JP2019528435A5 - - Google Patents

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Publication number
JP2019528435A5
JP2019528435A5 JP2019503570A JP2019503570A JP2019528435A5 JP 2019528435 A5 JP2019528435 A5 JP 2019528435A5 JP 2019503570 A JP2019503570 A JP 2019503570A JP 2019503570 A JP2019503570 A JP 2019503570A JP 2019528435 A5 JP2019528435 A5 JP 2019528435A5
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JP
Japan
Prior art keywords
sample
fluid sample
support
sample support
gas
Prior art date
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Application number
JP2019503570A
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English (en)
Japanese (ja)
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JP2019528435A (ja
JP6997757B2 (ja
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Priority claimed from GBGB1613173.2A external-priority patent/GB201613173D0/en
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Publication of JP2019528435A publication Critical patent/JP2019528435A/ja
Publication of JP2019528435A5 publication Critical patent/JP2019528435A5/ja
Application granted granted Critical
Publication of JP6997757B2 publication Critical patent/JP6997757B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2019503570A 2016-07-29 2017-07-28 電子顕微鏡法 Active JP6997757B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GBGB1613173.2A GB201613173D0 (en) 2016-07-29 2016-07-29 Electron microscopy
GB1613173.2 2016-07-29
PCT/EP2017/069240 WO2018020036A1 (en) 2016-07-29 2017-07-28 Electron microscopy

Publications (3)

Publication Number Publication Date
JP2019528435A JP2019528435A (ja) 2019-10-10
JP2019528435A5 true JP2019528435A5 (enExample) 2020-09-03
JP6997757B2 JP6997757B2 (ja) 2022-02-04

Family

ID=56936668

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2019503570A Active JP6997757B2 (ja) 2016-07-29 2017-07-28 電子顕微鏡法

Country Status (10)

Country Link
US (1) US11067486B2 (enExample)
EP (1) EP3491360B1 (enExample)
JP (1) JP6997757B2 (enExample)
CN (1) CN109891208A (enExample)
AU (1) AU2017302126B2 (enExample)
CA (1) CA3032234C (enExample)
DK (1) DK3491360T3 (enExample)
ES (1) ES3026360T3 (enExample)
GB (1) GB201613173D0 (enExample)
WO (1) WO2018020036A1 (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3647763B1 (en) * 2018-10-29 2021-07-14 FEI Company A method of preparing a biological sample for study in an analysis device
CN111389478B (zh) * 2020-03-23 2023-07-25 西安医学院 一种组织切片的实验处理装置及其使用方法
GB2593491A (en) * 2020-03-24 2021-09-29 Res & Innovation Uk Electron microscopy support
EP4109069A1 (en) 2021-06-25 2022-12-28 FEI Company Blotting material with profiled region, method of manufacturing same, and uses thereof
NL2033291B1 (en) 2022-10-12 2024-04-26 Academisch Ziekenhuis Leiden Device and Method for Cryogenic Electron Microscopy Sample Preparation
EP4711738A1 (en) * 2024-09-17 2026-03-18 European Molecular Biology Laboratory Sample preparation method and device for preparing a vitrified sample layer on a sample holder grid for subsequent cryo electron microscopy

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59109840A (ja) 1982-12-16 1984-06-25 Hitachi Koki Co Ltd 走査形電子顕微鏡用生物試料の前処理方法
US7112790B1 (en) * 2003-08-13 2006-09-26 Cypress Semiconductor Corp. Method to prepare TEM samples
JP2007163447A (ja) * 2005-12-09 2007-06-28 Lee Bing Huan 電子顕微鏡用の超薄液体制御板
JP4891830B2 (ja) * 2007-04-18 2012-03-07 日本電子株式会社 電子顕微鏡用試料ホルダおよび観察方法
US8256232B2 (en) * 2007-11-20 2012-09-04 Max-Planck-Gesellschaft Zur Foerderung Der Wissenschaften, E.V. Ultra-rapid freezing device and method
GB0724736D0 (en) * 2007-12-19 2008-01-30 Oxford Nanolabs Ltd Formation of layers of amphiphilic molecules
GB2461708A (en) * 2008-07-08 2010-01-13 Silson Ltd Sample holder
JP2010054272A (ja) 2008-08-27 2010-03-11 National Institute Of Advanced Industrial Science & Technology スピン偏極走査電子顕微鏡
AT507079B1 (de) * 2009-01-22 2010-02-15 Leica Mikrosysteme Gmbh Vorrichtung und verfahren zum präparieren von proben
JP5550262B2 (ja) * 2009-05-29 2014-07-16 キヤノン株式会社 試料観察システム及び試料観察方法
US9312095B2 (en) * 2010-03-24 2016-04-12 Brown University Method and system for automating sample preparation for microfluidic cryo TEM
GB201118282D0 (en) 2011-10-21 2011-12-07 Cancer Rec Tech Ltd Sample slide preparation method and device
JP5930922B2 (ja) * 2012-09-14 2016-06-08 株式会社日立ハイテクノロジーズ 荷電粒子線装置及び試料観察方法
JP6239246B2 (ja) * 2013-03-13 2017-11-29 株式会社日立ハイテクノロジーズ 荷電粒子線装置、試料観察方法、試料台、観察システム、および発光部材
GB201318463D0 (en) * 2013-08-13 2013-12-04 Medical Res Council Graphene Modification
EP3033762B1 (en) * 2013-08-13 2019-03-27 United Kingdom Research and Innovation Electron microscopy sample support comprising porous metal foil
EP2853847B1 (en) * 2013-09-30 2016-02-03 Fei Company Preparation of cryogenic sample for charged-particle microscopy
CA2932803C (en) 2013-12-13 2020-09-08 Ventana Medical Systems, Inc. Thermal management in the context of automated histological processing of biological specimens and associated technology
GB2537579A (en) 2014-11-07 2016-10-26 Linkam Scient Instr Ltd Microscopic sample preparation
CN107533080A (zh) * 2015-04-20 2018-01-02 文塔纳医疗系统公司 用于组织学样品的试剂的喷墨沉积
EP3260839B1 (en) * 2016-06-22 2021-01-27 Universiteit Maastricht Method for preparing samples for imaging or diffraction experiments under cryogenic conditions
EP3647763B1 (en) * 2018-10-29 2021-07-14 FEI Company A method of preparing a biological sample for study in an analysis device

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