JP2018081959A - 半導体モジュール - Google Patents
半導体モジュール Download PDFInfo
- Publication number
- JP2018081959A JP2018081959A JP2016221608A JP2016221608A JP2018081959A JP 2018081959 A JP2018081959 A JP 2018081959A JP 2016221608 A JP2016221608 A JP 2016221608A JP 2016221608 A JP2016221608 A JP 2016221608A JP 2018081959 A JP2018081959 A JP 2018081959A
- Authority
- JP
- Japan
- Prior art keywords
- resin
- semiconductor module
- hole
- circuit board
- press
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
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- 239000004065 semiconductor Substances 0.000 title claims abstract description 126
- 229920005989 resin Polymers 0.000 claims abstract description 200
- 239000011347 resin Substances 0.000 claims abstract description 200
- 239000004020 conductor Substances 0.000 claims abstract description 36
- 238000000465 moulding Methods 0.000 claims description 13
- 239000011888 foil Substances 0.000 abstract description 11
- 230000005489 elastic deformation Effects 0.000 description 14
- 239000000758 substrate Substances 0.000 description 11
- 238000004382 potting Methods 0.000 description 10
- 239000002184 metal Substances 0.000 description 5
- 229910052751 metal Inorganic materials 0.000 description 5
- 239000000853 adhesive Substances 0.000 description 4
- 230000001070 adhesive effect Effects 0.000 description 4
- 238000002485 combustion reaction Methods 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- 230000009466 transformation Effects 0.000 description 4
- 238000002347 injection Methods 0.000 description 3
- 239000007924 injection Substances 0.000 description 3
- 238000003825 pressing Methods 0.000 description 3
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 2
- 239000000919 ceramic Substances 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000003822 epoxy resin Substances 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 229920000647 polyepoxide Polymers 0.000 description 2
- 229920005992 thermoplastic resin Polymers 0.000 description 2
- 229920001187 thermosetting polymer Polymers 0.000 description 2
- 239000004925 Acrylic resin Substances 0.000 description 1
- 229920000178 Acrylic resin Polymers 0.000 description 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 1
- 230000001133 acceleration Effects 0.000 description 1
- 230000032683 aging Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 239000000945 filler Substances 0.000 description 1
- 239000010419 fine particle Substances 0.000 description 1
- 239000000446 fuel Substances 0.000 description 1
- 239000003365 glass fiber Substances 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 238000005304 joining Methods 0.000 description 1
- 239000011133 lead Substances 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 239000010445 mica Substances 0.000 description 1
- 229910052618 mica group Inorganic materials 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 230000035515 penetration Effects 0.000 description 1
- 239000005011 phenolic resin Substances 0.000 description 1
- 229920000515 polycarbonate Polymers 0.000 description 1
- 239000004417 polycarbonate Substances 0.000 description 1
- -1 polyethylene terephthalate Polymers 0.000 description 1
- 229920000139 polyethylene terephthalate Polymers 0.000 description 1
- 239000005020 polyethylene terephthalate Substances 0.000 description 1
- 229920001721 polyimide Polymers 0.000 description 1
- 239000009719 polyimide resin Substances 0.000 description 1
- 229920005749 polyurethane resin Polymers 0.000 description 1
- 238000011084 recovery Methods 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
- 239000011701 zinc Substances 0.000 description 1
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/03—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
- H01L25/10—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices having separate containers
- H01L25/105—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices having separate containers the devices being of a type provided for in group H01L27/00
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
- H01R13/04—Pins or blades for co-operation with sockets
- H01R13/05—Resilient pins or blades
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01F—MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUID LEVEL; METERING BY VOLUME
- G01F1/00—Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow
- G01F1/05—Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow by using mechanical effects
- G01F1/34—Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow by using mechanical effects by measuring pressure or differential pressure
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
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- H01L23/00—Details of semiconductor or other solid state devices
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- H—ELECTRICITY
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- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/03—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
- H01L25/04—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
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- H—ELECTRICITY
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- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/18—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof the devices being of types provided for in two or more different subgroups of the same main group of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
- H01R12/50—Fixed connections
- H01R12/51—Fixed connections for rigid printed circuits or like structures
- H01R12/55—Fixed connections for rigid printed circuits or like structures characterised by the terminals
- H01R12/57—Fixed connections for rigid printed circuits or like structures characterised by the terminals surface mounting terminals
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
- H01R12/50—Fixed connections
- H01R12/51—Fixed connections for rigid printed circuits or like structures
- H01R12/55—Fixed connections for rigid printed circuits or like structures characterised by the terminals
- H01R12/58—Fixed connections for rigid printed circuits or like structures characterised by the terminals terminals for insertion into holes
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- H—ELECTRICITY
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- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
- H01R12/50—Fixed connections
- H01R12/51—Fixed connections for rigid printed circuits or like structures
- H01R12/55—Fixed connections for rigid printed circuits or like structures characterised by the terminals
- H01R12/58—Fixed connections for rigid printed circuits or like structures characterised by the terminals terminals for insertion into holes
- H01R12/585—Terminals having a press fit or a compliant portion and a shank passing through a hole in the printed circuit board
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- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02G—INSTALLATION OF ELECTRIC CABLES OR LINES, OR OF COMBINED OPTICAL AND ELECTRIC CABLES OR LINES
- H02G3/00—Installations of electric cables or lines or protective tubing therefor in or on buildings, equivalent structures or vehicles
- H02G3/02—Details
- H02G3/08—Distribution boxes; Connection or junction boxes
- H02G3/16—Distribution boxes; Connection or junction boxes structurally associated with support for line-connecting terminals within the box
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- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/306—Lead-in-hole components, e.g. affixing or retention before soldering, spacing means
- H05K3/308—Adaptations of leads
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01F—MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUID LEVEL; METERING BY VOLUME
- G01F1/00—Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow
- G01F1/68—Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow by using thermal effects
- G01F1/684—Structural arrangements; Mounting of elements, e.g. in relation to fluid flow
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01F—MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUID LEVEL; METERING BY VOLUME
- G01F1/00—Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow
- G01F1/68—Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow by using thermal effects
- G01F1/684—Structural arrangements; Mounting of elements, e.g. in relation to fluid flow
- G01F1/6845—Micromachined devices
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- H—ELECTRICITY
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- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L2224/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
- H01L2224/29001—Core members of the layer connector
- H01L2224/29099—Material
- H01L2224/2919—Material with a principal constituent of the material being a polymer, e.g. polyester, phenolic based polymer, epoxy
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- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
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- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32225—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
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- H01L2224/42—Wire connectors; Manufacturing methods related thereto
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- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/45099—Material
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- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
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- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48101—Connecting bonding areas at the same height, e.g. horizontal bond
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- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48105—Connecting bonding areas at different heights
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- H—ELECTRICITY
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- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48225—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
- H01L2224/48227—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
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- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
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- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
- H01L2224/491—Disposition
- H01L2224/4912—Layout
- H01L2224/49171—Fan-out arrangements
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- H01L2224/732—Location after the connecting process
- H01L2224/73251—Location after the connecting process on different surfaces
- H01L2224/73265—Layer and wire connectors
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- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
- H01L23/49811—Additional leads joined to the metallisation on the insulating substrate, e.g. pins, bumps, wires, flat leads
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Abstract
【解決手段】半導体モジュールは、第1半導体チップ3と第2半導体チップ4が実装され、かつ内部に導体箔12が形成された第1貫通孔11を備えた回路基板1と、回路基板1の第1貫通孔11内の導体箔12と電気的に接続されたプレスフィット端子13と、回路基板1の表面1a側および裏面1b側に配置された第2樹脂23と、を含む。さらに、プレスフィット端子13は、第1貫通孔11内に圧入されて第1貫通孔11内の導体箔12と電気的に接続する圧接部を備えており、回路基板1の表面1a側の第2樹脂23と、裏面1b側の第2樹脂23と、が第1貫通孔11内に充填された第2樹脂25を介して一体に形成されている。
【選択図】図13
Description
自動車などの内燃機関にはセンサモジュールなどの半導体モジュールや、電子制御装置などの電子回路を含む半導体モジュールが搭載されている。これらの半導体モジュールには半導体部品が搭載された回路基板が用いられている。また、上記回路基板はハウジング内部に収められており、外部との信号入出力には導体端子が用いられている。そして、上記導体端子として、プレスフィット端子(プレスフィットピンとも言う)が知られている。
本実施の形態2では、実施の形態1の半導体モジュール(吸入空気量センサ、センサモジュール)において、プレスフィット端子13の接続領域を、ハウジングの形成時に同時に覆った場合について説明する。
図16は本発明の実施の形態3の回路モジュールの実装構造を示す平面図、図17は本発明の実施の形態3のプレスフィット端子の圧入時の状態を図16のB−B線の位置で切断して示すプレスフィット端子接続前の断面図、図18は本発明の実施の形態3のプレスフィット端子の圧入時の状態を図16のB−B線の位置で切断して示すプレスフィット端子接続後の断面図である。また、図19は本発明の実施の形態3の半導体モジュールにおいて図7のB−B線で切断した構造に相当する断面図、図20は本発明の実施の形態3の半導体モジュールにおいて図7のC−C線で切断した構造に相当する断面図、図21は本発明の実施の形態3の回路モジュールの他の実装構造を示す平面図である。
図22は本発明の実施の形態4の回路モジュールの実装構造を示す平面図、図23は図22に示すA―A線で切断した構造に相当する電子制御装置(半導体モジュール)の断面図、図24は図23に示す電子制御装置を実装したユニットが搭載された自動車の構造を示す斜視図である。
1a 表面(第1面)
1b 裏面(第2面)
3 第1半導体チップ(半導体部品)
4 第2半導体チップ(半導体部品)
10 ポッティング部(他の樹脂)
11 第1貫通孔
12 導体箔(導体部)
13 プレスフィット端子(接続用導体部材)
14 弾性変形部(圧接部)
20 第1樹脂
23 第2樹脂(樹脂部)
25 第2樹脂
26 第1樹脂
27 第2貫通孔
28 第2樹脂
40 モールド金型
50 自動車
Claims (14)
- 半導体部品と、
前記半導体部品が実装された第1面と、前記第1面と反対側の第2面と、を有し、かつ内部に導体部が形成された第1貫通孔を備えた回路基板と、
前記回路基板の前記第1貫通孔内に圧入された接続用導体部材と、
前記回路基板の前記第1面側と前記第2面側とに配置された樹脂部と、
を含み、
前記接続用導体部材は、前記第1貫通孔内の前記導体部と電気的に接続する圧接部を備え、
前記回路基板の前記第1面側の前記樹脂部と、前記第2面側の前記樹脂部と、が前記第1貫通孔内に充填された樹脂を介して一体に形成されている、半導体モジュール。 - 請求項1に記載の半導体モジュールにおいて、
前記回路基板には、前記第1貫通孔とは異なる第2貫通孔が前記第1貫通孔の周囲に複数形成され、
前記回路基板の前記第1面側の前記樹脂部と、前記第2面側の前記樹脂部と、が前記複数の第2貫通孔のそれぞれの内部に充填された樹脂を介して一体に形成されている、半導体モジュール。 - 請求項2に記載の半導体モジュールにおいて、
前記回路基板に前記第1貫通孔が複数形成され、
前記複数の第1貫通孔のそれぞれに前記接続用導体部材が圧入され、
隣り合う2つの前記第1貫通孔の間に前記複数の第2貫通孔のうちの何れかが形成されている、半導体モジュール。 - 請求項3に記載の半導体モジュールにおいて、
前記複数の第1貫通孔と前記複数の第2貫通孔のうちの何れかとが、平面視で直線上に並んで配置されている、半導体モジュール。 - 請求項3に記載の半導体モジュールにおいて、
前記複数の第2貫通孔のうちの何れかは、平面視の孔の形状において、前記複数の第2貫通孔の配列方向の長さより、前記配列方向に交差する方向の長さが長い、半導体モジュール。 - 請求項1に記載の半導体モジュールにおいて、
前記第1貫通孔内に充填された前記樹脂は、前記回路基板の前記第1面側の前記樹脂部と前記第2面側の前記樹脂部とを結ぶ直線上に配置されている、半導体モジュール。 - 請求項1に記載の半導体モジュールにおいて、
前記回路基板の前記第1面側と前記第2面側とに、第1樹脂からなり、かつ樹脂モールディングによって形成されたハウジングを備え、
前記第1貫通孔内に前記第1樹脂が充填され、
前記回路基板の前記第1面側の前記第1樹脂と、前記第2面側の前記第1樹脂と、が前記第1貫通孔内に充填された前記第1樹脂を介して一体に形成されている、半導体モジュール。 - 請求項7に記載の半導体モジュールにおいて、
前記半導体部品は、前記第1樹脂とは異なる他の樹脂で覆われている、半導体モジュール。 - 請求項1に記載の半導体モジュールにおいて、
前記回路基板の前記第1面側と前記第2面側とに、第1樹脂からなり、かつ樹脂モールディングによって形成されたハウジングを備え、
前記回路基板の前記第1面側の前記ハウジングの内側の領域に形成された前記樹脂部と、前記第2面側の前記ハウジングの内側の領域に形成された前記樹脂部と、が前記第1樹脂とは異なり、かつ前記第1貫通孔内に充填された第2樹脂を介して一体に形成されている、半導体モジュール。 - 請求項9に記載の半導体モジュールにおいて、
前記第1樹脂の硬度は、前記第2樹脂の硬度より大きい、半導体モジュール。 - 請求項1に記載の半導体モジュールにおいて、
前記接続用導体部材は、前記圧接部で弾性構造を備えており、
前記弾性構造により、前記第1貫通孔の内壁を押圧して前記内壁に形成された前記導体部と接触している、半導体モジュール。 - 請求項1に記載の半導体モジュールにおいて、
前記半導体モジュールは、物理量を検出するセンサである、半導体モジュール。 - 請求項12に記載の半導体モジュールにおいて、
前記半導体モジュールは、流量センサである、半導体モジュール。 - 請求項1に記載の半導体モジュールにおいて、
前記半導体モジュールは、自動車に搭載された電子制御装置である、半導体モジュール。
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Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7294007B1 (en) * | 2006-09-20 | 2007-11-13 | Delphi Technologies, Inc. | Electronics enclosure and method of fabricating an electronics enclosure |
JP2009289447A (ja) * | 2008-05-27 | 2009-12-10 | Hitachi Ltd | 配線基板及びこれを備えた電子装置 |
JP2010067773A (ja) * | 2008-09-10 | 2010-03-25 | Hitachi Ltd | 電気電子制御装置及びその製造方法 |
WO2016017299A1 (ja) * | 2014-07-30 | 2016-02-04 | 日立オートモティブシステムズ株式会社 | 回路基板の実装構造、それを用いたセンサ |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5117282A (ja) | 1974-08-02 | 1976-02-12 | Mitsubishi Heavy Ind Ltd | Taiyakaryupuresusochi |
US5117282A (en) * | 1990-10-29 | 1992-05-26 | Harris Corporation | Stacked configuration for integrated circuit devices |
JP3884354B2 (ja) | 2002-09-13 | 2007-02-21 | 株式会社日立製作所 | コネクタと電子部品の一体モールド構造を有する電気・電子モジュール |
JP3780243B2 (ja) * | 2002-09-17 | 2006-05-31 | 株式会社日立製作所 | 流量検出装置および電子装置 |
JP2009206195A (ja) | 2008-02-26 | 2009-09-10 | Hitachi Ltd | 配線基板 |
KR101449271B1 (ko) | 2013-04-19 | 2014-10-08 | 현대오트론 주식회사 | 오버몰딩을 이용한 차량의 전자 제어 장치 및 그 제조 방법 |
JP6251565B2 (ja) | 2013-12-26 | 2017-12-20 | 矢崎総業株式会社 | 電子回路ユニット及びその製造方法 |
JP6221932B2 (ja) * | 2014-05-16 | 2017-11-01 | 東京エレクトロン株式会社 | 成膜装置 |
US10217684B2 (en) * | 2015-09-30 | 2019-02-26 | Hitachi Automotive Systems, Ltd. | Resin molding and sensor device |
JP6866121B2 (ja) * | 2016-11-14 | 2021-04-28 | 日立Astemo株式会社 | 半導体モジュール |
JP2019052339A (ja) * | 2017-09-13 | 2019-04-04 | 東京エレクトロン株式会社 | 排気管のクリーニング方法 |
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Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7294007B1 (en) * | 2006-09-20 | 2007-11-13 | Delphi Technologies, Inc. | Electronics enclosure and method of fabricating an electronics enclosure |
JP2009289447A (ja) * | 2008-05-27 | 2009-12-10 | Hitachi Ltd | 配線基板及びこれを備えた電子装置 |
JP2010067773A (ja) * | 2008-09-10 | 2010-03-25 | Hitachi Ltd | 電気電子制御装置及びその製造方法 |
WO2016017299A1 (ja) * | 2014-07-30 | 2016-02-04 | 日立オートモティブシステムズ株式会社 | 回路基板の実装構造、それを用いたセンサ |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP7501145B2 (ja) | 2020-06-23 | 2024-06-18 | 富士電機株式会社 | 半導体モジュール及びその製造方法 |
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