JP2016518468A - 多層コーティングされた量子ドットビーズ - Google Patents
多層コーティングされた量子ドットビーズ Download PDFInfo
- Publication number
- JP2016518468A JP2016518468A JP2015562413A JP2015562413A JP2016518468A JP 2016518468 A JP2016518468 A JP 2016518468A JP 2015562413 A JP2015562413 A JP 2015562413A JP 2015562413 A JP2015562413 A JP 2015562413A JP 2016518468 A JP2016518468 A JP 2016518468A
- Authority
- JP
- Japan
- Prior art keywords
- coating
- beads
- powder
- pulse
- ald
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000011324 bead Substances 0.000 title claims abstract description 250
- 239000002096 quantum dot Substances 0.000 title claims abstract description 146
- 238000000576 coating method Methods 0.000 claims abstract description 220
- 239000011248 coating agent Substances 0.000 claims abstract description 194
- 239000000463 material Substances 0.000 claims abstract description 163
- 238000000034 method Methods 0.000 claims abstract description 110
- 239000002105 nanoparticle Substances 0.000 claims abstract description 86
- 239000011159 matrix material Substances 0.000 claims abstract description 59
- 239000011147 inorganic material Substances 0.000 claims abstract description 8
- 229910010272 inorganic material Inorganic materials 0.000 claims abstract description 7
- 238000000231 atomic layer deposition Methods 0.000 claims description 131
- 239000002243 precursor Substances 0.000 claims description 109
- 239000011164 primary particle Substances 0.000 claims description 99
- 239000007789 gas Substances 0.000 claims description 73
- 229920000642 polymer Polymers 0.000 claims description 69
- 230000008569 process Effects 0.000 claims description 41
- 238000006243 chemical reaction Methods 0.000 claims description 36
- 239000000843 powder Substances 0.000 claims description 36
- 239000011261 inert gas Substances 0.000 claims description 32
- 239000000203 mixture Substances 0.000 claims description 32
- NIXOWILDQLNWCW-UHFFFAOYSA-M Acrylate Chemical compound [O-]C(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-M 0.000 claims description 19
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 15
- 229910044991 metal oxide Inorganic materials 0.000 claims description 14
- 150000004706 metal oxides Chemical class 0.000 claims description 14
- -1 monolith Substances 0.000 claims description 12
- 238000003756 stirring Methods 0.000 claims description 12
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 claims description 10
- 239000011521 glass Substances 0.000 claims description 10
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 claims description 9
- 239000000377 silicon dioxide Substances 0.000 claims description 6
- 229920001296 polysiloxane Polymers 0.000 claims description 5
- 229920005989 resin Polymers 0.000 claims description 4
- 239000011347 resin Substances 0.000 claims description 4
- 239000004593 Epoxy Substances 0.000 claims description 3
- 229910052793 cadmium Inorganic materials 0.000 claims description 2
- BDOSMKKIYDKNTQ-UHFFFAOYSA-N cadmium atom Chemical compound [Cd] BDOSMKKIYDKNTQ-UHFFFAOYSA-N 0.000 claims description 2
- 239000002345 surface coating layer Substances 0.000 claims 3
- 229910052738 indium Inorganic materials 0.000 claims 1
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 claims 1
- 229910052698 phosphorus Inorganic materials 0.000 claims 1
- 239000011574 phosphorus Substances 0.000 claims 1
- 239000012495 reaction gas Substances 0.000 claims 1
- 229910052814 silicon oxide Inorganic materials 0.000 claims 1
- 239000002245 particle Substances 0.000 abstract description 69
- 239000002131 composite material Substances 0.000 abstract description 9
- 239000002861 polymer material Substances 0.000 abstract description 7
- 239000010410 layer Substances 0.000 description 121
- 238000010926 purge Methods 0.000 description 57
- 230000004888 barrier function Effects 0.000 description 49
- 239000004065 semiconductor Substances 0.000 description 41
- JLTRXTDYQLMHGR-UHFFFAOYSA-N trimethylaluminium Chemical compound C[Al](C)C JLTRXTDYQLMHGR-UHFFFAOYSA-N 0.000 description 41
- 238000000151 deposition Methods 0.000 description 33
- 125000006850 spacer group Chemical group 0.000 description 32
- LYCAIKOWRPUZTN-UHFFFAOYSA-N Ethylene glycol Chemical compound OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 description 30
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 28
- 238000013019 agitation Methods 0.000 description 27
- 239000011162 core material Substances 0.000 description 25
- 150000002500 ions Chemical class 0.000 description 25
- 239000008393 encapsulating agent Substances 0.000 description 23
- 230000008021 deposition Effects 0.000 description 22
- 241000894007 species Species 0.000 description 20
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical class O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 19
- 238000005755 formation reaction Methods 0.000 description 18
- 229910052751 metal Inorganic materials 0.000 description 17
- 239000002184 metal Substances 0.000 description 17
- 238000012545 processing Methods 0.000 description 17
- 230000015572 biosynthetic process Effects 0.000 description 16
- 238000005424 photoluminescence Methods 0.000 description 16
- 239000002987 primer (paints) Substances 0.000 description 16
- 239000000758 substrate Substances 0.000 description 15
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 14
- 230000007547 defect Effects 0.000 description 14
- 238000004519 manufacturing process Methods 0.000 description 14
- 239000011257 shell material Substances 0.000 description 14
- 229910052760 oxygen Inorganic materials 0.000 description 13
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 12
- 239000001301 oxygen Substances 0.000 description 12
- 239000007787 solid Substances 0.000 description 12
- 239000002904 solvent Substances 0.000 description 12
- 229910052782 aluminium Inorganic materials 0.000 description 11
- 230000008901 benefit Effects 0.000 description 11
- 230000003287 optical effect Effects 0.000 description 11
- 239000011148 porous material Substances 0.000 description 11
- 239000000178 monomer Substances 0.000 description 10
- 229920000620 organic polymer Polymers 0.000 description 10
- 230000002829 reductive effect Effects 0.000 description 10
- 229910052984 zinc sulfide Inorganic materials 0.000 description 10
- 239000000956 alloy Substances 0.000 description 9
- 229910045601 alloy Inorganic materials 0.000 description 9
- 239000011325 microbead Substances 0.000 description 9
- 230000000737 periodic effect Effects 0.000 description 9
- 230000001681 protective effect Effects 0.000 description 9
- 238000001878 scanning electron micrograph Methods 0.000 description 9
- 239000000126 substance Substances 0.000 description 9
- 125000004429 atom Chemical group 0.000 description 8
- 239000006227 byproduct Substances 0.000 description 8
- 230000015556 catabolic process Effects 0.000 description 8
- 150000001875 compounds Chemical class 0.000 description 8
- 238000005336 cracking Methods 0.000 description 8
- 238000006731 degradation reaction Methods 0.000 description 8
- 238000005243 fluidization Methods 0.000 description 8
- 239000003446 ligand Substances 0.000 description 8
- 230000000670 limiting effect Effects 0.000 description 8
- 239000011163 secondary particle Substances 0.000 description 8
- 239000002356 single layer Substances 0.000 description 8
- 239000000243 solution Substances 0.000 description 8
- 238000013459 approach Methods 0.000 description 7
- 239000000499 gel Substances 0.000 description 7
- 230000002776 aggregation Effects 0.000 description 6
- UHYPYGJEEGLRJD-UHFFFAOYSA-N cadmium(2+);selenium(2-) Chemical compound [Se-2].[Cd+2] UHYPYGJEEGLRJD-UHFFFAOYSA-N 0.000 description 6
- 239000012159 carrier gas Substances 0.000 description 6
- 239000003795 chemical substances by application Substances 0.000 description 6
- 239000011247 coating layer Substances 0.000 description 6
- 230000000694 effects Effects 0.000 description 6
- 238000005516 engineering process Methods 0.000 description 6
- 238000010348 incorporation Methods 0.000 description 6
- 230000003993 interaction Effects 0.000 description 6
- 238000006862 quantum yield reaction Methods 0.000 description 6
- 150000003254 radicals Chemical class 0.000 description 6
- 238000004574 scanning tunneling microscopy Methods 0.000 description 6
- 241000532412 Vitex Species 0.000 description 5
- 235000009347 chasteberry Nutrition 0.000 description 5
- 238000005538 encapsulation Methods 0.000 description 5
- 230000001976 improved effect Effects 0.000 description 5
- 230000001965 increasing effect Effects 0.000 description 5
- 229910021645 metal ion Inorganic materials 0.000 description 5
- 238000002156 mixing Methods 0.000 description 5
- 238000006116 polymerization reaction Methods 0.000 description 5
- 238000002360 preparation method Methods 0.000 description 5
- 239000000376 reactant Substances 0.000 description 5
- 238000009877 rendering Methods 0.000 description 5
- 229910004298 SiO 2 Inorganic materials 0.000 description 4
- 238000004220 aggregation Methods 0.000 description 4
- 238000005229 chemical vapour deposition Methods 0.000 description 4
- 239000003431 cross linking reagent Substances 0.000 description 4
- 239000012530 fluid Substances 0.000 description 4
- 238000009472 formulation Methods 0.000 description 4
- 125000000524 functional group Chemical group 0.000 description 4
- 239000002159 nanocrystal Substances 0.000 description 4
- 230000005693 optoelectronics Effects 0.000 description 4
- 239000003960 organic solvent Substances 0.000 description 4
- DCEMCPAKSGRHCN-UHFFFAOYSA-N oxirane-2,3-dicarboxylic acid Chemical compound OC(=O)C1OC1C(O)=O DCEMCPAKSGRHCN-UHFFFAOYSA-N 0.000 description 4
- 238000005240 physical vapour deposition Methods 0.000 description 4
- 229920002689 polyvinyl acetate Polymers 0.000 description 4
- 239000011118 polyvinyl acetate Substances 0.000 description 4
- 230000006798 recombination Effects 0.000 description 4
- 238000005215 recombination Methods 0.000 description 4
- 238000007873 sieving Methods 0.000 description 4
- 238000010557 suspension polymerization reaction Methods 0.000 description 4
- PEDCQBHIVMGVHV-UHFFFAOYSA-N Glycerine Chemical compound OCC(O)CO PEDCQBHIVMGVHV-UHFFFAOYSA-N 0.000 description 3
- 239000002879 Lewis base Substances 0.000 description 3
- 229910010413 TiO 2 Inorganic materials 0.000 description 3
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 3
- OKKRPWIIYQTPQF-UHFFFAOYSA-N Trimethylolpropane trimethacrylate Chemical compound CC(=C)C(=O)OCC(CC)(COC(=O)C(C)=C)COC(=O)C(C)=C OKKRPWIIYQTPQF-UHFFFAOYSA-N 0.000 description 3
- 230000009102 absorption Effects 0.000 description 3
- 238000010521 absorption reaction Methods 0.000 description 3
- 150000001408 amides Chemical class 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 3
- 239000003086 colorant Substances 0.000 description 3
- 230000007423 decrease Effects 0.000 description 3
- 238000011161 development Methods 0.000 description 3
- 230000005484 gravity Effects 0.000 description 3
- 230000012010 growth Effects 0.000 description 3
- 239000011572 manganese Substances 0.000 description 3
- 238000007539 photo-oxidation reaction Methods 0.000 description 3
- 229920001983 poloxamer Polymers 0.000 description 3
- 229920001223 polyethylene glycol Polymers 0.000 description 3
- 229920000139 polyethylene terephthalate Polymers 0.000 description 3
- 239000005020 polyethylene terephthalate Substances 0.000 description 3
- 239000003361 porogen Substances 0.000 description 3
- 230000005855 radiation Effects 0.000 description 3
- 239000011541 reaction mixture Substances 0.000 description 3
- SBIBMFFZSBJNJF-UHFFFAOYSA-N selenium;zinc Chemical compound [Se]=[Zn] SBIBMFFZSBJNJF-UHFFFAOYSA-N 0.000 description 3
- 238000003860 storage Methods 0.000 description 3
- 150000003573 thiols Chemical class 0.000 description 3
- 238000012546 transfer Methods 0.000 description 3
- MYRTYDVEIRVNKP-UHFFFAOYSA-N 1,2-Divinylbenzene Chemical compound C=CC1=CC=CC=C1C=C MYRTYDVEIRVNKP-UHFFFAOYSA-N 0.000 description 2
- VVJKKWFAADXIJK-UHFFFAOYSA-N Allylamine Chemical compound NCC=C VVJKKWFAADXIJK-UHFFFAOYSA-N 0.000 description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- 229910004613 CdTe Inorganic materials 0.000 description 2
- 239000004971 Cross linker Substances 0.000 description 2
- 229920000219 Ethylene vinyl alcohol Polymers 0.000 description 2
- WHNWPMSKXPGLAX-UHFFFAOYSA-N N-Vinyl-2-pyrrolidone Chemical compound C=CN1CCCC1=O WHNWPMSKXPGLAX-UHFFFAOYSA-N 0.000 description 2
- 239000002202 Polyethylene glycol Substances 0.000 description 2
- JUJWROOIHBZHMG-UHFFFAOYSA-N Pyridine Chemical compound C1=CC=NC=C1 JUJWROOIHBZHMG-UHFFFAOYSA-N 0.000 description 2
- YTPLMLYBLZKORZ-UHFFFAOYSA-N Thiophene Chemical compound C=1C=CSC=1 YTPLMLYBLZKORZ-UHFFFAOYSA-N 0.000 description 2
- 239000002253 acid Substances 0.000 description 2
- 239000012190 activator Substances 0.000 description 2
- 238000005054 agglomeration Methods 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 125000002915 carbonyl group Chemical group [*:2]C([*:1])=O 0.000 description 2
- 239000003054 catalyst Substances 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- 230000001419 dependent effect Effects 0.000 description 2
- 238000009792 diffusion process Methods 0.000 description 2
- 238000009826 distribution Methods 0.000 description 2
- 150000002148 esters Chemical class 0.000 description 2
- 239000004715 ethylene vinyl alcohol Substances 0.000 description 2
- 238000001704 evaporation Methods 0.000 description 2
- 230000005284 excitation Effects 0.000 description 2
- 239000012634 fragment Substances 0.000 description 2
- 238000010528 free radical solution polymerization reaction Methods 0.000 description 2
- 229910021485 fumed silica Inorganic materials 0.000 description 2
- 125000005842 heteroatom Chemical group 0.000 description 2
- RZXDTJIXPSCHCI-UHFFFAOYSA-N hexa-1,5-diene-2,5-diol Chemical compound OC(=C)CCC(O)=C RZXDTJIXPSCHCI-UHFFFAOYSA-N 0.000 description 2
- 230000005660 hydrophilic surface Effects 0.000 description 2
- 150000003949 imides Chemical class 0.000 description 2
- 238000002347 injection Methods 0.000 description 2
- 239000007924 injection Substances 0.000 description 2
- 238000001755 magnetron sputter deposition Methods 0.000 description 2
- 150000002739 metals Chemical class 0.000 description 2
- 239000002052 molecular layer Substances 0.000 description 2
- 239000011234 nano-particulate material Substances 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- 230000036961 partial effect Effects 0.000 description 2
- 230000035699 permeability Effects 0.000 description 2
- 229920006112 polar polymer Polymers 0.000 description 2
- 229920000196 poly(lauryl methacrylate) Polymers 0.000 description 2
- 229920002647 polyamide Polymers 0.000 description 2
- 229920000647 polyepoxide Polymers 0.000 description 2
- 229920000570 polyether Polymers 0.000 description 2
- 229920002338 polyhydroxyethylmethacrylate Polymers 0.000 description 2
- 229920002451 polyvinyl alcohol Polymers 0.000 description 2
- 230000009467 reduction Effects 0.000 description 2
- 229920006395 saturated elastomer Polymers 0.000 description 2
- 230000003068 static effect Effects 0.000 description 2
- 150000003568 thioethers Chemical class 0.000 description 2
- RIOQSEWOXXDEQQ-UHFFFAOYSA-N triphenylphosphine Chemical compound C1=CC=CC=C1P(C=1C=CC=CC=1)C1=CC=CC=C1 RIOQSEWOXXDEQQ-UHFFFAOYSA-N 0.000 description 2
- 125000000391 vinyl group Chemical group [H]C([*])=C([H])[H] 0.000 description 2
- 229920002554 vinyl polymer Polymers 0.000 description 2
- YBNMDCCMCLUHBL-UHFFFAOYSA-N (2,5-dioxopyrrolidin-1-yl) 4-pyren-1-ylbutanoate Chemical compound C=1C=C(C2=C34)C=CC3=CC=CC4=CC=C2C=1CCCC(=O)ON1C(=O)CCC1=O YBNMDCCMCLUHBL-UHFFFAOYSA-N 0.000 description 1
- PFNQVRZLDWYSCW-UHFFFAOYSA-N (fluoren-9-ylideneamino) n-naphthalen-1-ylcarbamate Chemical compound C12=CC=CC=C2C2=CC=CC=C2C1=NOC(=O)NC1=CC=CC2=CC=CC=C12 PFNQVRZLDWYSCW-UHFFFAOYSA-N 0.000 description 1
- FJLUATLTXUNBOT-UHFFFAOYSA-N 1-Hexadecylamine Chemical compound CCCCCCCCCCCCCCCCN FJLUATLTXUNBOT-UHFFFAOYSA-N 0.000 description 1
- NYEZZYQZRQDLEH-UHFFFAOYSA-N 2-ethyl-4,5-dihydro-1,3-oxazole Chemical compound CCC1=NCCO1 NYEZZYQZRQDLEH-UHFFFAOYSA-N 0.000 description 1
- 229910017115 AlSb Inorganic materials 0.000 description 1
- 229910000980 Aluminium gallium arsenide Inorganic materials 0.000 description 1
- 239000004215 Carbon black (E152) Substances 0.000 description 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- XDTMQSROBMDMFD-UHFFFAOYSA-N Cyclohexane Chemical compound C1CCCCC1 XDTMQSROBMDMFD-UHFFFAOYSA-N 0.000 description 1
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 1
- 229910002601 GaN Inorganic materials 0.000 description 1
- 229910005540 GaP Inorganic materials 0.000 description 1
- 229910005542 GaSb Inorganic materials 0.000 description 1
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- 229910000673 Indium arsenide Inorganic materials 0.000 description 1
- GPXJNWSHGFTCBW-UHFFFAOYSA-N Indium phosphide Chemical compound [In]#P GPXJNWSHGFTCBW-UHFFFAOYSA-N 0.000 description 1
- PWHULOQIROXLJO-UHFFFAOYSA-N Manganese Chemical compound [Mn] PWHULOQIROXLJO-UHFFFAOYSA-N 0.000 description 1
- 229910017680 MgTe Inorganic materials 0.000 description 1
- BPQQTUXANYXVAA-UHFFFAOYSA-N Orthosilicate Chemical compound [O-][Si]([O-])([O-])[O-] BPQQTUXANYXVAA-UHFFFAOYSA-N 0.000 description 1
- MUBZPKHOEPUJKR-UHFFFAOYSA-N Oxalic acid Chemical compound OC(=O)C(O)=O MUBZPKHOEPUJKR-UHFFFAOYSA-N 0.000 description 1
- CBENFWSGALASAD-UHFFFAOYSA-N Ozone Chemical compound [O-][O+]=O CBENFWSGALASAD-UHFFFAOYSA-N 0.000 description 1
- 229920001609 Poly(3,4-ethylenedioxythiophene) Polymers 0.000 description 1
- 229910002367 SrTiO Inorganic materials 0.000 description 1
- 239000005083 Zinc sulfide Substances 0.000 description 1
- 229910007709 ZnTe Inorganic materials 0.000 description 1
- GEIAQOFPUVMAGM-UHFFFAOYSA-N ZrO Inorganic materials [Zr]=O GEIAQOFPUVMAGM-UHFFFAOYSA-N 0.000 description 1
- 150000001252 acrylic acid derivatives Chemical class 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 150000001298 alcohols Chemical class 0.000 description 1
- 150000001335 aliphatic alkanes Chemical class 0.000 description 1
- 150000001336 alkenes Chemical class 0.000 description 1
- 150000001345 alkine derivatives Chemical class 0.000 description 1
- 150000003973 alkyl amines Chemical class 0.000 description 1
- 150000001350 alkyl halides Chemical class 0.000 description 1
- 150000001361 allenes Chemical class 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 150000001412 amines Chemical class 0.000 description 1
- 150000001413 amino acids Chemical class 0.000 description 1
- 150000008064 anhydrides Chemical class 0.000 description 1
- 150000001540 azides Chemical class 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000012984 biological imaging Methods 0.000 description 1
- 239000012620 biological material Substances 0.000 description 1
- 230000033228 biological regulation Effects 0.000 description 1
- 230000005587 bubbling Effects 0.000 description 1
- 239000013590 bulk material Substances 0.000 description 1
- 239000002775 capsule Substances 0.000 description 1
- 150000001735 carboxylic acids Chemical class 0.000 description 1
- 239000000969 carrier Substances 0.000 description 1
- 238000006555 catalytic reaction Methods 0.000 description 1
- 150000004770 chalcogenides Chemical class 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 239000002800 charge carrier Substances 0.000 description 1
- 238000012993 chemical processing Methods 0.000 description 1
- 150000001805 chlorine compounds Chemical class 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000007771 core particle Substances 0.000 description 1
- 238000004132 cross linking Methods 0.000 description 1
- IBAHLNWTOIHLKE-UHFFFAOYSA-N cyano cyanate Chemical compound N#COC#N IBAHLNWTOIHLKE-UHFFFAOYSA-N 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000005401 electroluminescence Methods 0.000 description 1
- 230000005670 electromagnetic radiation Effects 0.000 description 1
- 239000012776 electronic material Substances 0.000 description 1
- 230000002708 enhancing effect Effects 0.000 description 1
- 125000003700 epoxy group Chemical group 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- VEWLDLAARDMXSB-UHFFFAOYSA-N ethenyl sulfate;hydron Chemical compound OS(=O)(=O)OC=C VEWLDLAARDMXSB-UHFFFAOYSA-N 0.000 description 1
- 150000002170 ethers Chemical class 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 238000011049 filling Methods 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 238000005187 foaming Methods 0.000 description 1
- 229910052949 galena Inorganic materials 0.000 description 1
- 230000009477 glass transition Effects 0.000 description 1
- 125000001475 halogen functional group Chemical group 0.000 description 1
- 229910001385 heavy metal Inorganic materials 0.000 description 1
- 229930195733 hydrocarbon Natural products 0.000 description 1
- 150000002430 hydrocarbons Chemical class 0.000 description 1
- 229920001477 hydrophilic polymer Polymers 0.000 description 1
- 230000002209 hydrophobic effect Effects 0.000 description 1
- 238000002513 implantation Methods 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 238000011065 in-situ storage Methods 0.000 description 1
- WPYVAWXEWQSOGY-UHFFFAOYSA-N indium antimonide Chemical compound [Sb]#[In] WPYVAWXEWQSOGY-UHFFFAOYSA-N 0.000 description 1
- RPQDHPTXJYYUPQ-UHFFFAOYSA-N indium arsenide Chemical compound [In]#[As] RPQDHPTXJYYUPQ-UHFFFAOYSA-N 0.000 description 1
- 230000001939 inductive effect Effects 0.000 description 1
- 239000012442 inert solvent Substances 0.000 description 1
- 230000000977 initiatory effect Effects 0.000 description 1
- 239000000976 ink Substances 0.000 description 1
- 229920000592 inorganic polymer Polymers 0.000 description 1
- 229910003480 inorganic solid Inorganic materials 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 238000010849 ion bombardment Methods 0.000 description 1
- 230000005596 ionic collisions Effects 0.000 description 1
- 238000002372 labelling Methods 0.000 description 1
- 229910052747 lanthanoid Inorganic materials 0.000 description 1
- 150000002602 lanthanoids Chemical class 0.000 description 1
- 150000007527 lewis bases Chemical class 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 230000033001 locomotion Effects 0.000 description 1
- 150000004668 long chain fatty acids Chemical class 0.000 description 1
- 238000004020 luminiscence type Methods 0.000 description 1
- 229910052748 manganese Inorganic materials 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 230000005012 migration Effects 0.000 description 1
- 238000013508 migration Methods 0.000 description 1
- 229910003455 mixed metal oxide Inorganic materials 0.000 description 1
- 150000004767 nitrides Chemical class 0.000 description 1
- 238000010899 nucleation Methods 0.000 description 1
- IOQPZZOEVPZRBK-UHFFFAOYSA-N octan-1-amine Chemical compound CCCCCCCCN IOQPZZOEVPZRBK-UHFFFAOYSA-N 0.000 description 1
- 125000000962 organic group Chemical group 0.000 description 1
- 239000012044 organic layer Substances 0.000 description 1
- 239000011368 organic material Substances 0.000 description 1
- 239000007800 oxidant agent Substances 0.000 description 1
- 230000001590 oxidative effect Effects 0.000 description 1
- AHKZTVQIVOEVFO-UHFFFAOYSA-N oxide(2-) Chemical compound [O-2] AHKZTVQIVOEVFO-UHFFFAOYSA-N 0.000 description 1
- MPQXHAGKBWFSNV-UHFFFAOYSA-N oxidophosphanium Chemical class [PH3]=O MPQXHAGKBWFSNV-UHFFFAOYSA-N 0.000 description 1
- 150000002924 oxiranes Chemical class 0.000 description 1
- 238000012856 packing Methods 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- 238000002161 passivation Methods 0.000 description 1
- 230000035515 penetration Effects 0.000 description 1
- 150000003003 phosphines Chemical class 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
- 229920003223 poly(pyromellitimide-1,4-diphenyl ether) Polymers 0.000 description 1
- 229920006001 poly(vinyl alcohol-co-ethylene) Polymers 0.000 description 1
- 229920002432 poly(vinyl methyl ether) polymer Polymers 0.000 description 1
- 229920002401 polyacrylamide Polymers 0.000 description 1
- 229920000058 polyacrylate Polymers 0.000 description 1
- 229920000728 polyester Polymers 0.000 description 1
- 229920002959 polymer blend Polymers 0.000 description 1
- 239000003505 polymerization initiator Substances 0.000 description 1
- 229920000123 polythiophene Polymers 0.000 description 1
- 239000011253 protective coating Substances 0.000 description 1
- 238000005086 pumping Methods 0.000 description 1
- UMJSCPRVCHMLSP-UHFFFAOYSA-N pyridine Natural products COC1=CC=CN=C1 UMJSCPRVCHMLSP-UHFFFAOYSA-N 0.000 description 1
- 229910052761 rare earth metal Inorganic materials 0.000 description 1
- 150000002910 rare earth metals Chemical class 0.000 description 1
- 230000009103 reabsorption Effects 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 230000002441 reversible effect Effects 0.000 description 1
- 229930195734 saturated hydrocarbon Natural products 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 239000010420 shell particle Substances 0.000 description 1
- 229920002050 silicone resin Polymers 0.000 description 1
- 230000005476 size effect Effects 0.000 description 1
- 150000003384 small molecules Chemical class 0.000 description 1
- 239000012453 solvate Substances 0.000 description 1
- 238000001179 sorption measurement Methods 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 229910052950 sphalerite Inorganic materials 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 230000006641 stabilisation Effects 0.000 description 1
- 238000011105 stabilization Methods 0.000 description 1
- 230000003335 steric effect Effects 0.000 description 1
- 230000004936 stimulating effect Effects 0.000 description 1
- 229910052717 sulfur Inorganic materials 0.000 description 1
- 238000004347 surface barrier Methods 0.000 description 1
- 239000002344 surface layer Substances 0.000 description 1
- ZGNPLWZYVAFUNZ-UHFFFAOYSA-N tert-butylphosphane Chemical compound CC(C)(C)P ZGNPLWZYVAFUNZ-UHFFFAOYSA-N 0.000 description 1
- 229930192474 thiophene Natural products 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
- RMZAYIKUYWXQPB-UHFFFAOYSA-N trioctylphosphane Chemical compound CCCCCCCCP(CCCCCCCC)CCCCCCCC RMZAYIKUYWXQPB-UHFFFAOYSA-N 0.000 description 1
- ZMBHCYHQLYEYDV-UHFFFAOYSA-N trioctylphosphine oxide Chemical compound CCCCCCCCP(=O)(CCCCCCCC)CCCCCCCC ZMBHCYHQLYEYDV-UHFFFAOYSA-N 0.000 description 1
- FIQMHBFVRAXMOP-UHFFFAOYSA-N triphenylphosphane oxide Chemical compound C=1C=CC=CC=1P(C=1C=CC=CC=1)(=O)C1=CC=CC=C1 FIQMHBFVRAXMOP-UHFFFAOYSA-N 0.000 description 1
- 229930195735 unsaturated hydrocarbon Natural products 0.000 description 1
- 238000001771 vacuum deposition Methods 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
- 239000012808 vapor phase Substances 0.000 description 1
- 238000005303 weighing Methods 0.000 description 1
- 239000011701 zinc Substances 0.000 description 1
- DRDVZXDWVBGGMH-UHFFFAOYSA-N zinc;sulfide Chemical compound [S-2].[Zn+2] DRDVZXDWVBGGMH-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K11/00—Luminescent, e.g. electroluminescent, chemiluminescent materials
- C09K11/02—Use of particular materials as binders, particle coatings or suspension media therefor
- C09K11/025—Use of particular materials as binders, particle coatings or suspension media therefor non-luminescent particle coatings or suspension media
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/50—Wavelength conversion elements
- H01L33/501—Wavelength conversion elements characterised by the materials, e.g. binder
- H01L33/502—Wavelength conversion materials
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K11/00—Luminescent, e.g. electroluminescent, chemiluminescent materials
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K11/00—Luminescent, e.g. electroluminescent, chemiluminescent materials
- C09K11/02—Use of particular materials as binders, particle coatings or suspension media therefor
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K11/00—Luminescent, e.g. electroluminescent, chemiluminescent materials
- C09K11/08—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K11/00—Luminescent, e.g. electroluminescent, chemiluminescent materials
- C09K11/08—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials
- C09K11/56—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials containing sulfur
- C09K11/562—Chalcogenides
- C09K11/565—Chalcogenides with zinc cadmium
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K11/00—Luminescent, e.g. electroluminescent, chemiluminescent materials
- C09K11/08—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials
- C09K11/70—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials containing phosphorus
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K11/00—Luminescent, e.g. electroluminescent, chemiluminescent materials
- C09K11/08—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials
- C09K11/70—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials containing phosphorus
- C09K11/701—Chalcogenides
- C09K11/703—Chalcogenides with zinc or cadmium
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/40—Oxides
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/40—Oxides
- C23C16/403—Oxides of aluminium, magnesium or beryllium
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/4417—Methods specially adapted for coating powder
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/442—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using fluidised bed process
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45523—Pulsed gas flow or change of composition over time
- C23C16/45525—Atomic layer deposition [ALD]
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45523—Pulsed gas flow or change of composition over time
- C23C16/45525—Atomic layer deposition [ALD]
- C23C16/45527—Atomic layer deposition [ALD] characterized by the ALD cycle, e.g. different flows or temperatures during half-reactions, unusual pulsing sequence, use of precursor mixtures or auxiliary reactants or activations
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45523—Pulsed gas flow or change of composition over time
- C23C16/45525—Atomic layer deposition [ALD]
- C23C16/45527—Atomic layer deposition [ALD] characterized by the ALD cycle, e.g. different flows or temperatures during half-reactions, unusual pulsing sequence, use of precursor mixtures or auxiliary reactants or activations
- C23C16/45531—Atomic layer deposition [ALD] characterized by the ALD cycle, e.g. different flows or temperatures during half-reactions, unusual pulsing sequence, use of precursor mixtures or auxiliary reactants or activations specially adapted for making ternary or higher compositions
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/0352—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions
- H01L31/035209—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions comprising a quantum structures
- H01L31/035218—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions comprising a quantum structures the quantum structure being quantum dots
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/52—Encapsulations
- H01L33/56—Materials, e.g. epoxy or silicone resin
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y30/00—Nanotechnology for materials or surface science, e.g. nanocomposites
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/12—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/12—Passive devices, e.g. 2 terminal devices
- H01L2924/1204—Optical Diode
- H01L2924/12044—OLED
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2933/00—Details relating to devices covered by the group H01L33/00 but not provided for in its subgroups
- H01L2933/0008—Processes
- H01L2933/0033—Processes relating to semiconductor body packages
- H01L2933/0041—Processes relating to semiconductor body packages relating to wavelength conversion elements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2933/00—Details relating to devices covered by the group H01L33/00 but not provided for in its subgroups
- H01L2933/0008—Processes
- H01L2933/0033—Processes relating to semiconductor body packages
- H01L2933/005—Processes relating to semiconductor body packages relating to encapsulations
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/0256—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by the material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/50—Wavelength conversion elements
- H01L33/501—Wavelength conversion elements characterised by the materials, e.g. binder
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/70—Nanostructure
- Y10S977/773—Nanoparticle, i.e. structure having three dimensions of 100 nm or less
- Y10S977/774—Exhibiting three-dimensional carrier confinement, e.g. quantum dots
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Organic Chemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Inorganic Chemistry (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Computer Hardware Design (AREA)
- Manufacturing & Machinery (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Luminescent Compositions (AREA)
- Led Device Packages (AREA)
- Optical Filters (AREA)
- Processes Of Treating Macromolecular Substances (AREA)
Abstract
Description
一次マトリックス材料は、好ましくは、光学的に透明な媒体、即ち光が通過し、そして光学的にほぼ透明であってよいが、そうである必要はない媒体である。一次マトリックス材料は、好ましくはビーズ又はマイクロビーズの形態であって、樹脂、ポリマー、モノリス、ガラス、ゾル−ゲル、エポキシ、シリコーン、(メタ)アクリレート等であってよい。
一次粒子表面コーティングは保護バリアを提供して、潜在的に有害な種、例えば酸素、水分及び/又はフリーラジカルが外部環境から一次マトリックス材料を通って半導体ナノ粒子に至る通過又は拡散を防止する。結果として、半導体ナノ粒子は、LEDベースの発光デバイスの製造等の用途においてナノ粒子を利用するのに典型的に必要とされる周囲環境及び種々の処理条件にあまり敏感でない。
任意のタイプの半導体ナノ粒子(即ちQD)が、本明細書で記載されているように用いられてよい。例えば、ナノ粒子は、周期表の任意の族、例えば、限定されないが、周期表の11族、12族、13族、14族、15族又は16族等から選択されるイオンを含有してよい。ナノ粒子は、d−ブロック金属イオンを組み込んでよい。ナノ粒子は、第1及び第2のイオンならびに/又は任意で第3のイオン及び/もしくは第4のイオンを含有してよく、第1のイオンは好ましくは周期表の11族、12族、13族又は14族から選択され、第2のイオンは好ましくは14族、15族又は16族から選択される。ナノ粒子は、12族及び16族のイオン(II−VI半導体材料)、13族及び15族のイオン(III−V半導体材料)、14族及び16族のイオン(IV−VI半導体材料)、及び/又は、12族、13族及び16族のイオン(I−III−VI半導体材料)を含有してよい。ナノ粒子は、CdO、CdS、CdSe、CdTe、ZnO、ZnS、ZnSe、ZnTe、InP、InAs、InSb、AlP、AlS、AlAs、AlSb、GaN、GaP、GaAs、GaSb、PbS、PbSe、Si、Ge、MgS、MgSe、MgTe、AgInS2、CuInS2、CuInSe2及びこれらの組合せからなる群から選択される1又は複数の半導体材料を含有してよい。さらに、ナノ粒子は、二元、三元、四元、又はより高い次数の多元コア、コア/シェル、又は、コア/マルチシェル、ドープ、又は傾斜したナノ粒子であってよい。幾つかの実施形態では、QDナノ粒子には、カドミウム及び/又は他の重金属が基本的に存在していない。
量子ドットをビーズ中に組み込む最初の工程を検討すると、第1の選択肢は、量子ドットを直接的にビーズ中に組み込むものである。第2の選択肢は、量子ドットをビーズに物理的捕捉により固定するものである。これらの方法を用いて、単一タイプの量子ドット(例えば、1色)だけを含有するビーズの集団を、単一タイプの量子ドットをビーズに組み込むことによって製造することができる。或いは、2つ以上のタイプの量子ドット(例えば、2以上の色)を含有するビーズを、2つ以上のタイプの量子ドット(例えば、材料及び/又は粒子サイズ)の混合物をビーズに組み込むことによって製造することができる。その後、そのような混合ビーズは、任意の適切な比率で組み合わされて、一次光源(例えばLED)によって放射された一次光による励起の後に、任意の所望の二次光の色を放射してよい。
上記のように、適切な一次マトリックス材料は、ゾル−ゲル又はガラス等の光学的に透明な媒体である。そのような一次マトリックス材料は、先に述べたような粒子形成プロセス中に量子ドットを一次粒子に組み込むのに用いられる方法と類似したやり方で形成されてよい。例えば、単一タイプの量子ドット(例えば、1色)が、ゾル−ゲル又はガラスを生産するために用いられる反応混合物に加えられてよい。或いは、2つ以上のタイプの量子ドット(例えば、2つ以上の色)が、ゾル−ゲル又はガラスを生産するために用いられる反応混合物に加えられてよい。これらの手順によって生産されるゾル−ゲル及びガラスは、任意の形状、形態構造又は三次元構造を有してよい。例えば、生じた一次粒子は、球形であっても、ディスク状であっても、棒状であっても、卵形であっても、立方体であっても、矩形であってよく、多くの他の起こり得る任意の構成であってよい。
ALDコーティングされたQD含有ビーズの場合、ビーズ表面は、選択された無機バリア及び/又はスペーサコーティング材料との適合性がないかもしれない。例えば、QD−ポリマービーズの表面へのAl2O3のALDによる適用は、処理条件に起因して、ビーズへのダメージが生じ、光学特性が悪化して、ビーズ表面への無機バリアコーティングの付着が不十分となる虞がある。アクリレートベースのビーズの場合、非常に極性のあるポリマーコーティング、例えばポリエチレングリコール(PEG)は、ビーズ表面にあまり付着しない。これらの問題を克服するために、ある実施形態では、QD−ビーズコーティングの堆積前に、一次粒子が第2のポリマー中にカプセル化されて、二次粒子が形成される。ここで、第2のポリマー材料の薄い層が、一次粒子の表面上に堆積してバッファ層として作用して、一次粒子と第1の無機又はポリマーコーティング材料との付着を向上させる一方で、コーティングプロセスで起こりうる悪影響から一次粒子を保護する。コーティングは、当業者に知られている任意の技術によって適用されてよく、一次粒子(ビーズ)を形成するのに以前に記載された任意の方法、例えば、溶液又は懸濁重合、又は、以降で多層コーティング材料を堆積させるのに用いられる方法、ALDが挙げられ得るが、これらに制限されない。非限定的な例が、出願人の同時係属の米国特許出願公開第2011/0068321号に詳述されている。バッファ層は、親水性表面(例えば、−OH末端基を有する)を提供し得、ポリマーであっても架橋剤であってもよく、適切な例として、制限されないが、ポリ(エーテル)、ポリ(チオエーテル)、ポリ(チオール)、ポリ(カルボニル)、ポリ(エステル)、ポリ(アミド)が挙げられる。非限定的な例として、トリメチロールプロパントリメタクリレート(TMPTMA)架橋剤バッファ層が、QD−ポリ(ラウリルメタクリレート)ビーズの表面に、ポリ(ビニルアセテート)(PVA)/水溶液中の懸濁重合を介して適用されてから、Al2O3コーティングがALDによって堆積して、QD−ビーズを保護し、ビーズ表面に対するアルミナの付着を向上させる。
表面コーティング材料の少なくとも1つを堆積させるプロセスがALDである。しかし、勿論、他の適切な技術が用いられてよい。ALDによる、例として金属酸化物表面コーティングを用いる表面コーティングの提供は、以下の4つの基本的な工程を特徴とする。
1)量子ドット含有一次粒子の表面を金属前駆体に曝す工程;
2)一次粒子を含有する反応チャンバをパージして、非反応金属前駆体及びガス状反応副産物を取り出す工程;
3)一次粒子の表面を酸化物前駆体に曝す工程;及び
4)反応チャンバをパージして、非反応酸化物前駆体及びガス状反応副産物を取り出す工程。
1)量子ドット含有一次粒子の表面を金属前駆体に曝す工程;
2)一次粒子を含有する反応チャンバをパージして、非反応金属前駆体及びあらゆるガス状反応副産物を取り出す工程;
3)一次粒子の表面を有機ポリマー前駆体(モノマー)に曝す工程;ならびに
4)反応チャンバをパージして、非反応モノマー及びあらゆるガス状反応副産物を取り出す工程。
量子ドットを含有するビーズへの表面コーティングの提供は、先に概説されたような多くの利点を有する一方、1つの重要な利点として、コーティングされた量子ドット−ビーズ(コーティングされたQD−ビーズ)が単に所望量のコーティングされたQD−ビーズ材料を計量して、これを所望量のLEDカプセル材料に加えることによって、市販のLEDカプセル材料中に組み込まれ得ることがある。コーティングされたQD−ビーズをLEDカプセル材料に組み込んでから、適切なLEDカプセル化材料を含む発光デバイスを形成する方法、並びにカラーインデクシング(color indexing)及びカラーレンダリング(colour rendering)の方法は、出願人の同時係属の米国特許出願公開第2011/0068322号に詳述されており、本明細書に記載されているコーティングされたQD−ビーズに適用可能である。
[金属酸化物がALDコーティングされた量子ドット含有ビーズの完全パルス条件下での調製]
赤色発光InP/ZnS/ZnOコア/マルチシェル量子ドット(PLmax=606nm、FWHM=58nm、PLQY=82%)を、ポリ(ラウリルメタクリレート)マイクロビーズ中に組み込み、PVA/H2O溶液中での懸濁重合を介して調製したトリメチロールプロパントリメタクリレートシェルでコーティングした。
1)0.8sのTMA導入;100seemのN2パージガスを、全ての前駆体ラインに通すが、例外的に2000seemのN2パルスを、TMAライン及び水前駆体ラインの双方に、ビーズの撹拌のために通す。
2)1sのN2パージ。
3)工程1及び工程2をさらに2回繰り返す。
4)0.8sのTMA導入;100seemのN2パージガスを、全ての前駆体ラインに通すが、例外的に2000seemのN2パルスを、TMAライン及び水前駆体ラインの双方に、ビーズの撹拌のために通す。
5)125sのN2パージ。
6)0.8sのH2O導入;100seemのN2パージガスを、全ての前駆体ラインに通すが、例外的に2000seemのN2パルスを、TMAライン及び水前駆体ラインの双方に、ビーズの撹拌のために通す。
7)1sのN2パージ。
8)工程6及び工程7をさらに2回繰り返す。
9)0.8sのH2O導入;100seemのN2パージガスを、全ての前駆体ラインに通すが、例外的に2000seemのN2パルスを、TMAライン及び水前駆体ラインの双方に、ビーズの撹拌のために通す。
10)150sのN2パージ。
窒素を充填したグローブボックスにて、Pt触媒の存在下で、QD含有アクリレートビーズを、市販のシリコーン樹脂(SCR1011、信越化学工業株式会社)と組み合わせた。入念に混合した後、溶液をLEDケースに移して、48時間周囲温度にて硬化させた。
[半パルスALDを用いてのAl2O3による量子ドット含有アクリレートビーズのコーティング]
QD含有アクリレートビーズを、50μmの細孔サイズの頂部フリット及び150μmの細孔サイズの底部フリットを有するALDリアクタに入れた。半パルス条件下でALDを実行し、TMAパルスの間、2,000seemのN2ブーストを加えた。N2をキャリアガスとして、そして反応体曝露間のパージとして用いた。
1)150seemのN2ラインフローを、H2Oライン及び1スペアラインに通し、そして50seemで、TMAライン及び1スペアラインに通す、0.2sのH2O導入。
2)0.5sのN2パージ。
3)工程1及び工程2をさらに8回繰り返す。
4)150seemのN2ラインフローを、H2O及び1スペアラインに通し、そして50seemで、TMAライン及び1スペアラインに通す、0.2sのH2O導入。
5)120sのN2パージ。
6)0.8sのTMA導入;50seemのN2パージガスを、TMAライン及び1スペアラインに通し、そして150seemを、H2Oライン及び1スペアラインに通す。2000seemのN2パルスを、TMAライン及び水前駆体ラインの双方を通して、ビーズの撹拌のために加えた。
7)1sのN2パージ。
8)工程6及び工程7をさらに2回繰り返す。
9)0.8sのTMA導入;50seemのN2パージガスを、TMAライン及び1スペアラインに通し、そして150seemを、H2Oライン及び1スペアラインに通す。2000seemのN2パルスを、TMAライン及びH2O前駆体ラインの双方を通して、ビーズの撹拌のために加えた。
10)164.7sのN2パージ。
[完全パルスALDを用いた酸化アルミニウムバリア層による量子ドット含有アクリレートビーズのコーティング]
QD含有アクリレートビーズを、50μmの細孔サイズの頂部フリット及び150μmの細孔サイズの底部フリットを有するALDリアクタに入れた。完全パルス条件下でALDを実行し、前駆体パルスの間、250seemのN2ブーストを加えた。N2を前駆体キャリアガスとして、そして反応体曝露間のパージガスとして用いた。
1)0.8sのTMA導入;100seemのN2パージガスを、全ての前駆体ラインに通すが、例外的に1.3sの250seemのN2パルスを、TMAラインに、ビーズの撹拌のために通す。
2)0.5sのN2パージ
3)工程1及び工程2をさらに2回繰り返す
4)0.8sのTMA導入;100seemのN2パージガスを、全ての前駆体ラインに通すが、例外的に1.3sの250seemのN2パルスを、TMAラインに、ビーズの撹拌のために通す。
5)120sのN2パージ。
6)0.8sのH2O導入;100seemのN2パージガスを、全ての前駆体ラインに通すが、例外的に1.3sの250seemのN2パルスを、水前駆体ラインに、ビーズの撹拌のために通す。
7)0.5sのN2パージ。
8)工程6及び工程7をさらに2回繰り返す。
9)0.8sのH2O導入;100seemのN2パージガスを、全ての前駆体ラインに通すが、例外的に1.3sの250seemのN2パルスを、水前駆体ラインに、ビーズの撹拌のために通す。
10)120sのN2パージ。
[完全パルスALDを用いたアルミニウムアルコキシドアロイポリマースペーサ層による量子ドット含有アクリレートビーズのコーティング]
QD含有アクリレートビーズを、50μmの細孔サイズの頂部フリット及び150μmの細孔サイズの底部フリットを有するALDリアクタに入れた。完全パルス条件下でALDを実行し、前駆体パルスの間、250seemのN2ブーストを加えた。N2を前駆体キャリアガスとして、そして反応体曝露間のパージガスとして用いた。エチレングリコール前駆体を、反応チャンバ中への導入前に、80℃に加熱した。
1)0.8sのTMA導入;100seemのN2パージガスを、全ての前駆体ラインに通すが、例外的に1.3sの250seemのN2パルスを、TMAラインに、ビーズの撹拌のために通す。
2)0.5sのN2パージ。
3)工程1及び工程2をさらに2回繰り返す。
4)0.8sのTMA導入;100seemのN2パージガスを、全ての前駆体ラインに通すが、例外的に1.3sの250seemのN2パルスを、TMAラインに、ビーズの撹拌のために通す。
5)120sのN2パージ。
6)0.8sのエチレングリコール導入;100seemのN2パージガスを、全ての前駆体ラインに通すが、例外的に1.3sの250seemのN2パルスを、エチレングリコールラインに、ビーズの撹拌のために通す。
7)0.5sのN2パージ。
8)工程6及び工程7をさらに2回繰り返す。
9)0.8sのエチレングリコール導入;100seemのN2パージガスを、全ての前駆体ラインに通すが、例外的に1.3sの250seemのN2パルスを、エチレングリコールラインに、ビーズの撹拌のために通す。
10)180sのN2パージ。
11)0.8sのTMA導入;100seemのN2パージガスを、全ての前駆体ラインに通すが、例外的に1.3sの250seemのN2パルスを、TMAラインに、ビーズの撹拌のために通す。
12)0.5sのN2パージ
13)工程11及び工程12をさらに2回繰り返す。
14)0.8sのTMA導入;100seemのN2パージガスを、全ての前駆体ラインに通すが、例外的に1.3sの250seemのN2パルスを、TMAラインに、ビーズの撹拌のために通す。
15)120sのN2パージ
16)0.8sのH2O導入;100seemのN2パージガスを、全ての前駆体ラインに通すが、例外的に1.3sの250seemのN2パルスを、水前駆体ラインに、ビーズの撹拌のために通す。
17)0.5sのN2パージ。
18)工程16及び工程17をさらに2回繰り返す。
19)0.8sのH2O導入;100seemのN2パージガスを、全ての前駆体ラインに通すが、例外的に1.3sの250seemのN2パルスを、水前駆体ラインに、ビーズの撹拌のために通す。
20)120sのN2パージ。
[完全パルスALDを用いた多層Al2O3/アルミニウムアルコキシドアロイポリマー/Al2O3コーティングによる量子ドット含有アクリレートビーズのコーティング]
1)30サイクルのプライマー層、その後のふるい分けに続く220サイクルによって構成された、実施例3に記載された250回の総サイクルの酸化アルミニウム層。
2)15サイクルのプライマー層、その後のふるい分けに続く110サイクルからなる、実施例4に記載された125回の総サイクルのアルミニウムアルコキシドアロイポリマースペーサ層。
3)実施例3に記載された250総サイクルの酸化アルミニウム層。この場合、250サイクルをプライマー層なしで完了した。
パルス撹拌ベッドによるALDコーティングプロセスを、以下の非限定的な実施例によって示す。
1)不活性パージガス(例えばN2又はAr)流量:400乃至600seem。
2)不活性ガス(例えばN2又はAr)撹拌パルス流量:2,000乃至6,000seem。
3)不活性ガス(例えばN2又はAr)撹拌パルス時間:0.1乃至5s。
4)ALD前駆体(TMA、H2O)パルス時間:0.1乃至4s。
5)ALDサイクルあたりのALD前駆体(TMA、H2O)パルス数:1乃至100(例えば1乃至10)。
6)ALD前駆体パルス間の不活性ガス(例えばN2又はAr)パージ時間:120乃至180s。
Claims (24)
- 複数のビーズを含む粉末を含む組成物において、
各ビーズは、
一次マトリックス材料と、
一次マトリックス材料中に組み込まれる量子ドットナノ粒子の集団と、
一次粒子に配置される表面コーティングであって、少なくとも1つの表面コーティング層を含み、各表面コーティング層は、コーティング材料の1又は複数の単層から基本的に構成されている、表面コーティングと、
含む、組成物。 - 一次マトリックス材料は、シリカ、樹脂、ポリマー、モノリス、ガラス、ゾル−ゲル、エポキシ、シリコーン又は(メタ)アクリレートである、請求項1に記載の組成物。
- コーティング材料は無機材料である、請求項1に記載の組成物。
- コーティング材料は金属酸化物である、請求項1に記載の組成物。
- コーティング材料は、酸化アルミニウム又は酸化ケイ素である、請求項1に記載の組成物。
- コーティング材料はポリマーである、請求項1に記載の組成物。
- コーティング材料はアルコキシドアロイポリマーである、請求項1に記載の組成物。
- 量子ドットナノ粒子は、インジウム及びリンを含む、請求項1に記載の組成物。
- 量子ドットナノ粒子は、カドミウムを基本的に含んでいない、請求項1に記載の組成物。
- 表面コーティングは、異なる材料を含む2つ以上の表面コーティング層を含む、請求項1に記載の組成物。
- 一次粒子は、約1,000個、又は少なくとも約10,000個のナノ粒子を含む、請求項1に記載の組成物。
- 一次粒子は、約10,000個乃至約100,000個の量子ドットナノ粒子を含む、請求項1に記載の組成物。
- コーティングされた量子ドットビーズを製造するプロセスであって、
複数のビーズを含む粉末であって、各ビーズが、一次マトリックス材料と、一次マトリックス材料中に組み込まれる量子ドットナノ粒子の集団とを含む粉末を提供する工程と、
原子層堆積(ALD)前駆体に繰り返し粉末を曝しながら、粉末を撹拌する工程と、
を含む方法。 - ALD前駆体に粉末を曝すことは、ALD前駆体を含む反応ガスのパルスに粉末を曝す工程を含む、請求項13に記載の方法。
- 粉末を撹拌する工程は、不活性ガスのパルスに粉末を曝す工程を含む、請求項14に記載の方法。
- 粉末は、反応ガスのパルス及び不活性ガスのパルスに同時に曝される、請求項15に記載の方法。
- 粉末は、反応ガスのパルス及び不活性ガスのパルスに交互に曝される、請求項15に記載の方法。
- 不活性ガスのパルスの流量は、300乃至6,000seemである、請求項17に記載の方法。
- 不活性ガスのパルスの期間は、0.1乃至5秒である、請求項17に記載の方法。
- 反応ガスのパルスに粉末を曝す工程は、第1のセットのガスラインを通してALD反応チャンバに反応ガスを送達する工程を含んでおり、不活性ガスのパルスに粉末を曝す工程は、異なるセットのガスラインを通してALD反応チャンバに不活性ガスを送達する工程を含む、請求項15に記載の方法。
- 反応ガス及び不活性ガスは、同じセットのラインを用いてALD反応チャンバに送達される、請求項15に記載の方法。
- 反応ガスのパルスに粉末を曝す工程は、第1のパルス数の反応ガスに粉末を曝す工程と、粉末を機械的に分解する工程と、その後、第2のパルス数の反応ガスに粉末を曝す工程とを含む、請求項14に記載の方法。
- 第1のパルス数は、1乃至500である、請求項22に記載の方法。
- 第1のパルス数は、10乃至40である、請求項22に記載の方法。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201361781323P | 2013-03-14 | 2013-03-14 | |
US61/781,323 | 2013-03-14 | ||
PCT/IB2014/001257 WO2014140936A2 (en) | 2013-03-14 | 2014-03-13 | Multi-layer-coated quantum dot beads |
Publications (1)
Publication Number | Publication Date |
---|---|
JP2016518468A true JP2016518468A (ja) | 2016-06-23 |
Family
ID=51355564
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2015562413A Pending JP2016518468A (ja) | 2013-03-14 | 2014-03-13 | 多層コーティングされた量子ドットビーズ |
Country Status (8)
Country | Link |
---|---|
US (2) | US9443998B2 (ja) |
EP (1) | EP2970762A2 (ja) |
JP (1) | JP2016518468A (ja) |
KR (1) | KR101673508B1 (ja) |
CN (2) | CN107099283A (ja) |
HK (1) | HK1212724A1 (ja) |
TW (2) | TWI605619B (ja) |
WO (1) | WO2014140936A2 (ja) |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2017511969A (ja) * | 2014-06-20 | 2017-04-27 | コリア インスティテュート オブ マシーナリィ アンド マテリアルズ | 量子ドット薄膜形成方法 |
JP2018507264A (ja) * | 2014-12-19 | 2018-03-15 | 京東方科技集團股▲ふん▼有限公司Boe Technology Group Co.,Ltd. | 改質量子ドット及びその製造方法、着色剤、感光性樹脂組成物、カラーフィルタと表示装置 |
WO2018168638A1 (ja) * | 2017-03-13 | 2018-09-20 | 住友化学株式会社 | ペロブスカイト化合物を含む混合物 |
JP2019536653A (ja) * | 2016-09-12 | 2019-12-19 | ナノコ テクノロジーズ リミテッド | 半導体ナノ粒子用のガスバリアコーティング |
JP2020507801A (ja) * | 2017-01-27 | 2020-03-12 | オスラム オプト セミコンダクターズ ゲゼルシャフト ミット ベシュレンクテル ハフツングOsram Opto Semiconductors GmbH | ポリマーと絶縁体コーティングとを有する半導体構造物、ならびにそれを形成するための組成物及び方法 |
JP2020522749A (ja) * | 2017-06-02 | 2020-07-30 | ネクスドット | カプセル化されたナノ粒子を含むインク |
WO2021161580A1 (ja) | 2020-02-13 | 2021-08-19 | 富士高分子工業株式会社 | 耐熱性シリコーン樹脂組成物及び耐熱性シリコーン樹脂複合材料 |
Families Citing this family (85)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20130112942A1 (en) | 2011-11-09 | 2013-05-09 | Juanita Kurtin | Composite having semiconductor structures embedded in a matrix |
US9574135B2 (en) * | 2013-08-22 | 2017-02-21 | Nanoco Technologies Ltd. | Gas phase enhancement of emission color quality in solid state LEDs |
EP3194528B1 (en) * | 2014-09-17 | 2020-11-11 | Lumileds Holding B.V. | Phosphor with hybrid coating and method of production |
TWI608076B (zh) | 2015-03-04 | 2017-12-11 | 納諾柯技術有限公司 | 以金屬硫醇聚合物穩定化的量子點 |
US9831397B2 (en) * | 2015-03-09 | 2017-11-28 | Pacific Light Technologies Corp. | Quantum dots with multiple insulator coatings |
CN104910918A (zh) * | 2015-04-30 | 2015-09-16 | 中国科学院半导体研究所 | 一种核壳量子点材料及其制备方法 |
WO2016200225A1 (ko) * | 2015-06-10 | 2016-12-15 | 성균관대학교산학협력단 | 양자점 또는 염료를 함유하는 대면적 필름 및 이의 제조 방법 |
WO2017012688A1 (en) | 2015-07-17 | 2017-01-26 | Merck Patent Gmbh | Luminescent particle, ink formulation, polymer composition, optical device, fabrication of thereof, and use of the luminescent particle |
US9716211B2 (en) * | 2015-07-22 | 2017-07-25 | Sharp Kabushiki Kaisha | Semiconductor phosphor nanoparticle, semiconductor phosphor nanoparticle-containing glass, light emitting device, and light emitting element |
WO2017036997A1 (en) * | 2015-09-03 | 2017-03-09 | Basf Se | Process for formulating quantum dots |
US10557081B2 (en) | 2015-09-10 | 2020-02-11 | Merck Patent Gmbh | Light-converting material |
US9382432B1 (en) * | 2015-09-21 | 2016-07-05 | Ubiqd, Llc | Quantum dot security inks |
KR101714904B1 (ko) * | 2015-10-19 | 2017-03-09 | 경희대학교 산학협력단 | 실리카 나노입자-그래핀 양자점 하이브리드 구조를 이용한 광전자 소자 및 그 제조방법 |
US20170125650A1 (en) | 2015-11-02 | 2017-05-04 | Nanoco Technologies Ltd. | Display devices comprising green-emitting quantum dots and red KSF phosphor |
CN105440188B (zh) * | 2015-12-15 | 2018-01-23 | 苏州大学 | 一种新型三维凝胶剂量计材料及其制备方法 |
KR20170072418A (ko) | 2015-12-16 | 2017-06-27 | 삼성전자주식회사 | 컬러 필터, 그 제조 방법, 및 컬러 필터를 포함하는 표시 장치 |
US9460328B1 (en) | 2016-01-15 | 2016-10-04 | International Business Machines Corporation | Extracting information from surface coatings |
DE102016104194A1 (de) | 2016-03-08 | 2017-09-14 | Osram Gmbh | Verfahren zur Herstellung von Leuchtstoffpartikeln mit einer Schutzschicht und Leuchtstoffpartikel mit einer Schutzschicht |
KR20180132733A (ko) | 2016-03-31 | 2018-12-12 | 메르크 파텐트 게엠베하 | 컬러 변환 시트 및 광학 디바이스 |
TWI774664B (zh) * | 2016-04-12 | 2022-08-21 | 美商羅門哈斯電子材料有限公司 | 用於製造經囊封量子點之方法 |
CA3024847A1 (en) * | 2016-05-19 | 2017-11-23 | Crystalplex Corporation | Cadmium-free quantum dots, tunable quantum dots, quantum dot containing polymer, articles, films, and 3d structure containing them and methods of making and using them |
US20180011346A1 (en) | 2016-07-05 | 2018-01-11 | Nanoco Technologies Ltd. | Probe for targeting and manipulating mitochondrial function using quantum dots |
US20180009659A1 (en) | 2016-07-05 | 2018-01-11 | Nanoco Technologies Ltd. | Ligand conjugated quantum dot nanoparticles and methods of detecting dna methylation using same |
JP2019531367A (ja) * | 2016-08-03 | 2019-10-31 | ルミレッズ リミテッド ライアビリティ カンパニー | 被覆された波長変換ナノ粒子 |
US20180040783A1 (en) | 2016-08-03 | 2018-02-08 | Lumileds Llc | Coated wavelength converting nanoparticles |
US20180067121A1 (en) | 2016-09-06 | 2018-03-08 | Nanoco Technologies Ltd. | Exosome-conjugated quantum dot nanoparticles and methods of detecting exosomes and cancer using same |
WO2018050526A1 (en) | 2016-09-13 | 2018-03-22 | Merck Patent Gmbh | Light luminescent particle |
CN106479482B (zh) * | 2016-09-20 | 2018-11-06 | 纳晶科技股份有限公司 | InP量子点及其制备方法 |
US20190270932A1 (en) | 2016-11-11 | 2019-09-05 | Merck Patent Gmbh | Light luminescent particle |
US20180133345A1 (en) | 2016-11-15 | 2018-05-17 | Nanoco Technologies Ltd. | Nano-Devices for Detection and Treatment of Cancer |
CN106590624A (zh) * | 2016-12-05 | 2017-04-26 | 河北工业大学 | 一种发光纳米颗粒及其制备方法 |
CN110139912A (zh) | 2016-12-20 | 2019-08-16 | 默克专利股份有限公司 | 光学介质和光学器件 |
CN108269891B (zh) * | 2016-12-30 | 2021-05-18 | Tcl科技集团股份有限公司 | 一种纳米复合材料、制备方法及半导体器件 |
CN109370562A (zh) * | 2017-02-22 | 2019-02-22 | 苏州星烁纳米科技有限公司 | 水滑石包覆的量子点微球及其制备方法 |
US10610591B2 (en) | 2017-03-15 | 2020-04-07 | Nanoco Technologies Ltd. | Light responsive quantum dot drug delivery system |
CN107142100A (zh) * | 2017-03-29 | 2017-09-08 | 华南理工大学 | 一种梯度折射率包裹量子点膜片及其制备方法 |
CN106981562B (zh) * | 2017-03-30 | 2019-04-02 | 深圳市华星光电技术有限公司 | 量子点led封装结构 |
TWI614927B (zh) * | 2017-04-26 | 2018-02-11 | 國立清華大學 | 光擴散量子點奈米結構及具有該光擴散量子點奈米結構的發光二極體晶片 |
CN108807608B (zh) * | 2017-05-02 | 2020-06-12 | Tcl科技集团股份有限公司 | 一种氧化物包覆量子点led的制备方法 |
WO2018220165A1 (en) | 2017-06-02 | 2018-12-06 | Nexdot | Method for obtaining encapsulated nanoparticles |
WO2018220167A1 (en) * | 2017-06-02 | 2018-12-06 | Nexdot | Metastable aggregate and uses thereof |
KR101974724B1 (ko) * | 2017-06-22 | 2019-05-03 | 한국세라믹기술원 | 페로브스카이트 반도체 나노캡슐 및 그의 제조방법 |
US10209560B2 (en) * | 2017-07-17 | 2019-02-19 | Gl Vision Inc. | Backlight unit comprising a quantum dot powder having a first quantum dot, a first quantum dot, a second quantum dot, a first chain molecule, a second chain molecule, and a bead and display device including the same |
WO2019025392A1 (en) | 2017-08-03 | 2019-02-07 | Merck Patent Gmbh | QUANTUM PERFORMANCE RECOVERY |
CN111033328A (zh) * | 2017-09-28 | 2020-04-17 | 松下知识产权经营株式会社 | 波长转换构件及光源 |
WO2019077362A1 (en) | 2017-10-18 | 2019-04-25 | Nanoco Technologies Ltd | METHODS FOR IMPROVING MEDICAL IMAGING BASED ON 5-AMINOLEVULINIC ACID AND PHOTOTHERAPY |
WO2019083112A1 (ko) | 2017-10-27 | 2019-05-02 | 삼성에스디아이 주식회사 | 양자점 함유 조성물, 양자점 제조방법 및 컬러필터 |
KR102515817B1 (ko) * | 2017-11-28 | 2023-03-29 | 엘지디스플레이 주식회사 | 발광체, 이를 포함하는 발광 필름, 발광다이오드 및 발광장치 |
US10810808B2 (en) | 2017-12-07 | 2020-10-20 | Honeywell International Inc. | Avionics server for high integrity tablet applications |
US10636390B2 (en) * | 2017-12-07 | 2020-04-28 | Honeywell International Inc. | Display integrity system for ICA monitoring and annunciation for certified aeronautical applications running on a commercial device |
US10875762B2 (en) | 2017-12-07 | 2020-12-29 | Honeywell International Inc. | Addressable display system for ICA monitoring and annunciation for certified applications running on a personal electronic device |
US10338337B1 (en) | 2017-12-07 | 2019-07-02 | Honeywell International Inc. | System and method for displaying critical aeronautical information on an uncertified display |
US10901674B2 (en) | 2017-12-07 | 2021-01-26 | Honeywell International Inc. | Protocol for high integrity personal electronic device applications |
CN111566830A (zh) | 2017-12-18 | 2020-08-21 | 默克专利股份有限公司 | 光转换材料 |
US10752834B2 (en) * | 2018-05-17 | 2020-08-25 | Chung Yuan Christian University | Composite fluorescent gold nanoclusters with high quantum yield and method for manufacturing the same |
CN109321252B (zh) * | 2018-06-19 | 2021-08-31 | 李良 | 一种稳定的量子点及其制备方法 |
CN108624317B (zh) | 2018-07-12 | 2023-02-17 | 京东方科技集团股份有限公司 | 一种核壳型量子点及其制备方法和用途 |
CN109103348B (zh) * | 2018-08-10 | 2020-08-25 | 武汉艾特米克超能新材料科技有限公司 | 一种oled有机发光材料及其制备方法、oled器件及其制备方法 |
WO2020120970A1 (en) | 2018-12-13 | 2020-06-18 | Nanoco Technologies Ltd | Methods for enhancing indocyanine green medical imaging and phototherapy |
KR102296792B1 (ko) | 2019-02-01 | 2021-08-31 | 삼성에스디아이 주식회사 | 무용매형 경화성 조성물, 이를 이용하여 제조된 경화막, 상기 경화막을 포함하는 컬러필터, 디스플레이 장치 및 상기 경화막의 제조방법 |
US10756243B1 (en) * | 2019-03-04 | 2020-08-25 | Chung Yuan Christian University | Light-emitting diode package structure and method for manufacturing the same |
KR102360987B1 (ko) | 2019-04-24 | 2022-02-08 | 삼성에스디아이 주식회사 | 양자점 함유 경화성 조성물, 이를 이용한 수지막 및 디스플레이 장치 |
KR102504790B1 (ko) | 2019-07-26 | 2023-02-27 | 삼성에스디아이 주식회사 | 양자점, 이를 포함하는 경화성 조성물, 상기 조성물을 이용하여 제조된 경화막, 상기 경화막을 포함하는 컬러필터, 디스플레이 장치 |
US11976016B2 (en) | 2019-11-12 | 2024-05-07 | Forge Nano Inc. | Coatings on particles of high energy materials and methods of forming same |
GB201917899D0 (en) * | 2019-12-06 | 2020-01-22 | Nanexa Ab | New composition |
US20210190775A1 (en) | 2019-12-18 | 2021-06-24 | Nanoco Technologies Ltd. | Compositions and methods for tagging and detecting nucleic acids |
CN111334128A (zh) * | 2020-03-27 | 2020-06-26 | 苏州晶台光电有限公司 | 一种量子点复合材料墨水、制备方法及应用 |
CN111304634B (zh) * | 2020-03-27 | 2022-05-13 | 华中科技大学无锡研究院 | 一种利用原子层沉积包覆纳米淀粉微球的方法 |
EP3950879A1 (en) * | 2020-08-05 | 2022-02-09 | Lumileds LLC | Phosphor particle coating |
CN115698225A (zh) * | 2020-06-29 | 2023-02-03 | 亮锐有限责任公司 | 磷光体颗粒涂层 |
US11912918B2 (en) | 2020-06-29 | 2024-02-27 | Lumileds Llc | Phosphor particle coating |
US11912914B2 (en) | 2020-06-29 | 2024-02-27 | Lumileds Llc | Phosphor particle coating |
US20220018837A1 (en) | 2020-07-17 | 2022-01-20 | Nanoco Technologies Ltd. | Method for the Detection of Surface-Mounted Biological Materials and Pathogens |
WO2022073948A1 (en) * | 2020-10-08 | 2022-04-14 | Merck Patent Gmbh | Particle and method for fabricating a particle |
CN112310330B (zh) * | 2020-10-30 | 2024-06-04 | 北京京东方技术开发有限公司 | 一种量子点材料、量子点发光器件、显示装置及制作方法 |
KR20220062213A (ko) * | 2020-11-06 | 2022-05-16 | 삼성디스플레이 주식회사 | 반도체 나노입자, 이를 포함한 전자 장치 및 상기 반도체 나노입자의 제조 방법 |
KR102474391B1 (ko) * | 2020-12-28 | 2022-12-06 | (재)한국나노기술원 | 표면 제어 영역에 양자점이 포함된 구조체를 형성하는 방법 및 양자점이 포함된 구조체가 형성된 표면 제어 기재 그리고 이를 이용한 광전소자 |
CN113444520B (zh) * | 2021-06-25 | 2022-03-25 | 佛山安亿纳米材料有限公司 | 具有包覆层的硫化物荧光体及制备具有包覆层的硫化物荧光体的磁控溅射法 |
CN113956868B (zh) * | 2021-10-11 | 2022-09-20 | 佛山安亿纳米材料有限公司 | 一种具有钝化保护膜的量子点复合转光材料 |
CN115991922A (zh) * | 2021-10-19 | 2023-04-21 | 北京航空航天大学合肥创新研究院(北京航空航天大学合肥研究生院) | 一种复合材料及其制备方法与应用 |
US11807787B2 (en) | 2021-12-28 | 2023-11-07 | Industrial Technology Research Institute | Luminescence conversion material and fabrication method thereof |
TWI829059B (zh) * | 2021-12-28 | 2024-01-11 | 財團法人工業技術研究院 | 光轉換材料、其製備方法、顯示裝置以及照明裝置 |
CN114316950B (zh) * | 2022-01-12 | 2022-08-26 | 广东粤港澳大湾区国家纳米科技创新研究院 | 通过前体胶囊制备量子点材料的方法和量子点材料、量子点组合物以及量子点器件 |
WO2023152238A1 (en) * | 2022-02-10 | 2023-08-17 | Sony Group Corporation | Materials for quantum dot-based color conversion filters for led arrays and displays |
CN116731559A (zh) * | 2022-03-03 | 2023-09-12 | 北京航空航天大学合肥创新研究院(北京航空航天大学合肥研究生院) | 一种具有荧光效应的油墨及其制备方法和应用 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2012136876A1 (en) * | 2011-04-07 | 2012-10-11 | Picosun Oy | Atomic layer deposition with plasma source |
JP2013505346A (ja) * | 2009-09-23 | 2013-02-14 | ナノコ テクノロジーズ リミテッド | 添加物を含み、カプセル化された半導体ナノ粒子ベース材料 |
JP2013505347A (ja) * | 2009-09-23 | 2013-02-14 | ナノコ テクノロジーズ リミテッド | カプセル化された半導体ナノ粒子ベース材料 |
JP2014101578A (ja) * | 2012-11-18 | 2014-06-05 | Hgst Netherlands B V | 基材上に均一に配列されたコア−シェルナノ粒子の薄膜を製造する方法 |
JP2014160820A (ja) * | 2013-02-20 | 2014-09-04 | Imec | コンフォーマル反射防止コーティング |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20050054122A (ko) * | 2003-12-04 | 2005-06-10 | 성명모 | 자외선 원자층 증착법을 이용한 박막 제조 방법 |
US7306823B2 (en) * | 2004-09-18 | 2007-12-11 | Nanosolar, Inc. | Coated nanoparticles and quantum dots for solution-based fabrication of photovoltaic cells |
GB0409877D0 (en) | 2004-04-30 | 2004-06-09 | Univ Manchester | Preparation of nanoparticle materials |
US7588828B2 (en) | 2004-04-30 | 2009-09-15 | Nanoco Technologies Limited | Preparation of nanoparticle materials |
GB0522027D0 (en) | 2005-10-28 | 2005-12-07 | Nanoco Technologies Ltd | Controlled preparation of nanoparticle materials |
GB0820101D0 (en) | 2008-11-04 | 2008-12-10 | Nanoco Technologies Ltd | Surface functionalised nanoparticles |
GB0821122D0 (en) | 2008-11-19 | 2008-12-24 | Nanoco Technologies Ltd | Semiconductor nanoparticle - based light emitting devices and associated materials and methods |
US8343575B2 (en) * | 2008-12-30 | 2013-01-01 | Nanosys, Inc. | Methods for encapsulating nanocrystals and resulting compositions |
EP2370993A1 (en) * | 2008-12-30 | 2011-10-05 | Nanosys, Inc. | Methods for encapsulating nanocrystals and resulting compositions |
GB201005601D0 (en) | 2010-04-01 | 2010-05-19 | Nanoco Technologies Ltd | Ecapsulated nanoparticles |
-
2014
- 2014-03-13 CN CN201710054475.2A patent/CN107099283A/zh active Pending
- 2014-03-13 KR KR1020157029012A patent/KR101673508B1/ko active IP Right Grant
- 2014-03-13 EP EP14752372.4A patent/EP2970762A2/en not_active Withdrawn
- 2014-03-13 WO PCT/IB2014/001257 patent/WO2014140936A2/en active Application Filing
- 2014-03-13 US US14/208,311 patent/US9443998B2/en not_active Expired - Fee Related
- 2014-03-13 JP JP2015562413A patent/JP2016518468A/ja active Pending
- 2014-03-13 CN CN201480014975.8A patent/CN105051152A/zh active Pending
- 2014-03-14 TW TW105132413A patent/TWI605619B/zh not_active IP Right Cessation
- 2014-03-14 TW TW103109474A patent/TWI563687B/zh not_active IP Right Cessation
-
2016
- 2016-01-22 HK HK16100737.0A patent/HK1212724A1/zh unknown
- 2016-07-27 US US15/220,633 patent/US20170018690A1/en not_active Abandoned
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2013505346A (ja) * | 2009-09-23 | 2013-02-14 | ナノコ テクノロジーズ リミテッド | 添加物を含み、カプセル化された半導体ナノ粒子ベース材料 |
JP2013505347A (ja) * | 2009-09-23 | 2013-02-14 | ナノコ テクノロジーズ リミテッド | カプセル化された半導体ナノ粒子ベース材料 |
WO2012136876A1 (en) * | 2011-04-07 | 2012-10-11 | Picosun Oy | Atomic layer deposition with plasma source |
JP2014517499A (ja) * | 2011-04-07 | 2014-07-17 | ピコサン オーワイ | プラズマ源による原子層堆積 |
JP2014101578A (ja) * | 2012-11-18 | 2014-06-05 | Hgst Netherlands B V | 基材上に均一に配列されたコア−シェルナノ粒子の薄膜を製造する方法 |
JP2014160820A (ja) * | 2013-02-20 | 2014-09-04 | Imec | コンフォーマル反射防止コーティング |
Non-Patent Citations (1)
Title |
---|
DAVID M.KING ET AL: "Atomic layer deposition on particles using a fluidized bed reactor with in situ mass spectrometry", SURFACE & COATINGS TECHNOLOGY, vol. 201, JPN6017027973, 2007, pages 9163 - 9171, XP022191954, ISSN: 0003765900, DOI: 10.1016/j.surfcoat.2007.05.002 * |
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2017511969A (ja) * | 2014-06-20 | 2017-04-27 | コリア インスティテュート オブ マシーナリィ アンド マテリアルズ | 量子ドット薄膜形成方法 |
JP2018507264A (ja) * | 2014-12-19 | 2018-03-15 | 京東方科技集團股▲ふん▼有限公司Boe Technology Group Co.,Ltd. | 改質量子ドット及びその製造方法、着色剤、感光性樹脂組成物、カラーフィルタと表示装置 |
JP2019536653A (ja) * | 2016-09-12 | 2019-12-19 | ナノコ テクノロジーズ リミテッド | 半導体ナノ粒子用のガスバリアコーティング |
JP2020507801A (ja) * | 2017-01-27 | 2020-03-12 | オスラム オプト セミコンダクターズ ゲゼルシャフト ミット ベシュレンクテル ハフツングOsram Opto Semiconductors GmbH | ポリマーと絶縁体コーティングとを有する半導体構造物、ならびにそれを形成するための組成物及び方法 |
WO2018168638A1 (ja) * | 2017-03-13 | 2018-09-20 | 住友化学株式会社 | ペロブスカイト化合物を含む混合物 |
JPWO2018168638A1 (ja) * | 2017-03-13 | 2019-06-27 | 住友化学株式会社 | ペロブスカイト化合物を含む混合物 |
US11268023B2 (en) | 2017-03-13 | 2022-03-08 | Sumitomo Chemical Company, Limited | Mixture containing perovskite compound |
US11739264B2 (en) | 2017-03-13 | 2023-08-29 | Sumitomo Chemical Company, Limited | Mixture containing perovskite compound |
JP2020522749A (ja) * | 2017-06-02 | 2020-07-30 | ネクスドット | カプセル化されたナノ粒子を含むインク |
WO2021161580A1 (ja) | 2020-02-13 | 2021-08-19 | 富士高分子工業株式会社 | 耐熱性シリコーン樹脂組成物及び耐熱性シリコーン樹脂複合材料 |
Also Published As
Publication number | Publication date |
---|---|
WO2014140936A3 (en) | 2015-01-08 |
US20170018690A1 (en) | 2017-01-19 |
TWI605619B (zh) | 2017-11-11 |
US9443998B2 (en) | 2016-09-13 |
KR101673508B1 (ko) | 2016-11-07 |
US20140264196A1 (en) | 2014-09-18 |
CN107099283A (zh) | 2017-08-29 |
EP2970762A2 (en) | 2016-01-20 |
TW201703285A (zh) | 2017-01-16 |
WO2014140936A2 (en) | 2014-09-18 |
TWI563687B (en) | 2016-12-21 |
KR20150126961A (ko) | 2015-11-13 |
CN105051152A (zh) | 2015-11-11 |
TW201503419A (zh) | 2015-01-16 |
HK1212724A1 (zh) | 2016-06-17 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US9443998B2 (en) | Multi-layer-coated quantum dot beads | |
US10032964B2 (en) | Semiconductor nanoparticle-based materials | |
US8847197B2 (en) | Semiconductor nanoparticle-based materials | |
EP3194528B1 (en) | Phosphor with hybrid coating and method of production | |
CA2949556C (en) | Dispersion system for quantum dots | |
US10539297B2 (en) | Quantum dot containing light module |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20160927 |
|
A601 | Written request for extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A601 Effective date: 20161222 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20170209 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20170801 |
|
A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20180327 |