JP2016156823A5 - - Google Patents

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Publication number
JP2016156823A5
JP2016156823A5 JP2016031701A JP2016031701A JP2016156823A5 JP 2016156823 A5 JP2016156823 A5 JP 2016156823A5 JP 2016031701 A JP2016031701 A JP 2016031701A JP 2016031701 A JP2016031701 A JP 2016031701A JP 2016156823 A5 JP2016156823 A5 JP 2016156823A5
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JP
Japan
Prior art keywords
sample
membrane
sample holder
aqueous liquid
opening
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JP2016031701A
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English (en)
Japanese (ja)
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JP2016156823A (ja
JP6416809B2 (ja
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Priority claimed from EP15156546.2A external-priority patent/EP3062082B1/en
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Publication of JP2016156823A5 publication Critical patent/JP2016156823A5/ja
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JP2016031701A 2015-02-25 2016-02-23 荷電粒子顕微鏡用のサンプルの調製 Active JP6416809B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP15156546.2 2015-02-25
EP15156546.2A EP3062082B1 (en) 2015-02-25 2015-02-25 Preparation of sample for charged-particle microscopy

Publications (3)

Publication Number Publication Date
JP2016156823A JP2016156823A (ja) 2016-09-01
JP2016156823A5 true JP2016156823A5 (enExample) 2018-03-15
JP6416809B2 JP6416809B2 (ja) 2018-10-31

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JP2016031701A Active JP6416809B2 (ja) 2015-02-25 2016-02-23 荷電粒子顕微鏡用のサンプルの調製

Country Status (4)

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US (1) US9772265B2 (enExample)
EP (1) EP3062082B1 (enExample)
JP (1) JP6416809B2 (enExample)
CN (1) CN105914122B (enExample)

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3062082B1 (en) * 2015-02-25 2018-04-18 Fei Company Preparation of sample for charged-particle microscopy
EP3486633B1 (en) 2015-12-11 2021-11-24 FEI Company Preparation of cryogenic sample for charged-particle microscopy
DK3260839T3 (da) * 2016-06-22 2021-04-19 Univ Maastricht Fremgangsmåde til forberedelse af prøver til billeddannelses- eller diffraktionseksperimenter under kyrogene betingelser
US10879034B2 (en) 2017-06-21 2020-12-29 King Abdullah University Of Science And Technology Membraneless platform for correlated analysis of nanomaterials
WO2019010436A1 (en) * 2017-07-07 2019-01-10 Wisconsin Alumni Research Foundation PREPARATION OF GAS PHASE SAMPLE FOR CRYOELECTRONIC MICROSCOPY
JP6433550B1 (ja) * 2017-07-19 2018-12-05 株式会社日立製作所 試料保持機構、及び荷電粒子線装置
EP3477679B1 (en) 2017-10-26 2025-01-08 FEI Company Improved cryogenic cell for mounting a specimen in a charged particle microscope
EP3495798B1 (en) 2017-12-08 2021-01-20 FEI Company Improved preparation of cryogenic sample, e.g. for charged particle microscopy
EP3531439B1 (en) 2018-02-22 2020-06-24 FEI Company Intelligent pre-scan in scanning transmission charged particle microscopy
US11322334B2 (en) * 2018-07-12 2022-05-03 XTEM Biolab Co., Ltd. Grid sample production apparatus for electron microscope
KR102201993B1 (ko) * 2018-07-12 2021-01-12 주식회사 엑스템바이오랩 전자현미경용 그리드 샘플 제작장치
EP3647763B1 (en) * 2018-10-29 2021-07-14 FEI Company A method of preparing a biological sample for study in an analysis device
US11703429B2 (en) 2019-02-14 2023-07-18 Nanosoft, LLC Cryogenic transmission electron microscopy sample preparation
US11035766B2 (en) * 2019-02-14 2021-06-15 Nanosoft, Llc. Cryogenic transmission electron microscopy sample preparation
EP3840011A1 (en) * 2019-12-19 2021-06-23 Universiteit Leiden Methods and system for fabricating thin film liquid cells
WO2021217274A1 (en) * 2020-04-30 2021-11-04 The Hospital For Sick Children High-speed cryoem specimen preparation using through-grid wicking
JP7407483B2 (ja) * 2020-09-29 2024-01-04 国立研究開発法人物質・材料研究機構 水素透過検出用試料ホルダー及び水素透過拡散経路観測装置
US11728146B2 (en) 2021-01-13 2023-08-15 Wisconsin Alumni Research Foundation Retractable ion guide, grid holder, and technology for removal of cryogenic sample from vacuum
US20220252514A1 (en) * 2021-02-10 2022-08-11 Star Voltaic, LLC Fluorescent solid-state materials for optical calibration and methods thereof
KR102636920B1 (ko) * 2021-02-25 2024-02-16 주식회사 코엠에스 투광성 용기의 액체유무 확인 검사장치
EP4067860B1 (en) 2021-03-31 2024-07-24 FEI Company Method of preparing a cryogenic sample with improved cooling characteristics
EP4105632B1 (en) * 2021-06-14 2025-09-24 Nanosoft, LLC Cryogenic transmission electron microscopy sample preparation
EP4109069A1 (en) * 2021-06-25 2022-12-28 FEI Company Blotting material with profiled region, method of manufacturing same, and uses thereof
US20240011885A1 (en) * 2021-09-13 2024-01-11 Gregory Hirsch Vacuum Ultraviolet Cryo-EM Grid Screening Tool
WO2023168406A2 (en) * 2022-03-04 2023-09-07 Wisconsin Alumni Research Foundation Surface hydration with an ion beam
EP4368963A1 (en) 2022-11-08 2024-05-15 Fei Company Method of preparing a cryogenic sample with improved cooling characteristics

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001074621A (ja) * 1999-09-08 2001-03-23 Toshiba Microelectronics Corp 電子顕微鏡用試料の作製方法
JP2005114578A (ja) * 2003-10-08 2005-04-28 Jeol Ltd 試料作製方法および試料作製装置ならびに試料観察装置
JP2005249414A (ja) * 2004-03-01 2005-09-15 Toyota Motor Corp カーボンナノチューブの断面観察方法
JP2005345422A (ja) * 2004-06-07 2005-12-15 Canon Inc 試料物質の観察方法および観察装置
JP4891830B2 (ja) * 2007-04-18 2012-03-07 日本電子株式会社 電子顕微鏡用試料ホルダおよび観察方法
EP2458354A1 (en) * 2010-11-24 2012-05-30 Fei Company Method of measuring the temperature of a sample carrier in a charged particle-optical apparatus
JP5951223B2 (ja) * 2011-11-02 2016-07-13 株式会社日立ハイテクノロジーズ 電子顕微法、電子顕微鏡および観察標体作製装置
US8884248B2 (en) * 2012-02-13 2014-11-11 Fei Company Forming a vitrified sample for electron microscopy
EP2853847B1 (en) 2013-09-30 2016-02-03 Fei Company Preparation of cryogenic sample for charged-particle microscopy
EP3032564A1 (en) 2014-12-11 2016-06-15 FEI Company Improved cryogenic specimen holder for a charged particle microscope
EP3062082B1 (en) * 2015-02-25 2018-04-18 Fei Company Preparation of sample for charged-particle microscopy

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