AU2017302126B2 - Electron microscopy - Google Patents

Electron microscopy Download PDF

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Publication number
AU2017302126B2
AU2017302126B2 AU2017302126A AU2017302126A AU2017302126B2 AU 2017302126 B2 AU2017302126 B2 AU 2017302126B2 AU 2017302126 A AU2017302126 A AU 2017302126A AU 2017302126 A AU2017302126 A AU 2017302126A AU 2017302126 B2 AU2017302126 B2 AU 2017302126B2
Authority
AU
Australia
Prior art keywords
sample
fluid
gas
electron microscopy
support
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
AU2017302126A
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English (en)
Other versions
AU2017302126A1 (en
Inventor
Rafael FERNANDEZ-LEIRO
Joshua FIRMAN
Meindert Hugo Lamers
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
United Kingdom Research and Innovation
Original Assignee
United Kingdom Research and Innovation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by United Kingdom Research and Innovation filed Critical United Kingdom Research and Innovation
Publication of AU2017302126A1 publication Critical patent/AU2017302126A1/en
Application granted granted Critical
Publication of AU2017302126B2 publication Critical patent/AU2017302126B2/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/30—Staining; Impregnating ; Fixation; Dehydration; Multistep processes for preparing samples of tissue, cell or nucleic acid material and the like for analysis
    • G01N1/31—Apparatus therefor
    • G01N1/312—Apparatus therefor for samples mounted on planar substrates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/2813—Producing thin layers of samples on a substrate, e.g. smearing, spinning-on
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01L—CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
    • B01L3/00—Containers or dishes for laboratory use, e.g. laboratory glassware; Droppers
    • B01L3/50—Containers for the purpose of retaining a material to be analysed, e.g. test tubes
    • B01L3/508—Containers for the purpose of retaining a material to be analysed, e.g. test tubes rigid containers not provided for above
    • B01L3/5085—Containers for the purpose of retaining a material to be analysed, e.g. test tubes rigid containers not provided for above for multiple samples, e.g. microtitration plates
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01L—CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
    • B01L7/00—Heating or cooling apparatus; Heat insulating devices
    • B01L7/50—Cryostats
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01L—CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
    • B01L9/00—Supporting devices; Holding devices
    • B01L9/52—Supports specially adapted for flat sample carriers, e.g. for plates, slides, chips
    • B01L9/523—Supports specially adapted for flat sample carriers, e.g. for plates, slides, chips for multisample carriers, e.g. used for microtitration plates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/04—Preparation or injection of sample to be analysed
    • G01N30/06—Preparation
    • G01N30/12—Preparation by evaporation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/023—Means for mechanically adjusting components not otherwise provided for
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/20—Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01L—CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
    • B01L2300/00—Additional constructional details
    • B01L2300/18—Means for temperature control
    • B01L2300/1894—Cooling means; Cryo cooling
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/002—Cooling arrangements

Landscapes

  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Clinical Laboratory Science (AREA)
  • Engineering & Computer Science (AREA)
  • Biomedical Technology (AREA)
  • Molecular Biology (AREA)
  • Hematology (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
AU2017302126A 2016-07-29 2017-07-28 Electron microscopy Active AU2017302126B2 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GBGB1613173.2A GB201613173D0 (en) 2016-07-29 2016-07-29 Electron microscopy
GB1613173.2 2016-07-29
PCT/EP2017/069240 WO2018020036A1 (en) 2016-07-29 2017-07-28 Electron microscopy

Publications (2)

Publication Number Publication Date
AU2017302126A1 AU2017302126A1 (en) 2019-02-07
AU2017302126B2 true AU2017302126B2 (en) 2022-07-07

Family

ID=56936668

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2017302126A Active AU2017302126B2 (en) 2016-07-29 2017-07-28 Electron microscopy

Country Status (10)

Country Link
US (1) US11067486B2 (enExample)
EP (1) EP3491360B1 (enExample)
JP (1) JP6997757B2 (enExample)
CN (1) CN109891208A (enExample)
AU (1) AU2017302126B2 (enExample)
CA (1) CA3032234C (enExample)
DK (1) DK3491360T3 (enExample)
ES (1) ES3026360T3 (enExample)
GB (1) GB201613173D0 (enExample)
WO (1) WO2018020036A1 (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3647763B1 (en) 2018-10-29 2021-07-14 FEI Company A method of preparing a biological sample for study in an analysis device
CN111389478B (zh) * 2020-03-23 2023-07-25 西安医学院 一种组织切片的实验处理装置及其使用方法
GB2593491A (en) * 2020-03-24 2021-09-29 Res & Innovation Uk Electron microscopy support
EP4109069A1 (en) 2021-06-25 2022-12-28 FEI Company Blotting material with profiled region, method of manufacturing same, and uses thereof
NL2033291B1 (en) 2022-10-12 2024-04-26 Academisch Ziekenhuis Leiden Device and Method for Cryogenic Electron Microscopy Sample Preparation

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070145268A1 (en) * 2005-12-09 2007-06-28 Lee, Bing-Huan Ultra-thin liquid control plate and combination of box-like member and the control plate
US20090126373A1 (en) * 2007-11-20 2009-05-21 Max-Planck-Gesellschaft Zur Foerderung Der Wissenschaften E.V. Ultra-rapid freezing device and method
GB2461708A (en) * 2008-07-08 2010-01-13 Silson Ltd Sample holder
US20150090878A1 (en) * 2013-09-30 2015-04-02 Fei Company Preparation of Cryogenic Sample for Charged-Particle Microscopy
US20150221470A1 (en) * 2012-09-14 2015-08-06 Hitachi High-Technologies Corporation Charged Particle Beam Apparatus and Sample Observation Method

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59109840A (ja) 1982-12-16 1984-06-25 Hitachi Koki Co Ltd 走査形電子顕微鏡用生物試料の前処理方法
US7112790B1 (en) * 2003-08-13 2006-09-26 Cypress Semiconductor Corp. Method to prepare TEM samples
JP4891830B2 (ja) * 2007-04-18 2012-03-07 日本電子株式会社 電子顕微鏡用試料ホルダおよび観察方法
GB0724736D0 (en) * 2007-12-19 2008-01-30 Oxford Nanolabs Ltd Formation of layers of amphiphilic molecules
JP2010054272A (ja) 2008-08-27 2010-03-11 National Institute Of Advanced Industrial Science & Technology スピン偏極走査電子顕微鏡
AT507079B1 (de) * 2009-01-22 2010-02-15 Leica Mikrosysteme Gmbh Vorrichtung und verfahren zum präparieren von proben
JP5550262B2 (ja) * 2009-05-29 2014-07-16 キヤノン株式会社 試料観察システム及び試料観察方法
US9312095B2 (en) * 2010-03-24 2016-04-12 Brown University Method and system for automating sample preparation for microfluidic cryo TEM
GB201118282D0 (en) 2011-10-21 2011-12-07 Cancer Rec Tech Ltd Sample slide preparation method and device
JP6239246B2 (ja) * 2013-03-13 2017-11-29 株式会社日立ハイテクノロジーズ 荷電粒子線装置、試料観察方法、試料台、観察システム、および発光部材
CA2919961C (en) * 2013-08-13 2023-10-10 Medical Research Council Electron microscopy sample support comprising porous metal foil
GB201318463D0 (en) * 2013-08-13 2013-12-04 Medical Res Council Graphene Modification
CA2932803C (en) 2013-12-13 2020-09-08 Ventana Medical Systems, Inc. Thermal management in the context of automated histological processing of biological specimens and associated technology
GB2537579A (en) 2014-11-07 2016-10-26 Linkam Scient Instr Ltd Microscopic sample preparation
EP4215898A1 (en) * 2015-04-20 2023-07-26 Ventana Medical Systems, Inc. Inkjet deposition of reagents for histological samples
DK3260839T3 (da) * 2016-06-22 2021-04-19 Univ Maastricht Fremgangsmåde til forberedelse af prøver til billeddannelses- eller diffraktionseksperimenter under kyrogene betingelser
EP3647763B1 (en) * 2018-10-29 2021-07-14 FEI Company A method of preparing a biological sample for study in an analysis device

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070145268A1 (en) * 2005-12-09 2007-06-28 Lee, Bing-Huan Ultra-thin liquid control plate and combination of box-like member and the control plate
US20090126373A1 (en) * 2007-11-20 2009-05-21 Max-Planck-Gesellschaft Zur Foerderung Der Wissenschaften E.V. Ultra-rapid freezing device and method
GB2461708A (en) * 2008-07-08 2010-01-13 Silson Ltd Sample holder
US20150221470A1 (en) * 2012-09-14 2015-08-06 Hitachi High-Technologies Corporation Charged Particle Beam Apparatus and Sample Observation Method
US20150090878A1 (en) * 2013-09-30 2015-04-02 Fei Company Preparation of Cryogenic Sample for Charged-Particle Microscopy

Also Published As

Publication number Publication date
AU2017302126A1 (en) 2019-02-07
US11067486B2 (en) 2021-07-20
EP3491360B1 (en) 2025-03-19
GB201613173D0 (en) 2016-09-14
ES3026360T3 (en) 2025-06-11
EP3491360A1 (en) 2019-06-05
CN109891208A (zh) 2019-06-14
WO2018020036A1 (en) 2018-02-01
JP2019528435A (ja) 2019-10-10
JP6997757B2 (ja) 2022-02-04
CA3032234A1 (en) 2018-02-01
DK3491360T3 (da) 2025-06-10
US20190170618A1 (en) 2019-06-06
CA3032234C (en) 2024-02-13

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