(20)に対して、該固定樹脂部材の該リードフレームに対する前記実装素子が接合される実装面側(20a)の厚み(ta)が、該リードフレームに対する前記実装面側とは逆側である反対面側(20b)の厚み(tb)に比して小さくなるように配置されている回路装置。 - 全体の厚みが前記リードフレーム(16)の厚みに対して4倍以上である請求項1又は2記載の回路装置。
- 前記リードフレームが接続される回路配線が形成されているプリント基板(12)の表面に実装されている請求項1乃至3の何れか一項記載の回路装置。
- 前記リードフレームが外部接続コネクタ(32)に接続されている請求項1乃至3の何れか一項記載の回路装置。
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016039094A JP6658104B2 (ja) | 2016-03-01 | 2016-03-01 | 回路装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016039094A JP6658104B2 (ja) | 2016-03-01 | 2016-03-01 | 回路装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2017157672A true JP2017157672A (ja) | 2017-09-07 |
JP6658104B2 JP6658104B2 (ja) | 2020-03-04 |
Family
ID=59810196
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2016039094A Active JP6658104B2 (ja) | 2016-03-01 | 2016-03-01 | 回路装置 |
Country Status (1)
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JP (1) | JP6658104B2 (ja) |
Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05144982A (ja) * | 1991-11-19 | 1993-06-11 | Nippon Precision Circuits Kk | 集積回路装置 |
JPH05152365A (ja) * | 1991-11-26 | 1993-06-18 | Hitachi Ltd | 樹脂封止型半導体装置及びその製造方法 |
JPH09213826A (ja) * | 1996-02-01 | 1997-08-15 | Nec Corp | パッケージ |
JPH11150209A (ja) * | 1997-11-19 | 1999-06-02 | Nissan Motor Co Ltd | 半導体素子の実装方法 |
JP2000286367A (ja) * | 1999-03-30 | 2000-10-13 | Rohm Co Ltd | 半導体装置 |
JP2011155286A (ja) * | 2011-03-22 | 2011-08-11 | Rohm Co Ltd | 半導体装置 |
JP2015079789A (ja) * | 2013-10-15 | 2015-04-23 | 株式会社デンソー | 半導体装置 |
JP2015103790A (ja) * | 2013-11-28 | 2015-06-04 | 株式会社東海理化電機製作所 | リードフレーム構造及びその製造方法 |
-
2016
- 2016-03-01 JP JP2016039094A patent/JP6658104B2/ja active Active
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05144982A (ja) * | 1991-11-19 | 1993-06-11 | Nippon Precision Circuits Kk | 集積回路装置 |
JPH05152365A (ja) * | 1991-11-26 | 1993-06-18 | Hitachi Ltd | 樹脂封止型半導体装置及びその製造方法 |
JPH09213826A (ja) * | 1996-02-01 | 1997-08-15 | Nec Corp | パッケージ |
JPH11150209A (ja) * | 1997-11-19 | 1999-06-02 | Nissan Motor Co Ltd | 半導体素子の実装方法 |
JP2000286367A (ja) * | 1999-03-30 | 2000-10-13 | Rohm Co Ltd | 半導体装置 |
JP2011155286A (ja) * | 2011-03-22 | 2011-08-11 | Rohm Co Ltd | 半導体装置 |
JP2015079789A (ja) * | 2013-10-15 | 2015-04-23 | 株式会社デンソー | 半導体装置 |
JP2015103790A (ja) * | 2013-11-28 | 2015-06-04 | 株式会社東海理化電機製作所 | リードフレーム構造及びその製造方法 |
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JP6658104B2 (ja) | 2020-03-04 |
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